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Microphase Model 15 Magnetron Sputtering System

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Brand Microphase
Origin Japan
Model 15
Vacuum Chamber Options Cylindrical (φ300–2000 mm) or Custom Rectangular
Cathode Materials OFHC Copper
Magnet Type NdFeB Permanent Magnets (Fixed or Scanning)
Sputter Gun Configurations Circular (1–13 inch), Rectangular (1.5–10 inch width, 5–120 inch length)
Power Supplies DC (1–20 kW), MF (1–20 kW), RF (0.3–15 kW)
Substrate Size Range 2–120 inch
Film Uniformity ±1.5% (scanning magnet), ±3.0% (fixed magnet)
Thickness Monitoring Quartz Crystal Microbalance (QCM) — single/dual/six-sensor configuration
Vacuum System Dry Roughing Pump + Turbomolecular Pump / Cryopump / Ion Gauge
Control Architecture PLC + Industrial Touchscreen PC with IC-5/PC-based Deposition Logic
Compliance Ready GLP/GMP audit trail support, ASTM F2627-compliant process logging

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Overview

The Microphase Model 15 Magnetron Sputtering System is a high-precision, modular thin-film deposition platform engineered for reproducible physical vapor deposition (PVD) under ultra-high vacuum (UHV) and high-vacuum conditions. Based on the principles of magnetron sputtering—where a plasma discharge is confined near a target surface by crossed electric and magnetic fields—the system enables controlled ejection of atoms from conductive or semi-conductive targets onto substrates via momentum transfer. This physics-driven process ensures atomic-level stoichiometric fidelity in compound film growth (e.g., ITO, SiO₂, TiN, Al₂O₃) and supports both DC, medium-frequency (MF), and radio-frequency (RF) excitation modes for broad material compatibility. Designed for research laboratories, pilot-line R&D, and pre-production environments, the Model 15 integrates vacuum architecture, power delivery, real-time thickness metrology, and programmable process logic into a single robust platform compliant with international thin-film fabrication standards.

Key Features

  • Modular cathode configurations: Circular magnetrons (1–13 inch diameter) and planar rectangular magnetrons (1.5–10 inch width, up to 120 inch length for large-area deposition); optional dual-erosion geometry for extended target utilization.
  • NdFeB permanent magnet assemblies with fixed or scanning (rotating/linear) magnet configurations—achieving ≤±1.5% thickness uniformity across 12-inch substrates and ≤±3.0% with static field alignment.
  • Multi-mode power supply suite: DC (1–20 kW), medium-frequency (1–20 kW), and RF (0.3–15 kW) sources—enabling reactive sputtering, insulator target processing, and in-situ substrate biasing.
  • Integrated quartz crystal microbalance (QCM) thickness monitoring with configurable sensor arrays (single, dual, or six-position)—calibrated for real-time deposition rate feedback and endpoint detection.
  • UHV-capable chamber architecture: Cylindrical stainless-steel vessel (φ300–2000 mm × 500 mm height) or custom rectangular design; compatible with load-lock modules featuring automated sample transfer and inert-gas purged entry.
  • Full-process automation: PLC-driven sequencing with industrial touchscreen HMI; supports manual override, recipe-based execution, and event-triggered parameter adjustment during deposition.

Sample Compatibility & Compliance

The Model 15 accommodates substrates ranging from 2-inch wafers to 120-inch flexible or rigid panels—including glass, silicon, polymer foils, and metal sheets. Its gas handling subsystem employs mass flow controllers (MFCs) for precise Ar, O₂, N₂, and reactive gas dosing, while Baratron capacitance manometers ensure stable pressure regulation during plasma ignition and sustained operation (1×10⁻⁷ Torr base pressure typical). The system meets mechanical and electrical safety requirements per IEC 61000-6-2/6-4 and is configured for traceable operation under GLP and GMP frameworks: all deposition parameters (power, pressure, time, gas flows, QCM readings) are timestamped, logged, and exportable in CSV/Excel format. Optional 21 CFR Part 11-compliant software modules provide electronic signatures, audit trails, and user-access controls for regulated environments.

Software & Data Management

Deposition control is managed via IC-5 and PC-based software architecture, offering hierarchical access levels (operator, engineer, administrator) and scriptable process sequences. Real-time graphs display voltage, current, pressure, deposition rate, and cumulative thickness synchronized to millisecond resolution. All logs include metadata such as chamber ID, operator login, environmental conditions (room temperature/humidity), and calibration status of QCM sensors. Raw data files are stored in vendor-neutral formats (UTF-8 text, HDF5) and can be imported into MATLAB, Python (NumPy/Pandas), or third-party statistical process control (SPC) platforms. Remote diagnostics and firmware updates are supported over secure Ethernet (TLS 1.2), with optional OPC UA integration for factory-wide MES connectivity.

Applications

  • Optical coatings: Anti-reflective (AR), high-reflection (HR), and bandpass filters on precision optics and laser components.
  • Transparent conductive oxides (TCOs): Uniform ITO, AZO, and GZO films on display substrates for LCD/OLED manufacturing development.
  • Hard coatings: CrN, TiAlN, and DLC layers on cutting tools and biomedical implants requiring adhesion testing per ASTM B571.
  • Functional thin films: Ferroelectric (PZT), piezoelectric (AlN), and thermoelectric (Bi₂Te₃) layers for MEMS and energy harvesting prototypes.
  • Research-grade multilayer stacks: Alternating metal/dielectric structures for plasmonic, photonic crystal, and superconducting device studies.
  • Cluster tool integration: Seamless interface with adjacent evaporation, annealing, or etch modules via SECS/GEM protocol.

FAQ

What vacuum level can the Model 15 achieve?

Base pressure of ≤5×10⁻⁸ Torr is attainable with cryopump configuration; standard turbomolecular pump systems reach ≤1×10⁻⁷ Torr after 4-hour bakeout.
Is RF sputtering supported for oxide targets?

Yes—the integrated 0.3–15 kW RF generator enables stable sputtering of Al₂O₃, SiO₂, and other dielectric materials using impedance-matching networks and auto-tuning algorithms.
Can the system be upgraded to in-line configuration?

The Model 15’s modular chamber design and standardized flange interfaces (CF100/CF200) allow direct integration into in-line sputtering lines with conveyor-based substrate transport and inter-chamber isolation valves.
What certifications does the system carry?

CE marking (EMC & LVD directives), RoHS compliance, and ISO 9001-aligned manufacturing documentation are provided; UL/cUL listing available upon request.
How is film uniformity verified and maintained?

Uniformity mapping is performed using witness wafers and profilometry (Dektak) or spectrophotometry (UV-Vis/NIR); magnet scanning profiles and gas distribution manifolds are field-adjustable to compensate for edge effects.

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