Wavelength Dispersive X-Ray Fluorescence Spectrometer
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| Brand | Abner |
|---|---|
| Origin | Jiangsu, China |
| Model | ABN-XRF-001 |
| Instrument Type | Benchtop |
| Scanning Mode | 2D Mapping |
| Scan Speed | ≤1 frame/sec |
| Detector | 2048 × 2048 CMOS |
| Effective Detection Area | 4.6 mm × 4.6 mm |
| Spatial Resolution | ≤2 µm |
| Quantitative Accuracy | ±0.5% relative error (for major/majority elements) |
| Elemental Range | Na (Z=11) to U (Z=92) |
| Sample Stage Max Size | 30 mm × 30 mm |
| Operating Temperature Range | −196 °C to 100 °C |
| Power Consumption | ≤100 W |
| Safety Compliance | IEC 61010-1, IEC 62471 (UV/X-ray emission limits) |
| Brand | Aist (ST) |
|---|---|
| Model | DM8000 |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 400 W |
| X-ray Tube | Varian EG-60 thin Be-window, Rh anode |
| Detectable Elements | Any 10 elements from Na (11) to U (92) |
| Detector Window | Moxtek ProLINE 0.6 µm polyimide |
| Detector Linear Range | 500 kcps |
| Be Window Thickness | 75 µm |
| Compliance | GB/T 176–2017, JC/T 1085–2008, JB/T 11145–2011 |
| Brand | Aolong |
|---|---|
| Origin | Liaoning, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Simultaneous WDXRF Spectrometer |
| X-ray Tube Power | 400 W (50 kV / 8 mA) |
| Analyzed Elements | Na (11) to U (92), pre-configured for Ca, Fe, Si, Al, Na, Mg, S, K, Cl, P |
| Vacuum Level | < 7 Pa |
| Sample Diameter | 40 mm |
| Analysis Area | up to 35 mm |
| Sample Rotation Speed | 30 rpm |
| Stability (24 h) | ≤ 2% |
| Energy Resolution (Detector) | ≤ 40% |
| Counting Linearity | ≤ 1% |
| Measurement Time per Sample (incl. vacuum & exchange) | 2–5 min |
| Detector Types | Flow-proportional counter, sealed proportional counter, scintillation counter |
| Pulse Height Analyzer | 12-channel, 2048-channel MCA |
| Flow Gas Control Precision | ±0.01 kPa |
| Constant-Temperature Chamber Accuracy | ±0.1 °C |
| Power Supply | 220 V AC, 2 kVA stabilized |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | S2 PUMA Series 2 WDXRF/EDXRF Hybrid Platform |
| Price | Upon Request |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | S6 JAGUAR |
| Instrument Type | Benchtop |
| Instrument Kind | Scanning |
| X-ray Tube Power | 400 W |
| Analyzable Elements | F to Am (Fluorine to Americium) |
| Detector | High-sensitivity solid-state detector (HighSense XE™) |
| Optical Configuration | Compact WDXRF optical path with up to 4 collimators, up to 4 analyzing crystals, and dual high-sensitivity detectors |
| Software Platform | SPECTRA.ELEMENTS with SMART-QUANT WD fundamental parameters quantification |
| Automation Interface | AXSCOM-compatible |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | S6 JAGUAR |
| Instrument Type | Benchtop |
| X-ray Tube Power | 400 W |
| Elemental Range | F to U |
| Detector Linear Count Rate | 2 Mcps |
| Beryllium Window Thickness | 75 µm |
| Configuration | Sequential + Simultaneous (Hybrid Scanning/Multi-Channel) |
| Compliance | ASTM C114, ASTM D2622, ASTM D6443, ISO 2936, ISO 8258, USP <232>/<233> |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | S8 LION |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 3–4 kW |
| Analyzable Elements | C (6) to U (92) |
| Instrument Configuration | Simultaneous Multi-channel |
| Compliance | DIN EN ISO 9001:2008, CE, TÜV/PTB certified, radiation dose < 1 µSv/h (H*) |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | S8 TIGER |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 1–4 kW |
| Analyzable Elements | F to U (Fluorine to Uranium) |
| Detector Linear Range | 13 Mcps |
| Beryllium Window Thickness | 75 µm |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | S8 TIGER |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 1–4.2 kW |
| Elemental Range | Be (4) to Am (95) |
| Instrument Configuration | Scanning-type WDXRF |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | S8 TIGER (3rd Generation) |
| Instrument Type | Floor-standing WDXRF Spectrometer |
| X-ray Tube Power | 3 kW / 4 kW |
| Analyzable Elements | Be to Am |
| Configuration | Simultaneous/Sequential Multi-channel |
| Detector System | HighSense™ XE + SensorBoost™ Signal Processing |
| Operating Voltage Range | 20–60 kV |
| Sample Capacity | 84-position EasyLoad™ Autoloader with AI Vision |
| Vacuum System | Dual-chamber sealed vacuum with high-transmission beryllium window |
| Crystal Options | 8-position analyzing crystal changer |
| Collimator Options | 4-position collimator changer |
| Filter Options | 10-position filter changer |
| Aperture Mask Options | 5-position mask changer |
| Detectors | Flow-proportional counter & scintillation counter |
| Origin | Japan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | MESA-50 |
| Price Range | USD 42,000–70,000 |
| Instrument Type | Scanning |
| X-ray Tube Power | 10 W (50 kV, 0.2 mA) |
| Elemental Range | Al (13) to U (92) |
| Detector | Silicon Drift Detector (SDD) |
| Beam Spot Sizes | 1.2 mm, 3 mm, 7 mm (motorized auto-switching) |
| Primary Beam Filters | 4-position automatic filter wheel |
| Sample Environment | Ambient air (no vacuum required) |
| Dimensions | 294 × 208 × 205 mm |
| Weight | 12 kg |
| Battery Life | Up to 6 hours (integrated Li-ion) |
| Origin | Japan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | XGT-1700 |
| Price Range | USD 42,000–70,000 |
| Instrument Type | Scanning |
| X-ray Tube Power | Not Applicable (Rh anode, max 50 kV / 1 mA) |
| Elemental Range | Na to U |
| Detection Limits | Cd ≤ 2 ppm, Pb ≤ 5 ppm, Cl ≤ 50 ppm |
| Sample Chamber Max Size | 460 × 360 × 150 mm |
| X-ray Beam Diameters | Φ1.2 mm and Φ3.0 mm (motorized switching) |
| Detector | High-Purity Silicon XEROPHY Detector |
| Liquid Nitrogen Capacity | 3 L |
| LN₂ Consumption | <1 L/day (only during operation) |
| Optical Magnification | 50× (coaxial with X-ray beam) |
| Software | Automated qualitative/quantitative analysis (fundamental parameters method, calibration curve method, single-point correction) |
| PC Requirements | Pentium IV ≥1.8 GHz, ≥1 GB RAM, ≥120 GB HDD, Windows XP, 17″ monitor, color inkjet printer |
| Ambient Temp | 10–35 °C (optimal), 5–40 °C (operational) |
| Humidity | ≤80% RH at 5–31 °C |
| Power Supply | AC 100/120/220/240 V ±10%, 50/60 Hz |
| Power Consumption | ≤1.3 kVA (system-wide) |
| Weight | ~265 kg (analysis unit only) |
| Dimensions | Analyzer Unit: 610(W) × 750(D) × 500(H) mm |
| Signal Processing Unit | 220(W) × 500(D) × 480(H) mm |
| Origin | Japan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | XGT-5200 |
| Price Range | USD 42,000–70,000 (FOB) |
| Instrument Type | Scanning Micro-XRF |
| X-Ray Tube Power | 50 kV / 1 mA |
| Target Material | Rhodium (Rh) |
| Detectable Elements | Na (Z=11) to U (Z=92) |
| Primary Beam Spot Sizes | 10, 50, 100, 400 µm, 1.2 mm, 3 mm |
| Detector | Silicon Drift Detector (SDD) |
| Sample Stage | 100 × 100 mm (standard), up to 200 × 200 mm (optional) |
| Sample Chamber Dimensions | 400 × 350 × 40 mm (customizable) |
| Optical Imaging | Macro-view 100 × 100 mm (400K pixels standard |
| Analysis Modes | Qualitative (auto-identification, ROI color mapping, background subtraction, spectral matching) and Quantitative (Fundamental Parameters Method, calibration curve, Cl/thickness/wire compensation) |
| Data Export | Excel®-compatible reporting module |
| Power Supply | AC 100/120/220/240 V, 50/60 Hz |
| Weight | ~280 kg |
| Dimensions (W×D×H) | 680 × 833 × 670 mm |
| Origin | Japan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | XGT-7200 |
| Price Range | USD 42,000 – 70,000 (FOB) |
| Instrument Type | Scanning Micro-XRF |
| X-ray Tube Power | Not Applicable (Microfocus Rh Target, Fixed Excitation) |
| Elemental Range | Na (11) to U (92) |
| Brand | HORIBA |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Imported |
| Model | XGT-9000 |
| Excitation Mode | Single-Wavelength Excitation |
| X-ray Tube Power | 50 W |
| Voltage Range | Up to 50 kV |
| Current Range | Up to 1000 µA |
| Elemental Coverage | Na (11) to U (92) |
| Minimum Spot Size | ≥10 µm |
| Optional Capillary Probes | 15 µm and 100 µm |
| Detector Configuration | Dual-mode — Energy-Dispersive XRF + Transmission X-ray Imaging |
| Sample Chamber Flexibility | Up to 4 configurable measurement atmospheres (air, He, vacuum, N₂) |
| Software Platform | HORIBA X-RAY LAB |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | 2830 ZT |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 4 kW |
| Detector Configuration | Sequential Multi-channel |
| Analyzable Elements | B, C, N, O, F, Mg, TiSiₓ, CoSiₓ, WSiₓ |
| Brand | Malvern PANalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | Axios FAST |
| Instrument Type | Floor-standing |
| Instrument Configuration | Simultaneous Multi-Channel WDXRF |
| X-ray Tube | SST-mAX with 160 mA high-power capability |
| Analyzable Elements | Up to 28 elements (Na to U) |
| Detection Range | ppm to 100 wt% |
| Sample Throughput | Up to 168 samples unattended |
| Minimum Measurement Time per Sample | 2 seconds |
| Optional Configurations | Up to 4 goniometers, HiPer channel for light elements (Na–F), anode materials (Rh, Cr, Mo, Au) |
| Compliance | Designed for GLP/GMP environments |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Origin Category | Imported |
| Model | Zetium |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 2.4–4 kW |
| Elemental Range | 4Be to 95Am |
| Instrument Class | Scanning-type WDXRF |
| Brand | Malvern Panalytical |
|---|---|
| Origin | Netherlands |
| Instrument Type | Floor-standing |
| Excitation Source | High-power X-ray tube (2.4–4 kW) |
| Analytical Range | Be (4) to Am (95) |
| Configuration | Scanning-type WDXRF with integrated EDXRF core (SumXcore technology) |
| Software Platform | SuperQ with Virtual Analyst |
| Compliance | Designed for ISO/IEC 17025, ASTM E1621, ASTM E2488, USP <233>, and GLP/GMP environments requiring audit trail and electronic signature support (21 CFR Part 11 ready) |
| Brand | NCS |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Direct Manufacturer |
| Instrument Type | Floor-standing |
| Instrument Category | Scanning-type |
| X-ray Tube Power | 4 kW |
| Analyzable Elements | B to U |
| Beryllium Window Thickness | 75 μm (optional ≤75 μm variants) |
| Goniometer Angular Reproducibility | θ–2θ independent drive |
| Scan Ranges | SC (1–118°), PC (10–148°) |
| Step Angles | 0.001°, 0.002°, 0.005°, 0.01°, 0.02°, 0.05°, 0.1° |
| Origin | USA |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Nordson Dage Quadra™ 5 |
| Price Range | USD $130,000–$195,000 (est.) |
| Instrument Type | Scanning X-ray System |
| X-ray Tube Power | ≤10 W (0.35 µm spot size), ≤20 W (0.95 µm spot size) |
| X-ray Source | QuadraNT™ Sealed Transmission Tube |
| Detector | AspireFP™ Flat-Panel Detector |
| Integrated Micro-CT Stage | Yes |
| Thermal Stage for Reflow Simulation | Yes |
| Compliance Standards | IPC-A-610, IPC-7095, ISO/IEC 17025 (for lab accreditation), FDA 21 CFR Part 11 (software audit trail enabled) |
| Brand | OLYMPUS |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Vanta GX PIN |
| Instrument Type | Benchtop |
| Instrument Configuration | Multi-Channel |
| X-ray Tube Power | 70 W, 18 VDC, 50–60 Hz |
| Elemental Range | Atomic Number 12 (Mg) to 92 (U) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Micro-Z |
| Instrument Type | Scanning WDXRF |
| X-ray Tube Power | 40 W |
| Elemental Range | S (Sulfur) |
| Compliance | ASTM D2622, ISO 20884, JIS K 2541-7 |
| Cooling | Air-cooled (no water or gas required) |
| Power Supply | 220 V AC, 2 A |
| Sample Preparation | None required |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Micro-Z Cl |
| Instrument Type | Benchtop |
| Excitation Mode | Single-Wavelength |
| Analyte | Total Chlorine |
| X-ray Tube Power | 80 W |
| Detection Limit | 0.11 ppm |
| Quantification Range | 0–5 wt% |
| Analysis Time | 300 s |
| Vacuum Requirement | Yes (gas-free operation) |
| Compliance | SH/T 0977, ASTM D7536 |
| Operating Environment | 10–40 °C, <80% RH |
| Dimensions (W×D×H) | 45 × 41 × 43 cm |
| Weight | 40 kg |
| Power Supply | AC 200–240 V |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Mini-Z |
| Detection Principle | Wavelength Dispersive X-Ray Fluorescence (WDXRF) |
| Sample Throughput | 6-position automated sample changer |
| Power Requirement | 220 V AC, 2 A |
| Dimensions | 640 × 580 × 580 mm (W × D × H) |
| Weight | 65 kg |
| Detection Limit for S | 0.3 ppm |
| Precision (S at 10 ppm in gasoline) | σ = 0.17 ppm |
| S Quantification Range | 1 ppm – 4 wt% |
| Compliant Standards | ASTM D2622, ISO 20884, JIS K2541-7 |
| Cooling | Air-cooled (no water or gas required) |
| Operation Interface | Touchscreen control panel |
| Origin | Japan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | Primus |
| Pricing | Upon Request |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Simultix 14 |
| Element Range | Be (4) to U (92) |
| Simultaneous Channels | Up to 40 |
| Detection Limit | 0.0001% |
| Analytical Range | 0.0001% – 100% |
| Footprint | 1 m² |
| Light Element Capability | Be, B, C, N, O, F |
| Vacuum Control | APC (Automatic Pressure Control) |
| Sample Changer Options | ASC8 (standard), ASC20/50/100 (optional) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Simultix 15 |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 4 kW |
| Analytical Element Range | Be (4) to U (92) |
| Beryllium Window Thickness | 30 µm |
| Goniometer Angular Reproducibility | ±0.0001° |
| Detector Configuration | Simultaneous Multi-channel (Standard 30 channels, upgradable to 40) |
| Optional Features | XRD Channel, Curved Crystal Optics, Automatic Pressure Control (APC), Background Measurement (BG), Compton Scattering Ratio Calibration, Unattended Operation with 48-position ASC |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Simultix15 |
| Instrument Type | Simultaneous Multi-Channel WDXRF |
| X-ray Tube Power | 4 kW |
| Elemental Range | Beryllium (Be, Z=4) to Uranium (U, Z=92) |
| Simultaneous Channels | Up to 40 elements |
| Detector System | High-speed pulse-height-analyzed proportional counters with background subtraction circuitry |
| Vacuum System | Dual-stage vacuum pump with auto-stabilized vacuum control |
| Software | Multi-tasking, multi-window FP (Fundamental Parameters) quantification software with Chinese GUI (localized for operator interface only) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Supermini 200 |
| Instrument Type | Benchtop |
| X-ray Tube Power | 200 W |
| Elemental Range | Oxygen (O, Z=8) to Uranium (U, Z=92) |
| Instrument Class | Scanning-type WDXRF |
| Compliance | CE certified |
| Cooling | Air-cooled tube |
| Gas Consumption | Low-flow P-10 gas (Ar/CH₄) |
| Sample Handling | 12-position automatic sampler |
| Operating Environment | Vacuum or He-purged |