X-ray Diffractometer
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| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | D6 PHASER |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Benchtop |
| Power Options | 540 W / 600 W / 1.2 kW |
| Angular Accuracy | ±0.01° (2θ) |
| Angular Resolution | 0.01° |
| Detector | LYNXEYE XE-T Energy-Resolving Detector |
| Beam Geometry | Reflective & Transmission, Grazing Incidence (GID), X-ray Reflectivity (XRR), Stress & Texture Analysis |
| Automation | Motorized Sample Changer, Conveyor Interface, Dynamic Beam Optimization (DBO) |
| Software Suite | DIFFRAC.SUITE (MEASUREMENT CENTER, EVA), COD Database Integration |
| Compliance | Designed for GLP/GMP environments |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Configuration | Benchtop |
| Design Principle | Bragg’s Law-based θ–2θ scanning with Cu Kα radiation (λ = 1.5418 Å) |
| Detector | LynxEye XE high-speed energy-dispersive detector |
| Sample Stage | Motorized goniometer with ±60° 2θ range |
| Data Acquisition Mode | Step-scanning and continuous scanning |
| Compliance | CE, UL 61010-1, IEC 61326-1 |
| Brand | GKInst |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Authorized Distributor |
| Product Category | Domestic |
| Model | D7 Mate |
| Price Range | USD 28,000 – 140,000 |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Benchtop |
| Power Rating | 600 W / 1200 W (Selectable) |
| Angular Accuracy | ±0.0001° |
| High-Voltage Generator | 40 kV / 600 W or 40 kV / 1200 W |
| Target Materials | Cu, Cr, Mo |
| Goniometer Geometry | Horizontal θ/2θ or ω/θ |
| Goniometer Radius | 150 mm |
| Angular Range | −3° to 152° (140° with automatic beam-defining slit) |
| Repeatability | <0.0001° (2σ) |
| Detector | 640-channel 1D silicon strip detector, active area 32 mm × 8 mm |
| Cooling | Integrated recirculating water chiller (standard), optional external chiller interface |
| Beam Path | Air-scatter suppression module with motorized divergence slit and automatic anti-scatter device |
| Sample Stages | Fixed stage, in-situ heating stage, multi-axis rotating stage, capillary stage, thin-film stage, multifunctional stage, pouch-cell battery stage, high-throughput 8-position rotary stage, optional 6-position automated sample loader |
| Data Reproducibility | NIST SRM 660c LaB₆ reference standard, RSD ≤ 0.003% (peak position, 2θ) |
| Control Interface | External PC or integrated 10.1″ capacitive touchscreen |
| Dimensions (L×W×H) | 880 mm × 705 mm × 735 mm |
| Mass | ≤180 kg |
| Electrical Supply | AC 200–240 V, 50/60 Hz |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | D8 ADVANCE |
| Instrument Type | Powder X-ray Diffractometer |
| Power | 0.0001° angular resolution |
| 2θ Range | −110° to +168° |
| X-ray Tube Targets | Cr / Co / Cu (standard-size) |
| Detector Options | LYNXEYE Array Detector, LYNXEYE XE-T Energy-Dispersive Detector |
| Dimensions | 1868 × 1300 × 1135 mm |
| Weight | 770 kg |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | D8 ADVANCE |
| Instrument Type | High-Resolution X-ray Diffractometer |
| Configuration | Floor-Standing |
| Power Options | 1 kW (ECO) or 3 kW |
| Angular Accuracy | ±0.01° (2θ) |
| Angular Resolution | 0.01° (2θ) |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | D8 ADVANCE |
| Instrument Type | Powder and Multi-Mode X-ray Diffractometer |
| Beam Geometry Options | BB (Bragg–Brentano), Parallel-Beam, TWIN, TRIO, Göbel Mirror, Johansson Monochromator |
| Radiation Sources Supported | Cr, Co, Cu, Mo, Ag |
| Detector | EIGER2 R 500K Hybrid Photon Counting Detector |
| Energy Resolution | <380 eV @ 8 keV |
| Detection Modes | 0D, 1D, 2D |
| Angular Range (2θ) | <1° to >150° |
| Sample Environment Compatibility | Temperature: 85 K – 2500 K |
| Pressure | 10⁻⁴ mbar – 100 bar |
| Humidity | 5% – 95% RH |
| Automation | FLIPSTICK (9-position), AUTOCHANGER (90-position) |
| Software Suite | DIFFRAC.SUITE (including DIFFRAC.EVA, DIFFRAC.TOPAS, DIFFRAC.LEPTOS, DIFFRAC.TEXTURE, DIFFRAC.SAXS, DIFFRAC.WIZARD) |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | D8 DISCOVER |
| Instrument Type | High-Resolution X-ray Diffractometer |
| Configuration | Floor-Standing |
| X-ray Power | 5.4 kW |
| Angular Accuracy | ±0.01° |
| Angular Resolution | 0.01° |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | D8 DISCOVER |
| Instrument Type | Powder X-ray Diffractometer |
| Power Rating | 0.0001 kW |
| Compliance | Fully Compliant with ISO 17025, ASTM E975, and IEC 61000-6-3 for Electromagnetic Compatibility |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Bruker D8 DISCOVER / D8 DISCOVER Plus |
| Pricing | Upon Request |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Instrument Type | Powder X-ray Diffractometer |
| Model | D8 ENDEAVOR |
| Detector | LYNXEYE XE-T Energy-Resolving Array Detector |
| Sample Handling | 66-position or 72-position automated sample changer (Ø 51.5 mm and Ø 40 mm formats) |
| Automation Modes | Belt-driven or robotic integration |
| Compliance | Designed for GLP/GMP environments with audit-trail-ready software architecture |
| Regulatory Context | Fully compatible with FDA 21 CFR Part 11–compliant data management workflows |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | D8 ENDEAVOR |
| Instrument Type | High-Resolution X-ray Diffractometer |
| Configuration | Floor-Standing |
| Power Options | 1 kW (ECO) / 3 kW |
| Angular Accuracy | ±0.01° |
| Angular Resolution | 0.01° |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | D8 QUEST |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Power | 200 W (0.0002 MW) |
| Detector | PHOTON III MMPAD Hybrid Photon Counting Detector |
| Source Options | Microfocus Rotating Anode (Cu/Mo), Liquid Metal Jet (Ga/In), Dual-Target Auto-Switching |
| Software | APEX3 / PROTEUM3 |
| Compliance | ISO 17025-ready, GLP/GMP-supportive data audit trails, FDA 21 CFR Part 11 compliant modules available |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | D8 VENTURE |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Power | 200 W (0.0002 MW) |
| Detector | PHOTON III MMPAD Hybrid Photon-Counting Detector |
| X-ray Source Options | microfocus sealed-tube (Incoatec IμS 3.0), liquid-metal-jet (MetalJet), dual-target auto-switching |
| Software | APEX4 (successor to APEX3/PROTEUM3) |
| Compliance | Fully compatible with CIF deposition standards, supports IUCr-compliant data reduction and structure refinement workflows |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | JV-DX |
| Instrument Type | High-Resolution X-ray Diffractometer |
| Power Supply Requirement | 0.0001 kW (standby) |
| Sample Stage | Horizontal 300 mm wafer mount |
| Angular Range | Chi tilt up to 100°, Phi rotation continuous |
| Optical Configuration | Motorized parallel-beam multilayer mirror + auto-switchable high-resolution crystal optics (Ge 004 to Ge 111) |
| Software Platform | JV-RADS v5.x with HRXRD, XRR, and reciprocal space mapping modules |
| Compliance | ASTM E975, ISO 21367, IEC 61000-6-3, GLP/GMP-ready audit trail & user access control |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | JV-QCVelox |
| Instrument Type | High-Resolution X-ray Diffractometer (HRXRD) |
| Power | 0.0001 kW |
| Compliance | ASTM F394, ISO 15382, SEMI S2/S8, FDA 21 CFR Part 11 (software audit trail enabled) |
| Detector Dynamic Range | >3×10⁸ (with EDRc + auto-attenuator) |
| Sample Handling | Automated wafer loader (2″–200 mm), kinematic sample plates, barcode integration |
| Optical Configuration | VeloMAX™ high-flux optics with adjustable divergence crystals (25″ standard, <10″ optional for III-V), multilayer mirrors, motorized detector slits, triaxial crystal stage for GaN-grade resolution |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Instrument Type | Powder X-ray Diffractometer |
| Model | JV QC3 |
| Application Focus | Compound Semiconductor Epitaxial Layer & Substrate QC |
| Automation Level | Fully Automated Wafer Handling (Optional Robotic Arm) |
| Sample Capacity | Up to 4 × 100 mm wafers per batch |
| Compliance | Designed for ISO/IEC 17025-aligned semiconductor manufacturing environments |
| Software Platform | Bruker JV-RADS (Bede RADS) with automated peak fitting, strain/relaxation quantification, and multi-layer compositional analysis |
| X-ray Source Protection | XRG Protect™ tube longevity technology |
| Power Mode | Eco-standby with reduced idle power consumption |
| Brand | GKINST |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic |
| Model | D-POWER |
| Price Range | USD 42,000 – 210,000 |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Floor-standing |
| Power Rating | 3 kW |
| Angular Accuracy | 0.0001° |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported Instrument |
| Model | DDCOM |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| X-ray Source | 30 W Air-Cooled Cu Anode Tube |
| Scan Speed | Up to 200× Faster Than Conventional θ-Scanning |
| Orientation Measurement Time | Full 3D Lattice Orientation Determined in ≤10 s |
| Angular Resolution | ≤0.01° (0.01 degree) |
| Sample Capacity | Wafers 2–12 inches |
| Compliance | Designed for ISO/IEC 17025-aligned QC environments, compatible with GLP/GMP documentation workflows |
| Brand | ELDICO Scientific AG |
|---|---|
| Origin | Switzerland |
| Model | ED-1 |
| Instrument Type | Single-Crystal Electron Diffractometer |
| Sample Size Range | < 1000 nm |
| Beam Energy | 160 keV |
| Detector | DECTRIS QUADRO |
| Angular Precision | Sub-micrometer five-axis goniometer |
| Resolution | 0.82 Å |
| Chamber Geometry | Octagonal sample chamber |
| Brand | ELDICO Scientific AG |
|---|---|
| Origin | Switzerland |
| Model | ED-1 |
| Instrument Type | Single-Crystal Electron Diffractometer |
| Configuration | Floor-Standing |
| Resolution | 0.82 Å |
| Detector | DECTRIS QUADRO |
| Beam Energy | 160 keV |
| Sample Size Range | < 1000 nm |
| Brand | GBC |
|---|---|
| Origin | Australia |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Emma |
| Price Range | USD 135,000 – 205,000 (FOB Australia) |
| Instrument Type | Powder X-ray Diffractometer |
| Power Consumption | <0.1 W (standby), <150 W (operational) |
| Beam Geometry | Variable parallel-beam and Bragg–Brentano focusing geometry |
| Sample Stage | Motorized variable-height powder stage + Eulerian cradle (χ, φ, ω rotation) |
| Detector Configuration | Dual fixed-position detectors — one parallel-beam detector with 0.4° Soller slit collimator, one focusing detector with variable slits and graphite monochromator |
| X-ray Source Optics | XOS polycapillary optic delivering 10 × 10 mm quasi-parallel beam |
| parallel-beam radius | 250 mm |
| focusing radius range | 175–250 mm |
| Optional Integrated Detection | Simultaneous XRD/XRF capability via integrated Si-PIN or SDD X-ray fluorescence detector |
| Portability | Modular chassis with integrated handles |
| Goniometer | Harmonic drive-based θ–2θ goniometer with <0.001° angular reproducibility |
| Radiation Safety | Lead-acrylic interlocked viewing window (large-format, wide-field), software-controlled actuation |
| Electronics | Industrial-grade FPGA-based control architecture with GLP-compliant event logging |
| Brand | GKINST |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | HPXRD |
| Configuration | Floor-Standing |
| X-ray Source | Liquid-Metal In Target (E1 Type) |
| High-Flux Mode | 90 μm focal spot, 1.9 × 10⁸ ph/s, divergence 3.15 mrad |
| Micro-Focus Mode | 15 μm focal spot, 1.8 × 10⁷ ph/s, divergence 12.6 mrad |
| Ultra-Micro Mode | 10 μm focal spot, 1.0 × 10⁶ ph/s, divergence 2 mrad |
| XY Stage Repeatability | ±0.2 μm, travel ±10 mm |
| Z Stage Repeatability | ±0.2 μm, travel ±10 mm |
| φ Axis Repeatability | 0.002°, travel ±135° |
| X₁Y₁ Stage Repeatability | ±0.2 μm, travel ±12.5 mm |
| Brand | GNR |
|---|---|
| Origin | Italy |
| Model | APD 2000 PRO |
| Instrument Type | Powder X-ray Diffractometer |
| X-ray Tube Power | 0.0001 kW (100 W) |
| Radiation Source | Fine-focus Ceramic X-ray Tube |
| Monochromator | Johannson-type Kα₁ monochromator |
| Detector Types | Scintillation Counter & Energy-Dispersive Detector |
| Goniometer Control | Optical Encoder |
| Sample Stage | Motorized Multi-Sample Rotating Stage with Low-Background Options |
| Safety System | Dual Redundant Interlock Circuit |
| Compliance | CE, IEC 61010-1, ISO 9001 |
| Brand | GNR |
|---|---|
| Origin | Italy |
| Model | EXPLORER |
| Instrument Type | Powder X-ray Diffractometer |
| Power Rating | 0.0001 kW |
| Optical Configuration | Switchable Bragg-Brentano focusing / Johansson monochromator / Parabolic mirror monochromator |
| Beam Geometry | Parallel-beam optics with low-angle reflection capability |
| Thin-film Thickness Detection Range | 1–500 nm |
| Degrees of Freedom for Sample Manipulation | 5 |
| Modular Units | 7 |
| Primary Applications | Phase identification & quantification, crystallite size and microstrain analysis, residual stress measurement, texture analysis, thin-film characterization, depth profiling, nanocrystalline material assessment |
| Brand | Haoyuan |
|---|---|
| Origin | Liaoning, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | DX-2700BH |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Floor-standing |
| X-ray Generator Power | 3 kW |
| Angular Accuracy | ±0.0001° |
| Resolution (FWHM) | SiO₂ ≤ 60% |
| Brand | Haoyuan |
|---|---|
| Origin | Liaoning, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | DX-27mini |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Benchtop |
| Power Rating | 600 W (40 kV / 15 mA) or 1200 W (40 kV / 30 mA) |
| Angular Accuracy | 0.0001° |
| Resolution (FWHM) | SiO₂ ≤ 60% |
| X-ray Source | Metal-ceramic Cu-target tube, focal spot 1 × 10 mm |
| Goniometer Geometry | Horizontal θ–θ (sample-and-detector movement) |
| Radius of Diffraction Circle | 150 mm |
| Scan Modes | Continuous and Step Scanning |
| Angular Range (θs/θd coupled) | –3° to 150° |
| Minimum Step Size | 0.0001° |
| Angular Reproducibility | ±0.0005° |
| Angular Positioning Speed | 1500°/min |
| Detector Options | Sealed proportional counter or high-speed 1D semiconductor array |
| Energy Resolution | <25% (at Mn Kα) |
| Linear Count Rate | ≥5 × 10⁵ cps (proportional), ≥9 × 10⁷ cps (1D semiconductor) |
| Radiation Shielding | Lead + lead-glass enclosure |
| Overall System Stability | ≤1% RSD over 8 h |
| Sample Capacity | 6-position automated sample changer |
| Dimensions (W × D × H) | 600 × 410 × 670 mm |
| Cooling | Air or water (≥2.5 L/min) |
| Software Platform | Windows 7-based instrument control and data analysis suite |
| Brand | Haoyuan |
|---|---|
| Origin | Liaoning, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Floor-Standing |
| Angular Resolution | 0.001° |
| Angular Accuracy | ±0.0001° |
| Peak Resolution (FWHM) | SiO₂ ≤ 60% |
| Detector | High-Performance Semiconductor Array Detector |
| X-ray Source | Stabilized Cu Kα Sealed-Tube Source |
| Calibration Standard Compliance | NIST-traceable Si & α-Al₂O₃ reference materials (full-pattern angular deviation ≤ ±0.01°) |
| Brand | Haoyuan |
|---|---|
| Origin | Liaoning, China |
| Manufacturer Type | Direct Manufacturer |
| Country of Origin | China |
| Model | DX-2900 |
| Instrument Type | High-Resolution X-ray Diffractometer |
| Configuration | Floor-Standing |
| Power | 50 W |
| X-ray Source | Cu or Mo anode (50 kV / 1 mA) |
| Capillary Optics | Collimation ≤ 0.25°, Focal Spot Diameter: 0.5 mm, Photon Flux > 1×10⁸ ph/s |
| Goniometer | Two-Axis Thin-Film Stage (ω: –10° to +10°, resolution 0.002° |
| Z | 0–15 mm, resolution 0.002 mm) |
| Detector | 2D Array (512 × 512 pixels, pixel size 75 µm) |
| Optional Accessories | Transmission stage, in-situ heating stage (up to 600 °C), inert-atmosphere chamber, solvent vapor chamber, XY translation stage (150 mm × 150 mm), upgradeable to 3–5-axis thin-film goniometer or Pilatus200K/Eiger500K detectors |
| Brand | Hefei Kejing |
|---|---|
| Model | DX-100 |
| Origin | Anhui, China |
| Power Supply | 220 V AC, 50 Hz, 0.5 kW |
| X-ray Tube | Cu anode, air-cooled, grounded anode |
| Max. Operating Voltage/Current | 30 kV / 5 mA (continuously adjustable) |
| Detector | Geiger-Müller counter |
| Detector Bias Voltage | up to 1050 V |
| Time Constant Settings | Fast (1 s) and Slow (2 s) |
| Angular Readout | Mechanical scale (2θ/θ resolution: 1°), digital display in degrees-minutes-seconds (minimum digital resolution: 10″) |
| Angular Range | 2θ = –10° to +140° |
| Collimator Slits | 4′, 5′, 6′ |
| Peak Position Accuracy | ±30″ |
| Primary Beam Shutter | Motorized |
| Dimensions (Main Unit) | 628 × 512 × 428 mm |
| Dimensions (Control Box) | 520 × 520 × 468 mm |
| Net Weight | 45 kg |
| Brand | Hefei Kejing |
|---|---|
| Model | X-3 / X-4 / X-4A |
| Type | Double-Crystal Diffractometer-Based Orienting System |
| Angular Accuracy | ±15 arcseconds |
| Minimum Readout Resolution | 15″ (X-3), 10″ (X-4), 1″ (X-4A) |
| Angular Range | 2θ = 10°–120°, θ = −10°–60° |
| X-ray Source | Cu-target, air-cooled tube |
| Max. Operating Voltage/Current | 30 kV / 1 mA |
| Time Constants | 0.4 s / 0.8 s |
| Power Supply | AC 220 V, 50 Hz, 0.5 kW |
| Monochromator | Built-in graphite monochromator |
| Compliance | JB/T 5482–2004 |
| Dimensions (L×W×H) | 1140 × 650 × 1100 mm |
| Weight | 300 kg |