Hall Effect Tester
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| Brand | Ayao Instruments |
|---|---|
| Origin | Hubei, China |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic (PRC) |
| Model | HET |
| Pricing | Upon Request |
| Instrument Type | Variable-Temperature Hall Effect Tester |
| Measurement Principle | Van der Pauw Method |
| Sample Form | Thin Films & 2D Layers |
| Compatible Materials | Si, ZnO, SiGe, SiC, GaAs, InGaAs, InP, GaN (n-type & p-type) |
| Temperature Range | Cryogenic to 500 K (configurable with optional cryostat or furnace) |
| Magnetic Field Range | ±1.5 T (standard electromagnet), up to ±9 T (with superconducting magnet option) |
| Current Source Accuracy | ±0.05% of reading |
| Voltage Measurement Resolution | 100 nV |
| Data Acquisition Rate | Up to 100 samples/sec per channel |
| Software Compliance | Supports ASTM F76, ISO/IEC 17025 traceability logs, GLP-compliant audit trail (optional) |
| Brand | Lake Shore |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | MCS |
| Instrument Type | Variable-Temperature Hall Effect Tester |
| Constant Current Source Range | 1–20 mA |
| Mobility Range | 0.01–10⁶ cm²/V·s |
| Resistivity Range | 1×10⁻⁵ – 1×10⁵ Ω·cm |
| Carrier Concentration Range | 8×10² – 8×10²³ cm⁻³ |
| Typical Measurement Time | <10 s |
| Magnetic Field | 1 T (RT), 0.75 T (77 K) |
| Sample Dimensions (Max) | 10 mm × 10 mm × 3 mm (Solder Card) |
| Brand | Makeway |
|---|---|
| Origin | Japan |
| Model | 1600 |
| Instrument Type | Temperature-Variable Hall Effect Tester (Microwave-Based, Non-Contact) |
| Operating Frequency | 10 GHz |
| Current Source Range | 20 mA (for auxiliary calibration & optional DC bias) |
| Sample Diameter Support | 4–8 inch wafers |
| Carrier Mobility Range | 100–3000 cm²/V·s |
| Measurement Modes | Single-Point & Area Mapping |
| Compliance | Designed for ISO/IEC 17025-aligned lab environments |
| Brand | NanoMagnetics |
|---|---|
| Origin | United Kingdom |
| Model | LT-AC/DC |
| Magnetic Field Range | ±2.5 T (electromagnet, 25 mm pole face, 10 mm gap) |
| Optional High-Field Configuration | up to ±16 T (with cryogen-free superconducting magnet & cryostat) |
| Temperature Range | 3 K – 1273 K (via interchangeable cryogenic and high-temperature measurement heads) |
| Sample Positioning | 3-axis motorized stage (X/Y/Z) with sub-micron repeatability |
| Hall Probe Calibration | Integrated NanoMagnetics Gaussmeter with traceable NIST-calibrated Hall sensor |
| Electrical Measurement | Keithley SourceMeter (pA/μV resolution) |
| Software Platform | LabVIEW-based, fully automated, USB/Ethernet-controlled |
| Compliance | Supports ASTM F76, ISO/IEC 17025-aligned workflows, FDA 21 CFR Part 11-ready audit trail (optional), GLP/GMP-compatible data logging |
| Brand | Das-Nano |
|---|---|
| Origin | USA |
| Model | ONYX-1 |
| Instrument Type | Room-Temperature Hall Effect System |
| Current Source Range | 20 mA |
| Measurement Principle | Microwave Reflectometry-Based Carrier Profiling |
| Applicable Mobility Range | 100–3000 cm²/V·s |
| Sample Compatibility | Monolayer to multilayer graphene, graphene oxide, PEDOT:PSS, CNT dispersions, MoS₂, h-BN, ALD-ZnO, GaN-on-SiC epiwafers, spin-coated photoresists, powders, and inkjet-printed films |
| Brand | SWIN |
|---|---|
| Origin | Taiwan |
| Model | HL8800 |
| Operating Temperature | Ambient & Liquid Nitrogen (77 K) |
| Magnetic Field Strength | 0.65 T / 1 T (selectable) |
| Constant Current Source Range | 2 nA – 100 mA |
| Voltage Measurement Range | ±2000 V |
| Maximum Applied Voltage | 200 V |
| Carrier Concentration Range | 1 × 10⁷ – 1 × 10²¹ cm⁻³ |
| Mobility Range | 1 – 1 × 10⁷ cm²/(V·s) |
| Resistivity Range | 1 × 10⁻⁶ – 1 × 10⁷ Ω·cm |
| Sample Compatibility | Bulk and thin-film semiconductors (n- and p-type) |
| Hall Coefficient Accuracy | < ±0.5% typical |
| Voltage Resolution | ≤1 nV |
| Current Resolution | ≤2 nA |
| Dimensions (W × D × H) | 260 × 220 × 180 mm |
| Weight | 6 kg |