Optical Instruments
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| Brand | SuPro Instruments |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Direct Manufacturer |
| Country of Origin | China |
| Model | THS05 |
| Price | USD 16,800 (FOB Guangdong) |
| Brand | Suptratec |
|---|---|
| Origin | Germany |
| Model | S200 SS |
| Product Type | Online Analyzer |
| Measurement Range | SS: 0–50 g/L |
| Turbidity | 0–4000 FAU |
| Sludge Interface | 0–100% transmittance |
| Resolution | SS: 0.01 g/L |
| Turbidity | 0.01–1 FAU |
| Sludge Interface | 0.01–0.1% transmittance |
| Optical Wavelength | 870 nm (IR) |
| Principle | Infrared Absorption & 90° Scattered Light Detection |
| Communication | RS485 Modbus, SDI-12 |
| IP Rating | IP68 |
| Operating Temperature | −5.00 to +60.00 °C |
| Accuracy | SS <10% |
| Response Time | <35 s |
| Power Supply | 5–28 V DC |
| Power Consumption | 25 µA (standby), 4.5 mA (RS485/SDI-12 @ 1 Hz), 100 mA (pulse, 30 ms) |
| Sensor Weight | 750 g |
| Housing Material | Polyoxymethylene (POM) |
| Pressure Rating | 5 bar |
| Brand | SurfaceOptics |
|---|---|
| Origin | USA |
| Model | 410 DHR |
| Wavelength Bands | 0.9–1.1, 1.9–2.4, 3.0–4.0, 3.0–5.0, 4.0–5.0, 8.0–12.0 µm |
| Wavelength Resolution | Fixed-band spectral filtering (no scanning monochromator) |
| Measurement Time | 10 s per acquisition (after 90 s warm-up) |
| DHR Repeatability | ±0.5% absolute reflectance (typical, under controlled ambient conditions) |
| Incident Angles | 20° and 60° from normal |
| Sample Geometry Support | Flat, convex (≥6″ radius), concave (≥12″ radius) |
| IR Source | Kanthal® alloy resistive emitter |
| Probe Design | Modular, swappable optical heads |
| Display | Integrated touchscreen PDA with embedded control firmware |
| Operating Temperature | 0–40 °C (non-condensing) |
| Storage Temperature | −25–70 °C |
| Power | Dual rechargeable NiMH batteries |
| Weight | 2.1 kg (including batteries) |
| Calibration | NIST-traceable gold mirror reference standard included |
| Brand | SurfaceOptics |
|---|---|
| Origin | USA |
| Model | 410 Solar |
| Wavelength Range | 335–2500 nm |
| Wavelength Bands | 7 discrete bands (335–380, 400–540, 480–600, 590–720, 700–1100, 1000–1700, 1700–2500 nm) |
| Incident Angle | 20° from normal |
| Measurement Modes | Total reflectance, diffuse reflectance, and 20° specular reflectance |
| Repeatability | ±0.5% (within 10 s per measurement |
| Calibration Traceability | NIST-traceable gold reference standard included |
| Compliance | ASTM E903, ASTM C1549 |
| Spot Size | 0.250" diameter at 20° incidence |
| Beam Divergence | 3° half-angle |
| Operating Temperature | 0–40 °C (non-condensing) |
| Storage | −25 to 70 °C |
| Power | Dual rechargeable NiMH batteries |
| Weight | 2.1 kg (with batteries) |
| Display | Integrated PDA-style touchscreen interface with on-board SD card data storage |
| Brand | SurfaceOptics (SOC) |
|---|---|
| Origin | USA |
| Model | AE1/RD1 |
| Emissivity Measurement Range | 0.05–0.95 |
| Repeatability | ±0.01 |
| Measurement Time per Sample | ≤10 s |
| Sample Temperature Range | Up to 54 °C (130 °F) |
| Standard Blackbody Cavity Temperature Control | Required for thermal equilibrium |
| Detector Output Linearity Error | <±0.01 over full emissivity range |
| Output Signal | 2.4 mV at 25 °C, ε = 0.9, 150 Ω load |
| Power Supply | 100–240 VAC, 50–60 Hz → 12 VDC adapter |
| Optional Battery Pack | 12 V, 12 h continuous operation |
| Minimum Flat Sample Diameter | 5.7 cm (2.25 in) |
| with AE-AD1 | 2.54 cm (1.0 in) |
| with AE-AD3 | 1.9 cm (0.75 in measurement area) |
| Compliance | Designed for ASTM C1371, ISO 18434-1, and ASTM E1933-compliant emissivity validation workflows |
| Brand | SurfaceOptics (SOC) |
|---|---|
| Model | ET10 |
| Measurement Principle | Reflectance-based emissivity calculation (E = 1 − R) for opaque materials |
| Spectral Bands | 3–5 µm and 8–12 µm dual-band simultaneous detection |
| Measurement Time | ≤7 s per acquisition |
| Display | Integrated LCD touchscreen PDA interface |
| Calibration | NIST-traceable gold mirror reference standard included |
| Power | Rechargeable battery operation |
| Compliance | Supports ASTM E1933, ISO 18434-1, and USP <1210> emissivity validation protocols |
| Sample Requirement | Opaque, non-transmissive surfaces only |
| Operating Temperature Range | 15–35 °C ambient |
| Relative Humidity Limit | ≤80 % RH (non-condensing) |
| Brand | SurfaceOptics (SOC) |
|---|---|
| Model | 410DHR |
| Measurement Principle | Modified Integrating Sphere Method (co-developed with NRL & NIST) |
| Spectral Range | Six discrete bands spanning 0.9–12 µm (NIR, SWIR, MWIR, LWIR) |
| Incidence Angles | 20° and 60° |
| Data Points per Measurement Cycle | 12 |
| Measurement Time | ≤7 seconds |
| Calibration | NIST-traceable gold mirror reference standard included |
| Power Source | Rechargeable battery |
| Display | Integrated PDA with capacitive touchscreen interface |
| Detector Configuration | Six synchronized broadband detectors |
| Portability | Handheld, field-deployable design |
| Compliance | Supports ASTM E903, ISO 9034, and MIL-STD-45662A traceability requirements |
| Software Control | On-device GUI with real-time instrument status monitoring (10 operational parameters displayed simultaneously) |
| Probe Interchangeability | Modular measurement head architecture for application-specific optical configurations |
| Brand | Sutter |
|---|---|
| Origin | USA |
| Model | MPC-225 |
| Component Category | Optical Instrument Component |
| Actuation | Stepper Motor–Driven |
| Axes | 3 (X/Y/Z) + Optional 4th Diagonal Axis via ROE-225 |
| Travel Range per Axis | 25 mm |
| Motion Resolution | Adjustable via Dual-Range Position Knobs (Coarse/Fine, 10 µm fine increment) |
| Bearing System | Preloaded Ball-Bearing Slides |
| Compatibility | Mounting Interfaces for MP-285 Pipette Holders and Probes |
| Controller | Integrated Self-Diagnosing MP-225 Controller with ROE-225 Human-Machine Interface |
| Configuration | Factory-Assembled Right- or Left-Handed |
| Mounting | Standard ¼-20 or 10-32 threaded holes on Square Base Plate |
| Brand | Swamp Optics |
|---|---|
| Origin | USA |
| Model | 8-20-USB |
| Wavelength Range | 700–1100 nm |
| Pulse Width Range (at 800 nm) | ~19–~340 fs |
| Pulse Width Range (at 1050 nm) | ~15–~160 fs |
| Temporal Resolution (Delay Increment) | 0.9 fs/pixel |
| Maximum Time Window | 500 fs |
| Spectral Resolution (at 800 nm) | 1.4 nm |
| Spectral Range (at 800 nm) | 140 nm |
| Time-Bandwidth Product Limit | < ~10 |
| Intensity Accuracy | ±2% |
| Phase Accuracy | 0.01 rad (intensity-weighted phase error) |
| Spatial Chirp Sensitivity | 1 μm/nm |
| Pulse Front Tilt Sensitivity | 0.05 fs/mm |
| Input Polarization | Any (rotation required) |
| Input Beam Diameter (collimated) | >2–4 mm |
| Single-Shot Sensitivity | 1 μJ |
| Repetition-Rate-Dependent Sensitivity (10³ Hz) | 100 μW (100 nJ) |
| Repetition-Rate-Dependent Sensitivity (10⁸ Hz) | 10 mW (100 pJ) |
| Brand | Swamp Optics |
|---|---|
| Origin | USA |
| Model | 8-50-ECO |
| Wavelength Range | 700–1100 nm |
| Pulse Duration Range (@800 nm) | ~50–~500 fs |
| Pulse Duration Range (@1050 nm) | ~30 fs–~100 fs |
| Delay Increment | 1.15 fs/pixel |
| Temporal Window | 1.9 ps |
| Spectral Resolution (@800 nm) | 0.7 nm |
| Spectral Resolution (@1050 nm) | 2 nm |
| Spectral Bandwidth (@800 nm) | 50 nm |
| Spectral Bandwidth (@1050 nm) | 125 nm |
| Time-Bandwidth Product (TBP) | <~10 |
| Intensity Accuracy | 2% |
| Phase Accuracy (intensity-weighted) | 0.01 rad |
| Single-Shot Sensitivity | 1 µJ |
| Repetition-Rate-Dependent Sensitivity | 100 mW (100 nJ) @ 10³ Hz |
| Spatial Profile Accuracy | <0.2% (8-bit, 480 × 640 pixel camera) |
| Input Polarization | Horizontal |
| Input Beam Diameter (collimated) | 2–4 mm |
| ND Filter Interface | Fixed-slot, manual insertion |
| Triggering | None (non-gated single-shot only) |
| Spatial Chirp & Pulse Front Tilt Measurement | Not supported |
| Camera Configuration | Dual-camera (simultaneous temporal + spatial acquisition) |
| Brand | Swamp Optics |
|---|---|
| Origin | USA |
| Model | 15-40-USB |
| Wavelength Range | 1300–1650 nm |
| Pulse Duration Range (at 1550 nm) | 40 fs – 1.5 ps |
| Delay Increment | 4.4 fs/pixel |
| Time Window | 3.4 ps |
| Spectral Resolution (at 1550 nm) | 1.1 nm |
| Spectral Range (at 1550 nm) | 110 nm |
| Temporal-Bandwidth Product Limit | < ~10 |
| Intensity Accuracy | ±2% |
| Phase Accuracy | 0.01 rad (intensity-weighted phase error) |
| Single-Shot Sensitivity | 100 µJ |
| Repetition-Rate Sensitivity (10³ Hz) | 100 µW (100 nJ/pulse) |
| Repetition-Rate Sensitivity (10⁸ Hz) | 10 mW (100 pJ/pulse) |
| Spatial Chirp Precision | 1 µm/nm |
| Pulse Front Tilt Precision | 0.05 fs/mm |
| Input Polarization | Any (rotation required) |
| Collimated Beam Diameter Requirement | >2–4 mm |
| Interface | USB 2.0 |
| Compliance | CE, RoHS |
| Brand | SwampOptics |
|---|---|
| Origin | USA |
| Model | BOA Single-Prism Femtosecond Pulse Compressor |
| Wavelength Ranges | UV (175–500 nm), VIS (450–900 nm), IR (700–1700 nm) |
| Max Negative GDD | −35,000 to −70,000 fs² (UV/VIS), −14,000 to −44,000 fs² (IR) |
| Transmission | >55% (UV), >80% (VIS/IR) at shortest wavelength |
| Bandwidth @ Half-Max GDD | 7–200 nm depending on model |
| Peak Power Handling | 500 MW |
| Design | Single-prism + corner-cube retroreflector architecture |
| Compliance | Designed for alignment-free, distortion-free operation per ISO 10110 optical surface standards and laser safety Class 1 integration requirements |
| Origin | USA |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | GRENOUILLE 8-50-ECO |
| Price Range | USD $13,500 – $27,000 |
| Brand | DALSA |
|---|---|
| Origin | USA |
| Model | SWEEP2000 |
| Sensor Resolution | 2048 pixels (1D) |
| Pixel Size | 20 µm × 20 µm |
| Line Rate | 80 kHz @ 12-bit, 20 kHz @ 14-bit |
| Output Bit Depth | 12/14-bit |
| Spectral Response | UV to NIR |
| Interface Options | CoaXPress or Camera Link |
| Control Interface | Gigabit Ethernet |
| Brand | SWIFT |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | SWIFT In Situ Tensile Stage |
| Instrument Classification | In Situ Mechanical Testing Stage |
| Application Field | Materials Science |
| Maximum Load Capacity | 10 kN |
| Temperature Range | 0–1200 °C |
| Tensile Load Capacity | 10 kN |
| Stroke | 26 mm |
| Brand | SWIR Vision Systems |
|---|---|
| Origin | USA |
| Model | Acuros™ HD |
| Sensor Resolution Options | 640 × 512 |
| Spectral Range | 400–1700 nm |
| Pixel Pitch | 5.0 µm (standard for HD variant) |
| Interface | USB 3.0 / GigE Vision |
| Mount | C-Mount & F-Mount compatible |
| Shutter Type | Global Shutter |
| Cooling | Integrated TEC (Thermoelectric Cooler) |
| Export Classification | EAR99 |
| Effective Pixels | 1920 (horizontal, for 1920×1080 configuration) |