Oxford Instruments
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Showing 91–108 of 108 results
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Ultim Max |
| Detector Type | Tilting Insertion Mount |
| Energy Resolution | 127 eV (Mn Kα) |
| Peak-to-Background Ratio | 200,000:1 |
| Maximum Count Rate | 1,500,000 cps |
| Elemental Detection Range | Be to Cf |
| Active Detector Area | 40–170 mm² |
| Window Type | Super-Atmospheric Thin Window (SATW) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Ultim Max TLE |
| Instrument Type | Side-Insertion EDS Detector |
| Energy Resolution | 125 eV (Mn Kα) |
| Peak-to-Background Ratio | 200,000:1 |
| Maximum Count Rate | >200,000 cps (Xplore TEM), up to 400,000 cps (Ultim Max TLE, quantitative mode) |
| Elemental Detection Range | Beryllium (Be) to Californium (Cf) |
| Active Detector Area | 80 mm² (Xplore TEM), 100 mm² (Ultim Max TLE) |
| Window Type | Windowless |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | UltimMax TEM |
| Instrument Type | Side-entry (tilt-compatible) |
| Energy Resolution | 125 eV (Mn Kα) |
| Peak-to-Background Ratio | 200,000:1 |
| Maximum Count Rate | 400,000 cps |
| Elemental Detection Range | Be to Cf |
| Detector Active Area | 80 mm² |
| Window Type | Windowless |
| Solid Angle | 0.2–0.6 srad |
| Low-Energy X-ray Sensitivity Gain | Up to 8× vs. conventional windowed detectors |
| In Situ Operation Temperature | Up to 1000 °C |
| Compatible Accelerating Voltages | Up to 200 kV |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | UltimMax TLE |
| Detector Type | Tilting Insertion Geometry |
| Energy Resolution | 125 eV (Mn Kα) |
| Peak-to-Background Ratio | 200,000:1 |
| Maximum Input Count Rate | 400,000 cps |
| Elemental Detection Range | Be to Cf |
| Active Detector Area | 100 mm² |
| Window Type | Windowless |
| Solid Angle | 0.5–1.1 srad |
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | General Distributor |
| Origin Category | Imported |
| Model | UltraBright |
| Price Range | USD 0 – 9,999 |
| Max Anode Current | 1.0 mA |
| Max Anode Voltage | 50 kV |
| Max Power | 50 W |
| Filament Nominal Voltage | 2.0 V @ 50 kV, 1 mA |
| Filament Max Current | 1.7 A |
| Stability (after 4 hrs) | ±0.2% |
| Nominal Focal Spot Size | 110 µm |
| Anode Materials | W, Mo, Rh (custom options available) |
| Beryllium Window Thickness | 125 µm (optional: 75 µm or 250 µm) |
| Approx. Weight | 1.816 kg (4 lbs) |
| Cooling Method | Compressed Air @ 150 CFM |
| Beam Divergence Angle | 25° |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Unity |
| Mounting Type | Side-entry (inclined insertion) |
| Detector Architecture | Integrated Backscattered Electron (BSE) and Energy-Dispersive X-ray (EDS) Sensor Assembly |
| Positioning | Mounted directly beneath the objective lens pole piece |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | WITec alpha360 Raman Imaging Microscope |
| Pricing | Available Upon Request |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | X-Pulse 90 |
| Instrument Type | High-Field Benchtop NMR Spectrometer |
| Sensitivity | 240:1 for 1% ethylbenzene |
| Resolution | < 0.35 Hz (50% peak height) / < 15 Hz (0.55% peak height) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | X-Pulse |
| Instrument Type | Low-Field NMR Analyzer |
| Sample Form | Liquid |
| Operating Frequency | 60 MHz |
| Data Acquisition Mode | Pulsed Fourier Transform |
| Signal-to-Noise Ratio | >180:1 |
| Spectral Resolution | <0.35 Hz |
| ¹H Quantitative Reproducibility | Excellent |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Xplore 30 |
| Detector Type | Tilting (Side-Entry) |
| Energy Resolution | 129 eV at Mn Kα |
| Peak-to-Background Ratio | 20,000:1 |
| Maximum Count Rate | 1,000,000 cps |
| Elemental Detection Range | Be to Cf |
| Active Detector Area | 300 mm² |
| Window Type | Beryllium Window |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Xplore TEM |
| Instrument Type | Side-entry (tilt-compatible) EDS system for TEM |
| Energy Resolution | 125 eV (Mn Kα) |
| Peak-to-Background Ratio | 200,000:1 |
| Maximum Input Count Rate | 200,000 cps |
| Elemental Detection Range | Beryllium (Be) to Californium (Cf) |
| Detector Active Area | 80 mm² |
| Window Type | Windowless (ultra-thin polymer support) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Xplore15 / Xplore30 |
| Detector Geometry | Tilting (Side-entry) |
| Energy Resolution | 129 eV @ 100,000 cps |
| Peak-to-Background Ratio | 20,000:1 |
| Maximum Count Rate | 1,000,000 cps |
| Elemental Detection Range | Boron (B) to Californium (Cf) |
| Active Crystal Area | 15 mm² or 30 mm² |
| Window Type | Super-Atmospheric Thin Window (SATW) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Wave500, Wave700 |
| Detector Integration | Ultim Max EDS |
| Geometry | Focusing Rowland Circle with Curved Crystals |
| Energy Resolution | <10 eV at Mn Kα |
| Detection Limit | <100 ppm (typical, matrix-dependent) |
| Slit Mechanism | Motorized Incident Slit for Resolution/Background Optimization |
| Mounting Configuration | Tilted Geometry for Enhanced SEM Compatibility and Reproducible Sample Positioning |
| Compliance | Designed for integration with Zeiss SEM platforms (e.g., GeminiSEM, Sigma, Merlin) |
| Brand | Oxford Instruments |
|---|---|
| Origin | Germany |
| Model | alpha300 A |
| Instrument Type | Materials-Focused AFM |
| Position Detection Noise | ≤0.5 nm |
| Maximum Sample Diameter | 120 mm |
| Piezo Scanner Travel Range (X/Y) | ≤100 µm |
| Integrated Microscopy | Research-Grade Optical Microscope with Brightfield, Darkfield, Polarization & Fluorescence Capabilities |
| Scanning Technology | TrueScan™ Capacitive Feedback-Controlled Stage |
| Brand | Oxford Instruments |
|---|---|
| Origin | Germany |
| Model | alpha300 access |
| Instrument Type | Confocal Micro-Raman Spectrometer |
| Spectral Range | 90–9000 cm⁻¹ |
| Spectral Resolution | ≤0.2 cm⁻¹ |
| Spatial Resolution | Lateral 350 nm, Axial 800 nm |
| Minimum Wavenumber | 10 cm⁻¹ |
| Spectral Reproducibility | ≤±0.02 cm⁻¹ |
| Brand | Oxford Instruments |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | alpha300 R |
| Instrument Type | Confocal Micro-Raman Spectrometer |
| Spectral Range | 90–9000 cm⁻¹ |
| Spectral Resolution | ≤0.2 cm⁻¹ |
| Spatial Resolution | Lateral 350 nm, Axial 800 nm |
| Minimum Wavenumber | 10 cm⁻¹ |
| Spectral Reproducibility | ≤±0.02 cm⁻¹ |
| Brand | Oxford Instruments |
|---|---|
| Country of Origin | Germany |
| Model | alpha300S |
| Detection Principle | Aperture-type Scanning Near-Field Optical Microscopy (SNOM) |
| Lateral Resolution | ~60 nm |
| Operating Modes | Transmission & Reflection |
| Compatible Detectors | High-sensitivity PMT & APD with overload protection |
| Integrated Spectroscopy | UHTS spectrometer compatible |
| Multimodal Capabilities | Combined AFM, Confocal Microscopy, and SNOM |
| Environmental Operation | Ambient air and liquid environments |
| Sample Preparation | Label-free, non-destructive, minimal preparation required |
| Upgrade Path | Optional integration with confocal Raman and near-field Raman imaging |
| Brand | Oxford Instruments |
|---|---|
| Origin | Germany |
| Model | cryoRaman |
| Instrument Type | Confocal Micro-Raman Spectrometer |
| Spectral Range | 400–1000 nm |
| Spectral Resolution | <1 cm⁻¹ |
| Spatial Resolution (lateral) | <400 nm |
| Minimum Wavenumber Shift | ±10 cm⁻¹ |
| Spectral Reproducibility | 0.02 cm⁻¹ |