KP (UK)
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| Brand | KP (UK) |
|---|---|
| Origin | United Kingdom |
| Model | HVKP |
| Vacuum Compatibility | UHV (≤1×10⁻¹⁰ mbar) |
| Measurement Principle | Non-contact, vibrating capacitor-based Kelvin probe force microscopy (KPFM) with off-null detection |
| Work Function Resolution | 1–3 meV (2 mm tip), 5–10 meV (50 µm tip) |
| Tip-to-Sample Distance Control | Down to 400 nm with patented Height Regulation (HR) mode |
| Spatial Resolution | Sub-micron (dependent on tip geometry and vacuum conditions) |
| Detection Mode | Off-Null (ON) signal amplification |
| Actuation | Voice-coil (VC) driver |
| Data Output | Digital export to Excel, Origin, or third-party analysis software |
| Compliance | Designed for GLP/GMP-aligned surface science workflows |
| Brand | KP (UK) |
|---|---|
| Origin | United Kingdom |
| Model | KP020 |
| Environment | Ambient & Controlled Atmosphere |
| Probe Options | 2 mm & 50 µm tip diameters |
| Work Function Resolution | 1–3 meV (2 mm tip), 5–10 meV (50 µm tip) |
| Tip-to-Sample Distance Control | Down to ≤400 nm |
| Height Regulation Mode (HR) | Active feedback-controlled vertical positioning |
| Detection Principle | Off-Null (ON) non-zero signal detection |
| Actuation | Voice-coil (VC) driver |
| Digital Control | Full digital parameter management (DC, SM, SA, WA, QT, DE, OC, FC, RS) |
| Software Export | Excel, Origin, third-party formats |
| Compliance | Designed for GLP-aligned surface potential mapping and work function metrology |