X-ray Diffractometer
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| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | D8 VENTURE |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Power | 200 W (0.0002 MW) |
| Detector | PHOTON III MMPAD Hybrid Photon-Counting Detector |
| X-ray Source Options | microfocus sealed-tube (Incoatec IμS 3.0), liquid-metal-jet (MetalJet), dual-target auto-switching |
| Software | APEX4 (successor to APEX3/PROTEUM3) |
| Compliance | Fully compatible with CIF deposition standards, supports IUCr-compliant data reduction and structure refinement workflows |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Bruker JV-DX |
| Instrument Type | Powder X-ray Diffractometer |
| Power Stability | < 0.0001 (unitless relative stability, typical for high-end sealed-tube X-ray sources) |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | JV-DX |
| Instrument Type | High-Resolution X-ray Diffractometer |
| Power Supply Requirement | 0.0001 kW (standby) |
| Sample Stage | Horizontal 300 mm wafer mount |
| Angular Range | Chi tilt up to 100°, Phi rotation continuous |
| Optical Configuration | Motorized parallel-beam multilayer mirror + auto-switchable high-resolution crystal optics (Ge 004 to Ge 111) |
| Software Platform | JV-RADS v5.x with HRXRD, XRR, and reciprocal space mapping modules |
| Compliance | ASTM E975, ISO 21367, IEC 61000-6-3, GLP/GMP-ready audit trail & user access control |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Instrument Type | High-Resolution X-ray Diffractometer |
| Models | JV-QCTT (Transmission + Optional Reflection Channel), JV-QCRT (Reflection-Only) |
| Sample Size Support | Up to 300 mm wafers |
| Minimum Detectable Strain Field Resolution | ≤11 µm |
| Compliance | Designed for ISO/IEC 17025-compliant labs, supports GLP/GMP audit trails via Bruker DIFFRAC.SUITE software |
| Automation | Fully automated wafer alignment, stitching, defect classification, and KLARF-compliant reporting |
| Measurement Modes | Transmission XRT (JV-QCTT), Reflection XRT (JV-QCRT), Cross-sectional XRT (JV-QCTT with optional reflection channel) |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Instrument Type | Powder & High-Resolution X-ray Diffractometer |
| Model | JV-QCVelox |
| Power Stability | < 0.0001 (fractional intensity drift per hour) |
| Sample Size Compatibility | 2″ to 200 mm wafers |
| Optical Configuration | VeloMAX™ incident-beam optics with multilayer mirrors (standard), selectable crystal monochromators (8″–40″ curvature), motorized detector slits, EDRc detector (dynamic range > 2×10⁷, extended to > 3×10⁸ with auto-attenuator) |
| Automation | Robotic wafer handling, kinematic sample plates (31 × 2″), barcode integration, full script-driven measurement sequences |
| Software Platform | JV-RADS v6.x with GLP-compliant audit trail, ASTM E2921 & ISO 15405 compliant analysis modules |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | JV-QCVelox |
| Instrument Type | High-Resolution X-ray Diffractometer (HRXRD) |
| Power | 0.0001 kW |
| Compliance | ASTM F394, ISO 15382, SEMI S2/S8, FDA 21 CFR Part 11 (software audit trail enabled) |
| Detector Dynamic Range | >3×10⁸ (with EDRc + auto-attenuator) |
| Sample Handling | Automated wafer loader (2″–200 mm), kinematic sample plates, barcode integration |
| Optical Configuration | VeloMAX™ high-flux optics with adjustable divergence crystals (25″ standard, <10″ optional for III-V), multilayer mirrors, motorized detector slits, triaxial crystal stage for GaN-grade resolution |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Instrument Type | Powder X-ray Diffractometer |
| Power Stability | < 0.0001 (unitless relative stability, typical for high-stability X-ray generator control) |
| Automation Capability | Robotic wafer handling optional |
| Sample Capacity | 20 × 2-inch wafers or 5 × 4-inch wafers per sample tray |
| Core Application | In-line and off-line high-resolution XRD for compound semiconductor epitaxial layer characterization |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Instrument Type | Powder X-ray Diffractometer |
| Model | JV QC3 |
| Application Focus | Compound Semiconductor Epitaxial Layer & Substrate QC |
| Automation Level | Fully Automated Wafer Handling (Optional Robotic Arm) |
| Sample Capacity | Up to 4 × 100 mm wafers per batch |
| Compliance | Designed for ISO/IEC 17025-aligned semiconductor manufacturing environments |
| Software Platform | Bruker JV-RADS (Bede RADS) with automated peak fitting, strain/relaxation quantification, and multi-layer compositional analysis |
| X-ray Source Protection | XRG Protect™ tube longevity technology |
| Power Mode | Eco-standby with reduced idle power consumption |
| Brand | Caikon |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Direct Manufacturer |
| Country of Origin | China |
| Model | CH600-190-XV |
| Instrument Type | In Situ XRD Stage (Accessory) |
| Form Factor | Benchtop |
| Power Consumption | 100 W |
| Angular Accuracy | 0.001° |
| Angular Resolution | 0.01° |
| Temperature Range | –190 °C to +600 °C (LN₂-cooled) / RT to +1200 °C (resistive heating) |
| Temp. Stability | ±0.1 °C (≤600 °C), ±1 °C (>600 °C) |
| Temp. Resolution | 0.1 °C |
| Ramp Rate | 0–50 °C/min (programmable) |
| Control Algorithm | PID |
| Sensor | PT100 & Type-K Thermocouple |
| X-ray Window | Kapton film |
| Sample Stage Dimensions | 23 × 23 mm (low-T), 12 × 12 mm (high-T) |
| Stage Material | Silver (low-T), Ceramic (high-T) |
| Housing | Vacuum-compatible stainless steel chamber |
| Cooling | Liquid nitrogen + recirculating chiller |
| External Dimensions | 100 × 100 × 73 mm |
| Standard Accessories | Stage unit, dual-channel temperature controller, LN₂ cryo-controller, LN₂ dewar, custom XRD sample holder, Windows-based thermal control software, water chiller, fluidic interconnects |
| Brand | GKINST |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic |
| Model | D-POWER |
| Price Range | USD 42,000 – 210,000 |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Floor-standing |
| Power Rating | 3 kW |
| Angular Accuracy | 0.0001° |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported Instrument |
| Model | DDCOM |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| X-ray Source | 30 W Air-Cooled Cu Anode Tube |
| Scan Speed | Up to 200× Faster Than Conventional θ-Scanning |
| Orientation Measurement Time | Full 3D Lattice Orientation Determined in ≤10 s |
| Angular Resolution | ≤0.01° (0.01 degree) |
| Sample Capacity | Wafers 2–12 inches |
| Compliance | Designed for ISO/IEC 17025-aligned QC environments, compatible with GLP/GMP documentation workflows |
| Brand | DECTRIS |
|---|---|
| Origin | Switzerland |
| Model | EIGER2 R 250K |
| Detector Module Count | 1 |
| Active Area (W×H) | 38.4 × 38.4 mm² |
| Pixel Size | 75 × 75 µm² |
| Point Spread Function | 1 pixel |
| Energy Thresholds | 2 |
| Threshold Range | 3.5–30 keV |
| Max Count Rate | 6.9 × 10⁸ cps/mm² |
| Counter Depth | 2 × 16 bit/threshold |
| Max Frame Rate | 50 Hz |
| Readout Mode | Simultaneous read/write, zero dead time |
| Image Bit Depth | 32 bit |
| Vacuum Compatibility | Yes |
| Cooling | Air-cooled |
| Dimensions (W×H×D) | 100 × 140 × 93 mm³ |
| Weight | 1.8 kg |
| Brand | DECTRIS |
|---|---|
| Origin | Switzerland |
| Model | EIGER2 R 250K |
| Instrument Type | Powder X-ray Diffractometer Detector |
| Form Factor | Benchtop |
| Power Consumption | 0.3 kW |
| Angular Accuracy | ±0.01° |
| Energy Resolution | 400 keV (at Mn Kα) |
| Detector Module Count | 1 |
| Active Area | 38.4 × 38.4 mm² |
| Pixel Size | 75 × 75 µm² |
| Point Spread Function | ≤1 pixel |
| Dual-Energy Thresholds | 2 (adjustable 3.5–30 keV) |
| Max. Count Rate | 6.9 × 10⁸ cps/mm² |
| Frame Rate | 50 Hz |
| Readout Mode | Simultaneous read/write, zero dead time |
| Bit Depth per Threshold | 2 × 16-bit |
| Image Bit Depth | 32-bit |
| Vacuum Compatibility | Optional |
| Cooling | Air-cooled |
| Dimensions (W×H×D) | 100 × 140 × 93 mm³ |
| Weight | 1.8 kg |
| Brand | DECTRIS |
|---|---|
| Origin | Switzerland |
| Model | EIGER2 R 250K |
| Detector Module Count | 1 |
| Active Area (W×H) | 38.4 × 38.4 mm² |
| Pixel Size | 75 × 75 µm² |
| Point Spread Function | 1 pixel |
| Energy Thresholds | 2 |
| Threshold Range | 3.5–30 keV |
| Max Count Rate | 6.9 × 10⁸ cps/mm² |
| Counter Depth | 2 × 16 bit per threshold |
| Max Frame Rate | 50 Hz |
| Readout Mode | Simultaneous read/write, zero dead time |
| Image Bit Depth | 32 bit |
| Vacuum Compatibility | Yes |
| Cooling | Air-cooled |
| Dimensions (W×H×D) | 100 × 140 × 93 mm³ |
| Weight | 1.8 kg |
| Brand | DECTRIS |
|---|---|
| Origin | Switzerland |
| Model | EIGER2 R |
| Instrument Type | X-ray Detector |
| Form Factor | Benchtop |
| Power Consumption | 0.3 kW |
| Angular Accuracy | ±0.01° |
| Spatial Resolution | 400 µm (pixel pitch: 75 µm) |
| Detector Variants | R250K / R500K / R1M / R4M |
| Vacuum Compatibility | Yes |
| Cooling | Air-cooled (R250K/R500K), Water-cooled (R1M/R4M) |
| Max Frame Rate | 50 Hz (R250K/R500K), 100 Hz (R1M), 20 Hz (R4M) |
| Max Count Rate | 6.9×10⁸ cps/mm² |
| Energy Threshold Range | 3.5–30 keV (dual-threshold operation) |
| Count Depth | 2×16-bit per threshold |
| Readout Mode | Simultaneous read/write, zero dead time |
| Image Bit Depth | 32-bit |
| Point Spread Function | ≤1 pixel |
| Effective Area | 38.4×38.4 mm² (R250K) to 155.1×162.2 mm² (R4M) |
| Brand | DECTRIS |
|---|---|
| Origin | Switzerland |
| Model | EIGER2 R |
| Instrument Type | X-ray Detector |
| Form Factor | Benchtop |
| Power Consumption | 0.3 kW |
| Detector Modules | 1 / 1×2 / 1×4 / 2×4 (R250K / R500K / R1M / R4M) |
| Active Area (W×H) | 38.4×38.4 mm² / 77.2×38.6 mm² / 77.1×79.7 mm² / 155.1×162.2 mm² |
| Pixel Size | 75×75 µm² |
| Point Spread Function | ≤1 pixel |
| Energy Thresholds | 2 independent thresholds |
| Threshold Range | 3.5–30 keV |
| Max Count Rate | 6.9×10⁸ cps/mm² |
| Counter Depth | 2×16 bit per threshold |
| Max Frame Rate | 50 / 50 / 100 / 20 Hz |
| Readout Mode | Simultaneous read/write, zero dead time |
| Image Bit Depth | 32 bit |
| Vacuum Compatibility | Optional |
| Cooling | Air-cooled / Water-cooled (model-dependent) |
| Dimensions (W×H×D) | 100×140×93 mm³ / 100×140×93 mm³ / 114×133×240 mm³ / 235×235×372 mm³ |
| Weight | 1.8 / 1.8 / 4.7 / 15 kg |