X-ray Diffractometer
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| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | SHINE REX900 |
| Instrument Type | Powder X-ray Diffractometer |
| Geometry | Bragg–Brentano (BB) |
| Portability | Fully Integrated Ruggedized Enclosure |
| Radiation Safety | Fully Shielded, Zero Leakage During Operation |
| Data Output Formats | Excel, PDF |
| Connectivity | USB 2.0, Bluetooth 5.0, Wi-Fi 802.11ac |
| Software | CrystalX — Automated Phase Identification & Quantification Engine |
| Brand | JWGB (Jingwei Gaobo) |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | Lattice GO |
| Instrument Type | Powder X-ray Diffractometer |
| Instrument Configuration | Portable |
| X-ray Tube Power | 30 W |
| Angular Accuracy | ±0.01° |
| Angular Resolution | 0.2° |
| Dimensions (L×W×H) | 120 mm × 300 mm × 305 mm |
| Weight | 12 kg |
| X-ray Tube | Cu anode, 30 kV / 1 mA |
| Goniometer Geometry | Vertical θ–2θ Bragg–Brentano |
| Goniometer Radius | 110 mm |
| Detector | Photon-counting 2D array detector |
| Scan Speeds | 6°/min or 13°/min (selectable) |
| 2θ Range | 0°–130° |
| Battery Runtime | 3 hours |
| Origin | USA |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | LC-03 |
| Pricing | Available Upon Request |
| Origin | USA |
|---|---|
| Manufacturer Type | Distributor |
| Origin Category | Imported |
| Model | LC-06 |
| Price Range | USD 28,000 – 70,000 |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Angular Resolution | < 0.05° |
| Effective Detection Area | 30 cm × 30 cm |
| Data Acquisition Time | Seconds per Laue Pattern |
| Gas Replacement Interval | Every 6 months |
| Coolant Replacement Interval | Annually |
| Sample Rotation Capability | Yes |
| Origin | USA |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | LC-02 |
| Pricing | Upon Request |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Imported |
| Model | Aeris |
| Instrument Type | Powder X-ray Diffractometer |
| Form Factor | Benchtop |
| Power Stability | < 0.0001 (unitless relative stability, typical for high-stability X-ray tube voltage/current regulation) |
| Brand | Malvern PANalytical |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Aeris Cement Edition |
| Pricing | Upon Request |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported Instrument |
| Model | Aeris HCSC |
| Instrument Type | Powder X-ray Diffractometer |
| Form Factor | Benchtop |
| Brand | Malvern Panalytical |
|---|---|
| Country of Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | Empyrean |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Floor-Standing |
| Power Consumption | 0.0001 kW |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Model | Empyrean |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Floor-standing |
| Power Consumption | 0.0001 kW |
| Core Technology | MultiCore Optics (iCore/dCore) |
| Detector Technology | Hybrid Pixel Array (PIXcel3D / GaliPIX3D) |
| Sample Flexibility | Powder, Thin Film, Nanomaterials, Bulk Solids |
| Compliance Framework | GLP-ready, PreFIX modular architecture, ISO/IEC 17025-compatible workflow support |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported Instrument |
| Model | Omega/Theta |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Orientation Accuracy (1σ) | <0.003° (rocking angle), <0.03° (in-plane direction) |
| Measurement Time | ≤10 s per orientation determination |
| Maximum Sample Weight | 30 kg |
| Maximum Sample Length | 450 mm |
| Goniometer Configuration | Omega/Theta (θ–2θ coupled or independent scanning) |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | SDCOM |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| X-ray Source | 30 W air-cooled Cu-anode microfocus X-ray tube |
| Measurement Speed | Full orientation determination in ≤10 s per sample rotation |
| Sample Diameter Range | 1–200 mm |
| Angular Precision (Si 100) | Tilt magnitude < 0.01°, tilt direction < 0.03° |
| Uptime | >99% |
| Theta Scan Capability | Yes |
| Multi-crystal Transfer | Up to 6 oriented crystals per collimated beam |
| MES Integration | Compatible with SECS/GEM-compliant manufacturing execution systems |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | Wafer XRD |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Sample Size Compatibility | 3-inch to 8-inch wafers (custom FOUPs, carriers, or single-wafer stages available) |
| Measurement Speed | <10 seconds per wafer |
| Typical Standard Deviation (Tilt Angle) | <0.003° for Si(100) |
| X-ray Source Options | Air-cooled microfocus Cu-target tube (30 W) or water-cooled fine-focus Cu-target tube (1.5 kW) |
| Safety Compliance | Fully CE-compliant with integrated interlock and three-color tower light status indication |
| Interface Protocols | SEMI-compliant MES and SECS/GEM |
| Optional Modules | Resistivity measurement (0.01–0.020 Ω·cm), automated matrix/QR/barcode recognition, unpolished & mirror-surface distance metrology |
| Material Support | Si, SiC, GaAs, GaN, Sapphire (Al₂O₃), Ge, AlN, Quartz, InP, and >100 additional crystalline semiconductor substrates |
| Brand | Malvern PANalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | X’Pert3 MRD (XL) |
| Instrument Type | Powder X-ray Diffractometer |
| Power Supply | Not Specified |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported Instrument |
| Model | Crystal Orientation |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Orientation Speed | ≤10 s per measurement |
| Angular Accuracy | ±0.003° (Wafer XRD 200/300), ±0.01° (DDCOM/SDCOM) |
| Sample Diameter Range | 1–225 mm |
| Cooling Requirement | Air-cooled (no water cooling required) |
| Compliance | ASTM E975, ISO 18755, IEC 61000-6-3, CE, RoHS |
| Interface Options | Ethernet/IP, Profibus, Modbus TCP, SECS/GEM |
| Brand | Marxperts |
|---|---|
| Origin | Germany |
| Model | marμX2G |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Power Stability | < 0.0001 (relative intensity drift) |
| Detector Options | mar345 / mar345s Imaging Plate, PILATUS3 R 1M / 300K / 200K, EIGER R 4M / 1M, SX-165 / HS-85 CCD |
| X-ray Source Options | Microfocus Tube (30 W, 50 kV, 0.6 mA), Rotating Anode, MetalJet Liquid-Metal Jet Source |
| Focusing Optics | Montel Multilayer Mirror or Ellipsoidal Single-Element Mirror |
| Goniometer System | Automated mardtb “Desktop Beamline”, Optional easymount or marcsc Sample Mounting Robot |
| Cryogenic System | Oxford Instruments Cryostream 800 or Cobra |