Measurement Instruments
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| Brand | Beifen Sanpu |
|---|---|
| Model | ZM-103 |
| Type | Volumetric Flowmeter |
| Measurement Principle | Soap Film Displacement (Volumetric Timing Method) |
| Flow Range | 5 mL/min – 5 L/min |
| Accuracy | ±1% of reading |
| Repeatability | < 0.5% |
| Flow Resolution | 0.1 mL/min |
| Time Resolution | 0.01 s (displayed as 0.1 s) |
| Temperature & Pressure Compensation | Yes, user-adjustable |
| Operating Power | Internal 4.8 V / 700 mAh rechargeable battery (standby >24 h) |
| Auto Power Management | Backlight off after 1 min idle |
| Dimensions | 90 mm × 150 mm × 280 mm |
| Weight | ~1.3 kg |
| Compliance | Fully conforms to JJG 586–2006 “Verification Regulation for Soap Film Flowmeters” |
| Brand | Beifen Sanpu |
|---|---|
| Origin | Beijing, China |
| Manufacturer | Beifen Sanpu Instrument Co., Ltd. |
| Model | ZM-103A |
| Flow Range | 2 mL/min – 2 L/min |
| Accuracy | ±1% of reading |
| Repeatability | <0.5% |
| Volume Resolution | 0.1 mL |
| Time Resolution | 0.01 s (displayed as 0.1 s) |
| Operating Temperature Compensation | Built-in sensor (0–40 °C) |
| Pressure Compensation | Built-in sensor (60–110 kPa) |
| Power | Rechargeable 4.8 V / 1800 mAh Li-ion battery (standby >24 h) |
| Dimensions | 90 mm × 150 mm × 280 mm |
| Weight | 0.6 kg |
| Compliance | JJG 586–2006 Verification Regulation for Soap Film Flowmeters |
| Brand | Beifen Sanpu |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Direct Manufacturer |
| Model | ZM-103A |
| Flow Principle | Volumetric (Soap Film) |
| Flow Range | 4–1000 mL/min |
| Temperature Range | −10 °C to 50 °C |
| Pressure Range | 101.3 kPa ±50 kPa |
| Accuracy | ΔQ < ±1% |
| Repeatability | < 0.5% |
| Flow Resolution | 0.1 mL/min |
| Time Resolution | 0.1 s (internal calculation to 0.01 s) |
| Power | Rechargeable 4.8 V battery (standby >24 h |
| External Power | 9 V DC input with integrated trickle charging |
| Brand | Beifen Sanpu |
|---|---|
| Origin | Beijing, China |
| Manufacturer | Beifen Sanpu Instrument Co., Ltd. |
| Model | ZM-103B |
| Flow Range | 5 mL/min – 5 L/min |
| Accuracy | ±1% of reading |
| Repeatability | <0.5% |
| Volume Resolution | 0.1 mL |
| Time Resolution | 0.01 s (displayed as 0.1 s) |
| Temperature & Pressure Compensation | Yes |
| Power | Internal 4.8 V / 1800 mAh rechargeable battery (standby >24 h) or external 9 V DC adapter |
| Dimensions | 90 mm × 150 mm × 280 mm |
| Weight | ~0.6 kg |
| Compliance | JJG 586–2006 “Verification Regulation for Soap Film Flowmeters” |
| Brand | Beifen Sanpu |
|---|---|
| Origin | Hebei, China |
| Manufacturer Type | Direct Manufacturer |
| Country of Origin | China |
| Model | ZM-105 |
| Product Type | Positive Displacement Flowmeter |
| Flow Range | 30 mL/min – 30 L/min |
| Accuracy | ±1% of reading |
| Repeatability | < 0.5% |
| Volumetric Resolution | 0.1 mL/min |
| Time Resolution | 0.1 s (internal calculation at 0.01 s) |
| Operating Temperature Compensation | Built-in sensor |
| Pressure Compensation | Built-in sensor |
| Volume Correction | Automatic based on T & P |
| Compliance | JJG 586–2006 Verification Regulation for Soap Film Flowmeters |
| Power | Rechargeable 4.8 V / 700 mAh battery (standby >24 h) |
| Dimensions | 90 mm × 150 mm × 280 mm |
| Weight | 1.3 kg |
| Auto-power Management | Backlight off after 1 min idle |
| Brand | Beifen Sanpu |
|---|---|
| Origin | Beijing, China |
| Manufacturer | Original Equipment Manufacturer (OEM/ODM Capable) |
| Type | Volumetric Flowmeter |
| Model | ZM-105B |
| Measurement Principle | Soap Film Displacement (Volumetric Timed-Interval Method) |
| Flow Range | 30 mL/min – 30 L/min |
| Accuracy | ±1% of reading |
| Repeatability | < 0.5% |
| Volume Resolution | 0.1 mL |
| Time Resolution | 0.01 s (displayed as 0.1 s) |
| Temperature & Pressure Compensation | Yes (user-adjustable) |
| Power Supply | Internal 4.8 V / 700 mAh rechargeable battery (standby >24 h) |
| Operating Environment | 0–40 °C, ≤85% RH |
| Dimensions | 90 mm × 150 mm × 280 mm |
| Weight | 2.3 kg |
| Compliance | JJG 586–2006 “Verification Regulation for Soap Film Flowmeters” |
| Application Scope | Calibration of low-to-medium gas flow devices in environmental monitoring, occupational health, laboratory QA/QC, and analytical instrumentation |
| Brand | Belfort |
|---|---|
| Origin | USA |
| Model | AEPG II |
| Operating Temperature Range | -55 °C to +55 °C |
| Collection Area | 200 cm² (16 cm diameter) or 50.26 in² (8 in diameter) |
| Precipitation Rate Range | 0.25 mm/h to 3040 mm/h |
| Resolution | 0.025 mm (0.001 in) |
| Accuracy | ±0.25 mm (±0.01 in) or ±0.1% FS |
| Repeatability | ±0.25 mm (±0.01 in) |
| Output | RS-232 (configurable units: mm/in, mass, frequency, collector temperature) |
| Power Supply | 8–18 VDC (3 W nominal) |
| Optional Heater | 115 VAC/60 Hz/2 A or 12 VDC @ 30/60/90 W |
| Enclosure Material | UV-stabilized high-strength thermoplastic over aluminum frame |
| Weight | 13 kg (28.5 lb) |
| Compliance | WMO No. 8, NOAA/NWS Technical Memorandum NWS OH-1, ASTM D7297 |
| Brand | AS ONE |
|---|---|
| Origin | Japan |
| Manufacturer | AS ONE Corporation |
| Model No. | 2-5750-01 |
| Type | Mechanical Dual-Pan Centrifuge Tube Balancing Scale |
| Max. Tube Diameter | Ø35 mm |
| Pan Opening Diameter | Ø36 mm |
| Balance Base Material | Stainless Steel (SUS304) |
| Stand Material | PVC |
| Tube Holder Material | PMMA (Polymethyl Methacrylate) |
| Holder Dimensions | Ø50 × 86 mm |
| Net Weight | 820 g |
| Overall Dimensions (L×W×H) | 311 × 100 × 230 mm |
| Compliance | Designed for ISO/IEC 17025-aligned laboratory balance verification workflows |
| Brand | Biaozhuo |
|---|---|
| Origin | Shanghai, China |
| Model | JJ-2A |
| Measurement Range | 0°–360° |
| Angular Resolution | <1 arcsecond |
| Accuracy | <4 arcseconds |
| Base Material | Granite |
| Main Shaft Bearing | Dual-sphere rolling mechanism |
| Operating Temperature | 20 °C ±3 °C |
| Relative Humidity | 40–60 % RH |
| Mass | 350 kg |
| Brand | BOROSA |
|---|---|
| Country of Origin | Germany |
| Model | L200 |
| Operating Pressure | Ambient (1 atm) |
| Frequency | ~40 kHz |
| Temperature Range | −20 °C to +180 °C |
| Sample Type | Liquids and Solids |
| Levitation Mode | Standing-wave acoustic levitation (ultrasonic, single-axis) |
| Software Functions | Automated droplet detection, contour analysis, real-time dimensional tracking (axial/radial diameter), volume-time curve fitting, diffusion/transport coefficient derivation |
| Compliance | Designed for GLP-compliant lab environments |
| Brand | BOROSA |
|---|---|
| Origin | Germany |
| Model | L800 |
| Pressure Range | 0.10–20 MPa |
| Temperature Range | −20 °C to +180 °C |
| Droplet Diameter Capacity | 0.7–4 mm |
| Sample Chamber Material | Titanium Alloy with Triple Sapphire Windows |
| Compliance | Designed for ISO/IEC 17025-aligned research environments, supports GLP-compliant data traceability |
| Brand | Brookfield |
|---|---|
| Origin | USA |
| Model | SC4-18, SC4-31, SC4-34, SC4-16, SC4-25Z, KU-1030, KU-1031, T-A–T-F, SA-70, SSA, BTU-18Y, SC4-DSY, SC4-13RPY, SC4-13RD, SC4-27SD, SC4-27 Link Hanging Assembly |
| Shear Rate Range | Instrument-dependent (DVNext/RV series) |
| Torque Range | 0.28–1.32 N·cm |
| Sample Volume | 4.2–9.4 mL |
| Material | 316 Stainless Steel (standard), Anodized Aluminum (select spindles) |
| Compliance | ASTM D1200, ISO 2555, ISO 3219, USP <911>, GLP-ready with audit-trail-capable software |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | Contour Elite |
| Product Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Measurement Principle | White-light Interferometry (WLI) based on proprietary Wyko® technology |
| Software Platform | Vision64® |
| Configuration Options | Contour Elite K (benchtop, enhanced stability), Contour Elite I (fully automated benchtop with integrated vibration isolation), Contour Elite X (floor-standing configuration with active or passive vibration isolation platform) |
| Compliance | Designed for GLP/GMP environments |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | Contour-GT |
| Measurement Principle | White Light Interferometry (WLI) |
| Application Domain | R&D and Production QC/QA in Semiconductor, LED, Solar, Ophthalmic, and Medical Device Manufacturing |
| Compliance Framework | Supports ISO 25178-2:2012, ISO 4287, ASTM E1316, and GLP/GMP-aligned data integrity workflows |
| Software Platform | Bruker Vision64™ (64-bit, multi-threaded analysis engine) |
| Optical Resolution | Sub-micron lateral resolution |
| Vertical Resolution | <0.1 nm (typical) |
| Scan Range | Up to 10 mm vertical, 100 mm lateral (configurable with motorized stages) |
| Field of View | 0.1–10 mm² (objective-dependent) |
| Data Acquisition Speed | Up to 120 frames/sec (full-field WLI) |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | ContourGT-I |
| Pricing | Available Upon Request |
| Type | Non-Contact 3D Optical Profilometer / Surface Roughness Analyzer |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | ContourGT-X |
| Pricing | Upon Request |
| Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | ContourX-100 |
| Product Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Operating Principle | White Light Interferometry (WLI) |
| Camera Resolution | 5 MP |
| Compliance Standards | ISO 25178, ASME B46.1, ISO 4287 |
| Interface | VisionXpress™ and Vision64® software platforms |
| Vibration Isolation | Integrated passive damping architecture |
| Z-axis Resolution | Sub-nanometer (independent of magnification) |
| Field of View | Maximum standard FOV among benchtop WLI systems |
| Surface Reflectivity Range | 0.05% to 100% |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | ContourX-100 |
| Product Type | Non-contact Optical Profilometer / Surface Roughness Analyzer |
| Operating Principle | White Light Interferometry (WLI) |
| Compliance Standards | ISO 25178, ASME B46.1, ISO 4287 |
| Field of View | Standard large FOV |
| Z-Axis Resolution | Magnification-independent |
| Vibration Isolation | Integrated high-stability passive isolation |
| Software Interface | Intuitive graphical user interface with pre-configured filters and analysis modules |
| Measurement Mode | Full-field 2D/3D topographic mapping |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | ContourX-1000 |
| Type | Non-contact 3D Optical Profilometer / Surface Roughness Analyzer |
| Principle | White Light Interferometry (WLI) |
| Optical Head | Motorized Tilt & Pitch Adjustment |
| Illumination | Dual-source (broadband white light) |
| Automation | Auto-focus, Auto-surface detection (Advanced Find Surface™), Adaptive USI mode |
| Calibration | Integrated self-calibrating laser reference |
| Vibration Isolation | Built-in active/passive vibration isolation platform |
| Software | VisionXpress™ with guided workflows and ISO-compliant analysis modules |
| Compliance | Fully supports ISO 25178 (areal surface texture), ISO 4287/4288 (profile roughness), ASTM E2926, and GLP/GMP data integrity requirements |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | ContourX-200 |
| Measurement Principle | White Light Interferometry (WLI) |
| Camera Resolution | 5 MP |
| XY Stage | Motorized |
| Z-Axis Resolution | Sub-nanometer |
| Field of View | Large, Magnification-Independent |
| Compliance Standards | ISO 25178, ISO 4287, ASME B46.1 |
| Software Platform | VisionXpress™ and Vision64 |
| Surface Reflectivity Range | 0.05% – 100% |
| Sensor Array | 1200 × 1000 pixels |
| Measurement Mode | Universal Scanning Interferometry (USI) |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | ContourX-200 |
| Product Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Working Principle | White Light Interferometry (WLI) |
| Camera Resolution | 5 MP |
| Field of View | Standard Large FOV |
| Z-Axis Resolution | Sub-nanometer |
| Compliance Standards | ISO 25178, ISO 4287, ASME B46.1 |
| Software Platform | Vision64® and VisionXpress™ |
| Motion Control | Motorized XY Stage |
| Surface Reflectivity Range | 0.05% – 100% |
| Application Scope | Precision Machined Surfaces, Thin Films, Semiconductors, Ophthalmic Lenses, Medical Devices, MEMS, Tribology |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | ContourX-200 |
| Product Type | Non-contact Optical Profilometer / Surface Roughness Analyzer |
| Measurement Principle | White Light Interferometry (WLI) |
| Vertical Resolution | Sub-nanometer (typical < 0.1 nm RMS noise) |
| Lateral Resolution | Diffraction-limited, dependent on objective magnification (e.g., 0.49 µm at 50×) |
| Camera | 5 MP high-speed CMOS sensor |
| Stage | Motorized XY stage with 100 mm × 100 mm travel |
| Field of View | Up to 4.8 mm × 3.6 mm (with 2.5× objective), scalable via 5×–100× objectives |
| Compliance | Fully supports ISO 25178-2, ISO 4287, ASME B46.1, and NIST-traceable calibration protocols |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported |
| Model | ContourX-500 |
| Pricing | Upon Request |
| Instrument Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Operating Principle | White Light Interferometry (WLI) |
| Compliance Standards | ISO 25178, ASME B46.1, ISO 4287 |
| Key Features | Encoder-equipped XY stage, motorized auto-tilting optical head, auto-brightness adjustment, USI universal scanning mode, pneumatic vibration isolation base, magnification-independent Z-resolution |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | ContourX-500 |
| Product Type | Non-contact Profilometer / Surface Roughness Analyzer |
| Working Principle | White Light Interferometry (WLI) |
| Compliance Standards | ISO 25178, ASME B46.1, ISO 4287 |
| Automation Features | Motorized XY Stage with Encoders, Programmable Auto-Tilt Optical Head, Auto-Brightness Control, Pneumatic Vibration Isolation Base |
| Software Platform | VisionXpress™ and Vision64® |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | Dektak Pro |
| Type | Contact Stylus Profilometer |
| Operating Principle | Mechanical Stylus Scanning (Tactile Profilometry) |
| Category | Precision Geometric Measurement Instrument |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | Dektak Pro |
| Measurement Repeatability | 4 Å |
| Accuracy | ±1% |
| Probe Tip Radius | 50 nm – 25 µm |
| Normal Force Range | 0.03–15 mg |
| Scan Length | 55 mm |
| Step Height Repeatability | 4 Å |
| Vertical Resolution | 1 Å |
| Maximum Sample Size | 200 mm |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Dektak XT |
| Measurement Principle | Capacitive Transduction |
| Vertical Repeatability | ≤ 5 Å |
| Vertical Resolution | 1 Å |
| Probe Tip Radius | 50 nm – 25 µm |
| Normal Force | 15 µN |
| Scan Length | 55 mm (2-inch) |
| Maximum Sample Size | 50 mm |
| Operating Temperature | 10–30 °C |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | DEKTAK XT |
| Measurement Principle | Contact Stylus Profilometry |
| Vertical Resolution | 1 Å |
| Step Height Repeatability | <4 Å |
| Vertical Measurement Range | Up to 1 mm |
| Probe Tip Radius | 50 nm – 25 µm |
| Normal Force | 15 µN (adjustable) |
| Scan Length | 55 mm (2-inch stage travel) |
| Maximum Sample Size | 50 mm diameter |
| Accuracy | ±1% of measured value |
| Horizontal Positioning Resolution | 10 nm |
| Data Acquisition Speed | 40% faster than previous generation |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | Dektak XT |
| Price Range | USD 55,000–68,000 (FOB Hamburg) |
| Vertical Measurement Repeatability | <5 Å |
| Vertical Resolution | 1 Å |
| Accuracy | ±1% of measured step height |
| Tip Radius | 50 nm – 25 µm |
| Normal Force Range | 0.3–15 mg (adjustable in 0.1 mg increments) |
| Maximum Scan Length | 55 mm (2-inch stage travel) |
| Maximum Sample Diameter | 50 mm |
| Vertical Measurement Range | Up to 1 mm |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | Dektak XT-10th |
| Measurement Principle | Capacitive Probe Sensing |
| Measurement Capability | 2D Surface Topography Profiling |
| Vertical Accuracy | ±1 Å |
| Probe Tip Radius | 50 nm – 25 µm |
| Normal Force | 15 µN |
| Scan Length | 55 mm (2 in) |
| Step Height Repeatability | < 5 Å |
| Vertical Resolution | 1 Å |
| Maximum Sample Size | 50 mm |