Direct Reading Spectrometer
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Showing 1–30 of 61 results
| Brand | ARUN TECHNOLOGY LTD. |
|---|---|
| Origin | United Kingdom |
| Instrument Type | Benchtop |
| Excitation Method | Spark |
| Detector Type | High-Resolution CCD Array |
| Spectral Range | 130–700 nm |
| Optical Design | Paschen–Runge Mount with Dual Optical Chambers |
| Cooling | Thermostatically Controlled Enclosure (±0.1 °C) |
| Purge Medium | Argon |
| Compliance | ISO/IEC 17025-ready architecture, GLP/GMP-supporting data integrity features |
| Brand | Arun Technology Ltd. |
|---|---|
| Origin | United Kingdom |
| Instrument Type | Benchtop |
| Excitation Method | Spark Discharge |
| Detector Type | Scientific-grade CMOS Sensor with Active Cooling |
| Wavelength Range | 130–700 nm |
| Element Analysis Time | ≤10 s per measurement |
| Detection Limit | ≤1 ppm for key metallic elements |
| Compliance | Designed for ISO/IEC 17025-compliant laboratories, supports GLP/GMP audit trails and ASTM E415, E1086, E1479 methodologies |
| Brand | ARUN TECHNOLOGY LTD. |
|---|---|
| Origin | United Kingdom |
| Instrument Type | Benchtop |
| Excitation Source | Spark Discharge |
| Detector | Cooled Scientific-Grade A-CMOS Array |
| Wavelength Range | 130–700 nm |
| Optical Configuration | Dual-Optical-Path System |
| Element Coverage | ≥40 elements across Fe, Al, Cu, Ni, Zn, Mg, Co, Ti, Sn, Pb matrices |
| Detection Limit | ≤1 ppm (C, P, S, N with cryogenic cooling) |
| Compliance | Designed for ISO/IEC 17025-compliant laboratories |
| Brand | ARUN TECHNOLOGY LTD. |
|---|---|
| Origin | United Kingdom |
| Model | Calibus M |
| Instrument Type | Portable / Field-Deployable LIBS Analyzer |
| Optical Range | 190–700 nm |
| Detector | CMOS Array |
| Laser | Q-switched Nanosecond Solid-State, <0.1 °C Thermal Stability Control |
| Pulse Width | Nanosecond |
| Argon Purge | Integrated Recirculating System (≥200 analyses per charge) |
| Operating Temperature | –10 °C to +40 °C |
| Safety | Class 4 Laser (IEC 60825-1 compliant), Interlocked Trigger, Zero X-ray Emission |
| Quantification Method | Empirical Calibration with Multi-Parameter Spectral Correction (Background Subtraction, Matrix Correction, Spectral Drift Compensation) |
| Brand | Arun Technology Ltd. |
|---|---|
| Origin | United Kingdom |
| Instrument Type | Benchtop |
| Excitation Source | Spark Discharge |
| Detector Type | Cooled Scientific-Grade CMOS |
| Wavelength Range | Configurable (UV–Vis, down to ~130 nm) |
| Optical System | Dual-Chamber Paschen–Runge Mount |
| Cooling | Thermoelectric (Peltier) |
| Detection Limit | ≤1 ppm for C, P, S, N, and other metallic/non-metallic elements |
| Stability | Drift-Free Operation (No Recalibration Required Under Normal Conditions) |
| Analysis Time | <10 s per sample |
| Argon Consumption | Reduced by ~67% vs. conventional systems |
| Compliance | Designed for ISO/IEC 17025, ASTM E415, E1086, E3061, and EN 10315 environments |
| Brand | Arun Technology Ltd. |
|---|---|
| Origin | United Kingdom |
| Instrument Type | Benchtop |
| Excitation Source | Spark |
| Detector Type | Cooled Scientific-Grade A-CMOS |
| Focal Length | UV 300 mm, Visible 450 mm |
| Groove Density | UV 3600 lines/mm, Visible 2400 lines/mm |
| Wavelength Range | 130–700 nm |
| Number of Channels | Full CMOS Array (12–15 cm² active area) |
| Cooling | Thermoelectrically Cooled Detector |
| Optical Configuration | Dual Chamber (UV-Dedicated + Visible) |
| Stability | Drift-Free Operation (No Recalibration Required) |
| Brand | ARUN TECHNOLOGY LTD. |
|---|---|
| Origin | United Kingdom |
| Instrument Type | Benchtop |
| Excitation Source | Spark |
| Detector | Cooled Scientific CMOS (A-CMOS) |
| Wavelength Range | Configurable (UV–Vis, down to ~130 nm) |
| Optical System | Dual Chamber Design |
| Cooling | Thermoelectric (Peltier) |
| Stability | Drift-Free Operation (No Recalibration Required) |
| Detection Limit | ≤1 ppm for key elements (C, P, S, N, Al, Cu, etc.) |
| Analysis Time | <10 s per sample |
| Argon Consumption | Reduced by ~67% vs. conventional systems |
| Compliance | Designed for ISO/IEC 17025, ASTM E415, E1086, E3061, and USP <730> trace metal analysis workflows |
| Brand | ARUN TECHNOLOGY LTD. |
|---|---|
| Origin | United Kingdom |
| Instrument Type | Benchtop |
| Excitation Source | Spark |
| Detector Type | Cooled Scientific-Grade CMOS |
| Wavelength Range | Configurable (UV–VIS, down to ~130 nm) |
| Optical Design | Dual Chamber |
| Detection Limit | ≤1 ppm for key metallic and non-metallic elements |
| Stability | Drift-Free Operation Without Recalibration |
| Analysis Time | ≤10 s per sample |
| Gas Consumption | Reduced Argon Usage (≈33% of conventional systems) |
| Compliance | Designed for ISO/IEC 17025-compliant laboratories |
| Brand | ARUN TECHNOLOGY LTD. |
|---|---|
| Origin | United Kingdom |
| Instrument Type | Benchtop |
| Excitation Source | Spark |
| Detector | Charge-Coupled Device (CCD) |
| Spectral Range | Configurable (130–700 nm) |
| Optical Design | Paschen-Runge Mount with Long Focal Length |
| Temperature Control Stability | ±0.1 °C |
| Software Platform | iAPS Intelligent Alloy Identification System, OMVR Calibration Engine, ASR Spark Filtering Algorithm |
| Compliance | Designed for ISO/IEC 17025-compliant laboratories |
| Brand | Arun Technology Ltd. |
|---|---|
| Origin | United Kingdom |
| Instrument Type | Benchtop |
| Excitation Method | Spark |
| Detector Type | Charge-Coupled Device (CCD) |
| Spectral Range | Configurable (130–700 nm) |
| Optical Design | Paschen-Runge Mount with Long Focal Length |
| Gas Environment | Argon-Flushed Optical Chamber |
| Temperature Control Accuracy | ±0.1 °C |
| Software Compliance | Supports 21 CFR Part 11 Audit Trail & GLP/GMP Data Integrity Requirements |
| Sample Handling | Open-Design Spark Stand with Gravity-Driven Electrode, 32 kg Max Load |
| Brand | ARUN TECHNOLOGY LTD. |
|---|---|
| Origin | United Kingdom |
| Instrument Type | Benchtop |
| Excitation Source | Spark |
| Detector | Charge-Coupled Device (CCD) |
| Spectral Range | Configurable from 130 nm to 700 nm |
| Optical Design | Paschen–Runge mounting with extended focal length |
| Temperature Control Stability | ±0.1 °C |
| Software Platform | iAPS Intelligent Alloy Identification System, OMVR Optimized Multi-Variable Regression, ASR Aberrant Spark Removal Algorithm |
| Compliance Ready | ASTM E415, ASTM E1086, ISO 11577, ISO 17025-aligned workflows, FDA 21 CFR Part 11 optional audit trail module |
| Brand | ARUN TECHNOLOGY LTD. |
|---|---|
| Origin | United Kingdom |
| Model | ARTUS 8 U |
| Instrument Type | Benchtop |
| Excitation Method | Spark |
| Detector Type | High-Resolution CCD Array |
| Focal Length | 400 mm |
| Grating Line Density | 2400 l/mm (Visible), 3600 l/mm (UV) |
| Wavelength Range | 140–680 nm |
| Spectral Acquisition Mode | Full-Spectrum Direct Reading |
| Brand | Arun Technology Ltd. |
|---|---|
| Origin | United Kingdom |
| Instrument Type | Benchtop |
| Excitation Method | Spark |
| Detector Type | Charge-Coupled Device (CCD) |
| Optical System | Full-Spectrum Holographic Grating |
| Vacuum Requirement | None |
| Wavelength Range | Configurable (typically 130–800 nm) |
| Resolution | High spectral resolution enabled by optimized optical path and CCD pixel density |
| Sample Handling | Open-type spark stand with X-Y motorized sample stage |
| Compliance | Designed to support ISO/IEC 17025, ASTM E415, ASTM E1086, and GB/T 4336 workflows |
| Brand | Arun Technology Ltd. |
|---|---|
| Origin | United Kingdom |
| Instrument Type | Benchtop |
| Model | MERLIN 4 |
| Excitation | Spark Source |
| Optical System | Paschen-Runge Mount with Holographic Concave Grating |
| Detector | High-Resolution CCD Array |
| Spectral Range | 130–800 nm |
| Resolution | ≤ 10 pm at 200 nm |
| Sample Stage | Motorized X-Y Translation with Open Spark Stand |
| Compliance | ASTM E415, ISO 11577, GB/T 4336 |
| Brand | Arun Technology Ltd. |
|---|---|
| Origin | United Kingdom |
| Instrument Type | Benchtop |
| Excitation Method | Spark |
| Detector Type | Charge-Coupled Device (CCD) |
| Optical Design | Full-Spectrum Holographic Grating |
| Sample Handling | Open-Style Horizontal/Vertical Translational Spark Stand |
| Compliance | Designed for ISO/IEC 17025-aligned laboratories, supports ASTM E415, E1086, and ISO 6892-1 elemental analysis workflows |
| Software | ARUN SpectraSuite with audit trail, user access levels, and data export compliant with FDA 21 CFR Part 11 requirements |
| Brand | Arun Technology Ltd. |
|---|---|
| Origin | United Kingdom |
| Instrument Type | Benchtop |
| Excitation Method | Spark |
| Detector Type | Charge-Coupled Device (CCD) |
| Optical Design | Full-Spectrum Holographic Grating |
| Sample Handling | Open-Type Adjustable Spark Stand with X-Y Translation |
| Compliance | Designed for ISO/IEC 17025-compliant laboratories, supports ASTM E415, E1086, and ISO 6892-2 traceable analysis workflows |
| Brand | Beifen Ruili |
|---|---|
| Origin | Beijing, China |
| Model | AES-8000 Series |
| Instrument Type | Benchtop Direct-Reading Spectrometer |
| Excitation Source | AC/DC Arc |
| Detector | UV-Sensitive CMOS Array |
| Focal Length | 600 mm |
| Grating Grooves | 2400 lines/mm |
| Wavelength Range | 230–340 nm |
| Spectral Coverage | Full-Spectrum Acquisition |
| Optical Design | Vertical Symmetric Ebert-Fastie |
| Reciprocal Linear Dispersion | 0.64 nm/mm (1st order) |
| Theoretical Spectral Resolution | 0.003 nm @ 300 nm |
| Spectrometer Chamber Temperature Control | 35 °C ± 0.1 °C |
| Arc Current Range | 2–20 A (AC), 2–15 A (DC) |
| Dimensions (L×W×H) | 1500 × 820 × 650 mm |
| Weight | ~180 kg |
| Operating Environment | 15–30 °C, RH < 80 % |
| Brand | Beifen Ruili |
|---|---|
| Origin | Beijing, China |
| Model | OILA-I |
| Instrument Type | Benchtop |
| Excitation Method | Arc |
| Detector Type | CMOS |
| Focal Length | 400 mm |
| Grating Grooves | 2400 lines/mm |
| Wavelength Range | 201–810 nm |
| Detection Mode | Full-Spectrum Simultaneous Acquisition |
| Argon Consumption | None |
| Detector Resolution | High-Density CMOS Array with Pixel-Level Spectral Sampling |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Instrument Type | Benchtop |
| Excitation Source | Spark Discharge |
| Detector Configuration | Dual Detector (PMT + CCD) |
| Focal Length | 400 mm |
| Grating Groove Density | 3600 lines/mm |
| Wavelength Range | 170–685 nm |
| Number of Analytical Channels | 32 |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | Q4 POLO |
| Instrument Type | Benchtop |
| Excitation Method | Spark |
| Detector Type | Photomultiplier Tube (PMT) |
| Focal Length | 800 mm |
| Grating Groove Density | 3600 lines/mm |
| Wavelength Range | 120–200 nm |
| Number of Channels | 128 |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Q4 TASMAN |
| Instrument Type | Benchtop |
| Excitation Method | Spark |
| Detector Type | Dual Detector (PMT + CCD) |
| Focal Length | 800 mm |
| Grating Groove Density | 3600 lines/mm |
| Wavelength Range | 130–800 nm |
| Number of Channels | 128 |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Instrument Type | Benchtop |
| Excitation Source | Spark |
| Detector Type | Photomultiplier Tube (PMT) |
| Focal Length | 800 mm |
| Grating Density | 3600 lines/mm |
| Wavelength Range | 120–200 nm |
| Number of Channels | 128 |
| Argon Consumption | 2–4 L/min (during analysis) |
| Detector Configuration | Single PMT with 3880 discrete detection channels |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Instrument Type | Benchtop |
| Excitation Method | Spark |
| Detector Type | Photomultiplier Tube (PMT) |
| Focal Length | 1000 mm |
| Grating Groove Density | 3600 lines/mm |
| Wavelength Range | 110–800 nm |
| Number of Channels | 128 |
| Brand | FPI |
|---|---|
| Origin | Zhejiang, China |
| Model | E5000 |
| Instrument Type | Benchtop |
| Excitation Source | High-Power Numerically Controlled Arc |
| Detector | CCD Array |
| Focal Length | 400 mm |
| Grating Grooves | 2400 lines/mm |
| Wavelength Range | 190 nm – 680 nm |
| Detection Mode | Full-Spectrum Simultaneous Acquisition |
| Optical Design | Paschen–Runge Mount |
| Cooling | Water-Cooled Electrodes & Arc Source |
| Safety Interlocks | Real-Time Monitoring of Cooling Water Flow, Exhaust Ventilation, and Torch Chamber Door Status |
| Software Compliance | Supports Audit Trail, User Access Control, and Method Validation per GLP/GMP Requirements |
| Data Acquisition | Overflow-Protected CCD with Dynamic Integration |
| Brand | FPI |
|---|---|
| Origin | Zhejiang, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Instrument Type | Benchtop |
| Excitation Source | High-Power Programmable DC Arc |
| Detector | Back-Illuminated CCD Array |
| Focal Length | 400 mm |
| Grating Groove Density | 2400 lines/mm |
| Wavelength Range | 190–680 nm |
| Spectral Coverage | Full-Spectrum Simultaneous Acquisition |
| Optical Design | Paschen-Runge Mount with Fixed, Thermally Stabilized Vacuum- or Purged-Optics Chamber |
| Cooling | Integrated Water-Cooled Electrode & Arc Source |
| Safety Interlocks | Real-Time Monitoring of Cooling Flow, Exhaust Ventilation, Torch Chamber Door Status, and Thermal Sensors |
| Brand | FPI |
|---|---|
| Origin | Zhejiang, China |
| Instrument Type | Benchtop |
| Excitation Source | Spark Discharge |
| Detector | Charge-Coupled Device (CCD) |
| Optical Configuration | Paschen-Runge Mount |
| Wavelength Range | Configurable (Typical Range: 130–800 nm) |
| Number of Simultaneous Channels | Multi-channel (CCD-based full-spectrum acquisition) |
| Argon Purge System | Sealed argon recirculation with four-way purging |
| Operating Environment | Industrial floor and laboratory settings |
| Compliance | Designed to support ISO/IEC 17025 workflows, ASTM E415, ASTM E1086, and GB/T 4336 standards |
| Brand | FPI |
|---|---|
| Origin | Zhejiang, China |
| Instrument Type | Benchtop |
| Excitation Source | Spark |
| Detector | CCD (Charge-Coupled Device) |
| Wavelength Range | Configurable |
| Optical Configuration | Paschen–Runge Mount |
| Environmental Operation | Argon-purged Sealed Optical Chamber |
| Sample Interface | Open-type Spark Stand with Quadruple Argon Purge |
| Temperature Control | Thermostatically Stabilized Optics Chamber |
| Software Features | Real-time Drift Correction, Intelligent Calibration Curve Matching, Grade Identification, CE/CRE Calculation, QC Limit Enforcement, System Self-Diagnosis |
| Compliance Context | Designed for GLP-compliant metal analysis workflows |
| Brand | FPI |
|---|---|
| Origin | Zhejiang, China |
| Instrument Type | Benchtop |
| Excitation Source | Spark |
| Detector Type | CMOS-based CCD array |
| Optical Configuration | Paschen-Runge mount |
| Wavelength Range | Configurable (typically 130–800 nm) |
| Number of Simultaneous Channels | Up to 60 (software-defined) |
| Argon Purge System | Sealed argon-circulation optical chamber with four-way purge |
| Operating Environment | Industrial workshop / QC lab (IP54-rated spark stand) |
| Brand | FPI |
|---|---|
| Origin | Zhejiang, China |
| Instrument Type | Benchtop |
| Excitation Source | Spark |
| Detector Type | CMOS-based Multi-Channel Array |
| Optical Configuration | Paschen-Runge Mount |
| Wavelength Range | Configurable (Typically 130–800 nm) |
| Number of Simultaneous Channels | Up to 60 (Software-Defined) |
| Argon Purge System | Sealed Argon-Circulating Optical Chamber with Four-Point Purge |
| Operating Environment | Industrial Lab / Foundry Floor |
| Compliance | Designed to Support ISO/IEC 17025, ASTM E415, ASTM E1086, and GB/T 4336 |
| Brand | FPI |
|---|---|
| Origin | Zhejiang, China |
| Instrument Type | Benchtop |
| Excitation Source | Spark |
| Detector Type | CMOS |
| Wavelength Range | Configurable (Typical Range: 130–800 nm) |
| Number of Spectral Channels | Not Fixed (Multi-Channel CCD/CMOS Array-Based Detection) |
| Optical System | Paschen-Runge Mount |
| Purge Medium | Sealed Argon Circulation System |
| Operating Environment | Industrial Lab / Foundry Floor |