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| Brand | Leica |
|---|---|
| Origin | Germany |
| Model | DM4 M |
| Type | Upright Metallurgical Microscope |
| Measurement Principle | Reflected Light Optical Microscopy (Not White Light Interferometry) |
| Automation Level | Semi-Automatic (Motorized Objective Turret, Motorized XY Stage, Adjustable LED Illumination) |
| Application Domain | Metallographic Structure Observation, Grain Size Analysis, Phase Identification, Failure Analysis, QC/QA in Metals & Alloys |
| Compliance | Designed for ISO 9001, ASTM E3, ASTM E112, ASTM E1245, ISO 643, ISO 10770-1, and GLP-compliant documentation workflows |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Anhui, China |
| Model | ZEM20Pro |
| Instrument Type | Desktop SEM |
| Electron Source | LaB₆ (Lanthanum Hexaboride) |
| Secondary Electron Resolution | 3 nm |
| Magnification Range | up to 360,000× |
| Accelerating Voltage | 3–30 kV |
| Backscattered Electron Resolution | 3 nm |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Anhui, China |
| Model | ZEM20Pro |
| Instrument Type | Desktop SEM |
| Electron Source | LaB₆ (Lanthanum Hexaboride) |
| Secondary Electron Resolution | 3 nm @ 30 kV |
| Backscattered Electron Resolution | 3 nm @ 30 kV |
| Magnification Range | 10× – 360,000× |
| Accelerating Voltage | 3–30 kV |
| Brand | ZYGO |
|---|---|
| Origin | USA |
| Model | ZeGage Pro |
| Type | Non-Contact Profilometer / Surface Roughness Analyzer |
| Measurement Principle | Coherence Scanning Interferometry (CSI) |
| Compliance | ASTM E2947, ISO 25178-2, ISO 4287, ISO 10360-5 |
| Brand | RMC |
|---|---|
| Origin | USA |
| Distributor Type | Authorized Distributor |
| Origin Category | Imported |
| Model | PowerTome PC |
| Slice Thickness Range | 0 nm – 15 µm |
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