In Situ Sample Holders
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| Brand | Appo |
|---|---|
| Origin | United Kingdom |
| Model | SWIFT |
| Max Load Capacity | 10 kN |
| Temperature Range | –120 °C to +1000 °C |
| Stroke Range | 16–26 mm |
| Compatibility | SEM, TEM, Optical Microscope, Confocal Microscope, EBSD, Raman, XRD, AFM, Metallographic Microscope |
| Control Interface | Windows 10–compatible PC-based controller with drag-and-drop test sequencing software |
| Brand | Bestron |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Authorized Distributor |
| Product Category | Domestic |
| Model | INSTEMS MET/MT/ME/ET/M |
| Application Field | Materials Science |
| Instrument Classification | In Situ Tensile/Compression/Bending Holder |
| Thermal Range | RT–1200 °C |
| Max Force Output | >100 mN |
| Max Displacement | >4 µm |
| Minimum Step Resolution | <0.5 nm |
| Dual-Tilt Range (α/β) | ±25° each |
| Tilt Precision | <0.1° |
| Thermal Ramp Rate | >10,000 °C/s |
| Temperature Accuracy | ≥98% |
| Thermometry Method | Four-Probe Resistive |
| EDS Compatibility | Yes |
| Electrical Output | ±50 V |
| Current Measurement Range | 1 pA–1 A |
| Voltage Measurement Range | 100 nV–50 V |
| Spatial Resolution (in situ) | ≤0.1 nm |
| Drift Stability | <50 pm/s |
| Brand | Bestron |
|---|---|
| Model | INSTEMS-M |
| Type | MEMS-Based In Situ TEM Mechanical Testing Holder |
| Loading Modes | Tension, Compression, Nanoindentation, Bending, Impact, Creep, Fatigue |
| Force Range | >100 mN |
| Displacement Range | 4 µm |
| Actuation Resolution | <500 pm |
| Drift Rate | <50 pm/s |
| Spatial Resolution (TEM-compatible) | ≤0.1 nm |
| Dual-Axis Tilt | α ±20°, β ±10° |
| Compatibility | Standard 3-mm TEM specimen holders, Gatan/FEI/Thermo Fisher-compatible apertures |
| Chip Customization | User-configurable MEMS chip geometry and loading configuration |
| Brand | Bestron |
|---|---|
| Model | INSTEMS-ME |
| Type | Dual-Axis Tilt Electromechanical In Situ TEM Holder |
| Max Force | 100 mN |
| Max Displacement | 4 µm |
| Force Resolution | < 500 pm |
| Voltage Range | ±50 V |
| Current Range | 1 pA–1 A |
| Temperature Range | RT–1200 °C |
| Temp. Stability | < 0.1 °C |
| α/β Tilt Range | ±25° each |
| Drift Rate | < 50 pm/s |
| Spatial Resolution (TEM-compatible) | ≤0.1 nm |
| EDS-Compatible | Yes |
| Application Domain | Materials Science, Nanodevices, Energy Storage, Ferroelectrics, Piezoelectrics, Flexible Electronics |
| Brand | Bestron |
|---|---|
| Model | INSTEMS-MET |
| Type | In Situ TEM Dual-Axis Tilt Sample Holder with Integrated Mechanical, Electrical, and Thermal Actuation |
| Heating Range | RT to 1200 °C |
| Temperature Accuracy | < 0.1 °C |
| Max. Driving Force | > 100 mN |
| Drive Resolution | < 500 pm |
| Voltage Range | ±50 V (up to 150 V peak) |
| Current Range | 1 pA – 2 A |
| Dual-Axis Tilt | α/β ±25° |
| Spatial Resolution (TEM-compatible) | ≤ 0.1 nm |
| Sample Drift | < 50 pm/s |
| EDS-Compatible | Yes |
| Heating Rate | > 10,000 °C/s |
| Brand | Bestron |
|---|---|
| Model | INSTEMS-MT |
| Category | In Situ TEM Sample Holder |
| Heating Range | RT to 1200 °C |
| Temperature Accuracy | < 0.1 °C |
| Programmable Thermal Ramp Rate | >10,000 °C/s |
| Mechanical Load Capacity | >100 mN |
| Drive Resolution | < 500 pm |
| Dual-Axis Tilt | α ±20°, β ±10° |
| Sample Drift | < 50 pm/s |
| Spatial Resolution (TEM-compatible) | ≤0.1 nm |
| EDS-Compatible | Yes |
| Current Range | 0–2 A |
| Voltage Range | 0–150 V |
| Brand | Bestron |
|---|---|
| Model | INSTEMS-ET |
| Type | In Situ Dual-Axis Tilt TEM Sample Holder |
| Heating Range | RT to 1200 °C |
| Electrical Bias Range | 0–150 V |
| Current Range | 0–2 A |
| Dual-Axis Tilt | α ±20°, β ±10° |
| Spatial Resolution (in situ) | ≤0.1 nm |
| Sample Drift | <50 pm/s |
| EDS-Compatible | Yes |
| Heating Accuracy | ≥98% |
| Maximum Heating Rate | >10,000 °C/s |
| Current Measurement Range | 1 pA–1 A |
| Brand | CHIPNOVA |
|---|---|
| Origin | Fujian, China |
| Manufacturer Type | Direct Manufacturer |
| Regional Classification | Domestic (China) |
| Model | CNS-VH-LR |
| Price | USD 1.00 (Reference Only – Contact for Quotation) |
| Brand | CHIPNOVA |
|---|---|
| Origin | Fujian, China |
| Manufacturer Type | OEM Manufacturer |
| Country of Origin | Domestic (China) |
| Model | CNT-GNIH |
| Pricing | Upon Request |
| Instrument Category | In Situ Tensile/Compression Holder |
| Application Domain | Materials Science |
| Brand | CHIPNOVA |
|---|---|
| Origin | Fujian, China |
| Manufacturer Type | Direct Manufacturer |
| Country of Origin | China |
| Model | CNT-SHE |
| Application Category | In Situ Liquid TEM |
| Primary Application Field | Catalysis |
| Instrument Class | In Situ TEM Sample Holder |
| Brand | CHIPNOVA |
|---|---|
| Model | CNT-OTAR-S |
| Holder Type | In Situ Tomographic Sample Holder |
| Compatible TEM Platforms | Thermo Fisher/FEI, JEOL, Hitachi (HR)TEM/STEM |
| Sample Mounting Options | Single-Axis Tip & C-Type Tip |
| Tip Exchangeable | Yes |
| Tip Configurations | 3 mm Half-Grid (C-Type), Rod/Conical (Single-Axis) |
| Maximum Tilt Range | ±54° (Tomographic Series) |
| Tilt Increment | 6° |
| Drift Rate | <0.5 nm/min (Stabilized State) |
| Holder Body Material | High-Strength Titanium Alloy |
| EDS/EELS/SAED Compatibility | Fully Supported |
| Application Domain | Materials Science, Nanogeology, In Situ Structural Analysis |
| Compliance | Designed for GLP-aligned electron tomography workflows |
| Brand | MicroInno |
|---|---|
| Model | MIVTHD-TF/JL |
| Compatibility | Thermo Fisher, JEOL, Hitachi TEMs |
| Dual-Axis Tilt Range | α/β ±30° (typ.) |
| Tilt Resolution | < 0.1° |
| Linear Translation Resolution | < 1.5 nm/min |
| Sealing Mechanism | Retractable Viton O-ring |
| Sample Mounting | Hex-screw clamping |
| Vacuum Compatibility | ≤1×10⁻⁷ Pa |
| Gas Environment | Inert gas (Ar/N₂) or high vacuum transfer |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | OEM Manufacturer |
| Product Category | Domestic |
| Model Series | PicoFemto In Situ Cryo Sample Holder |
| Instrument Classification | In Situ Cryogenic TEM Holder |
| Application Field | Materials Science |
| Cooling Medium | Liquid Nitrogen |
| Minimum Temperature | ≤ –170 °C (≤ 103 K) |
| Temperature Stability | < ±0.1 K |
| Cool-down Time to Minimum Temperature | ≤ 45 min |
| Dewar Capacity | 180 mL |
| Cryo Hold Time | ≥ 4 h |
| Resolution Compatibility | < 0.3 nm TEM Imaging |
| Dual-Tilt Range (β) | ±25° |
| Vacuum Bake Temperature | 120 °C |
| Base Vacuum (with Pre-pump System) | 6×10⁻⁵ Pa |
| Integrated Plasma Cleaning Power | 5–50 W (ICP mode) |
| Modular Interface Slots | 4 |
| Compatible TEM Platforms | Thermo Fisher Scientific (TFS), JEOL, Hitachi |
| Optional Functional Modules | Heating, Electrical Biasing, Mechanical Actuation (MEMS), STM Integration, High-Angle Tilt, Porous-Sample Support |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Domestic |
| Model | PicoFemto In Situ MEMS Gas/Liquid TEM Sample Holder Series |
| Pricing | Upon Request |
| Instrument Classification | In Situ Gas Holder |
| Application Domain | Materials Science |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Direct Manufacturer |
| Origin Category | Domestic (China) |
| Model | PicoFemto In Situ MEMS Heating & Electrical Sample Holder Series |
| Application Field | Materials Science |
| Instrument Classification | In Situ Heating Holder |
| Pricing | Upon Request |
| Compatibility | Compatible with Standard TEM Goniometer Stages and Specified Pole Pieces |
| Brand | ZEPTOOLS |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Direct Manufacturer |
| Product Category | Domestic |
| Model | PicoFemto In Situ TEM Sample Holder Series |
| Instrument Classification | In Situ Tensile Holder |
| Application Field | Materials Science |
| Electrical Measurement Range | 1 nA – 30 mA |
| Current Resolution | < 100 fA |
| Voltage Output | ±10 V (Standard Mode), ±150 V (High-Voltage Mode) |
| Coarse Positioning Range (XY/Z) | 2.5 mm / 1.5 mm |
| Fine Positioning Range (XY/Z) | 15 µm / 1.5 µm |
| Fine Positioning Resolution (XY/Z) | 0.4 nm / 0.04 nm |