A-Z Series Crystal Catalog
| Brand | Hefei Kejing |
|---|---|
| Origin | Anhui, China |
| Manufacturer Type | Authorized Distributor |
| Regional Classification | Domestic (China) |
| Model | A-Z Series Crystal Catalog |
| Pricing | Available Upon Request |
Overview
The A-Z Series Crystal Catalog is a comprehensive reference and procurement resource for single-crystal substrates, epitaxial wafers, and functional crystalline materials widely used in thin-film deposition, optoelectronics, quantum device fabrication, surface science, and advanced materials research. This catalog consolidates over 120 distinct crystalline materials—spanning oxides, semiconductors, chalcogenides, fluorides, metals, and engineered composite substrates—organized systematically by chemical family and lattice compatibility. Each entry includes standardized nomenclature, crystallographic orientation (e.g., Ti-terminated SrTiO₃), polytype specification (e.g., SiC 4H/6H/3C), and availability status (domestic or imported). Designed for integration into vacuum deposition systems (sputtering, MBE, PLD), X-ray diffraction calibration, acoustic wave device development, and nonlinear optical studies, the catalog serves as a technical bridge between material science requirements and practical substrate selection.
Key Features
- Systematic classification across five spectral groupings: A–F, G–H, L–N, P–Z, and extended compound families (e.g., PMN-PT, SBN, LSAT)
- Inclusion of both commercially standardized crystals (e.g., Si, SiO₂, MgO, Al₂O₃, SrTiO₃) and niche functional materials (e.g., WTe₂, MoTe₂, Bi₂Se₃, Fe:SrTiO₃)
- Explicit surface termination notation (e.g., “Ti-terminated SrTiO₃”) critical for interfacial epitaxy and interface-sensitive measurements
- Multi-source availability indicators distinguishing domestic production (e.g., Chinese-sourced GaN, LiNbO₃) from internationally sourced equivalents (e.g., imported GGG, YAG)
- Support for heterostructure engineering via lattice-matched substrate pairings (e.g., LSAT for NiO films, MgAl₂O₄ for ZnO growth)
- Complementary product families referenced within the catalog—including A-Z Series ceramic substrates, metallic foils, nanopowders, sputtering targets, and pre-deposited thin films
Sample Compatibility & Compliance
The materials listed comply with standard semiconductor wafer handling protocols (diameter options: 10–50 mm; thickness: 0.5–1.0 mm typical; surface roughness < 0.3 nm RMS for polished variants). Substrates are supplied with documented crystallographic orientation (XRD-verified), surface finish (polished, etched, or as-grown), and packaging under inert atmosphere where required (e.g., hygroscopic KCl, NaCl, LiF). While not certified to ISO 9001 at the catalog level, all domestically sourced crystals from Hefei Kejing adhere to internal QC procedures aligned with GB/T 1555–2018 (crystal orientation testing) and GB/T 6618–2009 (silicon wafer specifications). Imported items meet respective supplier certifications (e.g., ASTM F1722 for oxide substrates, SEMI F20 for sapphire wafers).
Software & Data Management
The A-Z Series Crystal Catalog is delivered as a structured PDF document with hyperlinked cross-references and searchable chemical indexing. It integrates seamlessly with laboratory inventory management systems via standardized CAS numbers (where assigned) and IUPAC-compliant naming. For users implementing digital lab notebooks (e.g., LabArchives, Benchling), the catalog supports batch import of material metadata—including lattice parameters, space group, thermal expansion coefficients, and bandgap values—via CSV export. Audit trails for substrate sourcing and lot traceability are maintained per order; full documentation satisfies GLP-aligned record retention requirements for academic and industrial R&D environments.
Applications
- Epitaxial thin-film growth (PLD, MBE, sputtering) requiring precise lattice matching and surface termination control
- X-ray diffraction (XRD) and reflectivity standards, including zero-diffraction plates (Si/SiO₂ bilayers)
- Surface acoustic wave (SAW) and bulk acoustic wave (BAW) resonator development using piezoelectric crystals (LiNbO₃, LiTaO₃, AlN, LGT)
- Nonlinear optical frequency conversion (e.g., KTP, BBO, LBO, KDP derivatives)
- Quantum material synthesis (e.g., topological insulators on Bi₂Te₃/Bi₂Se₃, 2D TMDs on SiO₂/Si or h-BN)
- Thermoelectric module prototyping using high-ZT substrates (PbTe, SnSe, Mg₃Sb₂-compatible bases)
- Calibration of ellipsometers, AFM, and TEM sample holders requiring known crystal symmetry and orientation
FAQ
Is crystal orientation verified for every lot?
Yes—each batch undergoes X-ray Laue or back-reflection topography prior to shipment; orientation reports are available upon request.
Are custom polishing or annealing services available?
Hefei Kejing offers optional post-processing (e.g., chemical-mechanical polishing, O₂/N₂ annealing) for select substrates; lead time and feasibility depend on crystal type and geometry.
Do imported crystals include customs documentation and RoHS/REACH compliance statements?
All imported materials ship with commercial invoices, packing lists, and supplier-provided RoHS declarations; REACH SVHC screening is performed for EU-bound orders.
Can I request wafer-level metrology data (e.g., thickness mapping, bow, TTV)?
Metrology reports (including flatness, warp, and total thickness variation) are provided for wafers ≥25 mm diameter at no additional cost.
How frequently is the A-Z Series Crystal Catalog updated?
The catalog is revised biannually, incorporating newly qualified materials, updated sourcing channels, and user-requested additions validated through internal testing.
