Hitachi High-Technologies
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| Brand | Hitachi High-Technologies |
|---|---|
| Origin | Japan |
| Model | S-3400N |
| Operating Age | ~10 years |
| Vacuum System | Turbo-molecular pump |
| SE Resolution | 3.0 nm @ 30 kV (high vacuum), 10 nm @ 3 kV (high vacuum) |
| BSE Resolution | 4.0 nm @ 30 kV (low vacuum) |
| Accelerating Voltage | 0.3–30 kV |
| Magnification | ×5 to ×300,000 |
| Max Sample Diameter | 200 mm |
| Stage Types | Manual (Type I) and Motorized 5-Axis (Type II) |
| Stage Travel (Type II) | X 0–100 mm, Y 0–50 mm, Z 5–65 mm, R 360°, T –20° to +90° |
| Max Sample Height | 80 mm (WD = 10 mm) |
| Detector Configuration | High-sensitivity semiconductor BSE detector (5-segment), Everhart-Thornley SE detector |
| Analytical Compatibility | Simultaneous EDX, WDX, and EBSD integration supported |
| Beam Control | Auto filament saturation, auto gun alignment, auto stigmation, auto focus, auto brightness/contrast, manual & automatic beam current adjustment, fixed-ratio & manual & auto 4-quadrant biasing |
| Aperture | Movable 4-position objective aperture |
| Brand | Hitachi High-Technologies |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Category | Imported Instrument |
| Model | HITACHI SU-3500 |
| Price | USD 62,500 (FOB Yokohama) |
| Operational Age | 5 years |
| Secondary Electron Resolution | 3 nm @ 30 kV, 7.0 nm @ 3 kV |
| Backscattered Electron Resolution | 4.0 nm @ 30 kV, 10.0 nm @ 5 kV |
| Magnification Range | 5× to 300,000× (typical working range: 20×–50,000× for standard bulk samples) |
| Accelerating Voltage | 0.3–30 kV |
| Detector Configuration | In-lens SE detector, Everhart-Thornley SE detector, solid-state BSE detector |