Akrometrix
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| Brand | Akrometrix |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | AXP |
| Pricing | Available Upon Request |
| Brand | Akrometrix |
|---|---|
| Origin | USA |
| Model | Customized |
| Sample Size Range | 0.5 mm × 0.5 mm to 400 mm × 400 mm |
| Warpage Resolution | <1 µm |
| Data Acquisition Density | 1.4 million points per 2 seconds |
| Temperature Control | IR heating + convection cooling |
| Temp Range | −50 °C to 300 °C |
| Reflow Simulation Support | up to 300 °C |
| Brand | Akrometrix |
|---|---|
| Origin | USA |
| Model | TTSM |
| Measurement Principle | Non-contact shadow moiré interferometry |
| Temperature Range | Ambient to 300 °C (optional -50 °C to 300 °C) |
| Z-axis Resolution | ≤1.25 µm (AKM600P variant) |
| Field of View | Up to 600 mm × 600 mm (AKM600P), 48 mm × 64 mm (DFP), 70 mm circular (CRE) |
| Data Acquisition Speed | <2 s per full-field measurement (up to 1.4 million data points) |
| Compliance | JEDEC JESD22-B112, JEITA ED-7306, IPC TM-650 2.4.22 (Bow & Twist), IPC-9641, ASTM E2923 |