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| Brand | Bestron |
|---|---|
| Model | INSTEMS-ET |
| Type | In Situ Dual-Axis Tilt TEM Sample Holder |
| Heating Range | RT to 1200 °C |
| Electrical Bias Range | 0–150 V |
| Current Range | 0–2 A |
| Dual-Axis Tilt | α ±20°, β ±10° |
| Spatial Resolution (in situ) | ≤0.1 nm |
| Sample Drift | <50 pm/s |
| EDS-Compatible | Yes |
| Heating Accuracy | ≥98% |
| Maximum Heating Rate | >10,000 °C/s |
| Current Measurement Range | 1 pA–1 A |
| Brand | Bestron |
|---|---|
| Model | INSTEMS-ME |
| Type | Dual-Axis Tilt Electromechanical In Situ TEM Holder |
| Max Force | 100 mN |
| Max Displacement | 4 µm |
| Force Resolution | < 500 pm |
| Voltage Range | ±50 V |
| Current Range | 1 pA–1 A |
| Temperature Range | RT–1200 °C |
| Temp. Stability | < 0.1 °C |
| α/β Tilt Range | ±25° each |
| Drift Rate | < 50 pm/s |
| Spatial Resolution (TEM-compatible) | ≤0.1 nm |
| EDS-Compatible | Yes |
| Application Domain | Materials Science, Nanodevices, Energy Storage, Ferroelectrics, Piezoelectrics, Flexible Electronics |
| Brand | Bestron |
|---|---|
| Model | INSTEMS-MT |
| Category | In Situ TEM Sample Holder |
| Heating Range | RT to 1200 °C |
| Temperature Accuracy | < 0.1 °C |
| Programmable Thermal Ramp Rate | >10,000 °C/s |
| Mechanical Load Capacity | >100 mN |
| Drive Resolution | < 500 pm |
| Dual-Axis Tilt | α ±20°, β ±10° |
| Sample Drift | < 50 pm/s |
| Spatial Resolution (TEM-compatible) | ≤0.1 nm |
| EDS-Compatible | Yes |
| Current Range | 0–2 A |
| Voltage Range | 0–150 V |
| Brand | Bestron |
|---|---|
| Model | INSTEMS-MET |
| Type | In Situ TEM Dual-Axis Tilt Sample Holder with Integrated Mechanical, Electrical, and Thermal Actuation |
| Heating Range | RT to 1200 °C |
| Temperature Accuracy | < 0.1 °C |
| Max. Driving Force | > 100 mN |
| Drive Resolution | < 500 pm |
| Voltage Range | ±50 V (up to 150 V peak) |
| Current Range | 1 pA – 2 A |
| Dual-Axis Tilt | α/β ±25° |
| Spatial Resolution (TEM-compatible) | ≤ 0.1 nm |
| Sample Drift | < 50 pm/s |
| EDS-Compatible | Yes |
| Heating Rate | > 10,000 °C/s |
| Brand | Bestron |
|---|---|
| Model | INSTEMS-M |
| Type | MEMS-Based In Situ TEM Mechanical Testing Holder |
| Loading Modes | Tension, Compression, Nanoindentation, Bending, Impact, Creep, Fatigue |
| Force Range | >100 mN |
| Displacement Range | 4 µm |
| Actuation Resolution | <500 pm |
| Drift Rate | <50 pm/s |
| Spatial Resolution (TEM-compatible) | ≤0.1 nm |
| Dual-Axis Tilt | α ±20°, β ±10° |
| Compatibility | Standard 3-mm TEM specimen holders, Gatan/FEI/Thermo Fisher-compatible apertures |
| Chip Customization | User-configurable MEMS chip geometry and loading configuration |
| Brand | Bestron |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Authorized Distributor |
| Product Category | Domestic |
| Model | INSTEMS MET/MT/ME/ET/M |
| Application Field | Materials Science |
| Instrument Classification | In Situ Tensile/Compression/Bending Holder |
| Thermal Range | RT–1200 °C |
| Max Force Output | >100 mN |
| Max Displacement | >4 µm |
| Minimum Step Resolution | <0.5 nm |
| Dual-Tilt Range (α/β) | ±25° each |
| Tilt Precision | <0.1° |
| Thermal Ramp Rate | >10,000 °C/s |
| Temperature Accuracy | ≥98% |
| Thermometry Method | Four-Probe Resistive |
| EDS Compatibility | Yes |
| Electrical Output | ±50 V |
| Current Measurement Range | 1 pA–1 A |
| Voltage Measurement Range | 100 nV–50 V |
| Spatial Resolution (in situ) | ≤0.1 nm |
| Drift Stability | <50 pm/s |
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