Electron Backscatter Diffraction System
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Showing all 14 results
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model | QUANTAX ED-XS |
| CCD Camera Resolution | 640 × 480 pixels |
| Maximum Stage Speed | 10 mm/s |
| Spatial Resolution | 50 nm |
| Angular Resolution | 0.2° |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | OPTIMUS 2 QUANTAX EBSD eflash FS |
| CCD Camera Resolution | 640 × 480 |
| Maximum Stage Speed | 10 mm/s |
| Spatial Resolution | 1.5 nm |
| Angular Resolution | 0.2° |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | eWARP |
| Quotation | Upon Request |
| Maximum Pattern Acquisition Rate | 14,400 patterns/second |
| Spatial Resolution | 20 nm |
| Angular Resolution | 0.1° |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | QUANTAX EBSD |
| Pricing | Upon Request |
| CCD Camera Resolution | 640 × 480 pixels |
| Maximum Stage Speed | 10 mm/s |
| Spatial Resolution | 1.5 nm |
| Angular Resolution | 0.1° |
| Brand | EDAX |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | DigiView |
| Pricing | Upon Request |
| CCD Resolution | 1392 × 1040 pixels |
| Readout Speeds | 20 MHz / 40 MHz |
| Angular Resolution | < 0.1° |
| Quantum Efficiency | > 62% @ 500 nm |
| Bit Depth | 12-bit digital output |
| Read Noise | < 8 e⁻ @ 20 MHz |
| Exposure Time Range | Up to 15 minutes |
| Cooling | Single-stage Peltier (fanless) |
| Interface | Gigabit Ethernet |
| Gain Control Range | 0–35 dB (fully adjustable) |
| Vacuum Compatibility | Bellows-mounted for in-chamber operation |
| Optional Feature | Integrated Fore-Scatter Detector (FSD) |
| Software Integration | Fully compatible with EDAX TEAM™ EBSD analysis suite |
| Brand | EDAX |
|---|---|
| Origin | USA |
| Model | Hikari XP |
| Angular Resolution | < 0.1° |
| Maximum Pattern Indexing Rate | up to 1400 points/sec |
| Beam Current Compatibility | down to 100 pA |
| Accelerating Voltage Compatibility | down to 5 kV |
| Brand | EDAX |
|---|---|
| Origin | USA |
| Model | Velocity Super |
| Maximum Acquisition Speed | 4500 points/sec |
| Orientation Resolution | < 0.1° |
| Image Resolution (during high-speed acquisition) | 120 × 120 pixels |
| Detector Type | High-sensitivity, low-noise CMOS |
| Calibration Algorithm | Triplet-band confidence-based indexing |
| EDS-EBSD Synchronization | Yes, with compatible EDAX EDS detectors |
| Compliance | Designed for ASTM E112, ISO 11937, and ASTM E2627-compliant microstructural quantification workflows |
| Software Integration | OIM Analysis™ v9+ with GLP-compliant audit trail and 21 CFR Part 11-ready data handling |
| Brand | Hitachi |
|---|---|
| Origin | Japan |
| Model | TM4000II / TM4000PlusII |
| Accelerating Voltage | 5 kV / 10 kV / 15 kV (4-step current adjustment per voltage) |
| Magnification Range | 10× to 100,000× |
| Detector Configuration | Quad-segment backscattered electron detector (BSE) |
| Sample Chamber Dimensions | Ø80 mm × 50 mm (max. height) |
| Imaging Modes | Conductive mode (TM4000PlusII), Standard mode, Charge-free mode |
| Software Features | SEM-MAP navigation, report-generation export (PDF/HTML), real-time BSE + SE image overlay (TM4000PlusII) |
| Camera Resolution | 2560 × 1920 (CCD) |
| EDS Compatibility | Integrated EDX interface |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | C-Nano |
| CCD Camera Resolution | 1244 × 1024 pixels |
| Maximum Pattern Acquisition Rate | 870 Hz |
| Spatial Resolution | 2 nm |
| Angular Resolution | < 0.05° |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | C-Swift |
| CCD Camera Resolution | 1244 × 1024 |
| Maximum Frame Rate | 870 Hz |
| Spatial Resolution | 2 nm |
| Angular Resolution | < 0.05° |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | NA-TKD |
| Compatibility | Fully compatible with Oxford Instruments Symmetry CMOS EBSD detectors |
| Configuration | Near-axis phosphor screen geometry |
| Primary Application | High-resolution crystallographic orientation and strain mapping in thin, beam-sensitive, or nanoscale materials |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Symmetry S2 EBSD Detector |
| CCD Camera Resolution | 1244 × 1024 pixels |
| Pattern Resolution (High-Speed Mode) | 156 × 88 pixels |
| Spatial Resolution | 10 nm |
| Angular Resolution | 0.05° |
| Maximum Indexing Speed | 4500 patterns per second (pps) |
| Beam Current Requirement for 4500 pps | 12 nA |
| Integrated Forward Scatter Detectors (FSD) | 5-channel |
| Interface | Bellows-type SEM vacuum-compatible port with auto-calibrating tilt mechanism |
| Collision Avoidance | Proximity sensor–enabled retraction system |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Symmetry S3 |
| CCD Camera Resolution | 1244 × 1024 pixels |
| Maximum Acquisition Speed | 870 Hz (≥5700 patterns per second at 156 × 128 binning) |
| Spatial Resolution | 2 nm |
| Angular Resolution | <0.1° |
| Optical System | Lensless fiber-optic coupling |
| Sensor | Custom EBSD-optimized CMOS |
| Pattern Distortion | <1 pixel (sub-pixel guaranteed) |
| Sensitivity | up to 1000 pps/nA |
| Fluorescent Screen Travel Range | ±22 mm motorized vertical adjustment |
| Collision Protection | Patented proximity sensor system |
| Optional FSD | 5-diode front-scatter detector system |
| Brand | Thermo Fisher Scientific |
|---|---|
| Origin | USA |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | Thermo Scientific QuasOr |
| Pricing | Upon Request |