Energy Dispersive X-Ray Fluorescence Spectrometer
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Showing 31–60 of 78 results
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Configuration | Benchtop/ Floor-standing |
| Model | S2 POLAR |
| Compliance | ASTM D7220, ASTM D4294, ASTM D6481, ASTM D7751, ASTM D8252, ISO 13032, ISO 20847, ISO 8754, IP 336, IP 496, IP 532, JIS K2541-4 |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Configuration | Benchtop/Polarized EDXRF |
| Element Range | Na (11) to Am (95), optional C (6) to Am (95) |
| Concentration Range | ppm to 100% |
| Energy Resolution | <135 eV (Mn Kα) |
| Repeatability | <0.1% RSD |
| Detector | HighSense™ Ultra-Low-Noise Silicon Drift Detector (SDD) |
| Compliance | ASTM D6481, ASTM D7751, ASTM D7220, ISO 13032, ASTM D4294, ISO 20847, ISO 8754, IP 336/496/532, JIS K2541-4, GB/T 11140 |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | S2 PUMA Series 2 |
| Configuration Options | Benchtop / Floor-standing |
| Elemental Range | C (Z=6) to Am (Z=95) |
| X-ray Tube Power | 50 W |
| Detector | HighSense™ Silicon Drift Detector (SDD) |
| Sample Chamber Dimensions | 450 × 420 × 100 mm |
| Autochanger Capacity | Up to 20 positions (XY Autochanger) or 12–18 samples (Carousel) |
| Mapping Resolution | Down to 1 mm |
| Spot Size | 1–34 mm (with collimator masks) |
| Software | SPECTRA.ELEMENTS with SMART.QUANT FP |
| Compliance | Designed for GLP/GMP environments |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | S2 PUMA Series II |
| Element Range | Na (11) to Am (95) [C (6) to Am (95)] |
| Detection Range | ppm to 100% |
| Energy Resolution | <135 eV |
| Repeatability | <0.1% RSD |
| Detector | HighSense™ Silicon Drift Detector (SDD) |
| Configuration Options | Manual Single-Position, XY Autochanger, Carousel Autosampler |
| Sample Chamber Dimensions | 450 × 420 × 100 mm |
| X-ray Tube | 50 W Rh anode |
| Filter Changer | 10-position automatic |
| Software Suite | SPECTRA.ELEMENTS with Smart-Quant FP, Geo-Quant, Cement-Quant, and regulatory-compliant modules |
| Brand | Bruker |
|---|---|
| Origin | Germany |
| Model | S4 TSTAR |
| Technique | Total Reflection X-Ray Fluorescence (TXRF) |
| Detection Limit | Sub-ppb for liquid, solid, and thin-film samples |
| Sample Forms | Liquids, suspensions, dried residues, wafers, microscope slides, quartz carriers, membranes, filters, and nanoparticle layers |
| Compliance Context | Supports ISO 17025-compliant workflows |
| Brand | Bruker |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model | TRACER 5 |
| Application | Handheld / Portable |
| Industry Use | General-Purpose |
| Elemental Range | F to U |
| Quantification Range | ppm to wt% |
| Energy Resolution | 145 eV |
| Brand | Dongxi Analysis |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | XD-8010 |
| Form Factor | Benchtop/Floor-standing |
| Industry Application | Geological & Mineralogical Analysis |
| Elemental Range | S (Z=16) to U (Z=92) |
| Quantification Range | ppm to wt% |
| Filter Options | 15-position automatic filter wheel |
| Beam Diameter | 1–7 mm adjustable |
| Sample Chamber | Large-volume, non-destructive chamber |
| Software | Integrated EDXRF workstation with real-time video imaging, report customization (PDF/Excel), spectral comparison, and GLP-compliant data archiving |
| Brand | ESI |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | EDX9000B PLUS |
| Configuration | Benchtop/Floor-standing |
| Industry-Specific Application | Non-Ferrous Metals |
| Elemental Range | Na (Z=11) to U (Z=92) |
| Quantification Range | 1 ppm – 99.99% |
| Energy Resolution | <140 eV (Mn Kα) |
| Repeatability (RSD) | ≤0.05% |
| Detector | Peltier-Cooled Fast Silicon Drift Detector (FSDD) |
| Brand | Evident (formerly Olympus) / EVDENT |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | DELTA DPO-2000 |
| Application | Handheld / Portable |
| Industry-Specific Use | Non-Ferrous & Specialty Alloys |
| Elemental Range | Mg to U |
| Quantification Range | ppm to wt% |
| Energy Resolution | <140 eV at Mn Kα |
| Repeatability | ≤0.1% RSD |
| Brand | FPI |
|---|---|
| Origin | Zhejiang, China |
| Model | MiX5 500 |
| Form Factor | Handheld / Portable |
| Target Materials | Ferrous Alloys |
| Pre-installed Alloy Libraries | AISI, DIN, JIS, GB (1600+ grades) |
| Detector | Silicon Drift Detector (SDD) |
| X-ray Tube | High-Performance Microfocus Tube |
| Display | 4.3-inch Color Touchscreen |
| Weight | 1.5 kg |
| Battery Life | 10–12 hours |
| IP Rating | IP54 |
| Data Storage | Up to 100,000 results with spectra and optional images |
| Output Formats | CSV, PDF |
| Connectivity | USB, Wi-Fi, Bluetooth |
| Compliance Support | GLP/GMP audit trail capability, FDA 21 CFR Part 11–ready software architecture |
| Brand | FPI |
|---|---|
| Origin | Zhejiang, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | MiX5 Pro |
| Form Factor | Handheld / Portable |
| Application Scope | General-Purpose Metal & Alloy Analysis |
| Elemental Range | Mg (12) to U (92) |
| Detection Limits | Sub-ppm to % level (matrix-dependent) |
| Detector | High-Performance Silicon Drift Detector (SDD) |
| Energy Resolution | ≤145 eV at Mn Kα |
| Repeatability | RSD < 1% for major elements (typical alloy matrix, ≥10 s measurement) |
| Operating Temperature | –10 °C to 50 °C |
| IP Rating | IP54 |
| Battery Life | Up to 12 hours (standard Li-ion pack) |
| Display | 5.5-inch capacitive touchscreen with sunlight-readable brightness |
| Connectivity | Wi-Fi 802.11 a/b/g/n, USB-C, optional integrated 5 MP macro camera |
| Software Compliance | Supports audit trail, user access control, and data export compliant with GLP/GMP documentation requirements |
| Brand | GNR |
|---|---|
| Origin | Italy |
| Model | HORIZON |
| Configuration | Benchtop/Floor-standing |
| Application Type | General-purpose |
| Elemental Range | Na (11) to Pu (94) |
| Quantification Range | 10 pg – 100% |
| Energy Resolution | 124 eV (at Mn Kα) |
| Repeatability | ≤ 0.1% RSD |
| Brand | GNR |
|---|---|
| Origin | Italy |
| Model | TX 2000 |
| Configuration | Benchtop/Floor-standing |
| Application Type | General-purpose |
| Elemental Range | Na (11) to Pu (94) |
| Quantification Range | 10 pg – 100% |
| Energy Resolution | 124 eV (at Mn Kα) |
| Repeatability | 0.1% RSD |
| Detector | Peltier-cooled Silicon Drift Detector (SDD) |
| Excitation Source | Switchable Mo/W anode X-ray tube |
| Angular Control | High-precision optical encoder stepper motor |
| Brand | HORIBA |
|---|---|
| Origin | Japan |
| Model | MESA-50 |
| Detector Type | Silicon Drift Detector (SDD) |
| Excitation Source | Micro-focus X-ray Tube |
| Analytical Spot Sizes | 0.1 mm, 0.3 mm, and 1.2 mm |
| Minimum Detection Limit (MDL) | ≤2 ppm for Pb, Cd, Hg, Cr, Br |
| Measurement Time | Typically 60–300 s per point |
| Sample Viewing | Integrated High-Resolution CCD Camera with 30× Optical Zoom |
| Operating Environment | Ambient air (no vacuum or helium required) |
| Software Interface | Multilingual (English/Chinese), Excel-compatible data export |
| Compliance Support | RoHS Directive 2011/65/EU, WEEE Directive 2012/19/EU, ELV Directive 2000/53/EC, China RoHS II (SJ/T 11364-2014), JEITA EG0201, ASTM F2617-23 |
| Brand | HORIBA |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Imported |
| Model | MESA-50 |
| Configuration | Benchtop/Free-standing |
| Industry Application | Electronics Manufacturing & Compliance Testing |
| Elemental Range | Al (Z=13) to U (Z=92) |
| Quantitative Detection Range | 1 ppm – 99.99 wt% |
| Energy Resolution | <140 eV (Mn Kα) |
| Relative Standard Deviation (RSD) | ≤0.05% for repeated measurements under standardized conditions |
| Detector | Silicon Drift Detector (SDD) |
| Signal Processing | HORIBA Digital Pulse Processor (DPP) |
| Collimator Options | Three fixed apertures (Ø0.1 mm, Ø0.3 mm, Ø1.0 mm) |
| Dimensions | 225 × 210 × 40 mm (L×W×H) |
| Weight | 12 kg |
| Battery Life | Up to 6 hours continuous operation (integrated rechargeable Li-ion) |
| Vacuum/Atmosphere | Ambient air analysis (no vacuum pump or cryogenic cooling required) |
| Brand | HORIBA |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported Instrument |
| Model | MESA-7220V2 |
| Configuration | Benchtop / Floor-Standing |
| Instrument Type | Conventional ED-XRF |
| Application-Specific Design | Petroleum & Lubricant Compliance Testing |
| Elemental Range | S, Cl |
| Quantification Range | S: 0.7 ppm – 10.0 wt% |
| Cl | 0.6 ppm – 10.0 wt% |
| Mn-Kα Energy Resolution | ≤175 eV |
| Detector | Silicon Drift Detector (SDD) |
| Brand | HORIBA |
|---|---|
| Origin | Japan |
| Model | XGT-5200WR |
| Sample Environment | Air (Atmospheric) |
| Elemental Range | Na to U |
| Quantification Range | 1 ppm – 99.99% |
| Operating Conditions | 50 kV / 1 mA |
| Repeatability | ±0.1% RSD |
| Spot Size | Standard 400 µm, Optional 10 µm |
| Detector | Silicon Drift Detector (SDD), LN2-free |
| Geometry | Coaxial Optical Microscope Integration |
| Analysis Mode | Non-destructive, No Vacuum Required, No Sample Preparation |
| Brand | HORIBA |
|---|---|
| Origin | Japan |
| Model | XGT-7000V |
| Detector | Silicon Drift Detector (SDD) |
| X-ray Source | Rh anode, 50 kV / 1 mA |
| Spatial Resolution | Down to 10 µm |
| Measurement Range | Na (11) to U (92) |
| Vacuum Modes | Full vacuum & local vacuum (switchable in <5 s) |
| Optical Imaging | Co-axial CCD with macro/micro view |
| Sample Chamber | 300 mm × 300 mm × 80 mm (full vacuum), XY stage: 100 mm × 100 mm |
| Software | SmartMap™ for hyperspectral mapping, INCA™ pulse processor, GLP-compliant data handling |
| Quantification Methods | Fundamental Parameters (FP), single-standard FP, calibration curve, multilayer thin-film analysis (nm–µm scale) |
| Elemental Mapping | Pixel-resolved full-spectrum acquisition, offline reprocessing, RGB overlay, line scan, ROI masking |
| Brand | HORIBA |
|---|---|
| Origin | Japan |
| Model | XGT-7200WR |
| Detection Principle | Energy Dispersive X-Ray Fluorescence (ED-XRF) |
| Spot Size Range | 10 µm to 1.2 mm |
| Detector Type | Silicon Drift Detector (SDD), Liquid-Nitrogen-Free |
| Maximum Scan Area | 10 cm × 10 cm |
| Optical-Element Image Co-Registration | Yes |
| Elemental Mapping Resolution | ≤10 µm |
| Compliance | ASTM E1621, ISO 8256, IEC 62321-5 (RoHS), USP <232>/<233>, GLP/GMP-ready data audit trail |
| Brand | I-CHEQ |
|---|---|
| Origin | USA |
| Model | F2-9000 |
| Application | Handheld/Field-Portable |
| Element Range | Mg–Pu |
| Detection Range | 1 ppm – 99.99% |
| Energy Resolution | 120–140 eV |
| Repeatability | 0.1% |
| Detector | High-Resolution Silicon Drift Detector (SDD) |
| Excitation Source | Variable-Voltage (up to 50 kV) Microfocus X-ray Tube with Selectable Anode Materials (Au, Ag, W, Ta, Pd) |
| Cooling | Peltier Semiconductor |
| Operating System | Windows CE |
| Display | Industrial-Grade TFT Color Touchscreen |
| Dimensions (L×W×H) | 233 × 84 × 261 mm |
| Weight (with battery) | 1.46 kg |
| Compliance | Meets IEC 61000-6-3 (EMC), IEC 61000-6-2, ANSI N43.3, and FDA 21 CFR Part 1020.40 for X-ray safety |
| Brand | Ju Chuang Environmental |
|---|---|
| Origin | Shandong, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | JC-350X |
| Form Factor | Benchtop/Floor-Standing |
| Instrument Type | Conventional EDXRF |
| Application Scope | General-Purpose |
| Detection Range | 0.07 ppm – 99.9% |
| Energy Resolution | 125 eV (at Mn Kα) |
| Repeatability | ≤0.1% RSD (for major elements, 100 s counting) |
| Detector | Peltier-cooled Silicon Drift Detector (SDD) |
| Measurement Range | 1–45 keV |
| High Voltage | 5–50 kV |
| Tube Current | 5–1000 µA |
| Vacuum Level | ≤10⁻² Pa within 10 s (operational range: 10⁻¹–10⁻⁵ Pa) |
| Sample Imaging | 5 MP CCD camera with real-time positioning |
| Power Consumption | 50 W (main unit), 550 W (vacuum pump) |
| Dimensions | 720 × 440 × 435 mm (W×D×H) |
| Weight | 65 kg |
| Brand | NCS |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Product Type | Domestic |
| Model | PORT-X710 Handheld ED-XRF Spectrometer |
| Application | Field-Portable |
| Instrument Class | General-Purpose |
| Industry-Specific Use | Multi-Material Alloy Analysis |
| X-ray Tube | 5 W / 50 kV / 200 µA max |
| Target Material | Rhodium (Rh) |
| Detector | Si-Pin |
| Energy Resolution | ≤185 eV |
| Operating Temperature | –10 °C to 50 °C |
| Dimensions | 240 mm (L) × 110 mm (W) × 240 mm (H) |
| Weight | 1.6 kg |
| Quantitative Method | Fundamental Parameters (FP) |
| Elemental Range | Ti to U |
| Battery | Dual Li-ion, 7.4 V / 9600 mAh |
| Runtime | ≥10 h (typical) |
| Processor | Qualcomm Snapdragon™ octa-core, 2.0 GHz, 14 nm FinFET, 1 MB L2 cache |
| OS | Android 7.1 |
| Display | 5.5-inch Full HD (1080p) capacitive touchscreen |
| Connectivity | Wi-Fi 802.11 a/b/g/n/ac, Bluetooth 4.2/LE |
| Radiation Safety | Integrated shutter, sample proximity sensor, password-protected startup, certified radiation shielding per CNAS and GBZ 188–2014 |
| Sample Compatibility | Solid metal alloys (e.g., stainless steels, low-alloy steels, Cu-based, Ni-based, Ti alloys), scrap fragments, billets, pipes, fasteners |
| Brand | NCS |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Manufacturer |
| Product Type | Handheld/Portable |
| Model | PORT-X720 |
| X-ray Tube | 5 W, 50 kV, 200 µA max |
| Anode Material | Rhodium (Rh) |
| Detector | Silicon Drift Detector (SDD) |
| Energy Resolution | ≤155 eV |
| Operating Temperature | −10 °C to 50 °C |
| Dimensions | 240 × 110 × 240 mm |
| Weight | 1.6 kg |
| Measurement Elements | Mg to U |
| Battery | Dual 7.4 V / 9600 mAh Li-ion |
| Runtime | ≥10 h |
| Processor | Qualcomm Snapdragon™ Octa-core (14 nm FinFET), 2.0 GHz, 1 MB L2 cache |
| OS | Android 7.1 |
| Display | 5.5-inch Full HD (1080p) touchscreen |
| Connectivity | Wi-Fi 802.11 a/b/g/n/ac, Bluetooth 4.2/LE, USB |
| Radiation Safety | Integrated shutter, sample proximity sensor, password-protected startup, regulatory compliance per CNAS and GBZ 188–2014 |
| Analysis Algorithm | Fundamental Parameters (FP) method with user-customizable method development capability |
| Brand | Niton |
|---|---|
| Origin | USA |
| Manufacturer | Thermo Fisher Scientific |
| Model | XL5 |
| Application | Field-Portable |
| Industry-Specific Use | Geological & Mining Exploration |
| Elemental Range | Mg to U |
| Quantification Range | 1 ppm – 99.99% |
| Repeatability | ±0.1% RSD |
| Detector | Graphene-Enhanced Silicon Drift Detector (SDD) |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | ALTRACE |
| Configuration | Benchtop/Floor-standing |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-purpose |
| Elemental Range | Na (Z=11) to U (Z=92) |
| Quantification Range | 1 ppm – 99.99 wt% |
| Energy Resolution | <140 eV (Mn Kα) |
| Detector | Silicon Drift Detector (SDD) |
| Brand | Shimadzu |
|---|---|
| Origin | Jiangsu, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (PRC) |
| Model | EDX-7200 |
| Configuration | Benchtop or Floor-Standing |
| Instrument Type | Conventional ED-XRF |
| Application Scope | General-Purpose |
| Elemental Range | Na (Z=11) to U (Z=92) |
| Quantitative Concentration Range | 0.1 ppm – 100 wt% |
| Energy Resolution | ≤140 eV (Mn Kα) |
| Repeatability | ≤0.1% RSD (for major elements under standardized conditions) |
| Detector | High-Performance Silicon Drift Detector (SDD) |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | EDX-8100 |
| Configuration | Benchtop & Floor-Standing Options |
| Application Scope | General-Purpose Elemental Analysis |
| Elemental Range | C (Z=6) to U (Z=92) |
| Quantification Range | 1 ppm – 99.99 wt% |
| Energy Resolution | <140 eV at Mn Kα |
| Repeatability | <0.1% RSD (Relative Standard Deviation) |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | EDX-LE |
| Configuration | Benchtop / Floor-standing |
| Detection Principle | Energy Dispersive X-Ray Fluorescence (EDXRF) |
| Sample Forms | Solid, Liquid, Powder |
| Elemental Range | Al (13) to U (92) |
| Sample Chamber Dimensions | Max. W370 mm × D320 mm × H155 mm |
| Detector | Peltier-cooled Si-PIN Semiconductor Detector |
| Primary Beam Filters | 5-position automatic filter changer + OPEN position |
| Analysis Modes | Screening, Qualitative, Quantitative |
| Regulatory Compliance Focus | RoHS Directive (EU 2011/65/EU), ELV Directive (2000/53/EC), China RoHS II (SJ/T 11364-2014) |
| Brand | Shimadzu |
|---|---|
| Origin | Japan |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Import Status | Imported |
| Model | EDX-LE Plus |
| Configuration | Benchtop/Floor-standing |
| Industry Application | Electronics |
| Elemental Range | Al (Z=13) to U (Z=92) |
| Detection Limit | 0.1 ppm |
| Quantitative Range | 0.1 ppm – 99.99 wt% |
| Energy Resolution | <140 eV (Mn Kα) |
| Repeatability | ≤0.1% RSD (at 100 s counting time, for Cr in stainless steel standard) |
| Brand | SPECTRO |
|---|---|
| Origin | Germany |
| Model | SPECTROMIDEX |
| Instrument Type | Benchtop ED-XRF Spectrometer |
| Application Scope | General-purpose elemental analysis, optimized for precious metals |
| Compliance | Designed for ISO/IEC 17025-compliant labs, supports GLP/GMP data integrity requirements |
| Detector | High-resolution silicon drift detector (SDD) with micro-focus X-ray source |
| Measurement Principle | Energy-dispersive X-ray fluorescence (ED-XRF) with polycapillary optic collimation |
| Sample Form | Solid, powdered, or plated samples (non-destructive) |
| Software | SPECTRO XRF Analyzer Suite with audit trail, user-level permissions, and 21 CFR Part 11–ready reporting modules |
| Data Export | CSV, XML, PDF |