Freiberg Instruments
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| Brand | Freiberg Instruments |
|---|---|
| Origin | Germany |
| Model | MDPlinescan |
| Sample Type | Monocrystalline & Multicrystalline Silicon Wafers, Ingots, and Processed Substrates |
| Measurement Principle | µ-PCD (Microwave Photoconductance Decay) & Steady-State Photoconductance |
| Carrier Lifetime Range | 0.1 µs – 10 ms (typ.) |
| Resistivity Range | 0.2 – 10³ Ω·cm |
| Conductivity Type | p-type & n-type |
| Sample Dimensions | Up to 50 × 50 mm² |
| Hardware Interface | Ethernet (TCP/IP, Modbus TCP) |
| Power Supply | 24 V DC, 2 A |
| Dimensions | 174 × 107 × 205 mm |
| Weight | 3 kg |
| Compliance | CE, RoHS, IEC 61000-6-2/6-4 |
| Software Protocol | Standard OPC UA & RESTful API support |
| Brand | Freiberg Instruments |
|---|---|
| Origin | Germany |
| Model | MDPpro 850+ |
| Measurement Principle | Microwave Photoconductance Decay (µPCD) & Quasi-Steady-State Photoconductance (QSS-PCD/MDP) |
| Lifetime Range | 20 ns – 100 ms (for resistivity > 0.3 Ω·cm) |
| Scan Speed | Line scan < 30 s |
| Simultaneous Parameters | Minority carrier lifetime (µPCD/MDP), photoconductivity, resistivity |
| Sample Geometry Recognition | Automatic (G12, M10 bricks, wafers up to Ø300 mm) |
| Laser Sources | 980 nm IR diode (≤500 mW) + 905 nm IR diode (≤9 W) |
| Resistivity Range | 0.5 – 5 Ω·cm (custom ranges available) |
| Conductivity Type | p-type and n-type silicon |
| Compliance | SEMI PV9-1110, CE, ISO 9001 |
| Software Platform | MDP Studio (Windows 11+, .NET Framework, dual Ethernet) |
| Power Supply | 100–250 V AC, 6 A |
| Dimensions (W×H×L) | 2560 × 1910 × 1440 mm |
| Weight | ~200 kg |
| Brand | Freiberg Instruments |
|---|---|
| Origin | Germany |
| Model | MDPspot- |
| Minority Carrier Lifetime Range | 20 ns to several tens of ms |
| Penetration Depth | 500 µm |
| Sample Size | min. 50 × 50 mm², max. 12″ (300 mm) or 210 × 210 mm² |
| Resistivity Range | 0.2 – >10³ Ω·cm |
| Compatible Materials | Silicon, compound semiconductors, oxides, wide-bandgap materials, perovskites, epitaxial layers |