JEOL
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| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | CRYO ARM™ 200 II (JEM-Z200CA) |
| Acceleration Voltage | 200 kV |
| Magnification Range | ×100 to ×1,000,000 |
| Spherical Aberration Coefficient (Cs) | 1.5 mm |
| Chromatic Aberration Coefficient (Cc) | 1.8 mm |
| Specimen Temperature | ≤100 K |
| Sample Storage Capacity | Up to 12 cryo-samples |
| Energy Filter | Integrated Omega-type Energy Filter |
| Optional Software | JEOL Automated Data Acquisition System (JADAS) |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JBX-9500FS |
| Acceleration Voltage | 100 kV |
| Maximum Substrate Size | 300 mm Ø wafers or 6-inch masks |
| Maximum Field Size | 1000 µm × 1000 µm |
| Stage Travel Range | 260 mm × 240 mm |
| Minimum Positioning Unit (LBC) | 0.15 nm (λ/4096) |
| Overlay Accuracy | ≤ ±11 nm |
| Field Stitching Accuracy | ≤ ±10 nm |
| In-Field Placement Accuracy | ≤ ±9 nm |
| Position DAC Resolution | 20-bit |
| Scan DAC Resolution | 14-bit |
| Scan Step Size | 0.25 nm |
| Maximum Scan Rate | 100 MHz |
| Electron Source | ZrO/W Schottky Emitter |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JEM-2800 |
| Point Resolution | 0.21 nm |
| Lattice Resolution | 0.10 nm |
| STEM Resolution | 0.16 nm |
| Secondary Electron Resolution | 0.5 nm |
| EDS Configuration | Dual Ultra-High-Sensitivity Silicon Drift Detectors (SDD) |
| Lorentz Mode | Standard Equipment |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Instrument Type | Continuous-Wave (CW) ESR |
| Models | JES-X310, JES-X320 |
| Control System | Fully Computer-Controlled |
| Magnetic Field Control | Advanced Digital Gradient-Stabilized Electromagnet System |
| Operating Mode | X-band (9–10 GHz) |
| Detection Method | Phase-Sensitive Lock-in Detection with Field Modulation |
| Cryogenic Compatibility | Optional Liquid Nitrogen and Helium Cryostat Integration |
| Safety Compliance | IEC 61010-1, CE Marked |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JNM-ECZL400R |
| NMR Frequency | 400 MHz (¹H) |
| Magnet Type | Superconducting, Cryogen-Free Option Available |
| Field Homogeneity | < 0.1 Hz/30 min (shimmed) |
| Temperature Control Range | –140 °C to +140 °C |
| Sample Format | Solid, Semi-Solid, Gel, Liquid, and Heterogeneous Samples |
| Probe Compatibility | Broadband Solid-State MAS Probes (e.g., 2.5–4 mm rotors), Static & Variable-Temperature Configurations |
| Optional FFC Module | SPINMASTER FFC2000 (0.01–42 MHz field-cycling range) |
| Optional SMARTracer Module | 0.1–10 MHz |
| Optional 3 T Permanent Magnet Add-on | Extends ¹H Larmor frequency to ~130 MHz |
| Sample Tube Standard | 4 mm or 3.2 mm ZrO₂ MAS rotors (solid) |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JSM-7001F |
| Vacuum Mode | High Vacuum / Low Vacuum (up to 50 Pa) |
| Resolution | 3.0 nm @ 30 kV (Backscattered Electron Imaging) |
| Sample Chamber Diameter | Up to 200 mm |
| Stage | Motorized 5-axis (X, Y, Z, Tilt, Rotation) |
| Detector Compatibility | EDS, WDS, EBSD, CL, SE, BEI |
| Operating System | Windows XP (original factory configuration) |
| Gun Chamber Pressure | ≤5 × 10⁻⁷ Pa |
| Recommended Gas for LV Mode | Dry Nitrogen |
| Instrument Age | ~10 years |
| Condition | Refurbished & Functionally Verified |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JSM-7610FPLUS |
| Year of Manufacture | 2017 |
| Operational Age | 5 years |
| Vacuum System | Turbo-molecular + Ion Pump |
| Max Magnification | 1,000,000× |
| Resolution (SE) | 0.8 nm @ 15 kV, 1.0 nm @ 1 kV |
| Acceleration Voltage | 100 V – 30 kV |
| Electron Source | Schottky Thermal Field-Emission Gun |
| Beam Current | Up to 200 nA |
| Working Distance | 8 mm |
| Stage | 5-axis Motorized, ±5° to +70° tilt, 360° rotation |
| EDS Detector Area | ≥20 mm², Be–Am detection range, Mn-Kα resolution ≤127 eV |
| EBSD Compatibility | Yes |
| Compliance | ASTM E1558, ISO 16700, IEC 61000-4-5 (EMC), GLP-ready data logging |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JSM-IT100 |
| Vacuum Modes | High Vacuum & Low Vacuum (10–300 Pa) |
| Resolution | 3 nm @ 30 kV (HV), 4 nm @ 30 kV (LV) |
| Acceleration Voltage | 0.5–30 kV (optional extension to 30 kV) |
| Magnification | ×5 to ×300,000 |
| Stage Travel | X 80 mm, Y 40 mm, Z 5–48 mm, Tilt −10° to +90°, Rotation 360° |
| Max Sample Diameter | 150 mm |
| EDS Functions | Point analysis, elemental mapping, line scan, real-time filtering |
| Detector Options | Dry SD (10/30/60/100 mm² active area) |
| Software | InTouchScope™ GUI with integrated SEM/EDS workflow |
| Power Requirement | 100 V AC, no cooling water required |
| Footprint | ~30% smaller than prior JEOL benchtop SEMs |
| Operational Age | 2 years |
| Compliance | Designed per JEOL’s internal quality system aligned with ISO 9001 |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JSM-IT200 |
| Instrument Age | 2 years |
| Configuration | Standard SEM + EDS (Energy Dispersive X-ray Spectroscopy) |
| Vacuum Mode | High Vacuum & Low Vacuum (LA) compatible |
| Sample Stage | Motorized Tilt/Rotation/XYZ |
| CCD Navigation Camera | 5 MP, 6 × 4.5 cm FOV, Digital Zoom up to ×20 |
| Software Platform | SMILE VIEW™ Lab |
| Compliance | Fully serviceable per JEOL OEM maintenance protocols |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JXA-8230 |
| Accelerating Voltage | 0.2–30 kV (0.1 kV step) |
| Beam Current Range | 1×10⁻¹² – 1×10⁻⁵ A |
| Beam Current Stability | ±5% / h, ±0.3% / 12 h |
| Secondary Electron Resolution | 6 nm (W filament, WD = 11 mm, 30 kV) |
| Magnification | ×40 – ×300,000 |
| Max. Sample Size | 100 mm × 100 mm × 50 mm (H) |
| WDS Elemental Range | Be*¹–U (Be requires optional crystal) |
| EDS Elemental Range | B–U |
| WDS Wavelength Range | 0.087–9.3 nm |
| EDS Energy Range | 0–20 keV |
| WDS Spectrometers | 1–5 channels (configurable) |
| EDS Detector | 1 SDD (optional fanless digital pulse processor) |
| Display | Dual LCDs (1280×1024), dedicated for EPMA analysis and SEM/EDS operation |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | SXES |
| Energy Resolution | 0.3 eV (at Al-L edge, 73 eV) |
| Detection Energy Range | 50–170 eV (JS50XL grating) / 70–210 eV (JS50XL grating) |
| Mounting Interface | EPMA WDS Port #2 (front right) or FE-SEM WDS port (front left-rear) |
| Dimensions (W×D×H) | 168 mm × 348 mm × 683 mm (including CCD distance from interface) |
| Weight | 25 kg |
| Compatible Instruments | EPMA — JXA-8530F, JXA-8230, JXA-8500F, JXA-8200 |