X Ray Photoelectron Spectrometer
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| Brand | AERO |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | NSpec |
| Energy Resolution | ≤ 1.85 keV @ 1.33 MeV |
| Relative Efficiency | 20% @ 1.33 MeV (vs. 3"×3" NaI, Co-60, 25 cm) |
| Resolution @ 122 keV | ≤ 875 eV |
| Peak-to-Compton Ratio | ~51:1 |
| FWTM/FWHM | 1.9 |
| FWFM/FWHM | 2.65 |
| Energy Range | 40–3000 keV |
| Cooling Method | Liquid Nitrogen Cryogenic |
| Form Factor | Integrated Miniaturized Unit (Detector + Dewar + MCA + Display) |
| Brand | Angstrom |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | ELS5000 |
| Pricing | Upon Request |
| Brand | Angstrom |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | ELS5000 |
| Pricing | Upon Request |
| Brand | Angstrom (USA) |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | LUMO |
| Pricing | Upon Request |
| Brand | Angstrom (USA) |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | LUMO |
| Pricing | Upon Request |
| Brand | Angstrom |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | LEED 800 |
| Pricing | Upon Request |
| Brand | Angstrom |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | LEED 800 |
| Pricing | Available Upon Request |
| Brand | Angstrom (USA) |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | RVL2000 |
| Pricing | Upon Request |
| Brand | Angstrom (USA) |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | RVL2000 |
| Pricing | Upon Request |
| Brand | Makeway |
|---|---|
| Origin | Shanghai, China |
| Model | MKW-5250 |
| Energy Resolution | 40 meV |
| X-ray Source | Al Kα (1486.6 eV) |
| Spatial Resolution | ≤ 5 µm (focused monochromated beam) |
| Analysis Area | Up to 300 µm × 300 µm |
| Detection Sensitivity | 11,800 kcps (for C 1s at pass energy 20 eV) |
| Sample Stage | Motorized XYZ + tilt/rotation |
| Compatible Techniques | XPS, UPS, LEIPS, REELS, AES, HAXPES (with optional Cr/Mg anode), GCIB depth profiling, angle-resolved XPS (AR-XPS) |
| Origin | Japan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | PHI 700 SAM |
| Price | Upon Request |
| Detection Limit | 0.1 at.% |
| Minimum Probe Spot Size | 6 nm |
| Information Depth | ≤ 5 nm |
| Elemental Coverage | All elements except H and He |
| Brand | ULVAC-PHI |
|---|---|
| Origin | Japan |
| Model | PHI GENESIS 500 |
| Category | Imported Instrument |
| Distribution Status | Authorized Distributor |
| Pricing | Upon Request |
| Brand | PHI |
|---|---|
| Origin | Japan |
| Model | Genesis 500 |
| Type | Fully Automated Scanning Focused XPS System |
| Sample Stage | Motorized 3-Position Carousel (80 mm × 80 mm trays) |
| Microprobe Spot Size | ≤ 5 µm |
| Depth Profiling | Integrated High-Performance Ar⁺ Ion Gun + Dual-Beam Charge Neutralization |
| Optional Techniques | UPS, LEIPS, REELS, AES, HAXPES, GCIB Sputtering |
| Software Platform | PHI SmartSoft Suite with GLP/GMP-Compliant Audit Trail & 21 CFR Part 11 Support |
| Compliance | ASTM E1521, ISO 18118, ISO 21365, USP <1057>, IEC 62304 |
| Origin | Japan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | PHI Quantera SXM |
| Price | USD 900,000 |
| Vacuum Base Pressure | <5×10⁻¹⁰ Torr |
| Ag 3d₅/₂ FWHM Energy Resolution | <0.50 eV |
| PET C1s (O=C–O) FWHM Energy Resolution | <0.85 eV |
| Minimum Monochromated X-ray Spot Size | 9.0 µm (X) × 9.0 µm (Y) |
| Typical X-ray Spot Sizes | 10.0 µm @ ≤1.25 W |
| XPS Sensitivity | >125 kcps @ 20.0 µm, <1.00 eV resolution |
| Ion Gun Max Current | >5.0 µA at 5 kV |
| Ion Sputtering Pressure | <5×10⁻⁸ Torr during operation |
| Analysis Chamber Material | UHV-compatible stainless steel |
| Ion Pump Speed | 360 L/s (with Ti sublimation pump) |
| Software | MultiPeak™, CasaXPS-compatible data processing suite (peak fitting, least-squares deconvolution, multivariate analysis, chemical-state imaging, line scan extraction, depth profile quantification) |
| Origin | Japan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | VersaProbe III |
| Price | USD 950,000 (FOB Yokohama) |
| Brand | Shimadzu/KRATOS |
|---|---|
| Origin | United Kingdom |
| Manufacturer | KRATOS Analytical (a Shimadzu company) |
| Type | AMICUS |
| X-ray Source | Mg/Al Kα dual anode, non-monochromated |
| Maximum Power | 300 W (top-illumination geometry) |
| Anode Design | Conical bulk target |
| Energy Resolution | < 0.8 eV (Mo 3d₅/₂) |
| Typical Resolution & Sensitivity | 1.15 eV @ 700 kcps (Ag 3d₅/₂) |
| Software | Vision™ (Windows XP/Vista/7 compatible) |
| Vacuum Monitoring & Control | Real-time chamber pressure display, automated valve sequencing, full experimental parameter scripting, unattended operation capability |
| Optional Accessories | High-temperature catalytic reaction cell |
| Brand | Shimadzu |
|---|---|
| Origin | United Kingdom |
| Manufacturer | Kratos Analytical (a Shimadzu company) |
| Type | AXIS Nova |
| Category | Import Instrument |
| Pricing | Upon Request |
| Brand | Shimadzu/Kratos |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported Instrument |
| Model | AXIS SUPRA+ |
| Price Range | USD 650,000 – 1,050,000 |
| Brand | SPECS |
|---|---|
| Origin | Germany |
| Model | Phoibos 190 ARPES System |
| Energy Analyzer | ASTRAIOS 190 hemispherical analyzer with 2D-CMOS detector |
| Angular Resolution | <0.1° |
| Energy Resolution | <1.5 meV (with 2D-CMOS) |
| Acceptance Angle | ±30° |
| Vacuum Base Pressure | <1×10⁻¹⁰ mbar |
| Sample Stage | Closed-cycle 6-axis cryogenic manipulator (base temperature <7 K) |
| UV Source | UVS300 plasma discharge He lamp + TMM304 monochromator (HeI α/β, HeII lines |
| Soft X-ray Source | u-FOCUS 600 micro-focused monochromated Al/Ag/Cr anode (Rolan circle radius 600 mm |
| Detector | 1920×1200 pixel CMOS sensor, 160 fps frame rate, dynamic range >1×10⁶ cps, single-channel noise <0.002 cps |
| Software | SPECS Prodigy Suite (acquisition, real-time k-space mapping, Fermi surface reconstruction, GLP-compliant audit trail) |
| Origin | Shanghai, China |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic (PRC) |
| Model | SBA-25 |
| Price Range | USD 70,000 – 112,000 |
| Illumination Area | 6 × 6 mm |
| Irradiance Accuracy | ±5% |
| Spatial Uniformity | ±10% |
| Irradiance Stability | ±5% |
| Irradiance Range | 100 nW/cm² to 5 mW/cm² |
| Wavelength Purity | ~24 nm (monochromator slit width: 4 mm) |
| Optical Mount | Asymmetrical Czerny–Turner |
| f-number | F = 4.3 |
| Reciprocal Linear Dispersion | 6 nm/mm (600 lines/mm grating) |
| Wavelength Accuracy | ±0.2 nm |
| Illumination Mode | DC or Intermittent (manually switchable) |
| Chopper Frequency Range | 0.1–100 Hz |
| Illumination Direction | Downward |
| Light Intensity Monitoring | Lock-in Amplifier-based |
| Sample Current Measurement | Transimpedance Amplifier + Lock-in Detection |
| Minimum Detectable Current | 100 fA (1 × 10⁻¹³ A) |
| Absorption Coefficient Resolution | 6-digit numerical output |
| Brand | Thermo Fisher Scientific |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported Instrument |
| Model | ESCALAB Xi+ |
| Pricing | Available Upon Request |
| Brand | Thermo Fisher |
|---|---|
| Origin | United Kingdom |
| Manufacturer | Thermo Fisher Scientific |
| Origin Category | Imported |
| Model | ESCALAB QXi |
| Pricing | Upon Request |
| Brand | Thermo Scientific |
|---|---|
| Origin | Switzerland |
| Model | Hypulse |
| Instrument Type | XPS with REELS and ISS capabilities |
| Ion Source | MAGCIS dual-mode (Ar⁺/Ga⁺/Cs⁺/O₂⁺) |
| Depth Profiling | Integrated femtosecond laser ablation (fs-LA) system |
| Acquisition Modes | Snapshot mode (<1 s per spectrum), Scanning mode (energy-resolved) |
| Imaging | Stage-based mapping and SnapMap fast imaging |
| Compliance | Designed for ISO/IEC 17025-compliant labs |
| Brand | Thermo Fisher |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported Instrument |
| Model | K-Alpha |
| Pricing | Available upon Request |
| Brand | Thermo Fisher Scientific |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Domestic (China) |
| Model | K-Alpha |
| Pricing | Available Upon Request |
| Brand | Thermo Fisher |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | Nexsa G2 |
| Pricing | Available upon request |
| Brand | ULVAC-PHI |
|---|---|
| Origin | Japan |
| Model | PHI GENESIS 900 |
| Excitation Source | Cr Kα (5414.7 eV) |
| Probe Depth | ~30 nm |
| Spatial Resolution | <10 µm (focused beam mode) |
| Energy Resolution | <0.3 eV (at Fermi edge, pass energy 20 eV) |
| Analyzer Type | Hemispherical Deflector Analyzer (HDA) with 180° double-pass optics |
| Vacuum System | UHV base pressure <5×10⁻¹⁰ Torr |
| Automation | Fully motorized sample stage, multi-axis tilt/rotation, in-situ transfer capability |