X-Ray Instruments
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| Brand | Abner |
|---|---|
| Origin | Jiangsu, China |
| Model | ABN-XRF-001 |
| Instrument Type | Benchtop |
| Scanning Mode | 2D Mapping |
| Scan Speed | ≤1 frame/sec |
| Detector | 2048 × 2048 CMOS |
| Effective Detection Area | 4.6 mm × 4.6 mm |
| Spatial Resolution | ≤2 µm |
| Quantitative Accuracy | ±0.5% relative error (for major/majority elements) |
| Elemental Range | Na (Z=11) to U (Z=92) |
| Sample Stage Max Size | 30 mm × 30 mm |
| Operating Temperature Range | −196 °C to 100 °C |
| Power Consumption | ≤100 W |
| Safety Compliance | IEC 61010-1, IEC 62471 (UV/X-ray emission limits) |
| Brand | Advacam |
|---|---|
| Origin | Czech Republic |
| Model | ADVAPIX TPX |
| Sensor Options | Si or CdTe (custom thickness) |
| Frame Rate | Up to 1,700 fps sustained |
| Spatial Resolution | ≤200 nm (ion tracking), 2.5 µm σ (thermal neutron imaging, with 6LiF converter) |
| Field of View | 14 × 14 mm |
| Effective Pixel Count | 6.5 MPix |
| Readout Interface | Independent USB 3.0 per module |
| Trigger Mode | Synchronous or independent per module |
| Neutron Conversion Layer | Optional 6LiF deposition |
| Compliance | Designed for GLP-compliant research environments |
| Brand | Advacam |
|---|---|
| Origin | Czech Republic |
| Model | AdvaPIX TPX3 |
| Sensor Material | CdTe (1 mm) or Si + 6LiF neutron converter layer |
| Pixel Pitch | 55 µm |
| Spatial Resolution | 15 µm (CdTe, sub-pixel), 2.5 µm (Si + 6LiF, σ PSF) |
| Frame Rate | Up to 40 M hits/s per module |
| Readout Chip | Timepix3 (CERN-developed) |
| Interface | USB 3.0 |
| Field of View | 14 × 14 mm |
| Max Effective Resolution | 6.5 MPix |
| Applications | Energy-resolved radiography, neutron imaging, particle tracking, time-of-flight imaging, Compton camera reconstruction |
| Brand | Advacam |
|---|---|
| Origin | Czech Republic |
| Model | MiniPIX EDU |
| Sensor Chip | Timepix |
| Pixel Size | 55 × 55 µm |
| Sensor Resolution | 256 × 256 pixels |
| Dynamic Range per Frame | 11082 counts |
| Dark Current | Negligible |
| Interface | USB 2.0 |
| Max Frame Rate | 55 fps |
| Dimensions | 88.9 × 21 × 10 mm |
| Weight | 30 g |
| Operating Modes | Event (count), ToT (energy deposition), ToA (time-of-arrival) |
| OS Compatibility | Windows, macOS, Linux |
| Software | RadView (educational radiation visualization suite) |
| Brand | Advacam |
|---|---|
| Origin | Czech Republic |
| Model | MiniPIX TPX |
| Detector Chip | Timepix (256 × 256 pixels) |
| Pixel Size | 55 µm |
| Sensor Material | Silicon |
| Sensor Thickness | 300 µm |
| Readout Interface | USB 2.0 |
| Frame Rate | up to 30 fps (1 ms exposure) |
| Operating Systems | Windows, macOS, Linux |
| Software | PIXET Lite (included), optional PIXET Pro or Pixelman |
| Radiation Types Detected | X-rays, neutrons, alpha particles, electrons, ions |
| Energy-resolved Imaging | Yes |
| Spatial Resolution | 55 µm |
| Dynamic Range | Effectively unlimited (zero dark current, photon-counting operation) |
| Brand | Advacam |
|---|---|
| Origin | Czech Republic |
| Model | MiniPIX TPX3 |
| Sensor Material | Si or CdTe |
| Sensor Thickness | 100 µm, 300 µm, 500 µm (Si) |
| Sensitive Area | 14 mm × 14 mm |
| Time Resolution | 1.6 ns |
| Readout Speed | 2.35 million hits/s |
| Frame Rate | 16 fps |
| Pixel Array | 256 × 256 |
| Pixel Pitch | 55 µm |
| Energy Resolution | 0.5–1 keV (Si), 1.1–3.6 keV (CdTe) |
| Minimum Detectable Energy | 3 keV (Si), 5 keV (CdTe) |
| Readout Chip | Timepix3 |
| Operating Modes | Time-over-Threshold (ToT), Time-of-Arrival (ToA) |
| Connectivity | µUSB 2.0 |
| Weight | 30 g |
| Dimensions | 80 mm × 21 mm × 14 mm |
| Software | Pixet Pro |
| Brand | Advacam |
|---|---|
| Origin | Czech Republic |
| Model | ADVAPIX TPX3F, MINIPIX TPX3F |
| Sensor Material | Si (100/300/500 µm), CdTe (1 mm) |
| Pixel Size | 55 × 55 µm |
| Array | 256 × 256 pixels |
| Dark Noise | None |
| Time Resolution | 1.6 ns |
| Event Rate (MAX) | 40 × 10⁶ hits/s (ADVAPIX TPX3F), 2.35 × 10⁶ hits/s (MINIPIX TPX3F) |
| Frame Rate | 30 fps (ADVAPIX), 16 fps (MINIPIX) |
| Readout Interface | USB 3.0 (ADVAPIX), USB 2.0 (MINIPIX) |
| Operating Modes | Frame-based (Event+iToT, iToT, ToA), Pixel/Event-driven (ToT+ToA, ToA-only, ToT-only) |
| Brand | Advacam |
|---|---|
| Origin | Czech Republic |
| Model | WidePIX 2(1)x10-MPX3 |
| Sensor Material | Si or CdTe |
| Sensor Thickness | 300 µm (Si), 1 mm (CdTe) |
| Active Area | 28 (14) × 140.8 mm |
| Pixel Count | 512 (256) × 2560 |
| Pixel Size | 55 µm |
| Spatial Resolution | 9 lp/mm |
| Frame Rate | 170 fps (1×10 configuration), 80 fps (2×10 configuration) |
| Readout Chip | Medipix3 RX |
| Energy Thresholds | 1 or 2 programmable thresholds per pixel |
| Minimum Detectable Energy | 4 keV (Si), 5 keV (CdTe) |
| ADC Resolution | 12-bit or 24-bit (configurable) |
| TDI Support | Hardware-based, enabled in 1×10 mode at 1.5 m/s scan speed |
| Interface | Dual Ethernet RJ-45 |
| Dimensions | 210 × 190 × 42 mm (L × W × H) |
| Edgeless Tiling | Yes |
| Brand | Advacam |
|---|---|
| Origin | Czech Republic |
| Model | WidePIX 5×5 |
| Detector Architecture | Tiled 5×5 array of Timepix3 hybrid pixel detectors |
| Sensor Material | Edgeless Si or CdTe |
| Total Active Area | ~14.1 × 14.1 cm² |
| Pixel Count | 1280 × 1280 (1.63 MP) |
| Pixel Pitch | 55 µm |
| Energy Threshold Range | Adjustable from ~3 keV (Si) or ~10 keV (CdTe) |
| Counting Mode | Per-pixel digital photon counting with time-over-threshold (ToT) energy estimation |
| Frame Rate | Up to 100 fps (full frame, depending on readout configuration) |
| Readout Interface | USB 3.0 or PCIe (optional) |
| Compliance | CE, RoHS, compatible with ISO 17025-accredited lab environments |
| Brand | Aisida |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | XG6000 |
| Pricing | Upon Request |
| Brand | Aisite/ST |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Domestic (China) |
| Model | DM2400 |
| Price Range | USD 42,000–70,000 |
| Form Factor | Benchtop/Floor-Standing |
| Industry Application | Energy & Petrochemicals |
| Elemental Range | F (Z=9) to Cl (Z=17) |
| Quantification Range | 1 ppm – 10 wt% |
| Energy Resolution | <135 eV (Mn Kα) |
| Repeatability (S) | 0.3 ppm (RSD ≤ 2.7% at 1 ppm S level) |
| Brand | Aist / ST |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Domestic (China) |
| Model | DM1230 |
| Configuration | Benchtop |
| Industry Application | Cement, Energy & Chemicals |
| Elemental Analysis Range | Al₂O₃, SiO₂ |
| Concentration Range | 0.01%–100% (w/w) |
| Energy Resolution | ≤18% at Mn Kα (5.9 keV) |
| Repeatability | σ(Al₂O₃) ≤ 0.07%, σ(SiO₂) ≤ 0.07% (n=11, cement raw meal) |
| Detector | Thin-Be-window gas-flow proportional counter |
| X-ray Source | Low-power microfocus tube (≤10 kV, ≤0.5 mA, ≤5 W) |
| Measurement Time | 100–300 s (user-selectable |
| default | 300 s) |
| Compliance | GB/T 176–2017, JC/T 1085–2008, JB/T 11145–2011 |
| Brand | Aist / ST |
|---|---|
| Origin | Shanghai, China |
| Model | DM2100 |
| Form Factor | Benchtop |
| Industry Application | Cement & Energy Chemicals |
| Elemental Range | Si, Al, S, Ca, Fe |
| Concentration Range | 0.01% – 99.99% |
| Energy Resolution | 16% (at Mn Kα) |
| Repeatability (RSD) | ≤0.20% |
| Detector | Thin-Be-window Proportional Counter |
| X-ray Tube | ≤10 kV, ≤0.5 mA, ≤5 W |
| Measurement Time | 1–999 s (default 310 s) |
| Compliance | GB/T 176–2017, JC/T 1085–2008, JB/T 11145–2011 |
| Radiation Status | Exempted per National Radiation Safety Authority (First EDXRF instrument in China granted exemption) |
| Brand | Aist (ST) |
|---|---|
| Model | DM2500 |
| Element Range | B (Z=5) to Zn (Z=30) |
| Detection Limit | 1 ppm |
| Quantification Range | 1 ppm – 99.99% |
| Energy Resolution | <129 eV (Mn Kα) |
| Repeatability | ≤0.3 ppm (S, typical) |
| Detector | Silicon Drift Detector (SDD), 20 mm² active area, AP3.3 polymer window |
| X-ray Source | 50 W microfocus Ag-target tube with thin Be window, optimized kV/mA/target combination |
| Excitation Method | Multiple Monochromatic Excitation (MMEDXRF) using Logarithmic Spiral Doubly Curved Crystal (LSDCC) and Ge secondary target |
| Sample Geometry | Downward-beam configuration with sample rotation |
| Compliance | GB/T 176–2017, JC/T 1085–2008, JB/T 11145–2011 |
| Form Factor | Benchtop |
| Regulatory Status | Radiation-exempt design per national safety standards |
| Brand | Aist / ST |
|---|---|
| Origin | Shanghai, China |
| Model | DM2300 |
| Configuration | Benchtop / Floor-standing |
| Analytical Range | Cl (Z=17) to U (Z=92) |
| Detection Limit | ≤2 ppm (for Pb, Cd, Hg, Cr, Br, Cl) |
| Measurement Time | 300 s (typical) |
| X-ray Tube | 0–50 kV, 0–1 mA (continuously adjustable) |
| Collimators | Ø1 mm, Ø3 mm, Ø5 mm, Ø7 mm (motorized auto-switching) |
| Filters | 4-position motorized filter wheel |
| Detector | High-resolution silicon PIN diode |
| Energy Resolution | ≤155 eV at Mn Kα (5.9 keV) |
| Sample Chamber | 480 × 350 × 125 mm (L×W×H) |
| Operating Environment | 5–30 °C, RH ≤80% @ 25 °C, 220 ±20 V, 50 Hz |
| Power Consumption | ≤150 W |
| Dimensions | 503 × 412 × 478 mm |
| Weight | 45 kg |
| Brand | Aist (ST) |
|---|---|
| Model | DM8000 |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 400 W |
| X-ray Tube | Varian EG-60 thin Be-window, Rh anode |
| Detectable Elements | Any 10 elements from Na (11) to U (92) |
| Detector Window | Moxtek ProLINE 0.6 µm polyimide |
| Detector Linear Range | 500 kcps |
| Be Window Thickness | 75 µm |
| Compliance | GB/T 176–2017, JC/T 1085–2008, JB/T 11145–2011 |
| Brand | Along |
|---|---|
| Origin | Liaoning, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Regional Classification | Domestic (PRC) |
| Model | JF-2000 |
| Pricing | Available Upon Request |
| Brand | Along |
|---|---|
| Origin | Liaoning, China |
| Manufacturer Type | OEM Manufacturer |
| Model Series | YX-2, YX-200, YX-2H8, YX-300, YX-2A, YX-2B |
| X-ray Tube | Cu anode, air-cooled, 30 kV, 0–5 mA |
| Detector | Geiger-Müller counter |
| Angular Range | θ = −10° to +50°, 2θ = −10° to +100° |
| Angular Resolution | 10 arcseconds (digital display) |
| Accuracy | ±30″ (YX-2, YX-2H8, YX-2A left channel), ±10″ (YX-200, YX-300, YX-2A/YX-2B right channel), ±3″ or ±1″ (YX-300 & YX-2B right channel, min. readout) |
| Slit Options | 4′, 5′, 6′ |
| Time Constants | 0.1 s, 0.4 s, 3 s |
| Power Supply | 220 V AC, 50 Hz, 0.3 kW |
| Dimensions (L×W×H) | 1140–1150 mm × 650–665 mm × 1030–1100 mm |
| Weight | 150–170 kg |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Detector Active Area | 25 mm² (standard) or 70 mm² (optional) |
| Thickness | 1 mm |
| Element Range | Na (Z=11) to U (Z=92) |
| Detection Limit | 1 ppm |
| Quantification Range | 1 ppm – 99.99 wt% |
| Energy Resolution | <140 eV at Mn Kα (5.89 keV) |
| Count Rate Capability | High-throughput fast pulse processing |
| Repeatability | ±0.1% RSD (relative standard deviation) |
| Package | TO-8 metal can, pin-compatible with legacy 0.5 mm SDDs |
| Operating Voltage | Standard ±5 V bias |
| Transmission Efficiency | Enhanced above 15 keV vs. thinner detectors |
| Detector Type | Silicon Drift Detector (SDD) |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Model | C1/C2 |
| Window Substrate | Silicon Nitride (Si₃N₄) |
| Top Layer | Aluminum Coating |
| Thickness | C1 ≈ 80 nm, C2 ≈ 150 nm |
| Compatible Detectors | SuperSDD™ Series, 25 mm² / 500 µm thick silicon drift detectors |
| Energy Range Extension | Down to Boron (B, Z=5) and Carbon (C, Z=6) |
| Compliance | ASTM E135 – Standard Terminology Relating to Analytical Chemistry |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Model | C1/C2 |
| Window Substrate | Silicon Nitride (Si₃N₄) |
| Front Coating | Aluminum |
| Thickness | C1 ≈ 80 nm, C2 ≈ 150 nm |
| Compatible Detectors | SuperSDD®, standard SDDs (25 mm² / 50 mm² active area) |
| Energy Range Enhancement | Extended low-energy response down to boron (B, 183 eV) and carbon (C, 277 eV) |
| Compliance | RoHS-compliant, vacuum-compatible, TEM-grid compatible |
| Mounting | Standard 3.5 mm or 5.0 mm diameter window frames |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Model | Fast SDD |
| Detector Type | Silicon Drift Detector (SDD) |
| Energy Resolution (FWHM) | ≤125 eV at Mn Kα (5.9 keV) |
| Peak Shaping Time | 0.2–1.0 µs (adjustable) |
| Maximum Input Count Rate | ≥1.2 Mcps |
| Output Count Rate Linearity | >99.5% up to 1.2 Mcps |
| Operating Temperature | −20 °C to −35 °C (Peltier-cooled) |
| Active Area | 50 mm² (standard) |
| Thickness | 450 µm |
| Compliance | RoHS, CE |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Model | Fast SDD |
| Energy Resolution (55Fe) | ≤121 eV FWHM |
| Maximum Count Rate | >1 Mcps |
| Peak-to-Background Ratio | 20,000:1 |
| Operating Temperature | <80 K (achieved with thermoelectric cooling at +30 °C ambient) |
| Package | TO-8 vacuum-sealed |
| Detector Type | Silicon Drift Detector (SDD) |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Model | FASTSDD-70-1000 |
| Detector Type | Silicon Drift Detector (SDD) |
| Active Area | 70 mm² |
| Thickness | 1000 µm |
| Elemental Range | Be (Z=4) to U (Z=92) |
| Detection Limit | 1 ppm |
| Energy Resolution | <140 eV at Mn Kα (5.9 keV) |
| Count Rate Capability | High-throughput fast pulse processing |
| Reproducibility | ≤0.1% RSD |
| Package | TO-8 metal can, pin-compatible with legacy 0.5 mm thick SDDs |
| Operating Voltage | Standard ±5 V analog output |
| Transmission Efficiency | Enhanced above 15 keV vs. thinner SDDs |
| Mounting Form Factor | Benchtop and floor-standing EDXRF systems |
| Brand | AMPTEK |
|---|---|
| Origin | USA |
| Model | FASTSDD & DP5-X |
| Element Range | Li to U |
| Detection Limit | 1 ppm |
| Concentration Range | 1 ppm – 99% |
| Energy Resolution | <140 eV (at Mn Kα, 5.9 keV) |
| Count Rate Capability | >1,000,000 cps |
| Repeatability | ±0.1% RSD |
| Detector Type | Fast Silicon Drift Detector (FASTSDD) |
| Form Factor | Portable / Handheld-Compatible Integrated Detector System |
| Compliance | RoHS/WEEE-ready architecture |
| Application Domain | OEM Integration, Process Monitoring, Laboratory Research, Regulatory Screening |
| Brand | AMPTEK |
|---|---|
| Origin | USA |
| Model | FASTSDD |
| Active Area Options | 25 mm² (collimated to 17 mm²) or 70 mm² (collimated to 50 mm²) |
| Energy Resolution | ≤122 eV at 5.9 keV |
| Maximum Count Rate | >1,000,000 cps |
| Peak-to-Background Ratio | 26,000:1 |
| Preamplifier Rise Time | <35 ns |
| Window Options | Beryllium (0.5 mil / 12.5 µm) or Silicon Nitride (C-series / Si₃N₄) |
| Detector Thickness | 500 µm |
| Package | TO-8 |
| Cooling Delta-T | >85 K |
| Noise Performance | Optimized for low electronic noise and high charge collection efficiency |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Model | MCA8000D |
| Detector Interface | Analog Pulse Input (Unipolar/Bipolar) |
| ADC | 100 MHz, 16-bit |
| Channel Count | Up to 8192 (8K) |
| Differential Nonlinearity | < ±0.6% |
| Integral Nonlinearity | < ±0.02% |
| Peak Pileup Rejection | Dual TTL-compatible Gate Inputs (GATE1/GATE2) |
| Communication Interfaces | USB 2.0 Full-Speed (12 Mbps), RS-232 (115 kbps), 10BASE-T Ethernet (10 Mbps) |
| Input Voltage Range | 0–1 V or 0–10 V (software-selectable) |
| Input Impedance | 1 kΩ or 100 kΩ (factory-configurable) |
| Minimum Pulse Height | 5 mV |
| Pulse Peaking Time | ≥500 ns (200 ns shaping) |
| Conversion Time | 10 ns |
| Sliding-Scale Linearization | Yes |
| Operating Temperature | –20 °C to +60 °C |
| Dimensions | 125 × 71 × 20 mm |
| Weight | 165 g |
| Power | +4–5.5 V DC, ≤2 W (USB or external AC/DC adapter) |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Model | MCA8000D |
| ADC | 100 MHz, 16-bit |
| Channel Count | 8,192 (8K) |
| Pulse Peaking Time | ≥500 ns (200 ns shaping) |
| Conversion Time | 10 ns |
| Differential Nonlinearity | <±0.6% |
| Integral Nonlinearity | <±0.02% |
| Input Range | 0–1 V or 0–10 V (software-selectable) |
| Interfaces | USB 2.0 Full-Speed, RS-232 (115 kbps), Ethernet (10BASE-T) |
| Dimensions | 125 × 71 × 20 mm |
| Weight | 165 g |
| Operating Temperature | −20 to +60 °C |
| Power | +4 to +5.5 V DC, ≤2 W |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Model | Mini-X-OEM |
| X-ray Tube Type | Metal-Ceramic |
| Operating Voltage Range | 5–50 kV |
| Tube Current Range | 0–200 µA |
| Max Power | 4 W |
| Anode Material (Standard) | Au, Ag, or Rh |
| Anode Material (Optional) | W |
| Window Material | Be (125 µm) |
| Beam Spot Size | ~2 mm |
| Output Divergence Angle | 120° (5° with 2 mm collimator) |
| Input Voltage | 6–12 VDC |
| Input Current | 1.35 A (typ. @6 V), 0.70 A (typ. @12 V) |
| HV Stability | <0.1% |
| Cooling | Conductive (user-supplied heatsink required) |
| Operating Temperature | −10 °C to +60 °C (housing) |
| Humidity | 30–90% RH (non-condensing) |
| Weight | 340 g |
| Radiation Shielding | Integrated self-shielding (except output window) |
| Control Interface | Analog voltage inputs (0–4 V for kV/µA) and TTL logic outputs |
| Brand | Amptek |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | OEM System Package |
| Pricing | Upon Request |