Scanning Transmission Electron Microscope
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| Brand | Auniontech |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Domestic (China) |
| Model | AFM-Portable Series |
| Pricing | Available Upon Request |
| Origin | USA |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Double Helix |
| Pricing | Upon Request |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JEM-2800 |
| Point Resolution | 0.21 nm |
| Lattice Resolution | 0.10 nm |
| STEM Resolution | 0.16 nm |
| Secondary Electron Resolution | 0.5 nm |
| EDS Configuration | Dual Ultra-High-Sensitivity Silicon Drift Detectors (SDD) |
| Lorentz Mode | Standard Equipment |
| Brand | KA Imaging |
|---|---|
| Origin | Canada |
| Model | inCiTe CT |
| Detector | BrillianSe™ amorphous selenium (a-Se) |
| Imaging Principle | Propagation-based phase-contrast tomography |
| Spatial Resolution | Sub-micron to ~1 µm (system-dependent) |
| Field of View | Up to 100 mm diameter |
| Sample Max Height | 150 mm |
| X-ray Source | Microfocus tungsten-target tube (high-energy capable) |
| Energy Range | 30–90 kVp |
| Scan Time | Seconds to minutes per projection (depending on dose and resolution) |
| Compliance | CE-marked, ISO 13485-aligned design, GLP-ready data traceability |
| Brand | LaVision GmbH |
|---|---|
| Country of Origin | Germany |
| Model | TriM Scope |
| Scan Mode Flexibility | Single-beam to multi-beam configurable scanning |
| Software Control | ImSpector Pro with millisecond-scale region switching |
| Detection Channels | Up to 8 non-descanned detectors (NDDs) |
| Detector Options | Cooled Generation III GaAsP PMTs or APDs |
| Quantum Efficiency Gain | Up to 40% higher than standard PMTs |
| OPO Compatibility | Full integration support for optical parametric oscillator excitation sources |
| Brand | Leica |
|---|---|
| Origin | Germany |
| Model | QWin |
| Version Variants | QWin Runner, QWin Lite, QWin Plus, QWin Std, QWin Pro |
| Software Architecture | QUIPS-based modular platform |
| Microscope Integration | Full compatibility with Leica motorized microscopes and digital cameras |
| Pixel Resolution Support | Optimized for >1 MP imaging systems |
| Regulatory Context | Designed to support GLP/GMP-compliant workflows with audit-trail-ready operation (via optional modules) |
| Data Export | TIFF, BMP, JPEG, PNG, CSV, XML |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | Pharos STEM |
| Pricing | Available Upon Request |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Model | Pharos STEM |
| Accelerating Voltage | 20 kV |
| Resolution | ≤ 1 nm |
| Sample Holder | Standard 3 mm TEM grid clamp |
| Imaging Modes | Bright-Field (BF), Dark-Field (DF), High-Angle Annular Dark-Field (HAADF), User-Defined Detector Segmentation |
| Vacuum Levels | 0.1, 10, and 60 Pa |
| Imaging Time (Sample-to-Image) | < 40 s |
| Working Distance | Fixed for optimal STEM performance |
| Detector Configuration | 11-segment annular STEM detector with fully configurable quadrant/group selection |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | Phenom Pharos-STEM |
| Price | Upon Request |
| Brand | Phenom |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | Pharos-STEM |
| Pricing | Available Upon Request |
| Brand | TESCAN |
|---|---|
| Origin | Czech Republic |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported Instrument |
| Model | TENSOR |
| Pricing | Available Upon Request |
| Brand | Yoke |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Manufacturer |
| Country of Origin | China |
| Model | XSP-1CA |
| Price | Upon Request |
| Total Magnification Range | 40×–1600× |
| Eyepiece | WF10×/Φ18 mm, WF16×/Φ11 mm |
| Objective Lenses | 4×/0.10, 10×/0.25, 40×(S)/0.65, 100×(S) oil/1.25 |
| Nosepiece | Quadruple revolving nosepiece |
| Mechanical Tube Length | 160 mm |
| Stage | Dual-layer mechanical stage (125 × 120 mm), travel range 70 × 30 mm |
| Condenser | N.A. 1.25 Abbe condenser with centering adjustment, iris diaphragm and filter holder |
| Focusing Mechanism | Coaxial coarse/fine focus (15 mm travel), fine focus graduation: 0.002 mm |
| Eyepiece Tube | Monocular, inclined at 45°, rotatable 360° |
| Illumination | Reflected natural light (no built-in lamp) |
| Brand | ZEISS |
|---|---|
| Origin | Germany |
| Model | Xradia 515 Versa |
| Spatial Resolution | ≤500 nm (true native resolution) |
| Imaging Modes | Absorption Contrast, Propagation-Based Phase Contrast |
| Software Platform | Scout-and-Scan Control System with ART 3.0 Advanced Reconstruction Toolbox |
| Compatibility | In Situ Mechanical & Thermal Stages, Automated Sample Handling, Flat-Panel Detector Options |
| Regulatory Compliance | Designed for GLP/GMP-aligned workflows |