PHI (Physical Electronics)
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| Brand | PHI (Physical Electronics) |
|---|---|
| Model | TRIFT™ |
| Origin | Japan |
| Instrument Type | Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) |
| Mass Analyzer | Triple-Focusing Reflectron TOF |
| Spatial Resolution | ≤ 100 nm (typical, dependent on primary ion source and sample conditions) |
| Imaging Modes | 256 × 256, 512 × 512, 1024 × 1024 pixel formats |
| Depth Profiling | Sputter-driven sequential layer removal with synchronized mass spectral acquisition |
| 3D Reconstruction | Voxel-based data integration from depth-resolved imaging stacks |
| Sample Stage Temperature Range | –150 °C to +200 °C (LN₂ cooling + resistive heating) |
| Sample Mounting Options | Back-mount (25 mm diameter), front-mount (100 mm × 100 mm planar support) |
| Compliance | Designed for GLP/GMP-aligned workflows |