Electron Microscope Accessories Peripherals
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| Brand | Bruker |
|---|---|
| Origin | Germany |
| Product Type | Imported Software for Electron Microscopy |
| Model | ESPRIT 2 |
| Price Range | USD 25,000 – 65,000 |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | ESPRIT QUBE |
| Compatibility | Integrated with Bruker e-Flash EBSD detectors and QUANTAX EDS systems |
| Data Format Support | HDF5, .ctf, .ang, .h5ebsd, .edax, .oxford, .bmp, .tiff |
| Licensing | Concurrent or node-locked perpetual license |
| System Requirements | Windows 10/11 (64-bit), ≥32 GB RAM, ≥2 TB SSD storage recommended, NVIDIA GPU with ≥8 GB VRAM (CUDA 11.2+) |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | Hysitron PI 89 |
| Application | In-situ nanomechanical testing inside SEM and FIB/SEM chambers |
| Sensing Principle | Capacitive displacement sensing with sub-nanometer resolution |
| Actuation | Electromechanical force actuation |
| Force Range | Up to 100 mN (standard configuration) |
| Displacement Resolution | < 0.2 nm |
| Positioning Accuracy | ≤ 50 nm (with integrated linear encoder and motorized tilt/rotate stages) |
| Compatibility | Fully compatible with FEI/Thermo Fisher, Zeiss, JEOL, and Hitachi SEM/FIB platforms |
| Analytical Integration | Synchronized acquisition with EBSD, EDS, BSE, and TKD detectors |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Model | PI 89 AUTO |
| Application Domain | In situ SEM-integrated nanomechanical characterization |
| Automation Level | Fully motorized stage + patented dual-axis rotation/tilt (R/T) mechanism |
| Software Platform | TriboScan Auto v5.0+ |
| Compliance Framework | Designed for GLP-compliant workflows |
| Sample Environment | Compatible with standard high-vacuum and low-vacuum SEM chambers (FEI, Thermo Fisher, Zeiss, JEOL) |
| Maximum Load Resolution | Sub-100 nN |
| Displacement Resolution | < 0.05 nm |
| Stage Precision | ±50 nm positional repeatability over 10 mm × 10 mm travel range |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | QUANTAX xsense |
| Pricing | Upon Request |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | QUANTAX XTrace |
| Pricing | Available Upon Request |
| Brand | Advacam |
|---|---|
| Origin | Czech Republic |
| Model | ePix® |
| Sensor Technology | Timepix3-based hybrid pixel detector |
| Pixel Size | 55 × 55 µm |
| Pixel Matrix | 256 × 256 |
| Sensitive Area | 14 × 14 mm |
| Sensor Material | Silicon (Si), thickness options: 100, 300, 500 µm |
| Time-of-Arrival (TOA) Resolution | 1.56 ns |
| Maximum Hit Rate (Data-Driven Mode) | 64 Mhit/s |
| Energy Range | 2.5–300 keV |
| Readout Interface | USB-C |
| Power Consumption | 3.5 W |
| Operating Modes | Data-driven zero-suppressed, frame-based zero-suppressed |
| Pixel Operation Modes | Simultaneous Time-Over-Threshold (TOT) and Time-Of-Arrival (TOA), or integral TOT + event counting |
| Front-End Dimensions | 69 × 28 × 16 mm |
| Readout Unit Dimensions | 104 × 67 × 30 mm |
| Detector Mounting | Customizable mechanical interface |
| External Synchronization | LVDS I/O (Trigger In/Out, Clock In/Out, Ready In/Out) |
| Front-End to Readout Distance | Up to 45 cm |
| Thermal Management | Peltier-cooled, temperature-stabilized |
| Brand | GATAN |
|---|---|
| Origin | USA |
| Manufacturer | GATAN, Inc. |
| Model | ChromaCL2 |
| Optical Collection Angle | Parabolic Diamond-Machined Mirror |
| Spectral Range | 400–800 nm |
| Detector | High-Gain Array Photomultiplier Tube (PMT) |
| Signal Processing | Integrated Pulse Amplification & Discrimination Electronics |
| Control & Acquisition | DigiScan II Digital Beam Controller with 3 TTL Channels Dedicated to CL |
| Software | DigitalMicrograph® with ChromaCL Plugin (Real-Time RGB Mixing, Post-Processing, GLP-Compliant Metadata Logging) |
| Dynamic Range | Up to 600,000 counts/sec per pixel |
| Retraction Range | 150 mm |
| Integrated BSED Capability | Simultaneous Secondary Electron (SE), Backscattered Electron (BSE), and CL Acquisition |
| Mounting | Fixed Insertion Geometry with Lockable Retraction |
| Operating System | Windows 7 (32-/64-bit) |
| Brand | Accurion |
|---|---|
| Origin | Germany |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Halcyonics Sandwich |
| Price Range | USD 27,000 – 68,000 (FOB Hamburg) |
| Brand | Leica |
|---|---|
| Origin | Germany |
| Model | EM ACE200 |
| Vacuum Level | ≤7 × 10⁻³ mbar |
| Chamber Dimensions (W×D×H) | 140 mm × 145 mm × 150 mm |
| Sample Stage Diameter | 80 mm |
| Working Distance | 30–100 mm |
| Sputtering Current | ≤150 mA |
| Film Thickness Resolution (with QCM option) | 0.1 nm |
| Coating Modes | Ion Sputtering, Carbon Wire Evaporation, Dual-Mode, Optional Glow Discharge |
| Optional Features | Quartz Crystal Microbalance (QCM), Planetary Rotation, Interchangeable Shields, Directional Sputtering, Pulsed Carbon Evaporation |
| Brand | Mel-Build |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Dual-Tilt Probe TEM Sample Holder |
| Pricing | Available Upon Request |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Fast-Scan Scanning Capacitance Microscope (SCM) |
| Price Range | USD 25,000 – 65,000 |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | AZtecBattery |
| Detector Compatibility | Ultim Max / Xplore / UltimExtreme EDS detectors |
| Maximum Field Count | 10,000 fields per sample |
| Max Particle Count | 200,000 particles per sample |
| Throughput | Up to 30,000 particles/hour |
| EDS Count Rate Capability | Up to 400 kcps |
| Effective Detector Area | Up to 170 mm² |
| Software-Enabled Capabilities | Automated particle detection, multi-threshold contrast segmentation, morphology-based filtering, Z-focus stabilization across large-area scans, cross-field particle reconstruction, customizable classification logic, ASTM/ISO-compliant reporting templates, FDA 21 CFR Part 11-ready audit trail (optional configuration) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | AZtecPharma |
| Compliance | FDA 21 CFR Part 11, EU Annex 11, GxP-aligned |
| Software Platform | AZtecLive-based |
| User Authentication | Integrated Windows Active Directory / LDAP |
| Audit Trail | Immutable, timestamped, user-attributed, inspector-accessible |
| Digital Signature | Enforced per action (acquisition, processing, reporting) |
| SOP Integration | Configurable acquisition profiles with version-controlled parameters |
| Real-time EDS Imaging | Elemental mapping with live spectral overlay comparison |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | AZtecWave |
| Detector Type | Wavelength Dispersive Spectrometer (WDS) with Integrated EDS Compatibility (Ultim Max) |
| Roland Circle Radius | 210 mm |
| Energy Resolution | <10 eV (Mn Kα, typical) |
| Detection Limit | <100 ppm (matrix-dependent) |
| Peak-to-Background Ratio | >10,000:1 (typical for major elements) |
| Optical Geometry | Focusing Johann-type spectrometer with bent crystals |
| Incident Slit | Motorized, variable width |
| Installation | Tilt-mounted for minimal working distance dependency |
| Software Platform | AZtecWave v4.x or later |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | OmniGIS II |
| Gas Port Configuration | Single-port, multi-source compatible |
| Gas Capacity | Up to 3 primary gas sources + 2 auxiliary gases |
| Control Architecture | Pressure-feedback regulated flow control |
| Vacuum Compatibility | Adaptive operation across wide chamber pressure range (10⁻⁷ mbar to 10⁻¹ mbar) |
| Integration | Designed for SEM and FIB platforms |
| Compliance | CE-marked |
| Software Interface | Native integration with AZtec GIS Control Suite (v5.0+) |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | OmniProbe (OP350, OP400, Cryo) |
| Drive Technology | Piezoelectric actuation |
| Positioning Resolution | Sub-nanometer |
| Operating Temperature Range (Cryo) | –180 °C to room temperature |
| Port Compatibility | Standard SEM/FIB vacuum feedthroughs (e.g., 60 mm, 80 mm) |
| Control Interface | Digital USB/Ethernet with real-time image-synchronized calibration |
| Compliance | Designed for GLP/GMP-aligned workflows |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Model | Relate Correlative Imaging Software |
| Data Format Support | Aztec H5oina, AFM native formats (e.g., Gwyddion, Nanoscope, SPIP) |
| Primary Function | Multi-modal correlative analysis of SEM/TEM, EDS, EBSD, and AFM datasets |
| Compatibility | Integrated with Oxford Instruments Aztec and Symmetry platforms |
| Licensing | Node-locked or floating license options |
| Compliance | Supports GLP/GMP-aligned documentation workflows, audit-trail-ready metadata logging |
| Brand | Oxford Instruments |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | TKD |
| Price Range | USD 1,400 – 7,000 |
| Brand | point electronic |
|---|---|
| Origin | Germany |
| Model | 3D Calibration Kit |
| Compliance | VDI/VDE 2656 |
| Software | microCal Calibration Suite |
| Compatibility | SEM, AFM, CLSM, 3D-SEM |
| Calibration Type | Geometric Metrology (X/Y/Z Scale, Shear, Coupling) |
| Traceability | NIST-traceable reference data provided |