Benyuan Nano
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| Brand | Benyuan Nano |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Domestic (China) |
| Model | BY1000 |
| Price Range | USD 14,000 – 70,000 |
| Instrument Type | Scanning Tunneling Microscope (STM) |
| Position Detection Noise | 0.1 Å RMS |
| Maximum Sample Size | Ø45 mm × 15 mm |
| XY Sample Stage Travel Range | 100 mm × 100 mm |
| Brand | Benyuan Nano |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | BY3000 |
| Price Range | USD 14,000 – 72,000 |
| Instrument Type | Atomic Force Microscope (AFM) |
| Position Detection Noise | 0.1 nm |
| Maximum Sample Diameter | 45 mm |
| Maximum Sample Thickness | 15 mm |
| XY Sample Stage Travel Range | 100 mm × 100 mm |
| Brand | BENYUAN Nano |
|---|---|
| Model | CSPM5500 |
| Origin | Beijing, China |
| Instrument Type | Atomic Force Microscope (AFM) with integrated Scanning Tunneling Microscope (STM) and Lateral Force Microscope (LFM) |
| Position Detection Noise | 0.1 nm |
| Sample Diameter Limit | <102 mm (4 in) |
| Sample Thickness Limit | <40 mm |
| XY Sample Stage Travel Range | 100 mm × 100 mm |
| Maximum Z-Travel (Auto-Approach) | >30 mm |
| Image Resolution | Up to 4096 × 4096 physical pixels |
| Horizontal Resolution (AFM) | 0.2 nm (mica-calibrated) |
| Vertical Resolution (AFM) | 0.1 nm (mica-calibrated) |
| Horizontal Resolution (STM) | 0.1 nm (graphite-calibrated) |
| Vertical Resolution (STM) | 0.01 nm (graphite-calibrated) |
| Data Interface | Fast Ethernet (10/100 Mbps) or USB 2.0 |
| Real-Time 3D Visualization | Yes |
| PID-Controlled Force Feedback | Yes |