Accretech (Tokyo Seimitsu)
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| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | AD3000T-PLUS |
| Pricing | Upon Request |
| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | AP3000 / AP3000e |
| Operation Type | Fully Automatic |
| Maximum Wafer Size | 300 mm (12-inch) |
| Compliance | ISO Class 4 Cleanroom-Compatible Design |
| Structural Rigidity | High-stiffness granite base with active/passive vibration isolation |
| Alignment System | Integrated ITV (Image Tile Vision) for sub-micron probe-to-pad registration |
| Probe Capacity | Multi-site parallel probing capability |
| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Netherlands |
| Model | ChaMP-211 |
| Wafer Sizes Supported | 100 mm, 150 mm, 200 mm |
| Polishing Head Configurations | 2–8 inch |
| Automation Options | Optional auto-loader integration |
| Cleaning System | Integrated post-polish cleaning module |
| Endpoint Detection | Optional optical endpoint monitoring |
| Air-bearing Carrier Design | Yes |
| Edge Control | Ring-type independent pressure zones |
| Quick-change Retainer/Retaining Ring | <60-second swap time |
| Footprint | Compact design for R&D and pilot-line integration |
| Compliance | Designed to meet semiconductor cleanroom requirements (ISO Class 5 compatible), supports GLP/GMP-aligned process documentation workflows |
| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | ChaMP-232 |
| Wafer Compatibility | Φ100 mm, Φ150 mm, Φ200 mm |
| Polishing Head Type | Pneumatic Floating Head with Zonal Pressure Control |
| Endpoint Detection | Integrated Optical End-Point Monitoring System |
| Cleaning Module | Integrated ChaMP Wet Cleaning System |
| Compliance | Designed for Semiconductor Front-End Manufacturing Environments |
| Vendor Status | Authorized Distributor (Non-OEM) |
| Import Category | Imported Equipment |
| Brand | ACCRETECH (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | DM43801 |
| Type | Standard CMM Probe Styli |
| Compliance | ISO 10360-5, VDI/VDE 2617 Part 5 |
| Mounting Interface | M3 thread (standard for most tactile CMM probe heads) |
| Ball Material | Ruby (Al₂O₃) |
| Stem Material | Stainless Steel or Carbon Fiber (configurable) |
| Total Length Definition | From rear mounting face to center of stylus ball |
| Effective Working Length (EWL) | Distance from stylus ball center to first interference point along surface normal direction |
| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | EM46000-S302 |
| Type | High-Precision Contact Profilometer for 2D/3D Surface Metrology |
| Compliance | ISO 25178-2, ISO 4287, ISO 11562, JIS B 0601, ASME B46.1 |
| Measurement Principle | Stylus-based Inductive Displacement Sensing with Dual-Axis Scanning Mechanism |
| Brand | ACCRETECH (Tokyo Seimitsu) |
|---|---|
| Origin | Netherlands |
| Model | Fortia |
| Wafer Size Support | Φ200 mm |
| Application Focus | DC High-Current/High-Voltage, Avalanche (L-Load), and Wide-Temperature Range Characterization of Power Devices |
| Temperature Range | -65 °C to +300 °C (configurable) |
| Probe Card Compatibility | Up to 330 mm² PLP (Probe Landing Pad) |
| Interface Standards | GEM/SECS-II, TCP/IP, GB-IB, VegaNet |
| Motion Control | Integrated ATi Unit (ACCRETECH TESEC Interface) with DARUMA Stage and Pressurized Chuck |
| Safety Features | Fast Path Interruption during Avalanche Testing, Fault-Triggered Electrical Isolation |
| Brand | ACCRETECH (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | PG3000RMX |
| Type | Integrated Backside Grinding & CMP Stress-Relief System for Ultra-Thin Wafer Processing |
| Application | Front-End Wafer Preparation for 15 µm Final Thickness Production |
| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | R73A |
| Bearing Type | Pneumatic (Air) |
| Measurement Principle | Radial Method with Rotating Sensor Table |
| Z-Axis Travel | 1000 mm |
| Radial (R-Axis) Auto-Zero Function | Yes |
| Tilt & Centering | Fully Automatic Compensation |
| Software Platform | ACCTee |
| Measurement Magnification | 50× to 10,000× (8 selectable steps) |
| Compliance | Designed for ISO 1101, ISO 12181 (Roundness), ISO 12180 (Cylindricity), and ASME Y14.5 geometric tolerance evaluation |
| Brand | ACCRETECH (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | R73A |
| Bearing Type | Aerostatic Air Bearing |
| Measurement Principle | Radius Method with Rotating Sensor Spindle |
| Z-Axis Travel | 1000 mm |
| Radial (R-Axis) Auto-Zero Function | Yes |
| Tilt & Centering Compensation | Fully Automated via Software |
| Measurement Magnification | 50× to 10,000× (8-step selectable) |
| Sensor Traverse Mechanism | Integrated Horizontal Probe Translation Unit |
| Z/R-Axis Position Encoders | Built-in Absolute Encoders |
| Air Pressure Monitoring | Real-time Diagnostic Circuit |
| Software Platform | ACCTee Measurement Suite (v6.x or later) |
| Compliance Framework | Designed for ISO 1101, ISO 12181 (Roundness), ISO 12180 (Cylindricity), and ASME Y14.5 geometric tolerance evaluation |
| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | RONCOM 31C |
| Rotary Axis (θ) | 6 rpm |
| Z-Axis Travel | 200 mm |
| R-Axis Radial Travel | 125 mm |
| Maximum Workpiece Diameter | Ø250 mm |
| Maximum Height (External) | 520 mm |
| Maximum Height (Internal) | 300 mm |
| Spindle Accuracy (ISO 4291 / JIS B7451) | (0.04 + 6H/10000) µm |
| Straightness (Z-axis) | 0.50 mm / 100 mm |
| Sensor Linear Range | ±400 µm |
| Stylus Tip | Ø1.6 mm sintered carbide sphere |
| Measuring Force | 70 mN |
| Filter Options | Digital 2RC & Gaussian filters |
| Rotational cutoffs | 15–500 undulations/rev |
| Axial cutoffs | 0.025–8 mm |
| Data Analysis | MZC, LSC, MIC, MCC, N.C. evaluation methods |
| Software Platform | ACCTee integrated measurement suite |
| Power Supply | AC 100 V, 50/60 Hz |
| Air Supply | 0.35–0.7 MPa, 30 L/min (NTP) |
| Dimensions (W×D×H) | 1800 × 1000 × 1700 mm |
| Mass | 120 kg |
| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | RONCOM 31C |
| Measurement Range (Max. Diameter) | Ø250 mm |
| Z-Axis Vertical Travel | 200 mm |
| R-Axis Radial Travel | 125 mm |
| Spindle Rotational Accuracy | (0.04 + 6H/10000) µm per ISO 4291 / JIS B7451 |
| Minimum Zone Circularity Deviation | (0.02 + 3H/10000) µm |
| Z-Axis Straightness | 0.50 mm / 100 mm |
| Sensor Linear Range | ±400 µm |
| Stylus Tip | Ø1.6 mm sintered carbide sphere |
| Measuring Force | 70 mN |
| Rotation Speed (θ-axis) | 6 rpm |
| Z-Axis Feed Speed (Measuring) | 0.6–5 mm/s |
| Air Supply Requirement | 0.35–0.7 MPa |
| Power Supply | AC 100 V, 50/60 Hz |
| Weight | 120 kg |
| Dimensions (W×D×H) | 1800 × 1000 × 1700 mm (with optional system stand) |
| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | RONCOM 41C |
| Rotary Axis (θ-axis) Speed | 6 rpm |
| Z-axis Travel | 200 mm |
| R-axis Radial Travel | 125 mm |
| Maximum Workpiece Diameter | Ø250 mm |
| Maximum Height (External) | 520 mm |
| Maximum Height (Internal) | 300 mm |
| Spindle Accuracy (ISO 4291 / JIS B7451) | (0.04 + 6H/10000) µm |
| Straightness (Z-axis) | 0.50 mm / 100 mm, 15 mm / 300 mm |
| Sensor Linear Range | ±400 µm |
| Stylus Tip | Ø1.6 mm Tungsten Carbide Sphere |
| Measuring Force | 70 mN |
| Filter Options | Digital 2RC & Gaussian |
| Cutoff Frequencies | 15–500 cycles/rev (rotary), 0.025–8 mm (axial) |
| Data Analysis | MZC, LSC, MIC, MCC, N.C. methods |
| Software Platform | ACCTee Integrated Measurement Suite |
| Power Supply | AC 100 V, 50/60 Hz |
| Air Supply | 0.35–0.7 MPa, 30 L/min (NTP) |
| Dimensions (W×D×H) | 1800 × 1000 × 1700 mm |
| Mass | 120 kg |
| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | RONCOM 41C |
| Rotary Axis Precision | (0.04 + 6H/10000) µm per ISO 4291/JIS B7451 |
| Z-Axis Travel | 200 mm |
| Maximum Workpiece Diameter | Φ250 mm |
| Maximum Height Measurement | Ø420 mm (OD) / Ø200 mm (ID) |
| Spindle Speed | 6 rpm |
| Z-Axis Measurement Speed | 0.6–5 mm/s |
| Radial (R-Axis) Travel | 125 mm |
| Pneumatic Supply | 0.35–0.7 MPa |
| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | RONCOM 43C |
| Maximum Measuring Diameter | Ø250 mm |
| Z-Axis Vertical Travel | 300 mm |
| R-Axis Radial Travel | 125 mm |
| Maximum Workpiece Height (OD/ID) | 520 mm / 300 mm |
| Spindle Accuracy (ISO 4291/JIS B7451) | (0.02 + 6H/10000) µm |
| Minimum Zone Circularity Deviation | (0.01 + 3H/10000) µm |
| Z-Axis Straightness | 0.25 µm/100 mm |
| Sensor Linear Range | ±400 µm |
| Stylus Tip | Ø1.6 mm Sintered Carbide Sphere |
| Measurement Force | 70 mN |
| Rotation Speed (θ-axis) | 6 rpm |
| Z-Axis Feed Speed (Measuring) | 0.6–6 mm/s |
| Air Supply | 0.35–0.7 MPa, 30 L/min (NTP) |
| Power | AC 100 V, 50/60 Hz, 600 VA |
| Dimensions (W×D×H) | 1800 × 1000 × 1700 mm |
| Mass | 130 kg |
| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | RONCOM 43C |
| Spindle Accuracy | (0.02 + 6H/10000) µm per ISO 4291/JIS B7451 |
| Max. Workpiece Diameter | Ø250 mm |
| Radial (R-axis) Travel | 125 mm |
| Vertical (Z-axis) Travel | 300 mm |
| Max. Height Measurement | Ø520 mm (OD) / Ø300 mm (ID) |
| Spindle Speed | 6 rpm |
| Z-axis Measurement Speed | 0.6–6 mm/s |
| Sensor Linear Range | ±400 µm |
| Stylus Tip | Ø1.6 mm sintered carbide sphere |
| Measuring Force | 70 mN |
| Filter Options | Digital 2RC & Gaussian, with cutoffs from 15 to 500 undulations/revolution (rotational) and 0.025 to 8 mm (axial) |
| Display | 15″ color LCD |
| Power Supply | AC 100 V, 50/60 Hz |
| Air Supply | 0.35–0.7 MPa, 30 L/min (NTP) |
| Footprint | 1800 × 1000 × 1700 mm (w/d/h) |
| Mass | 130 kg |
| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | RONCOM 44DX |
| Bearing Type | Hydrostatic Air Bearing |
| Radial Spindle Accuracy | (0.02 + 4H/10000) µm |
| Mounting Configuration | Offset-Type Chuck |
| Control Mode | Manual (R44), CNC-Enabled (with TIMS Software) |
| Software Platform | TIMS v8.x (Standard & Optional Modules) |
| Footprint Reduction | 25% vs. Prior Generation |
| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | RONCOM 44DX |
| Category | Precision Geometric Measurement Instrument for Roundness and Cylindricity |
| Bearing Type | Hydrostatic Air Bearing |
| Rotational Accuracy | (0.02 + 4H/10000) µm |
| Mounting Configuration | Offset-type Chuck with 80 mm Radial Probe Offset |
| Control Mode | Manual (R44), Optional CNC Automation |
| Software Platform | TIMS (Tokyo Seimitsu Integrated Measurement System) |
| Compliance | Designed for ISO 1101, ISO 5436-1, ASME Y14.5, and JIS B 0621 conformance |
| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | RONCOM 54 |
| Measurement Range | Max. Diameter Φ300 mm |
| Radial Travel (R-axis) | 170 mm |
| Vertical Travel (Z-axis) | 300 mm (500 mm with high column) |
| Max. Workpiece Diameter | Φ580 mm |
| Max. Height (OD) | 300 mm (500 mm with high column) |
| Spindle Accuracy (Rotational) | (0.02 + 4H/10000) µm per JIS B 7451-1997 (H = height from table to measurement point) |
| Axial Accuracy | (0.02 + 4H/10000) µm per JIS B 7451-1997 (H = distance from rotation center to probe point) |
| Z-axis Straightness | 0.12 µm/100 mm |
| R-axis Straightness | 0.8 µm/150 mm |
| Z-axis Parallelism | 0.8 µm/290 mm (1.18 µm/490 mm with high column) |
| R-axis Parallelism | 1.0 µm/150 mm |
| Radial Indication Accuracy | (2 + L/170) µm (L = measured length) |
| Rotation Speed (θ-axis) | 2–10 rpm (measurement) |
| Z-axis Traverse Speed | 0.5–6 mm/s (max 50 mm/s) |
| R-axis Traverse Speed | 0.5–6 mm/s (max 25 mm/s) |
| Auto-stop Positioning Accuracy | ±5 µm |
| Rotating Table Diameter | Φ220 mm |
| Centering/Tilt Adjustment Range | ±2 mm / ±1° |
| Max. Load Capacity | 30 kg |
| Stylus Force | 30–100 mN (adjustable) |
| Stylus Tip | Φ1.6 mm steel ball, 53 mm length |
| Data Points per Revolution | 14,400 |
| Digital Filter Types | Gaussian, 2RC, Multi-groove |
| Low-pass cutoffs | 15–1500 cycles/rev (rotational), 0.025–8 mm (axial) |
| Band-pass | 15–150, 15–500, 15–1500 cycles/rev (user-definable) |
| Measurement Range | ±1000 µm / ±200 µm |
| Evaluation Methods | MZC (Minimum Zone Circle), LSC (Least Squares Circle), MIC (Maximum Inscribed Circle), MCC (Minimum Circumscribed Circle), N.C. (No Correction), Multi (composite specification) |
| Measurable Parameters | Roundness, Flatness (single/multi-plane), Parallelism, Concentricity, Coaxiality, Cylindricity, Radial Runout, Perpendicularity, Thickness Variation, Total Runout, Radius Measurement, Partial Arc Analysis, Z-axis & R-axis Straightness, Axial Linearity, Cylindrical Surface Deviation |
| Analysis Functions | Auto-centering & auto-tilt correction, Groove profiling (vertical/angular/cursor-based), Combined roundness evaluation modes, Design nominal comparison, 3D cylindrical surface visualization (wireframe, shaded, contour), Real-time profile display, Profile-derived curves (bearing ratio curve, amplitude distribution, power spectral density), Wide-range assessment capability |
| Standard Features | Offset-type chuck holder included |
| Display | 17″ LCD showing measurement conditions, parameters, print settings, 2D/3D profiles, annotations, error logs |
| Output | Color or laser printer (SD card option for data export) |
| Power Supply | AC 220 V, 50–60 Hz ±10%, ~470 VA (excl. printer) |
| Pneumatic Supply | 0.35–0.7 MPa supply pressure |
| Dimensions (W×D×H)/Weight | DX type: 1500×925×1600 mm (1800 mm with column), 500 kg (510 kg) |
| SD type | 2050×900×1700 mm (1900 mm), 194 kg (204 kg) |
| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | RONCOM 54 |
| Maximum Measurable Diameter | Ø300 mm |
| Radial Travel (R-axis) | 170 mm |
| Vertical Travel (Z-axis) | 300 mm (500 mm with tall column) |
| Max. Workpiece Diameter | Ø580 mm |
| Max. Measurable Height | 300 mm (500 mm with tall column) |
| Spindle Accuracy (Rotational Axis) | (0.02 + 4H/10000) µm per JIS B 7451-1997 (H = height from table to measurement point) |
| Axial Accuracy | (0.02 + 4H/10000) µm per JIS B 7451-1997 (H = distance from rotation center to probe point) |
| Z-axis Straightness | 0.12 µm/100 mm |
| R-axis Straightness | 0.8 µm/150 mm |
| Z-axis Parallelism | 0.8 µm/290 mm (1.18 µm/490 mm with tall column) |
| R-axis Parallelism | 1.0 µm/150 mm |
| Radial Indication Accuracy | (2 + L/170) µm (L = measurement length in mm) |
| Rotation Speed (θ-axis) | 2–10 rpm during measurement |
| Z-axis Traverse Speed | 0.5–6 mm/s (max 50 mm/s) |
| R-axis Traverse Speed | 0.5–6 mm/s (max 25 mm/s) |
| Auto-Stop Positioning Accuracy | ±5 µm |
| Rotating Table Diameter | Ø220 mm |
| Centering & Tilt Adjustment Range | ±2 mm / ±1° |
| Max. Load Capacity | 30 kg |
| Stylus Force | 30–100 mN (adjustable) |
| Stylus Tip | Ø1.6 mm steel ball, 53 mm length |
| Data Points per Revolution | 14,400 |
| Digital Filter Types | Gaussian, 2RC, Multi-slot |
| Low-pass cutoffs | 15–1000 cycles/rev (rotational), 0.025–8 mm (axial) |
| Band-pass | 15–1500 cycles/rev |
| Measurement Range | ±1000 µm / ±200 µm |
| Evaluation Methods | MZC (Minimum Zone Circle), LSC (Least Squares Circle), MIC (Maximum Inscribed Circle), MCC (Minimum Circumscribed Circle), N.C. (No Correction), Multi (Composite Specification) |
| Measured Parameters | Roundness, Flatness (single/multi-plane), Parallelism, Concentricity, Coaxiality, Cylindricity, Radial Runout, Perpendicularity, Thickness Variation, Total Runout, Radius Measurement, Partial Arc Analysis, Z-axis & R-axis Straightness, Axial Linearity, Cylindrical Surface Deviation |
| Analysis Functions | Auto-centering & auto-tilt correction, Groove Detection (upper/lower limit, angular position, cursor-based), Combined roundness evaluation modes, Design Nominal Value Comparison, 3D Cylindricity Visualization (wireframe, shaded, contour), Real-time profile display, Profile Characterization (bearing ratio curve, amplitude distribution, power spectral density), Wide-range assessment capability, CNC-programmed automated measurement sequence |
| Standard Accessories | Offset-type chuck holder |
| Optional Upgrades | CNC-compatible offset chuck holder |
| Display | 17″ LCD monitor |
| Output | Color printer or laser printer (SD card optional) |
| Power Supply | AC 220 V, 50–60 Hz ±10%, ~470 VA (excl. printer) |
| Pneumatic Supply | 0.35–0.7 MPa supply pressure |
| consumption | 30 NL/min |
| Dimensions (W×D×H)/Weight | DX model: 1500×925×1600 mm (1800 mm with tall column), 500 kg (510 kg) |
| SD model | 2050×900×1700 mm (1900 mm), 194 kg (204 kg) |
| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | RONCOM 60A |
| Maximum Measurable Diameter | Ø420 mm |
| Radial (R-axis) Travel | 220 mm |
| Vertical (Z-axis) Travel | 500 mm |
| Maximum Workpiece Height (for roundness/coaxiality) | 700 mm |
| Maximum Workpiece Diameter | Ø680 mm |
| Spindle Accuracy per JIS B7451 | (0.020 + 6H/10000) mm (H = height in mm from turntable surface) |
| Digital Filter Options | 2RC/Gaussian (Rotational: 15–500 cyc/rev |
| Linear | 0.025–8 mm) |
| Probe Force | 70 mN |
| Spherical Tip | Ø1.6 mm Tungsten Carbide |
| Measurement Modes | Rotational (θ), Linear (Z), Combined Cylindricity |
| Software | Real-time Shape Display, Re-analysis of up to 40 Cross-sections, GD&T Compliant Reporting (ISO 1101, ASME Y14.5) |
| Brand | ACCRETECH (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | Rondcom 65B |
| Rotation Accuracy (Radial) | (0.01 + 4H/10,000) µm per JIS B 7451:1997 |
| Axial Accuracy | (0.03 + 4R/10,000) µm per JIS B 7451:1997 |
| Straightness (Z-axis, narrow range) | 0.05 µm/100 mm |
| Straightness (Z-axis, full range) | 0.2 µm/500 mm |
| Parallelism (Z-axis) | 1.5 µm/500 mm |
| Stylus Force | 30–100 mN (stepless adjustment) |
| Max Workpiece Diameter | φ68 mm |
| Max Height | 7800 mm |
| R-axis Travel | 220 mm |
| Z-axis Travel | 500 mm |
| Table Load Capacity | 60 kg |
| Power Supply | AC 100–240 V ±10%, 50/60 Hz |
| Air Supply | 0.5–0.7 MPa, consumption 49 NL/min |
| [Brand | ACCRETECH (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | ROUNDCOM Series |
| Type | CNC-Driven, Shop-Floor Hardened Coordinate Metrology System |
| Bearing Technology | Air-Bearing Spindle (Z & R Axes) |
| Rotation Accuracy | ≤0.01 µm (ROUNDCOM 65B), ≤0.02 µm (ROUNDCOM 60A/45A) |
| Max. Workpiece Load | 250 kg |
| Max. Measurable Diameter | Φ580 mm |
| Max. Measurable Height | 900 mm (Std.) |
| Control Mode | Fully Automatic CNC |
| Compliance | CE Marked |
| Standard Vibration Isolation | Integrated Air-Damped Granite Base |
| Sensor Mounting | Patented Dual-Axis Auto-Positioning Bracket (XY + YZ Rotational Degrees of Freedom) |
| Software Platform | TIMS — Total Integrated Measurement Suite] |
| Brand | ACCRETECH (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrumentation |
| Service Fee | USD 1,400–2,800 (excl. tax & travel) |
| Field Experience | 30 Years |
| Response Time | ≤7 Business Days |
| Compliance | ISO/IEC 17025-aligned Procedures |
| Environmental Requirements | 18–22 °C (±0.5 °C/h), 45–75% RH (non-condensing) |
| Power Supply Verification | 110–240 VAC, 50/60 Hz, L/N/E phase integrity, UPS mandatory |
| Preventive Maintenance Scope | Granite surface cleaning, linear guide & lead screw anti-corrosion, stylus handling protocol, thermal drift compensation calibration verification, vibration isolation assessment |
| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | SURFCOM 1800G |
| Z-axis Range | 800 mm (Profile) / 50 mm (Roughness) |
| X-axis Range | 100 mm (standard), up to 200 mm (optional -22 system) |
| Z-axis Indication Accuracy | ±0.25% FS (±4 µm within 5 mm range) |
| Z-axis Resolution | 0.1 µm (±2.5 mm), 0.4 µm (10 mm), 1 µm (±25 mm) |
| X-axis Indication Accuracy | ±(1 + 2L/100) µm (L in mm) |
| Straightness Accuracy | (0.05 + 1.5L/1000) mm |
| Measurement Principle | Differential Voltage (Z), Moiré Interferometric Scale (X) |
| Stylus Force | 0.75 mN (roughness), ≤30 mN (profile) |
| Stylus Radius | 2 µm (roughness), 25 µm (profile) |
| Stylus Material | Diamond (roughness), Tungsten Carbide (profile) |
| Vertical Feed Direction | Upward/Downward |
| Horizontal Feed Direction | Pull/Push |
| Filtering Standards | JIS B 0601:2001, ISO 4287, ISO 13565, ASME B46.1, DIN 4768, CNOMO |
| Roughness Parameters | Ra, Rq, Rz, Rmax, Rt, Rv, Rp, Rc, R3z, Sm, S, RDa, RDq, Rla, Rlq, Til, TA, lr, Pc, Rmr, tp2, Rmr2, Rdc, AVH, Hmax, Hmin, AREA, NCRX, R, Rx, AR, NR, CPM, SR, SAR |
| Profile Evaluation | Coordinate transformation, symmetry analysis, intersection detection (line-line, line-circle, circle-circle, etc.), GD&T deviation mapping with on-graph dimensioning, shape synthesis, CNC measurement replay, AI-assisted feature recognition |
| Software Compliance | Supports audit trail, user access control, and data integrity per FDA 21 CFR Part 11 requirements for regulated environments |
| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | SURFCOM 1800G |
| Z-Axis Range | 50 mm |
| X-Axis Range | 100 mm (200 mm optional) |
| Z-Axis Indication Accuracy | ±0.25% FS (±4 µm within 5 mm) |
| Z-Axis Resolution | 0.1 µm (±2.5 mm), 0.4 µm (10 mm), 1 µm (±25 mm) |
| X-Axis Indication Accuracy | ±(1 + 2L/100) µm (L in mm) |
| X-Axis Straightness | (0.05 + 1.5L/1000) mm |
| Measurement Principle | Contact stylus profilometry with Moiré fringe interferometric X-axis positioning and differential voltage displacement sensing on Z-axis |
| Stylus Force | 0.75 mN (standard), ≤30 mN (max) |
| Stylus Tip Radius | 2 µm or 25 µm (interchangeable) |
| Stylus Material | Diamond or superhard alloy |
| Traverse Speeds | 0.03–6 mm/s (8-step programmable) |
| Vertical Column Speed | 3 mm/s |
| Filter Types | 2RC standard, 2RC phase-corrected, Gaussian |
| Cutoff Wavelengths | 0.025–25 mm (7 standard values) |
| Standards Compliance | JIS B 0601:2001/1994/1982, ISO 4287, ISO 13565, DIN 4768, ASME B46.1, CNOMO |
| Roughness Parameters | Ra, Rq, Rv, Rp, Rc, Rz, Rmax, Rt, Rz(JIS), R3z, Sm, S, RDa, RDq, Rla, Rlq, Til, TA, lr, Pc, Rmr, tp2, Rmr2, Rdc, AVH, Hmax, Hmin, AREA, NCRX, R, Rx, AR, NR, CPM, SR, SAR |
| Profile Evaluation | Straightness, flatness, roundness, curvature, slope, angle, radius, distance, coordinate difference, polar coordinate difference, symmetry (point-point, point-circle, line-line, circle-circle, etc.), envelope wave profile, motif analysis (roughness & waviness), load curve, power spectral density (PSD), amplitude distribution |
| Software Functions | Auto-condition setup (patented AI function), CNC measurement sequence recording & playback, automatic feature recognition & dimensioning, shape synthesis, tilt compensation (linear, R-surface, front/rear/both-end, spline), macro programming, peak/valley search, workpiece trajectory mapping, design vs. actual comparison, mirror inversion |
| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | NEX |
| Type | Contact Profilometer / Surface Roughness Tester |
| Drive System | Patented Linear Motor-Based X-Axis Drive |
| Measurement Principle | Stylus-Based Profile Tracing with High-Resolution Vertical Displacement Sensing |
| Compliance | Designed for ISO 25178, ISO 4287, ISO 11562, ASME B46.1, and JIS B 0601 Standards |
| Software Platform | SURFCOM Data Analysis Suite with GLP/GMP-Ready Audit Trail (FDA 21 CFR Part 11 Optional) |
| Configuration | Integrated All-in-One Benchtop System (DX or SD variants) |
| Environmental Robustness | Vibration-Isolated Base with Optional PC Enclosure in Anti-Vibration Substructure |
| Brand | Accretech (Tokyo Seimitsu) |
|---|---|
| Origin | Japan |
| Model | SURFCOM Series |
| Type | CNC-Controlled Contact Profilometer with Dual-Mode Sensor Architecture |
| Axes | Up to 5-Axis Synchronized Motion |
| Max. Traverse Speed | 100 mm/s |
| Z-Range | Up to 60 mm (NEX040), 10 mm (CREST LP), 13 mm (CREST DX) |
| X-Range | Up to 200 mm |
| Vertical Resolution | 0.31 nm (CREST DX, laser interferometric sensor) |
| Z-Axis Resolution | 0.02 µm (NEX040, laser diffraction grating encoder) |
| Measurement Modes | Simultaneous roughness & contour (dual-sensor hybrid), upward measurement (with auto-stop), lateral tracing |
| Compliance | ISO 25178-605 (areal surface texture), ISO 4287/4288 (profile-based roughness), ISO 11562 (filtering), ISO 12781 (flatness), ISO 12780 (straightness) |
| Sensor Options | NEX001 (1000 µm range, 500,000× magnification), NEX030 (universal profilometry, high-accuracy linear scale), NEX040 (high-precision, auto-force adjustment), CREST LP (non-contact autofocus mode for low-reflectivity/color-insensitive surfaces) |
| Brand | Accretech Tokyo Seimitsu |
|---|---|
| Origin | Japan |
| Product Type | Contact Profilometer / Surface Roughness Tester |
| Operating Principle | Stylus-Based Profilometry |
| Model Variants | 1600G, S1400G, 1800G |
| Distribution Status | Authorized Distributor Supply |
| Compliance Context | Designed for ISO 4287, ISO 4288, ISO 25178-2, and JIS B 0601-compliant surface metrology |
| Brand | Accretech Tokyo Seimitsu |
|---|---|
| Origin | Japan |
| Product Type | Contact Profilometer / Surface Roughness Tester |
| Operating Principle | Stylus-Based Profilometry |
| Model Range | 1600G, S1400G, 1800G |
| Compliance | Designed for ISO 25178, ISO 4287, ISO 4288, and JIS B 0601-compliant surface metrology |