Hitachi
Filter
Showing all 5 results
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Type | Steady-State Fluorescence Spectrometer |
| Wavelength Scanning Speed | Up to 60,000 nm/min |
| Slit Width (Spectral Bandpass) | 1–20 nm |
| Excitation Source | Xenon Arc Lamp |
| Monochromator Type | Dual Grating |
| Detection Mode | Photon Counting with PMT |
| Dimensions & Weight | Approx. 2/3 volume and 30% less mass vs. F-4500 model |
| Software Compliance | FDA 21 CFR Part 11 (Audit Trail, Electronic Signature, User Access Control) |
| Linear Dynamic Range | 6 decades for calibration curve generation |
| Phosphorescence Measurement Capability | Extended time-gated detection up to seconds scale |
| Optional Module Support | Report Generator, Temperature-Controlled Cell Holder, Polarization Accessories, Microvolume Adapters |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Model | IM400II / ArBlade 5000 |
| Sample Stage Cooling | Yes (Optional) |
| Vacuum Transfer Capability | Yes (Optional) |
| Dual-Stage Milling Mode | Yes |
| Touchscreen Interface | Yes |
| Maximum Cross-Section Width | 8 mm (±5 mm Traverse Range) |
| Ion Gun Configuration | PLUS Ion Gun (IM400II), PLUS II Ion Gun (ArBlade 5000) |
| Compliance | Designed for SEM/TEM sample preparation per ISO 14644-1 Class 5 cleanroom-compatible operation |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Manufacturer | Hitachi High-Tech Corporation |
| Instrument Type | Post-Column Derivatization Amino Acid Analyzer |
| Model | LA8080 |
| Pump Flow Rate | 0.000–1.000 mL/min |
| Maximum Pump Pressure | 34 MPa |
| Autosampler Injection Volume | 0–100 µL |
| Autosampler Temperature Control | 4 °C and 10 °C |
| Post-Column Reactor Temperature Range | 50–140 °C |
| Detection Wavelengths | 570 nm and 440 nm |
| Flow Cell Volume | 8 µL |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Model | TM4000II / TM4000PlusII |
| Accelerating Voltage | 5 kV / 10 kV / 15 kV (4-step current adjustment per voltage) |
| Magnification Range | 10× to 100,000× |
| Detector Configuration | Quad-segment backscattered electron detector (BSE) |
| Sample Chamber Dimensions | Ø80 mm × 50 mm (max. height) |
| Imaging Modes | Conductive mode (TM4000PlusII), Standard mode, Charge-free mode |
| Software Features | SEM-MAP navigation, report-generation export (PDF/HTML), real-time BSE + SE image overlay (TM4000PlusII) |
| Camera Resolution | 2560 × 1920 (CCD) |
| EDS Compatibility | Integrated EDX interface |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Model | TMA7100 / TMA7300 |
| Temperature Range | –170 °C to 600 °C (TMA7100) |
| Displacement Range | ±5 mm |
| Sensitivity (RMS Noise) | 0.005 µm / Resolution: 0.01 µm |
| Load Range | ±5.8 N (Resolution: 9.8 µN) |
| Heating Rate | 0.01–100 °C/min |
| Sample Max Dimensions | Ø10 mm × 25 mm (cylindrical) or 5 mm × 1 mm × 25 mm (film) |
| Probe Mounting | Cantilever-type |
| Atmosphere Control | Ambient, inert gas, vacuum (~1.3 Pa), optional humidity & swelling modules |
| Load/Displacement Control Modes | Constant force, constant rate, oscillatory (0.001–1 Hz), multi-step sequences (up to 40 steps) |
| Optional Cooling | Automated LN₂ cooling (–150 °C to 600 °C), electronic cooler (–60 °C to 450 °C), forced-air cooling (RT–600 °C), LN₂ Dewar kit (–170 °C to 600 °C) |
| Sample Tube Materials | Quartz (TMA7100), Alumina (TMA7300) |
| Probe Types | Expansion/compression quartz, penetration (standard & conical), tensile (quartz & metal), bending, sapphire dilatometry |
