X-ray Diffractometer
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| Brand | Malvern Panalytical |
|---|---|
| Country of Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | Empyrean |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Floor-Standing |
| Power Consumption | 0.0001 kW |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Model | Empyrean |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Floor-standing |
| Power Consumption | 0.0001 kW |
| Core Technology | MultiCore Optics (iCore/dCore) |
| Detector Technology | Hybrid Pixel Array (PIXcel3D / GaliPIX3D) |
| Sample Flexibility | Powder, Thin Film, Nanomaterials, Bulk Solids |
| Compliance Framework | GLP-ready, PreFIX modular architecture, ISO/IEC 17025-compatible workflow support |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported Instrument |
| Model | Omega/Theta |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Orientation Accuracy (1σ) | <0.003° (rocking angle), <0.03° (in-plane direction) |
| Measurement Time | ≤10 s per orientation determination |
| Maximum Sample Weight | 30 kg |
| Maximum Sample Length | 450 mm |
| Goniometer Configuration | Omega/Theta (θ–2θ coupled or independent scanning) |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | SDCOM |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| X-ray Source | 30 W air-cooled Cu-anode microfocus X-ray tube |
| Measurement Speed | Full orientation determination in ≤10 s per sample rotation |
| Sample Diameter Range | 1–200 mm |
| Angular Precision (Si 100) | Tilt magnitude < 0.01°, tilt direction < 0.03° |
| Uptime | >99% |
| Theta Scan Capability | Yes |
| Multi-crystal Transfer | Up to 6 oriented crystals per collimated beam |
| MES Integration | Compatible with SECS/GEM-compliant manufacturing execution systems |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | Wafer XRD |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Sample Size Compatibility | 3-inch to 8-inch wafers (custom FOUPs, carriers, or single-wafer stages available) |
| Measurement Speed | <10 seconds per wafer |
| Typical Standard Deviation (Tilt Angle) | <0.003° for Si(100) |
| X-ray Source Options | Air-cooled microfocus Cu-target tube (30 W) or water-cooled fine-focus Cu-target tube (1.5 kW) |
| Safety Compliance | Fully CE-compliant with integrated interlock and three-color tower light status indication |
| Interface Protocols | SEMI-compliant MES and SECS/GEM |
| Optional Modules | Resistivity measurement (0.01–0.020 Ω·cm), automated matrix/QR/barcode recognition, unpolished & mirror-surface distance metrology |
| Material Support | Si, SiC, GaAs, GaN, Sapphire (Al₂O₃), Ge, AlN, Quartz, InP, and >100 additional crystalline semiconductor substrates |
| Brand | Malvern PANalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | X’Pert3 MRD (XL) |
| Instrument Type | Powder X-ray Diffractometer |
| Power Supply | Not Specified |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported Instrument |
| Model | Crystal Orientation |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Orientation Speed | ≤10 s per measurement |
| Angular Accuracy | ±0.003° (Wafer XRD 200/300), ±0.01° (DDCOM/SDCOM) |
| Sample Diameter Range | 1–225 mm |
| Cooling Requirement | Air-cooled (no water cooling required) |
| Compliance | ASTM E975, ISO 18755, IEC 61000-6-3, CE, RoHS |
| Interface Options | Ethernet/IP, Profibus, Modbus TCP, SECS/GEM |
| Brand | Olympus |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | BTX III |
| Instrument Type | Powder X-ray Diffractometer |
| Power Consumption | 0.0001 kW (100 mW) |
| Brand | Olympus |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | TERRA II |
| Price Range | USD 65,000 – 130,000 |
| Instrument Type | Powder X-ray Diffractometer |
| Power Consumption | 0.0001 kW (100 mW typical operational power) |
| Brand | Olympus |
|---|---|
| Origin | USA |
| Model | Terra |
| XRD Range | 5–55° 2θ |
| XRD Resolution | 0.25° 2θ FWHM |
| Detector | 1024 × 256-pixel, 2D Peltier-cooled CCD |
| XRF Energy Resolution | 250 eV at 5.9 keV |
| XRF Energy Range | 3–25 keV |
| X-ray Tube Anode | Cu (standard), Co optional |
| Tube Voltage | 30 kV |
| Tube Power | 10 W |
| Sample Mass | ~15 mg |
| Particle Size | <150 µm (100 mesh) |
| Operating Temperature | –10 °C to 35 °C |
| Weight | 14.5 kg (with 4 hot-swappable batteries) |
| Dimensions | 48.5 × 39.2 × 19.2 cm |
| Enclosure Rating | IP67, MIL-STD-810G compliant |
| Battery Life | ~4 hours |
| Internal Storage | 40 GB ruggedized HDD |
| Wireless Connectivity | IEEE 802.11b/g |
| Brand | Olympus |
|---|---|
| Origin | USA |
| Model | XRD-Terra |
| Instrument Type | Powder X-ray Diffractometer |
| Power Stability | < 0.0001 (unitless relative stability) |
| Dimensions | 485 × 392 × 192 mm |
| Weight | 14.5 kg (including integrated battery pack) |
| Sample Mass Requirement | ~15 mg |
| Measurement Time | ≤ 3 minutes per sample |
| Detector | 2D CCD-based area detector |
| Geometry | Transmission-mode XRD |
| Integrated Capability | Simultaneous XRD and XRF analysis |
| Cooling | Peltier electronic cooling |
| Environmental Rating | IP54-equivalent (dust- and splash-resistant), shock-damped chassis |
| Compliance | NASA Patent US7113265B2 |
| Software Interface | WiFi-enabled remote acquisition and real-time data streaming |
| Brand | Persee |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic (China-made) |
| Model | XD-2 / XD-3 |
| Instrument Type | Powder X-ray Diffractometer |
| Price Range | USD 70,000 – 140,000 (FOB China) |
| Detector | Imported NaI Scintillation Counter |
| Goniometer Configuration | Vertical θ–θ geometry with hollow-axis design |
| X-ray Source Control | Fully digital, microprocessor-regulated high-voltage and tube current |
| Software | PDP Diffraction Data Processing Suite (Windows-based, multi-format export support) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | 2991F2 |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Configuration | Floor-Standing |
| X-ray Target | Cu |
| Max. Tube Voltage/Current | 30 kV / 5 mA |
| Cooling | Air-Cooled |
| Angular Range | 2θ = 0°–110°, θ = −10°–60° |
| Angular Resolution | 30 arcseconds (total system accuracy) |
| Detector | 2-inch Scintillation Counter |
| Output | Analog Signal |
| Time Constants | 0.1 s / 0.4 s (switchable) |
| Beam Shielding | 1 mm Pb-lined metal enclosure |
| Dimensions (per shield) | 580 mm (W) × 730 mm (D) × 530 mm (H) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | D/max RAPID |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Floor-Standing |
| X-ray Source Options | 3 kW Sealed-Tube or 18 kW Rotating-Anode Anode |
| Detector | Large-Area Cylindrical 2D Imaging Plate (IP), 466 mm × 256 mm |
| Angular Range | –60° to +144° 2θ |
| Beam Conditioning | Incident-Beam Monochromator |
| Collimators | 800, 300, 100, 50, 30 µm (optional 10 µm) |
| Compliance | Designed for ISO/IEC 17025-compliant laboratories |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | D/max-2600/PC |
| X-ray Generator Power | 9 kW |
| Goniometer Type | Vertical or Horizontal Wide-Angle |
| Minimum Step Angle | 0.0001° |
| Variable Aperture Slit | Programmed |
| Optical Configurations | Focusing and Parallel Beam (Switchable) |
| Monochromator | High-Efficiency Graphite |
| Detector | D/teX-Ultra (Energy Resolution <20%) |
| Automation | Fully Automated Alignment & Calibration |
| Software Suite | Comprehensive XRD Analysis Package |
| Sample Types | Powder, Bulk, Thin Film, Micro-region, Trace |
| Environmental Capabilities | In-situ HT/VT/LT, Humidity, Electrochemical, Magnetic Field |
| Origin | Japan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | GOX Series |
| Pricing | Upon Request |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | MiniFlex 600 |
| Instrument Type | Benchtop Powder X-ray Diffractometer |
| Configuration | Floor-standing |
| Power Output | 600 W |
| Dimensions (W×H×D) | 560 × 700 × 395 mm |
| Weight | ~80 kg |
| Safety | Interlocked X-ray shutter with automatic beam cutoff during sample loading |
| Detector | Compatible with D/teX Ultra2 high-speed 1D array detector |
| Optional Accessories | Monochromator (Kβ suppression), Rotating Sample Stage, Air/Moisture-Sensitive Sample Stage, 6-Position Auto-Sampler |
| Software Suite | PDXL (Qualitative & Quantitative Analysis), ICDD PDF-4+ Database Integration, Dust Quantification Module (for occupational hygiene applications), Multi-Scan Acquisition, Rietveld Refinement (optional module) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | MiniFlex600 |
| Instrument Type | Powder X-ray Diffractometer |
| Power Rating | 0.0001 kW |
| Dimensions | 560 W × 460 D × 700 H mm |
| Detector Type | Advanced Semiconductor Detector |
| Software Suite | PDXL (Phase Identification, Quantitative Analysis, Rietveld Refinement, Crystal Structure Visualization) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Instrument Type | Powder X-ray Diffractometer |
| Model | SmartLab |
| X-ray Source | 3 kW or 9 kW sealed-tube generator |
| Anode Materials | Cu, Cr, Fe, Co, Ni, Mo, Ag, Au (selectable) |
| Goniometer Radius | 300 mm |
| Detector | HyPix-3000 2D pixel array detector |
| Optics | CBO-Auto (automated beam optics switching) and CBO-μ (high-resolution micro-beam optics) |
| Primary Source | PhotonMax high-brilliance X-ray tube |
| Software | SmartLab Studio II (with in-situ analysis modules) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Instrument Type | Powder X-ray Diffractometer |
| Model | SmartLab SE |
| X-ray Generator Power | 3 kW |
| Goniometer Radius Options | 185 mm (standard), 285 mm (optional), 280 mm (TTR configuration) |
| Optical Configurations | Automated切换 between Bragg-Brentano (focused beam) and parallel-beam geometries |
| Detector | Rigaku HyPix-400 or equivalent high-speed 2D photon-counting detector |
| Safety Enclosure | Interlocked, fail-safe shutter-equipped X-ray housing |
| Goniometer Orientation | Horizontal |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Floor-standing |
| X-ray Generator Power | 3 kW |
| Goniometer Type | Horizontal |
| Goniometer Radius | 300 mm |
| Programmable Variable Slit | Yes |
| Minimum Step Size | 0.0001° |
| Optical System | CBO Cross-Beam Optics (Patented by Rigaku) |
| Detectors | D/teX Ultra250 (0D/1D mode), HyPix-400 Semiconductor Array Detector (0D/1D/2D mode) |
| Software | SmartLab Studio II |
| Sample Viewing | Integrated Video Observation System |
| Compliance | Designed for ASTM E975, ISO 17892-12, and JIS Z 8821 applications |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | SmartLab Series |
| Instrument Type | Powder X-ray Diffractometer |
| X-ray Generator Power | 3 kW (standard), optional 9 kW rotating anode |
| Goniometer | Horizontal, high-precision dual-optical-encoder with direct-on-axis positioning |
| Minimum Step Angle | 0.0001° (0.1 arcsec) |
| Optical System | CBO Cross-Beam Optics (focusing & high-intensity parallel-beam with mirror) |
| Detector Options | D/teX-Ultra (energy resolution <20%), PILATUS 100K/R (2D pixel array, direct-beam capable) |
| Software | SmartLab Guidance (intelligent workflow-driven analysis) |
| Optional Modules | SAXS/Ultra-SAXS, Thin-Film (out-of-plane & in-plane), Micro-area (CBO-F), Ka₁ monochromator |
| Compliance | Designed for ISO 17025-compliant labs |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | SmartLab Series |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Floor-standing |
| X-ray Generator Power | 3 kW standard, optional 9 kW rotating anode |
| Goniometer Minimum Step | 0.0001° (1/10,000°) |
| Angular Accuracy | Dual optical encoder, direct-on-axis positioning |
| Optical System | CBO Cross-Beam Optics (patented) |
| Detector Options | D/teX-Ultra high-speed energy-discriminating detector (energy resolution <20%), PILATUS 100K/R 2D pixel array detector |
| Software | SmartLab Guidance (patented intelligent measurement & analysis platform) |
| Optional Modules | SAXS/Ultra-SAXS, thin-film analysis (including In-Plane geometry), micro-area mapping (CBO-F optics), monochromated Kα₁ beam optics |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Ultima IV Series |
| Instrument Type | Powder X-ray Diffractometer |
| X-ray Generator Power | 3 kW |
| Goniometer | Horizontal Type |
| Minimum Angular Step | 0.0001° |
| Optical System | CBO Cross-Beam Optics (Patented) |
| Detector | D/teX-Ultra High-Speed Energy-Dispersive Detector |
| Optional Modules | In-Plane Geometry Unit, Small-Angle X-ray Scattering (SAXS) Module, Thin-Film Analysis Module, Micro-Beam Mapping Unit, XRD-DSC Simultaneous Measurement System |
| Software Suite | PDXL (with Rietveld), NANO-Solver, GXRR, and XRD Analysis Package |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Configuration | Floor-Standing |
| Detector | PILATUS200K Hybrid Pixel Array Detector |
| Detector Pixel Size | 172 µm |
| Dynamic Range | 1 × 10⁶ photons/pixel |
| Operating Temperature | Ambient (No Cryogenic Cooling Required) |
| X-ray Source Options | MicroMax003 (Cu or Mo), DualSource (Cu + Mo), MicroMax007HF, MicroMax007HF-DW, MultiMax9 |
| Goniometer Types | Partial χ, Fixed χ, Three-Axis AFC-Kappa, Four-Axis Kappa |
| Optional Accessories | Low-Temperature Device (e.g., Oxford Cryostream) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | XtaLAB Synergy |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Configuration | Floor-Standing |
| Power Stability | < 0.0001 (unitless, indicating angular reproducibility or beam stability per manufacturer specification) |
| Detector | HyPix-6000HE Photon-Counting Pixel Array Detector |
| Detector Active Area | 77.5 mm × 80.0 mm |
| Pixel Size | 100 µm × 100 µm |
| Cooling Method | Air-Cooled |
| Dynamic Range | Up to 31-bit equivalent |
| Readout Mode | Shutterless, 0-ms dead time |
| Goniometer | AFC-Kappa Four-Axis |
| X-ray Source Options | Microfocus Sealed-Tube (Cu/Mo), MM007HF Rotating Anode, FR-X High-Brilliance Rotating Anode |
| Anode Materials | Cu, Mo, or Dual Cu/Mo |
| Cryogenic Capability | Integrated Low-Temperature System (e.g., Oxford Instruments Cryostream-compatible) |
| Software Suite | CrysAlisPro (data collection & processing), AutoChem (automated structure solution and refinement) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | XtaLABmini |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Configuration | Benchtop |
| X-ray Source | Mo Kα, 600 W high-frequency generator |
| Goniometer Axes | χ fixed at 54°, Φ rotation: −360° to +360° about sample center axis, ω range: 2θ ± 90° (−60° to +120°), 2θ fixed at 30° |
| Sample Viewing | 70× CCD microscope with 50 mm camera-to-sample distance |
| Detector | CCD, active area Φ75 mm, pixel sizes 73.2 µm / 146.4 µm, resolution modes 1024 × 1024 / 512 × 512, readout times 2.24 s / 0.56 s, dark current 0.1 e⁻/pixel/s |
| Optional | Cryogenic sample stage (e.g., Oxford Instruments Cryostream-compatible) |
| Brand | Tongda |
|---|---|
| Origin | Liaoning, China |
| Model | TD-5000 |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Configuration | Floor-Standing |
| X-ray Source Power | 3 kW |
| 2θ Angular Repeatability | 0.0001° |
| Minimum Step Angle | 0.0001° |
| Temperature Control Range | 100 K – 300 K |
| Temperature Stability | ±0.3 K |
| Detector | PILATUS Hybrid Pixel Detector |
| Goniometer Architecture | Four-Circle Concentric Design |
| Data Acquisition Interface | Touchscreen-Controlled PLC System |
| Brand | Thermo Fisher |
|---|---|
| Origin | Switzerland |
| Manufacturer | Thermo Fisher Scientific |
| Instrument Type | Powder X-ray Diffractometer |
| Geometry | Bragg–Brentano θ/θ |
| Angular Accuracy | ±0.002° |
| Detector | Solid-state 2D pixel detector (55 × 55 µm pixel pitch) |
| Sample Handling | Manual 1-position holder or optional 6-position autosampler |
| X-ray Source | Cu or Co sealed-tube anode |
| Cooling | Optional water-cooling system |
| Data Output | Automated LIMS integration |
| Compliance | IEC 61000-4, IEC 62471, EN 61000-6-3, FDA 21 CFR Part 11 ready (with optional audit trail module) |
| Brand | Thermo Fisher |
|---|---|
| Origin | France |
| Manufacturer | Thermo Fisher Scientific |
| Instrument Type | Powder X-ray Diffractometer |
| Model | ARL EQUINOX 100 |
| Power Stability | < 0.0001 (unitless relative stability, typical for high-stability X-ray tube power supply) |
| Detector | Integrated EQUINOX curved position-sensitive detector (CPSD) |
| Cooling | Fully integrated internal water-cooling system |
| Sample Handling | Optional 6-position autosampler, transmission powder holders, thin-film accessories |