Oxford Instruments
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| Brand | Oxford Instruments |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | alphaCART |
| Instrument Type | Portable Confocal Raman Microscope |
| Laser Options | 532 nm, 633 nm, 785 nm (custom wavelengths available) |
| Spectral Range | ~90–3500 cm⁻¹ (laser-dependent) |
| Spatial Resolution | Diffraction-limited |
| Spectral Resolution | High across full range |
| Detector | Scientific-grade low-noise CCD spectrometer camera |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | BC43 SR |
| Pixel Size | 6.5 µm |
| Resolution | 2040 × 1992 (4.1 MP) |
| Excitation Lasers | 405 nm, 488 nm, 561 nm, 639 nm |
| Scanning Mode | XYZ |
| Objective Lenses | 10×, 20×, 40×, 60×, 100× |
| Software & Workstation | Imaris image analysis software |
| Vibration Isolation | Integrated active/passive damping platform |
| XY Stage Control | Motorized |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Andor Dragonfly |
| Software | Imaris (3D/4D image analysis), Fusion (acquisition & processing) |
| Imaging Modes | Laser Scanning Confocal, Widefield + GPU-Accelerated Deconvolution (ClearView-GPU™), TIRF (chromatically corrected), HILO, SRRF-Stream®, dSTORM, Iterative Deconvolution |
| Max Frame Rate | 400 fps (Dragonfly 200 series) |
| Detector Compatibility | EMCCD and sCMOS cameras |
| Core Technology | Microlens-based parallel confocal scanning head with Borealis™ uniform illumination |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | iDus |
| Effective Pixels | 1024 |
| Pixel Size | 25 µm |
| Cooling | TE-cooled to –100 °C (iDus 401/420), –95 °C (iDus 416), –90 °C (iDus 491/492) |
| Sensor Types | Back-illuminated deep-depletion CCD, front-illuminated CCD, InGaAs (1.7 µm & 2.2 µm cutoff) |
| Peak Quantum Efficiency | up to 95% (CCD), >85% (1.7 µm InGaAs), >70% (2.2 µm InGaAs) |
| Key Technology | UltraVac™ vacuum architecture, single fused-silica window, fringe suppression, open-electrode design (optional) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | iStar |
| Sensor Resolution | 1024 × 1024 pixels |
| Pixel Size | 13 µm |
| Active Sensor Area | 13.3 mm × 13.3 mm |
| Onboard Memory | 2 GB |
| Readout Speed | 5 MHz |
| Quantum Efficiency | >50% |
| Gating Width | <2 ns |
| Minimum Inter-Frame Interval (PIV mode) | 300 ns |
| Frame Rate (full frame) | up to 4,000 fps |
| Interface | USB 3.0 |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Marana 4.2B-11 |
| Image Resolution | 4.2 MP (2048 × 2048) |
| Pixel Size | 11 µm |
| Sensor Format | 22.5 mm × 22.5 mm (32 mm diagonal) |
| Readout Speed | 100 MHz (16-bit mode) |
| Dynamic Range | 53,000:1 |
| Quantum Efficiency | 95% @ peak (600 nm) |
| Cooling | -45 °C (thermo-electric vacuum-sealed) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Mechelle 5000 |
| Wavelength Range | 200–975 nm |
| Optical Configuration | Fixed-grating, pre-aligned echelle spectrograph |
| Detector Integration | Integrated CCD/CMOS detector option |
| Cooling | Thermoelectric (TE) cooled detector |
| Purge Environment | N₂-purged optical path |
| Temperature Stabilization | Auto-temperature correction system |
| Mechanical Design | Compact, rigid monolithic housing |
| Moving Parts | None |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Newton |
| Sensor Pixel Size | 13.5 × 13.5 µm or 26 × 26 µm |
| Cooling | Thermoelectric (TE) to –100°C |
| Readout Speed | Multi-Megahertz (up to 3 MHz) |
| Quantum Efficiency | Up to 95% |
| Vacuum Technology | UltraVac™ |
| Sensor Architecture | EMCCD or conventional CCD |
| Spectral Acquisition Rate | >1600 spectra/sec (Newton 920) |
| Pixel Array Options | 1024 × 255, 2048 × 512, or 1600 × 400 |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Zyla 4.2 PLUS sCMOS |
| Image Resolution | 2048 × 2048 |
| Pixel Size | 6.5 µm |
| Sensor Area | 13 mm × 13 mm |
| Onboard Memory | 4 GB |
| Readout Speed | 540 MHz |
| Dynamic Range | 33,000:1 |
| Quantum Efficiency (QE) | 82% |
| Interface | USB 3.0 |
| Full-Frame Frame Rate | 53 fps |
| FCS ROI Frame Rate (2048 × 8) | 26,041 fps |
| Read Noise | < 1 e⁻ |
| Linearity | 99.8% |
| Brand | Oxford Instruments |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | GetReal |
| Price Range | USD 13,500 – 68,000 |
| Instrument Type | AFM Calibration Module |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Imaris |
| Price | Contact for Quote |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Model | 5000 Series |
| Max Anode Current | 1.0 mA |
| Max Anode Voltage | 50 kV |
| Max Power | 50 W |
| Filament Nominal Voltage | 2.0 V @ 50 kV, 1 mA |
| Filament Max Current | 1.7 A |
| Stability (4 hr) | ±0.2% |
| Nominal Focal Spot Size | 110 µm |
| Anode Material Options | W, Mo, Rh (custom anodes available) |
| Beryllium Window Thickness Options | 75 µm, 125 µm, 250 µm |
| Approx. Weight | 1.816 kg (4 lbs) |
| Cooling Method | Compressed Air @ 150 CFM |
| Beam Divergence Angle | 25° |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | ALD OpAL |
| Substrate Size | Up to 200 mm |
| Process Temperature | Up to 200 °C |
| Precursor Sources | Up to 4 (liquid or solid) |
| Plasma-Enhanced ALD Capability | Optional, field-upgradable |
| Chamber Design | Direct-load, open-frame thermal ALD platform |
| Safety Integration | Compatible with N₂-purged gloveboxes and exhaust hoods |
| Service Support | Lifetime process support, including new recipe development and material-specific optimization guidance |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | BC43 |
| Imaging Modes | Confocal, Widefield, Brightfield & Differential Phase Contrast (DPC) Transmission |
| Illumination Technology | Patented Borealis™ Uniform Illumination |
| Z-Stack Speed | ≥10× faster than point-scanning confocal systems |
| Software Platform | ANDOR Fusion (GPU-accelerated deconvolution, multi-position montage, hardware-synchronized 3D stitching) |
| Compliance | Designed for GLP/GMP-aligned workflows |
| Physical Design | Compact benchtop architecture with integrated vibration damping and optical sealing — no darkroom or optical table required |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | iKon-M (912 & 934 variants) |
| Sensor Format | 512 × 512 (iKon-M 912) / 1024 × 1024 (iKon-M 934) |
| Effective Pixels | 4 Megapixel (iKon-M 934) |
| Pixel Size | 24 µm (iKon-M 912) / 13 µm (iKon-M 934) |
| Quantum Efficiency | >90% (iKon-M 912), up to 95% (iKon-M 934) |
| Read Noise | ≤3 e⁻ RMS |
| Full Well Capacity | 300,000 e⁻ (iKon-M 912) |
| Cooling | TE-cooled UltraVac™ vacuum enclosure to –100 °C |
| Readout Speeds | 50 kHz to 5 MHz |
| Dark Current | <0.0001 e⁻/pix/sec at –100 °C |
| Compliance | CE, RoHS, ISO 9001 certified manufacturing |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | iKon-XL CCD |
| Price Range | USD 13,500 – 68,000 (est.) |
| Effective Pixels | 16.8 Megapixel |
| Pixel Size | 15 × 15 µm |
| Sensor Type | Back-Illuminated CCD (e2v CCD231-84 or CCD230-84) |
| Cooling Method | Thermoelectric (TE) with ColdSpace™ |
| Operating Temperature | −100 °C |
| Quantum Efficiency | Up to 95% (deep-depletion NIR-enhanced) |
| Read Noise | ≤ 2.1 e⁻ |
| Full Well Capacity | 350,000 e⁻ |
| Digitization | 18-bit ADC |
| Interface | USB 3.0 or Fiber Optic |
| Readout Modes | Single-channel or Quad-channel (quadrant-balanced) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | iXon 888 |
| Pixel Size | 13 µm |
| Sensor Type | Back-Illuminated Electron-Multiplying CCD |
| Quantum Efficiency | >95% (peak) |
| Cooling | Thermoelectric (−80 °C typical operating temperature) |
| Readout Modes | EMCCD and conventional CCD |
| Frame Rate | Up to 30 fps at full resolution (configurable via ROI and binning) |
| Interface | USB 3.0 |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model | Marana 4.2B-6 |
| Image Resolution | 2048 × 2048 |
| Pixel Size | 6.5 µm × 6.5 µm |
| Sensor Active Area | 13.3 mm × 13.3 mm |
| Onboard Memory | 1 GB |
| Readout Speed | 310 MHz |
| Dynamic Range | 34,000:1 |
| Quantum Efficiency | 95% |
| Cooling Temperature | −45 °C |
| Full-Frame Frame Rate | 74 fps |
| ROI (512 × 512) Frame Rate | 397 fps |
| Read Noise | 1.2 e⁻ |
| Vacuum-Sealed Housing | Yes |
| Mechanical Shutter | None |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Sona 4.2B-6 |
| Image Resolution | 2048 × 2048 |
| Pixel Size | 6.5 µm × 6.5 µm |
| Sensor Dimensions | 13.3 mm × 13.3 mm |
| Onboard Memory | 1 GB |
| Readout Speed | 310 MHz |
| Dynamic Range | 34,000:1 |
| Quantum Efficiency | 95% |
| Brand | Oxford Instruments |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | blueDrive |
| Price Range | USD 13,500 – 68,000 |
| Instrument Type | AFM Accessory |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Cypher ES EC-AFM |
| Price Range | USD 340,000 – 410,000 (FOB) |
| Instrument Type | Atomic Force Microscope (AFM), Materials-Focused |
| Position Detection Noise | 625 Hz (RMS, bandwidth-corrected) |
| Sample Dimensions | Ø < 15 mm, Thickness < 5 mm |
| XY Stage Scan Range | 180 µm × 180 µm (optical field of view), with full 180 mm × 180 mm motorized sample positioning area |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Cypher S |
| Instrument Type | Materials-Focused AFM |
| Closed-Loop Noise (X,Y) | <0.06 nm |
| Closed-Loop Noise (Z) | <0.05 nm |
| Height Noise | <0.015 nm |
| Sample Diameter | <15 mm (standard), <7 mm (high-stability configuration) |
| XY Stage Travel Range | 180 mm × 180 mm |
| Imaging Speed | Up to 10–100× faster than conventional AFMs |
| Probe Compatibility | Supports ultra-small probes (e.g., 3 × 9 µm optical spot size, optional) |
| Environmental Flexibility | Upgradeable to Cypher ES (environmental control) and Cypher VRS (video-rate scanning) |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Model | Cypher VRS |
| Instrument Type | Material-Focused Atomic Force Microscope |
| XY Positional Noise | <60 pm |
| Z Positional Noise | <50 pm |
| Maximum Sample Diameter | ≤15 mm |
| Maximum Sample Thickness | ≤7 mm |
| Sample Stage Travel Range | 180 mm × 180 mm |
| Scan Speed | Up to 625 lines/sec |
| Frame Rate | >10 fps at 512×512 pixel resolution |
| Excitation Method | blueDrive™ Photothermal Actuation |
| Compliance | ASTM E2539, ISO/IEC 17025-compatible operation, GLP/GMP-ready data integrity architecture |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Fast-Scan Scanning Capacitance Microscope (SCM) |
| Price Range | USD 25,000 – 65,000 |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Jupiter XR |
| Price Range | USD 320,000 – 385,000 |
| Instrument Type | Atomic Force Microscope (AFM) |
| Application Class | Materials Science AFM |
| Position Detection Noise | 35 pm |
| Maximum Sample Diameter | 210 mm |
| XY Stage Travel Range | 200 mm × 200 mm |
| Scan Range | Up to 100 μm (full closed-loop) |
| Imaging Speed | 5–20× faster than conventional large-sample AFMs |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | MFP-3D |
| Price Range | USD 135,000 – 205,000 (FOB) |
| Instrument Type | Atomic Force Microscope (AFM) |
| Application Class | Materials Science AFM |
| Z-Axis Positioning Noise | < 0.06 nm (RMS, in air) |
| X/Y Closed-Loop Scanning Noise | < 0.5 nm (RMS) |
| Sample Diameter | ≤ 80 mm |
| Sample Thickness | ≤ 25 mm |
| Visual Field of View | 200 mm × 200 mm (XY stage travel with optical alignment) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Scanning Microwave Impedance Microscopy (sMIM) |
| Instrument Type | Scanning Probe Microscope |
| Application Domain | Nanoscale Electrical Characterization |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Vero |
| Price | Upon Request |
| Instrument Type | Atomic Force Microscope (AFM) |
| Application Class | Materials Science AFM |
| Position Detection Noise | X&Y Sensor Noise < 60 pm, Z Sensor Noise < 50 pm |
| Sample Dimensions | Up to 15 mm in diameter, 7 mm in thickness |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | AZtecBattery |
| Detector Compatibility | Ultim Max / Xplore / UltimExtreme EDS detectors |
| Maximum Field Count | 10,000 fields per sample |
| Max Particle Count | 200,000 particles per sample |
| Throughput | Up to 30,000 particles/hour |
| EDS Count Rate Capability | Up to 400 kcps |
| Effective Detector Area | Up to 170 mm² |
| Software-Enabled Capabilities | Automated particle detection, multi-threshold contrast segmentation, morphology-based filtering, Z-focus stabilization across large-area scans, cross-field particle reconstruction, customizable classification logic, ASTM/ISO-compliant reporting templates, FDA 21 CFR Part 11-ready audit trail (optional configuration) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | AZtecFeature |
| Instrument Type | Benchtop SEM-EDS System |
| Electron Source | Tungsten Filament |
| Secondary Electron Resolution | 1.0 nm @ 15 kV, WD = 4 mm |
| Magnification Range | 20–2,000× (low mag) |
| Accelerating Voltage | 1–30 kV |
| Backscattered Electron Resolution | 4 nm @ 30 kV (low-vacuum mode) |
| Detector Configuration | Up to four Ultim Max SDDs supported |
| Real-time Particle Counting Capacity | Up to 200,000 particles per sample |
| Data Acquisition & Quantification Engine | Tru-Q® automated elemental identification and quantification |
| Peak Deconvolution | Advanced sum-peak correction for high-count-rate accuracy |
| Software Architecture | Native 64-bit multithreaded processing |
| Compliance | ASTM E1588–10e1 (GSR), ISO 16232 (cleanliness), VDA 19.1, USP <788>, GLP/GMP-aligned audit trail support |