AEP Technology
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| Brand | AEP Technology |
|---|---|
| Origin | USA |
| Model | NANOMAP 500LS |
| Type | Contact-mode profilometer / surface roughness analyzer |
| Vertical Resolution | ≤0.1 nm |
| Lateral Scan Range (Tip Scan) | 10 µm × 10 µm to 500 µm × 500 µm |
| Lateral Scan Range (Stage Scan) | up to 50 mm |
| Maximum Vertical Dynamic Range | 500 µm |
| Measurement Speed | High-speed scanning from 1 nm to 10 mm profiles |
| Sample Handling | No specialized preparation required |
| Brand | AEP Technology |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | NANOMAP D |
| Price Range | USD 65,000 – 130,000 |
| Type | Non-contact + Contact Hybrid Profilometer / Surface Roughness & 3D Topography Analyzer |