NT-MDT
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| Brand | NT-MDT |
|---|---|
| Origin | Russia |
| Model | Solver Next |
| Instrument Type | Atomic Force Microscope |
| Z-direction Position Detection Noise | 0.02 nm (low-current mode) |
| Maximum Sample Dimensions | Ø ≤ 20 mm, Height ≤ 10 mm |
| XY Sample Stage Travel Range | 5 mm × 5 mm |
| Scan Range (Closed-loop) | 100 µm × 100 µm × 10 µm |
| Z-noise (RMS, 10–1000 Hz) | ≤ 0.04 nm (closed-loop), 0.02 nm (low-current mode) |
| XY Nonlinearity | ≤ 0.1% (closed-loop) |
| Video Microscope Resolution | 2 µm |
| Temperature Control Range | Room Temperature to 150 °C |
| Brand | NT-MDT |
|---|---|
| Origin | Imported |
| Manufacturer Type | Authorized Distributor |
| Model | Solver P47-Pro |
| Pricing | Available Upon Request |
| Measurement Modes | STM, AFM (Contact/Tapping/Non-contact), LFM, Phase Imaging, Force Modulation, Force Spectroscopy, Adhesion Mapping, MFM, EFM, Kelvin Probe, SSRM, Nanoindentation, Voltage/Force Nanolithography |
| Scanning Configurations | Sample Scanning, Tip Scanning, Dual-Scan Option |
| Max Sample Size (Sample Scan) | Ø40 mm × 10 mm |
| XY Sample Positioning Range | 5 × 5 µm |
| Positioning Accuracy | ±5 µm |
| Environmental Operation | Ambient Air, Controlled Atmosphere, Liquid Cell Compatible |
| Temperature Control | Room Temperature to 130 °C |
| Optical System | Custom-Configurable |
| SPM Techniques Supported | >40 Quantitative Modes |