Energy Dispersive X-Ray Fluorescence Spectrometer
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| Brand | Aisite/ST |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Domestic (China) |
| Model | DM2400 |
| Price Range | USD 42,000–70,000 |
| Form Factor | Benchtop/Floor-Standing |
| Industry Application | Energy & Petrochemicals |
| Elemental Range | F (Z=9) to Cl (Z=17) |
| Quantification Range | 1 ppm – 10 wt% |
| Energy Resolution | <135 eV (Mn Kα) |
| Repeatability (S) | 0.3 ppm (RSD ≤ 2.7% at 1 ppm S level) |
| Brand | Aist / ST |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Domestic (China) |
| Model | DM1230 |
| Configuration | Benchtop |
| Industry Application | Cement, Energy & Chemicals |
| Elemental Analysis Range | Al₂O₃, SiO₂ |
| Concentration Range | 0.01%–100% (w/w) |
| Energy Resolution | ≤18% at Mn Kα (5.9 keV) |
| Repeatability | σ(Al₂O₃) ≤ 0.07%, σ(SiO₂) ≤ 0.07% (n=11, cement raw meal) |
| Detector | Thin-Be-window gas-flow proportional counter |
| X-ray Source | Low-power microfocus tube (≤10 kV, ≤0.5 mA, ≤5 W) |
| Measurement Time | 100–300 s (user-selectable |
| default | 300 s) |
| Compliance | GB/T 176–2017, JC/T 1085–2008, JB/T 11145–2011 |
| Brand | Aist / ST |
|---|---|
| Origin | Shanghai, China |
| Model | DM2100 |
| Form Factor | Benchtop |
| Industry Application | Cement & Energy Chemicals |
| Elemental Range | Si, Al, S, Ca, Fe |
| Concentration Range | 0.01% – 99.99% |
| Energy Resolution | 16% (at Mn Kα) |
| Repeatability (RSD) | ≤0.20% |
| Detector | Thin-Be-window Proportional Counter |
| X-ray Tube | ≤10 kV, ≤0.5 mA, ≤5 W |
| Measurement Time | 1–999 s (default 310 s) |
| Compliance | GB/T 176–2017, JC/T 1085–2008, JB/T 11145–2011 |
| Radiation Status | Exempted per National Radiation Safety Authority (First EDXRF instrument in China granted exemption) |
| Brand | Aist (ST) |
|---|---|
| Model | DM2500 |
| Element Range | B (Z=5) to Zn (Z=30) |
| Detection Limit | 1 ppm |
| Quantification Range | 1 ppm – 99.99% |
| Energy Resolution | <129 eV (Mn Kα) |
| Repeatability | ≤0.3 ppm (S, typical) |
| Detector | Silicon Drift Detector (SDD), 20 mm² active area, AP3.3 polymer window |
| X-ray Source | 50 W microfocus Ag-target tube with thin Be window, optimized kV/mA/target combination |
| Excitation Method | Multiple Monochromatic Excitation (MMEDXRF) using Logarithmic Spiral Doubly Curved Crystal (LSDCC) and Ge secondary target |
| Sample Geometry | Downward-beam configuration with sample rotation |
| Compliance | GB/T 176–2017, JC/T 1085–2008, JB/T 11145–2011 |
| Form Factor | Benchtop |
| Regulatory Status | Radiation-exempt design per national safety standards |
| Brand | Aist / ST |
|---|---|
| Origin | Shanghai, China |
| Model | DM2300 |
| Configuration | Benchtop / Floor-standing |
| Analytical Range | Cl (Z=17) to U (Z=92) |
| Detection Limit | ≤2 ppm (for Pb, Cd, Hg, Cr, Br, Cl) |
| Measurement Time | 300 s (typical) |
| X-ray Tube | 0–50 kV, 0–1 mA (continuously adjustable) |
| Collimators | Ø1 mm, Ø3 mm, Ø5 mm, Ø7 mm (motorized auto-switching) |
| Filters | 4-position motorized filter wheel |
| Detector | High-resolution silicon PIN diode |
| Energy Resolution | ≤155 eV at Mn Kα (5.9 keV) |
| Sample Chamber | 480 × 350 × 125 mm (L×W×H) |
| Operating Environment | 5–30 °C, RH ≤80% @ 25 °C, 220 ±20 V, 50 Hz |
| Power Consumption | ≤150 W |
| Dimensions | 503 × 412 × 478 mm |
| Weight | 45 kg |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Detector Active Area | 25 mm² (standard) or 70 mm² (optional) |
| Thickness | 1 mm |
| Element Range | Na (Z=11) to U (Z=92) |
| Detection Limit | 1 ppm |
| Quantification Range | 1 ppm – 99.99 wt% |
| Energy Resolution | <140 eV at Mn Kα (5.89 keV) |
| Count Rate Capability | High-throughput fast pulse processing |
| Repeatability | ±0.1% RSD (relative standard deviation) |
| Package | TO-8 metal can, pin-compatible with legacy 0.5 mm SDDs |
| Operating Voltage | Standard ±5 V bias |
| Transmission Efficiency | Enhanced above 15 keV vs. thinner detectors |
| Detector Type | Silicon Drift Detector (SDD) |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Model | FASTSDD-70-1000 |
| Detector Type | Silicon Drift Detector (SDD) |
| Active Area | 70 mm² |
| Thickness | 1000 µm |
| Elemental Range | Be (Z=4) to U (Z=92) |
| Detection Limit | 1 ppm |
| Energy Resolution | <140 eV at Mn Kα (5.9 keV) |
| Count Rate Capability | High-throughput fast pulse processing |
| Reproducibility | ≤0.1% RSD |
| Package | TO-8 metal can, pin-compatible with legacy 0.5 mm thick SDDs |
| Operating Voltage | Standard ±5 V analog output |
| Transmission Efficiency | Enhanced above 15 keV vs. thinner SDDs |
| Mounting Form Factor | Benchtop and floor-standing EDXRF systems |
| Brand | AMPTEK |
|---|---|
| Origin | USA |
| Model | FASTSDD & DP5-X |
| Element Range | Li to U |
| Detection Limit | 1 ppm |
| Concentration Range | 1 ppm – 99% |
| Energy Resolution | <140 eV (at Mn Kα, 5.9 keV) |
| Count Rate Capability | >1,000,000 cps |
| Repeatability | ±0.1% RSD |
| Detector Type | Fast Silicon Drift Detector (FASTSDD) |
| Form Factor | Portable / Handheld-Compatible Integrated Detector System |
| Compliance | RoHS/WEEE-ready architecture |
| Application Domain | OEM Integration, Process Monitoring, Laboratory Research, Regulatory Screening |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | OEM System Package |
| Pricing | Upon Request |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported |
| Model | OEM System Package |
| Form Factor | Handheld or Benchtop Configurable |
| Instrument Type | Conventional ED-XRF |
| Industry-Specific Design | Electronics Manufacturing & RoHS Compliance |
| Elemental Range | Na (Z=11) to U (Z=92) |
| Quantification Range | 1 ppm – 99.99 wt% |
| Energy Resolution | <140 eV at Mn Kα (5.9 keV) |
| Repeatability | ≤0.1% RSD (for major elements under controlled conditions) |
| Detector | Silicon Drift Detector (SDD) with Peltier cooling |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported |
| Model | OEM Solution |
| Form Factor | Benchtop / Portable |
| Industry Focus | Electronics |
| Elemental Range | Na (11) – U (92) |
| Quantification Range | 1 ppm – 99.99% |
| Energy Resolution | <140 eV FWHM at Mn Kα |
| Repeatability | ≤0.1% RSD |
| Detector Type | X-ray Detector (Si-PIN, SDD, or CdTe) |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Model | X-123 |
| Form Factor | Benchtop/Portable |
| Element Range | Na (11) – U (92) |
| Detection Limit | 1 ppm – 99.99% |
| Energy Resolution | 139–260 eV @ 5.9 keV |
| Repeatability | 0.1% |
| Detector | Si-PIN with Two-Stage Thermoelectric Cooling |
| Effective Area | 6–25 mm² |
| Thickness | 500 µm |
| Be Window | 12.5–25 µm |
| Operating Temperature Range | −30 °C to +80 °C |
| Power Consumption | 2.5 W (5 VDC, 300–800 mA) |
| Weight | 180 g |
| Dimensions | 70 × 100 × 25 mm |
| Interface | USB 2.0 (12 Mbps), RS-232 (115.2 kbps), Ethernet (10BASE-T) |
| Compliance | RoHS-compliant, UL 61010-1:2009, CAN/CSA-C22.2 No. 61010-1, TÜV Certified (CU 72101153 01) |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Model | X-123 |
| Detector Type | Si-PIN |
| Active Area | 6–25 mm² |
| Thickness | 300–500 µm |
| Energy Range | 1.5–40 keV |
| Resolution (FWHM @ 5.9 keV) | 145–230 eV |
| Max Count Rate | 2 × 10⁶ cps |
| Power Consumption | 2.5 W (typ.) |
| Dimensions | 70 × 100 × 25 mm |
| Weight | 180 g |
| Cooling | Two-stage thermoelectric (ΔT ≤ 85 °C) |
| Interface | USB 2.0, RS-232, Ethernet (10BASE-T) |
| Compliance | RoHS, UL 61010-1:2009, CAN/CSA C22.2 No. 61010-1 |
| Brand | AMPTEK |
|---|---|
| Origin | USA |
| Model | X-123 FAST SDD C2 Window |
| Detector Type | Silicon Drift Detector (SDD) |
| Window Material | Ultra-thin Si₃N₄ (C2 series) |
| Elemental Detection Range | C (4.9 keV) to U (98 keV) |
| Energy Resolution | ≤125 eV at Mn Kα (5.9 keV), typical |
| Count Rate Capability | Up to 10⁶ counts/second |
| Vacuum Compatibility | Yes, integrated vacuum interface |
| Standard Interface | USB 2.0 and digital pulse processing |
| Compliance | CE, RoHS, FCC Class A |
| Brand | AMPTEK |
|---|---|
| Origin | USA |
| Model | X-123FAST SDD (70 mm²) |
| Element Range | C (Z=6) to U (Z=92) with C₂ window |
| Detection Limit | 1 ppm – 99.99% |
| Energy Resolution | 123 eV FWHM at 5.9 keV |
| Count Rate Capability | >1,000,000 cps |
| Peak-to-Background Ratio | 26,000:1 |
| Window Options | 0.5-mil Be or C₂ (Si₃N₄) |
| Cooling ΔT | >85 K |
| Rise Time | <60 ns |
| Active Si Thickness | 500 µm |
| Collimated Effective Area | 50 mm² |
| Vacuum Compatibility | Yes |
| OEM Integration | Fully supported for XR100FAST, PX5, and X-123 platform configurations |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported |
| Model | OEM Solution |
| Pricing | Upon Request |
| Brand | Analytical Instruments |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Country of Origin | China |
| Model | Atomray CX-6500 |
| Application | Handheld / Portable |
| Industry-Specific Use | Geological & Mineral Exploration |
| Elemental Range | Mg to U |
| Quantitative Detection Range | 10 ppm – 99 wt% |
| Energy Resolution | <140 eV (at Mn Kα) |
| Repeatability | ≤0.1% RSD (for major elements under controlled conditions) |
| Weight | 1.6 kg (with battery) |
| Dimensions | 254 × 79 × 280 mm (L × W × H) |
| X-ray Tube | Ag anode (standard), optional Au/W/Rh anodes |
| Max. Tube Voltage/Current | 50 kV / 200 µA, fully adjustable |
| Detector | BOOST-type Si-Pin detector (CX-5500 series) |
| Display | 5-inch industrial-grade resistive touchscreen |
| Operating System | Embedded Linux with proprietary analytical software |
| Language Support | English, Chinese, Spanish, French, Russian, Arabic |
| Brightness Control | Ambient-light adaptive auto-brightness |
| Onboard Storage | 32 GB internal flash memory |
| Battery Life | ~8 hours per charge (smart MSBUS battery with real-time SOC monitoring) |
| Connectivity | USB 2.0, Bluetooth 5.0, Wi-Fi 802.11 b/g/n |
| Safety | DoubleBeam™ beam-on-sample interlock system |
| Compliance | Meets IEC 62495 (handheld XRF safety), RoHS, and CE requirements for portable radiation-emitting devices |
| Brand | Anchor Wisdom |
|---|---|
| Origin | Beijing, China |
| Model | PHECDA-FVS |
| Instrument Type | Micro-Zone ED-XRF |
| Elemental Range | Mg to U |
| Detection Limits (Large Spot Mode, Light Matrix) | S: 10 mg/kg, Fe: 2 mg/kg, Pb: 1.0 mg/kg, Cd: 0.3 mg/kg |
| Minimum Focal Spot | φ200 µm |
| Spot Size Options | Software-Selectable Apertures (φ200–φ5000 µm, Rectangular Beam Optional) |
| X-Y Stage Range | ±10 mm |
| Step Resolution | 10 µm |
| Camera Magnification | 10×–100× |
| Sample Chamber Dimensions | 280 × 230 × 70 mm (L×W×H) |
| Brand | Anyty |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Benchtop ED-XRF |
| Model | 3R-AX6800S |
| Element Range | Na (11) to U (92) |
| Detection Limit | 1 ppm (matrix-dependent) |
| Quantification Range | 1 ppm – 99.99 wt% |
| Energy Resolution | 129 ± 5 eV @ Mn Kα |
| Repeatability | ≤ 0.05% RSD (for major elements, n=10) |
| Detector | Electrically Cooled Silicon Drift Detector (SDD) |
| Vacuum System | Integrated scroll pump, ultimate pressure 6.7×10⁻² Pa, pumping speed 60 L/min @ 50 Hz |
| Sample Chamber | Open design, 600 × 550 × 600 mm (L×W×H), equipped with HD coaxial camera |
| Power Supply | AC 220 V ±5 V, 50/60 Hz |
| Dimensions | 800 × 650 × 1400 mm |
| Weight | 230 kg |
| Brand | Aolong |
|---|---|
| Origin | Liaoning, China |
| Manufacturer Type | OEM Manufacturer |
| Regional Classification | Domestic (China) |
| Model | XRF |
| Configuration | Benchtop or Floor-standing |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-purpose |
| Elemental Range | Na (Z=11) to U (Z=92) |
| Detection Limit | ≤2 ppm |
| Energy Resolution | <145 eV (FWHM at Mn Kα) |
| Repeatability | 0.1% RSD |
| Brand | ARUN TECHNOLOGY LTD. |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | HELIUS Series |
| Pricing | Upon Request |
| [Brand | Safe |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Direct Manufacturer |
| Model | AT-X100 |
| Portability | Handheld / Field-Deployable |
| Elemental Range | Mg to U |
| Quantification Range | 1 ppm – 99.99% (w/w) |
| Repeatability | ≤ 0.1% RSD |
| Detector Options | Si-Pin or SDD (Selectable) |
| Compliance | Designed for field-deployable environmental screening per EPA Method 6200, ASTM D7298, and China’s HJ 1003–2018] |
| Brand | Auniontech |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Authorized Distributor |
| Product Category | Domestic (PRC-Made) |
| Model Designation | XRF-Desktop Series |
| Form Factor | Benchtop |
| Detector Technology | Silicon Drift Detector (SDD) |
| Elemental Range | Na (11) to U (92) |
| Simultaneous Elements | Up to 25 |
| Coating Layers | Up to 5 (including alloy substrates) |
| Analysis Mode | Fundamental Parameters (FP) & Standardless Quantitative Analysis |
| Software Platform | Archer™ XRF Suite |
| Compliance | CE, RoHS, ISO/IEC 17025-compatible workflows |
| Connectivity | USB 2.0 |
| Footprint | < 400 × 350 × 300 mm |
| Weight | < 25 kg |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Detector Type | Silicon Pin Diode (SiPIN) and Fast Silicon Drift Detector (FASTSDD) with Boron Carbide (B4C) Window |
| Element Range | Na (11) to U (92) |
| Detection Limit | 1 ppm |
| Analytical Range | 1 ppm – 99.99% |
| Repeatability | ±0.1% RSD |
| Form Factor | Handheld/Portable Compatible |
| Compliance | RoHS-compliant, Be-free alternative per ASTM E1361 and ISO 18557 |
| Origin | Beijing, China |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic (PRC) |
| Model | EDX 8000H |
| Configuration | Benchtop/Floor-Standing |
| Industry-Specific Use | Electronics & RoHS Compliance |
| Elemental Range | Na (11) to U (92) |
| Quantitative Range | 1 ppm to 99.99 wt% |
| Energy Resolution | 149 ± 5 eV (Mn Kα) |
| Repeatability | RSD ≤ 0.05% (at 100 s counting time, certified reference materials) |
| Operating Temperature | 15–30 °C |
| Relative Humidity | 40–70% RH |
| Power Supply | AC 220 V ± 5 V, 50 Hz |
| Brand | Betop Scientific |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Benchtop/Floor-Standing EDXRF |
| Elemental Range | S (16) to U (92) |
| Quantitative Range | 1 ppm – 99.99 wt% |
| Energy Resolution | ≤139 eV at 5.9 keV (⁵⁵Fe) / ≤125 eV at 5.9 keV (⁵⁵Fe, optimized configuration) |
| Detector | Silicon Pin Diode (Si-Pin) or Silicon Drift Detector (SDD) |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | PeDX G7 |
| Application | Handheld/Portable |
| Instrument Type | Conventional EDXRF |
| Industry-Specific Use | Non-Ferrous Metals |
| Elemental Range | Al (13) to U (92) |
| Detection Limit | ppm-level quantification |
| Form Factor | Portable handheld spectrometer |
| Brand | LANScientific |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | PeDX OIL |
| Form Factor | Handheld / Portable |
| Instrument Type | Conventional EDXRF Spectrometer |
| Application Scope | General-Purpose Petrochemical Analysis |
| Elemental Range | Mg to U |
| Quantification Range | 1 ppm – 99.99% (for S and key wear metals/additives) |
| Energy Resolution | <136 eV (at Mn Kα) |
| Repeatability (RSD) | ≤0.1% for sulfur in stable matrix conditions |
| Brand | LANScientific |
|---|---|
| Model | TrueX 760 |
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Portable EDXRF Spectrometer |
| Application Domain | Soil & Environmental Field Screening |
| Regulatory Scope | RCRA Metals, EPA Priority Pollutants, ISO 12847, ASTM D6359, USP <232>/<233> (for elemental impurities in environmental matrices) |
| Detection Range | Elements from Mg (Z=12) to U (Z=92) |
| Typical Detection Limits | 1–10 mg/kg (ppm) for heavy metals (Pb, As, Cd, Cr, Hg, Ni, Cu, Zn) in soil matrices |
| Sample Form | Solid, powder, slurry filtrate, filter membrane, thin film, bulk sediment |
| Measurement Principle | Energy-Dispersive X-Ray Fluorescence (EDXRF) with Peltier-cooled Si-PIN or SDD detector |
| Operating Mode | Direct-field analysis without sample preparation |
| Compliance | GLP-compliant data logging, audit trail ready, 21 CFR Part 11 optional configuration |