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Phenom Temperature-Controlled Sample Holder for Desktop SEM

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Key Brand: Phenom
Origin Netherlands
Manufacturer Phenom-World B.V.
Product Type Electron Microscope Accessory
Model Temperature Controlled Sample Holder
Temperature Range −25 °C to +50 °C (standard), optional −50 °C to +50 °C
Accuracy ±1.5 °C
Resolution 0.1 °C
Max Cooling Rate 20 °C/min
Max Sample Dimensions Ø25 mm × 5 mm
Operating Principle Peltier-based thermoelectric control
Compliance Designed for integration with Phenom desktop SEM platforms

Overview

The Phenom Temperature-Controlled Sample Holder is an engineered accessory designed specifically for Phenom desktop scanning electron microscopes (SEM) to enable in situ thermal management of beam-sensitive, hygroscopic, or structurally fragile specimens. Unlike conventional room-temperature sample stages, this holder leverages solid-state Peltier thermoelectric modules to actively regulate specimen temperature—thereby modulating local vapor pressure and relative humidity within the specimen chamber during imaging. This capability is critical for preserving morphological integrity in vacuum environments where dehydration, electrostatic charging, or thermal drift would otherwise compromise structural fidelity. The device operates without cryogenic fluids or external chillers, delivering rapid thermal response (up to 20 °C/min cooling rate) and stable setpoint maintenance across its full operational range. It is fully integrated into the Phenom platform’s hardware communication protocol, enabling synchronized temperature logging alongside image acquisition metadata.

Key Features

  • Peltier-based thermoelectric control enables precise, bidirectional temperature regulation from −25 °C to +50 °C (standard configuration); extended range models support −50 °C to +50 °C upon request
  • Real-time temperature monitoring with 0.1 °C display resolution and ±1.5 °C system accuracy over the entire operating range
  • Dedicated front-panel controller with intuitive keypad interface for manual setpoint adjustment and status feedback
  • Optimized thermal path design minimizes thermal lag and ensures uniform temperature distribution across the sample mounting surface
  • Compact, vacuum-compatible mechanical interface compatible with all Phenom ProX, Pure, and Pharos series desktop SEMs
  • No external coolant lines or auxiliary power supplies required—powered entirely through the SEM stage interface

Sample Compatibility & Compliance

The holder is validated for use with biological tissues, hydrated polymers, food matrices, pharmaceutical coatings, and soft organic thin films—materials prone to collapse, cracking, or mass loss under standard high-vacuum SEM conditions. By stabilizing specimen temperature, it mitigates water desorption kinetics and reduces electron-beam-induced damage mechanisms such as radiolysis and localized heating. The device meets CE marking requirements and complies with IEC 61000-6-3 (EMC emission standards) and IEC 61000-6-2 (immunity). Its design supports GLP-compliant workflows when paired with Phenom’s audit-trail-enabled software; temperature setpoints and real-time logs are embedded in the .emd image metadata file format, facilitating traceability per ISO/IEC 17025 and FDA 21 CFR Part 11 requirements for regulated laboratories.

Software & Data Management

Temperature parameters are fully accessible via Phenom’s proprietary Phenom Desktop Software (v5.0+). Users can define time-synchronized thermal profiles (e.g., ramp-hold-cool sequences) directly from the acquisition interface. All temperature readings—including setpoint, actual reading, and deviation—are timestamped and saved alongside image data in the native .emd container. Export options include CSV-formatted thermal logs synchronized to frame acquisition timestamps, enabling post-acquisition correlation between morphological evolution and thermal history. No third-party drivers or middleware are required; firmware updates are delivered through standard Phenom software update channels.

Applications

  • In situ observation of phase transitions in lipid bilayers and polymer blends under controlled thermal stress
  • Morphological stability assessment of freeze-dried biologics during gradual warming cycles
  • Hydration-state-dependent imaging of plant cuticles and mucilage layers without metal sputtering
  • Thermal expansion coefficient estimation of thin-film coatings via sequential low-dose imaging at discrete temperatures
  • Minimizing charging artifacts in uncoated food particulates (e.g., starch granules, protein aggregates)
  • Correlative studies linking microstructural changes in battery electrode materials to temperature-dependent SEI formation

FAQ

Is the Temperature-Controlled Sample Holder compatible with non-Phenom SEM systems?
No—this holder is mechanically and electrically engineered exclusively for Phenom desktop SEM platforms. It relies on proprietary stage bus communication and physical mounting geometry.
Can temperature be controlled during live imaging without interrupting acquisition?
Yes. Real-time temperature adjustments are supported during continuous imaging; the system maintains vacuum integrity and stage stability throughout thermal transients.
Does the holder support automated temperature ramping in programmable sequences?
Yes. Ramp rates, dwell times, and endpoint temperatures can be defined in the acquisition protocol and executed autonomously with metadata synchronization.
What is the maximum allowable sample weight?
The holder supports samples up to 10 g mass while maintaining thermal uniformity and mechanical stability under beam exposure.
How is calibration verified and maintained?
Each unit undergoes factory calibration against NIST-traceable reference thermometers. End users may perform verification using calibrated PT100 probes inserted into the designated sensor port adjacent to the sample mount.

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