Nanoindentation and Scratch Tester
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| Brand | Anton Paar |
|---|---|
| Origin | Austria |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported Instrument |
| Model | Piezo Sample Stage 100 μm × 100 μm |
| Pricing | Upon Request |
| Brand | Anton Paar |
|---|---|
| Origin | Switzerland |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Category | Imported Instrument |
| Model | MCT³ |
| Instrument Type | Micro/Nano Scratch and Indentation Tester |
| Maximum Indentation Depth | 1000 µm |
| Effective Load Range | 30 N |
| Load Resolution | 6 µN |
| Displacement Resolution | 0.05 nm |
| Load Noise (RMS) | 100 µN |
| Depth Noise (RMS) | 1.5 nm |
| Data Acquisition Rate | 192 kHz |
| Scratch Speed Range | 0.1–600 mm/min |
| Depth Measurement Range | 1000 µm |
| Depth Resolution | 0.03 nm |
| Optional Modules | Peltier Stage (−120 °C to +120 °C), Heated Stage (up to 200 °C), Liquid Environment Cell |
| Brand | Anton Paar |
|---|---|
| Origin | Switzerland |
| Manufacturer Type | Manufacturer |
| Origin Category | Imported |
| Model | MHT³ |
| Instrument Type | (Micro/Nano) Scratch Tester |
| Load Range | 10 mN – 30 N |
| Load Resolution | 6 µN |
| Load Noise (RMS) | 100 µN |
| Depth Range | 0–1000 µm |
| Depth Resolution | 0.03 nm |
| Depth Noise (RMS) | 1.5 nm |
| Data Acquisition Rate | 192 kHz |
| Scratch Speed | 0.1–600 mm/min |
| Maximum Heating Temperature (Peltier) | 120 °C |
| Optional Heating Stage | up to 200 °C |
| Optional Cryo Cooling | down to −120 °C |
| Liquid Environment Testing | Yes |
| Brand | Anton Paar |
|---|---|
| Origin | Switzerland |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Imported |
| Model | NHT³ |
| Instrument Type | Nanoindentation Tester |
| Maximum Indentation Depth | 200 µm |
| Effective Load Range | 0.1 mN to 500 mN |
| Load Resolution | 20 nN |
| Load Noise (RMS) | ≤0.5 µN |
| Depth Resolution | 0.01 nm |
| Depth Noise (RMS) | ≤0.15 nm |
| Loading Rate | up to 10,000 mN/min |
| Data Acquisition Rate | 192 kHz |
| Environmental Options | Liquid Testing Compatible |
| Brand | Anton Paar |
|---|---|
| Origin | Austria |
| Manufacturer | Anton Paar GmbH |
| Type | Imported Instrument |
| Model | NST³ |
| Instrument Category | Nanoindentation and Scratch Tester |
| Maximum Indentation Depth | 1 µm |
| Load Resolution | 0.01 µN |
| Displacement Range | 600 µm |
| Maximum Friction Force | 1 N |
| Brand | Anton Paar |
|---|---|
| Origin | Switzerland |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Category | Imported |
| Model | RST 300 |
| Instrument Type | Micro/Nano Scratch Tester |
| Maximum Indentation Depth | 100 / 1000 µm |
| Effective Normal Load Range | 100 / 200 N |
| Load Resolution | 100 µN |
| Displacement Resolution | 0.05 / 0.5 nm |
| Maximum Friction Force | 100 / 200 N |
| Friction Resolution | 0.1 / 0.2 mN |
| Acoustic Emission Sensor | Center Frequency 150 kHz, Dynamic Range 65 dB, Max Gain 200,000× |
| Scratch Speed Range | 0.4 – 600 mm/min |
| Scratch Length | Up to 70 mm |
| In-situ Scratch Inspection Length | Up to 30 mm |
| Compliance | ASTM C1624, ISO 20502, ISO EN 1071 |
| Brand | Anton Paar |
|---|---|
| Origin | Switzerland |
| Manufacturer | Anton Paar GmbH |
| Type | Imported Instrument |
| Model | STEP x01 |
| Instrument Category | Nanoindentation and Scratch Tester |
| Indenter Tip Material | Diamond |
| Base Platform | Modular Mechanical Surface Testing System |
| Maximum Load Capacity | Not specified in input |
| Compliance | GLP/GMP-ready architecture, ASTM E2546, ISO 14577, ISO 20502, USP <1089> compatible (inferred from platform class) |
| Vibration Isolation | Optional active damping table & acoustic enclosure |
| Microscopy | Dual-view optical microscope (20×–10,000× continuous zoom) |
| Positioning Accuracy | <1 µm over extended scan range |
| Automation Interface | Integrated for factory-floor QC integration |
| Brand | Anton Paar TriTec (formerly CSM Instruments, Switzerland) |
|---|---|
| Origin | Switzerland |
| Model | HIT 300 |
| Instrument Type | Nanoindentation and Scratch Tester |
| Thermal Drift | ≤0.0008 nm/s |
| Frame Stiffness | 10⁸ µN/µm |
| Positioning Accuracy | <1 µm |
| Repeatability | High |
| Compliance | ASTM E2546, ISO 14577, ISO 20519, USP <1089>, GLP/GMP-ready data traceability |
| Brand | Anton Paar TriTec (formerly CSM Instruments, Switzerland) |
|---|---|
| Origin | Switzerland |
| Model | NST³ |
| Instrument Type | Nano Scratch Tester |
| Application Scope | Thin film and coating adhesion, cohesion, scratch resistance, and mechanical integrity assessment for layers < 1 µm thick |
| Key Measurement Capabilities | Critical load (Lc) determination, real-time scratch depth profiling, friction force mapping, elastic recovery quantification, and simultaneous panoramic imaging |
| Brand | Anton Paar |
|---|---|
| Origin | Switzerland |
| Manufacturer Type | Manufacturer |
| Origin Category | Imported |
| Model | UNHT³ Bio |
| Instrument Type | Biological Nanoindenter |
| Maximum Indentation Depth | 100 µm |
| Effective Load Range | 20 mN |
| Load Resolution | 1 nN |
| Displacement Resolution | 0.006 nm |
| Brand | Anton Paar |
|---|---|
| Origin | Switzerland |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Imported |
| Model | UNHT³ HTV |
| Instrument Type | Ultra-Nanoindentation Tester |
| Maximum Indentation Depth | 100 µm |
| Effective Load Range | 100 mN |
| Load Resolution | 3 nN |
| Displacement Resolution | 0.003 nm |
| Thermal Drift (Ambient) | < 0.5 nm/min |
| Thermal Drift (Up to 800 °C) | < 3 nm/min |
| Frame Stiffness | > 10⁶ N/m |
| Frame Compliance | < 0.1 nm/mN |
| Vacuum Base Pressure | 1×10⁻⁷ mbar |
| Maximum Operating Temperature | 800 °C |
| Temperature Stability | ±0.1 °C (surface-controlled) |
| Compliance Standards | ISO 14577, ASTM E2546 |
| Brand | Anton Paar |
|---|---|
| Origin | Switzerland |
| Manufacturer | Anton Paar GmbH |
| Type | Nanoindentation and Scratch Tester |
| Model | UNHT³ |
| Indentation Depth Range | 0–100 µm |
| Load Range | 10 µN – 100 mN |
| Load Resolution | 3 nN |
| Displacement Resolution | 0.003 nm |
| Thermal Drift | <3 nm/min |
| Frame Stiffness | >10⁸ N/m |
| Compliance with Standards | ISO 14577, ASTM E2546 |
| Brand | Appo |
|---|---|
| Origin | Switzerland |
| Model | MTA03 |
| Load Range | ±200 mN |
| Load Resolution | 0.5 nN |
| Displacement Range | 0.1 nm to 29 mm |
| Displacement Resolution (short-range) | 0.1 nm |
| Displacement Resolution (long-range) | 1 nm |
| Microscope Working Distance | 95 mm |
| Camera | 3 MP CMOS USB |
| Optical Zoom | 7:1 motorized |
| Illumination Options | Coaxial lens, ring light, diffuse backlight |
| Probe Types | Multiple FT-S microforce sensing probes |
| Optional Modules | FT-G microtweezers for microassembly |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | CETR-UMT |
| Instrument Type | Nanoindentation and Scratch Tester |
| Maximum Indentation Depth | 75 mm |
| Effective Load Range | 1 mN to 1000 N |
| Load Resolution | 1 µN |
| Displacement Range | ±75 mm |
| Displacement Resolution | 0.1 nm |
| Maximum Friction Force | 1000 N |
| Indenter Types | Conical, Berkovich, Spherical, Cube-Corner, Flat Punch, Custom Tips |
| Thermal Drift | <0.1 nm/min (at 25 °C, stabilized) |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | PI 95 |
| Instrument Type | Integrated Nanoindentation and Scratch Tester |
| Compatibility | JEOL, FEI (Thermo Fisher), Hitachi, Zeiss TEMs (excludes UHR pole-piece configurations) |
| Core Functionality | In-situ TEM-compatible nanomechanical, thermal, and electrical property characterization |
| Brand | Bruker |
|---|---|
| Origin | Malaysia |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | Hysitron TS 77 Select Nanoindenter |
| Instrument Type | Nanoindenter |
| Maximum Indentation Depth | µm |
| Effective Load Range | 100 nN – 10 mN |
| Load Resolution | <1 nN |
| Displacement Range | 1 nm – 10 µm |
| Displacement Resolution | <0.05 nm |
| Maximum Friction Force | 10 mN |
| Indenter Tip Geometry | Berkovich (triangular pyramid), Cube-corner, Flat-punch, and Custom trapezoidal tips |
| Thermal Drift | <0.05 nm/s |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | Hysitron TS 77 Select™ |
| Instrument Type | Nanoindentation and Scratch Tester |
| Compliance Standards | ISO 14577, ASTM E2546 |
| Core Technologies | Capacitive Transducer-Based Force/Displacement Sensing, Electrostatic Actuation, In Situ SPM Imaging |
| Automation Features | Auto-calibration, Multi-sample Sequential Testing, Preloaded Standard Test Protocols |
| Software Platform | Hysitron Insight™ (FDA 21 CFR Part 11–compliant audit trail, GLP/GMP-ready data management) |
| Form Factor | Benchtop |
| Application Scope | Quantitative nanoscale mechanical property mapping, tribological behavior analysis, and structure–property correlation at sub-100 nm resolution |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | PI 89 |
| Pricing | Available Upon Request |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | TI 980 |
| Instrument Type | Nanoindentation and Scratch Tester |
| Key Technology | Three-Plate Capacitive Transduction |
| Compliance | ASTM E2546, ISO 14577, ISO 20503, USP <1062> |
| Optional Modules | High-Temperature Stage, Electrical Characterization Module, Humidity Control Chamber, Cryogenic Stage, Raman Coupling Interface |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | TI 980 |
| Price Range | USD $260,000 – $390,000 |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | TI 990 |
| Drive Technology | Electrostatic actuation |
| Noise Floor | <0.1 nm RMS displacement noise |
| Maximum Load Resolution | 50 nN |
| Depth Resolution | <0.01 nm |
| Active Vibration Isolation | Integrated pneumatic + electromagnetic hybrid system |
| Platform | Precision granite base with environmental enclosure |
| Control Architecture | Performech III dual-lock-in parallel processing module |
| Software Platform | Tribo iQ v4.x (FDA 21 CFR Part 11 compliant audit trail, GLP/GMP-ready reporting) |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | TI Premier II |
| Instrument Type | Nanoindentation and Scratch Tester |
| Measurement Principle | Capacitive Displacement Sensing with Electromechanical Actuation |
| Compliance Framework | ASTM E2546, ISO 14577, ISO 20519, USP <1062>, GLP/GMP-Ready Data Integrity Architecture |
| Brand | Ducom |
|---|---|
| Origin | USA |
| Model | TR-101 |
| Instrument Type | (Micro/Nano) Scratch Tester |
| Maximum Indentation Depth | 5 mm |
| Effective Normal Load Range | 10 mN – 200 N |
| Load Resolution | 1 µN |
| Displacement Range | 0.1 mm – 50 mm |
| Displacement Resolution | 1 µm |
| Maximum Friction Force | 200 N |
| Indenter Tip | Rockwell C Diamond Tip |
| Brand | FemtoTools |
|---|---|
| Origin | Switzerland |
| Model | FT-G Series Nanotweezers (FT-G30, FT-G60, FT-G100) |
| Compatible Systems | FT-GS1000 Micro-Nano Assembler, FT-GS5000 Nano Assembly System |
| Controller | FT-GC01 Nanotweezer Controller |
| Operating Environments | Ambient air, liquid, and high vacuum (SEM-compatible) |
| Force Feedback | Integrated capacitive force sensor (FT-G30 & FT-G100) |
| Displacement Resolution | <1 nm |
| Force Resolution | <100 pN |
| Brand | SHNTI (Distributor) |
|---|---|
| Origin | Switzerland |
| Model Series | FT-RS / FT-FS / FT-S / FT-G / FT-UMS1000 |
| Instrument Type | Nanoindentation and Scratch Tester |
| Maximum Indentation Depth | 1 µm |
| Effective Load Range | 5 nN – 10 mN |
| Load Resolution | 1 nN |
| Displacement Range | ±100 µm |
| Displacement Resolution | 5 nm |
| Maximum Friction Force | 1 mN |
| Indenter Tip Types | Berkovich, Cube-Corner, Flat Punch, Spherical (customizable) |
| Thermal Drift | <0.1 nm/s (at 25 °C, stabilized environment) |
| Brand | Fischer |
|---|---|
| Origin | Germany |
| Model | HM500 LIGHT |
| Compliance | DIN EN ISO 14577-1, DIN EN ISO 14577-2, DIN 50359 |
| Measurement Principle | Continuous Stiffness Measurement (CSM) & Depth-Sensing Indentation |
| Load Range | 0.1 mN – 500 mN |
| Depth Resolution | ≤ 0.05 nm (50 pm) |
| Load Resolution | ≤ 0.01 mN |
| Indenter Types | Vickers (136° diamond pyramid), Berkovich (115.2° tri-pyramid), spherical WC or diamond |
| Stiffness Measurement Mode | Enhanced Stiffness Profiling (ESP) |
| Data Acquisition Rate | Up to 1 kHz |
| Zero-Point Detection | Capacitive contact sensing with sub-nm repeatability |
| Environmental Stability | Active thermal drift compensation (< 0.05 nm/s) |
| Software Platform | FISCHER FISCHERWIN v8.x (FDA 21 CFR Part 11 compliant audit trail, GLP/GMP-ready) |
| Brand | Fischer |
|---|---|
| Origin | Germany |
| Model | HM500 |
| Compliance | DIN EN ISO 14577-1, DIN EN ISO 14577-2, DIN 50359 |
| Measurement Principle | Continuous Stiffness Measurement (CSM) & Depth-Sensing Indentation |
| Load Range | 0.1 mN – 1000 mN |
| Depth Resolution | ≤ 0.05 nm (sub-pm interpolation capability) |
| Load Resolution | ≤ 10 nN |
| Indenter Types | Vickers (136° diamond pyramid), Berkovich (115.2° trihedral pyramid), spherical diamond (R = 1 µm to 100 µm) |
| Stiffness Measurement Mode | Enhanced Stiffness Profiling (ESP) |
| Data Acquisition Rate | Up to 1 kHz |
| Environmental Stability | Active temperature compensation (±0.1 °C) |
| Software Compliance | FDA 21 CFR Part 11 ready, GLP/GMP audit trail enabled |
| Brand | Fischer |
|---|---|
| Origin | Germany |
| Model | ST200 |
| Instrument Type | Micro- and Nano-Scratch Tester |
| Maximum Indentation Depth | 1000 µm |
| Effective Normal Load Range | 0.1–200 N |
| Load Resolution | 3.3 µN |
| Displacement Range | 130 mm |
| Displacement Resolution | 0.01 nm |
| Maximum Friction Force | 200 N |
| Indenter Type | Natural Diamond Tip |
| Thermal Drift | ≤0.05 nm/s |
| Brand | Fischer |
|---|---|
| Origin | Germany |
| Model | ST30 |
| Instrument Type | Micro/Nano Scratch Tester |
| Maximum Indentation Depth | 1000 µm |
| Effective Load Range | 0.01–30 N |
| Load Resolution | 0.7 µN |
| Displacement Range | 100 mm |
| Displacement Resolution | 0.01 nm |
| Maximum Friction Force | 50 N |
| Indenter Type | Rockwell Indenter |
| Brand | Fischer |
|---|---|
| Origin | Germany |
| Model | HM2000 |
| Instrument Type | Nanoindentation Tester |
| Max Indentation Depth | 500 µm |
| Effective Load Range | 0.1–2000 mN |
| Load Resolution | 150 nN |
| Displacement Range | 130 mm |
| Displacement Resolution | 0.01 nm |
| Max Friction Force | 50 N |
| Indenter Types | Vickers, Berkovich, Tungsten Carbide Sphere |