X-ray Diffractometer
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| Brand | EVDENT |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | BTXIII |
| Instrument Type | Powder X-ray Diffractometer |
| Power Supply | Rechargeable Battery (up to 6 h continuous operation) |
| Sample Requirement | 15 mg, particle size ≤ 150 µm |
| Detector | High-speed solid-state X-ray detector |
| Connectivity | Wi-Fi, Bluetooth |
| Software | SwiftMin™ (real-time phase ID & quantification) |
| Brand | EVDENT (formerly Olympus) |
|---|---|
| Origin | USA |
| Instrument Type | Powder X-ray Diffractometer |
| Form Factor | Benchtop |
| X-ray Source | Microfocus Co or Cu anode tube |
| Power Consumption | 10 W |
| Angular Range | 5–55° 2θ |
| Detector | Energy-resolving CCD array |
| Geometry | Transmission mode |
| Sample Mass Required | 15 mg |
| Wireless connectivity | Built-in Wi-Fi hotspot |
| Compliance | ASTM E1361, ISO 17892-12, USP <421>, GLP-ready data audit trail |
| Brand | EVDENT (formerly Olympus Industrial XRD Division) |
|---|---|
| Origin | USA |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Benchtop |
| X-ray Source Options | Co Kα or Cu Kα |
| Power | 10 W |
| Angular Range | 5–55° 2θ |
| Detector | Energy-Resolved CCD Array |
| Geometry | Transmission Mode |
| Sample Mass Requirement | As low as 15 mg |
| Data Acquisition | Simultaneous full-pattern collection |
| Compliance | Designed for ASTM E1420, ISO 17873, and USP <941> compliant workflows |
| Brand | EVDENT (formerly Olympus) |
|---|---|
| Origin | USA |
| Instrument Type | Powder X-ray Diffractometer |
| Form Factor | Benchtop |
| Power Consumption | 10 W |
| Angular Range | 5°–55° 2θ |
| Weight | 12.5 kg |
| Integrated XRD/XRF Capability | Yes |
| No Moving Mechanical Parts | Yes |
| Cooling System | Air-cooled (no water circulation) |
| Connectivity | Wi-Fi (ad-hoc network) and USB-C |
| Sample Preparation Time | <3 min (grind → sieve → load) |
| Brand | EVDENT |
|---|---|
| Origin | USA |
| Model | XRD-BTXIII |
| Instrument Type | Powder X-ray Diffractometer |
| Form Factor | Benchtop |
| Power Consumption | 10 W |
| Angular Range | 5°–55° 2θ |
| Weight | 12.5 kg |
| Compliance | NASA Mars Mission-qualified ruggedized design |
| Brand | EVDENT (formerly Olympus) |
|---|---|
| Origin | USA |
| Instrument Type | Powder X-ray Diffractometer |
| Form Factor | Benchtop |
| Resolution | 0.2° 2θ (FWHM) |
| Detector | Energy-Dispersive CCD |
| Geometry | Transmission |
| Sample Mass Required | 15 mg |
| Weight | 12.5 kg |
| Cooling | Air-cooled, no water circulation |
| X-ray Source Options | Co-Kα or Cu-Kα microfocus tube |
| Wireless Connectivity | Integrated Wi-Fi AP mode |
| Compliance | CE, FCC, RoHS |
| Data Output | CIF, XY, CSV, PDF |
| Brand | Evident (formerly Olympus) |
|---|---|
| Origin | USA |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Benchtop, Portable |
| Power Consumption | 10 W |
| Angular Range | 5–55° 2θ |
| Detector | CCD-based area detector |
| Geometry | Transmission mode |
| Sample Mass Required | 15 mg |
| Weight | 12.5 kg |
| Compliance | CE, RoHS, FDA 21 CFR Part 11-ready software architecture |
| Brand | Examinart |
|---|---|
| Origin | USA |
| Model | Duetto 2 |
| X-ray Tube | 28 kV, 10 W |
| Portability | Field-deployable (museum, archaeological site, conservation studio) |
| Detection | Photon-counting CCD for simultaneous 2D XRD & XRF mapping |
| Core Technology | NASA-derived miniaturized planetary instrumentation architecture |
| Compliance | Designed for GLP-aligned cultural heritage analysis workflows |
| Brand | Examinart |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | Fenix |
| Instrument Type | Powder X-ray Diffractometer |
| X-ray Source | 30 kV (adjustable), 10 W (max, adjustable) |
| Dimensions | 45 cm (H) × 18 cm (W) × 35 cm (D) |
| Weight | 12 kg |
| Detector | Deep-cooled sealed vacuum CCD |
| Power Supply | AC adapter (laptop-style) or optional Li-ion portable power station |
| Operating Systems | Windows & Linux via USB interface |
| Compliance | CE, RoHS, FDA 21 CFR Part 11–ready software architecture |
| Brand | Freiberg Instruments |
|---|---|
| Origin | Germany |
| Model | DDCOM |
| Cooling | Air-cooled X-ray tube |
| Measurement Principle | Omega-scan-based X-ray diffraction (XRD) for full 3D lattice orientation determination |
| Speed | Full crystal orientation mapping in ≤5 seconds per sample |
| Angular Resolution | Up to 0.01° (1/100°) |
| Sample Capacity | Wafers up to 12 inches (300 mm), ingots up to 20 kg |
| Compliance | Designed for ISO/IEC 17025-aligned QC workflows, compatible with GLP/GMP documentation requirements |
| Software | Pre-configured cubic crystal parameter library, automated peak indexing, real-time orientation visualization, CSV/PDF report export |
| Brand | Freiberg Instruments |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Omega/Theta |
| Pricing | Upon Request |
| Brand | Freiberg Instruments |
|---|---|
| Origin | Germany |
| Model | Omega/Theta XRD |
| Angular Resolution | 0.1 arcsec |
| Scan Speed (Omega) | ≤5 s per orientation |
| Tilt Accuracy (Theta) | <0.001° |
| Sample Max Dimensions | 450 mm length, 30 kg weight |
| Compliance | ISO 9001-certified manufacturing |
| Software Interface | MES & SECS/GEM compatible |
| Measurement Methods | Omega-scan, Theta-scan, Rocking Curve analysis |
| Optional Modules | Stacking Alignment, Laser Shape Profiling, Optical Flatness Detection, Multi-axis Sample Rotation |
| Brand | Freiberg Instruments |
|---|---|
| Origin | Germany |
| Model | SDCOM |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Cooling | Air-Cooled X-ray Tube |
| Measurement Principle | Omega-Scan Bragg Diffraction |
| Angular Accuracy | ≤ 0.01° (dependent on crystal quality) |
| Sample Size Range | ≥ 1 mm diameter or larger |
| Operation Mode | Manual (no motorized automation) |
| Compliance | Designed for ISO/IEC 17025-aligned lab environments |
| Sample Mounting | Compatible with standard crystal holders, sawing jigs, and polishing fixtures |
| Brand | Freiberg Instruments |
|---|---|
| Origin | Germany |
| Instrument Type | Powder X-ray Diffractometer |
| Form Factor | Benchtop |
| Application Scope | In-line Crystallographic Orientation Measurement |
| Compatible Substrates | Silicon, Silicon Carbide (SiC), Gallium Arsenide (GaAs), and other single-crystal wafers/ingots |
| Max Sample Diameter | 450 mm (17.7 in) |
| Max Sample Length | 400 mm (15.7 in) |
| Cooling Method | Air-cooled, Low-Noise Operation |
| Interface Standard | Industrial PLC-compatible digital I/O (e.g., Profibus, Profinet, EtherCAT), RS-232/485, Ethernet TCP/IP |
| Measurement Geometry | Fixed-position, non-contact θ–2θ scanning with motorized goniometer |
| Detector | High-sensitivity scintillation or silicon-strip detector (OEM-configurable) |
| X-ray Source | Sealed-tube Cu Kα (optional Mo, Co, or Cr anodes) |
| Safety Class | CE-compliant, EN 61000-6-2/6-4, IEC 61010-1 |
| Brand | Freiberg Instruments |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | XRD-OEM |
| Price Range | USD 68,000 – 136,000 (FOB Hamburg) |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Sample Diameter Capacity | Up to 450 mm (17.7 in) |
| Sample Length Capacity | Up to 400 mm (15.7 in) |
| Cooling Method | Forced Air |
| Acoustic Noise Level | <62 dB(A) |
| Interface Standard | EtherCAT, PROFIBUS DP, Modbus TCP, Digital I/O (24 V DC) |
| Measurement Geometry | Fixed-position, plane or circumferential scanning |
| Detection Principle | Bragg diffraction using monochromatic Cu-Kα or Mo-Kα X-ray source (optional) |
| Target Materials | Silicon (Si), Silicon Carbide (SiC), Gallium Arsenide (GaAs), Germanium (Ge), Sapphire (Al₂O₃), and other single-crystal semiconductors |
| Brand | GBC |
|---|---|
| Origin | Australia |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Emma |
| Price Range | USD 135,000 – 205,000 (FOB Australia) |
| Instrument Type | Powder X-ray Diffractometer |
| Power Consumption | <0.1 W (standby), <150 W (operational) |
| Beam Geometry | Variable parallel-beam and Bragg–Brentano focusing geometry |
| Sample Stage | Motorized variable-height powder stage + Eulerian cradle (χ, φ, ω rotation) |
| Detector Configuration | Dual fixed-position detectors — one parallel-beam detector with 0.4° Soller slit collimator, one focusing detector with variable slits and graphite monochromator |
| X-ray Source Optics | XOS polycapillary optic delivering 10 × 10 mm quasi-parallel beam |
| parallel-beam radius | 250 mm |
| focusing radius range | 175–250 mm |
| Optional Integrated Detection | Simultaneous XRD/XRF capability via integrated Si-PIN or SDD X-ray fluorescence detector |
| Portability | Modular chassis with integrated handles |
| Goniometer | Harmonic drive-based θ–2θ goniometer with <0.001° angular reproducibility |
| Radiation Safety | Lead-acrylic interlocked viewing window (large-format, wide-field), software-controlled actuation |
| Electronics | Industrial-grade FPGA-based control architecture with GLP-compliant event logging |