Minority Carrier Lifetime Tester
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| Brand | Freiberg Instruments |
|---|---|
| Origin | Germany |
| Model | MDPpro 850+ |
| Measurement Principle | Microwave Photoconductance Decay (µPCD) & Quasi-Steady-State Photoconductance (QSS-PCD/MDP) |
| Lifetime Range | 20 ns – 100 ms (for resistivity > 0.3 Ω·cm) |
| Scan Speed | Line scan < 30 s |
| Simultaneous Parameters | Minority carrier lifetime (µPCD/MDP), photoconductivity, resistivity |
| Sample Geometry Recognition | Automatic (G12, M10 bricks, wafers up to Ø300 mm) |
| Laser Sources | 980 nm IR diode (≤500 mW) + 905 nm IR diode (≤9 W) |
| Resistivity Range | 0.5 – 5 Ω·cm (custom ranges available) |
| Conductivity Type | p-type and n-type silicon |
| Compliance | SEMI PV9-1110, CE, ISO 9001 |
| Software Platform | MDP Studio (Windows 11+, .NET Framework, dual Ethernet) |
| Power Supply | 100–250 V AC, 6 A |
| Dimensions (W×H×L) | 2560 × 1910 × 1440 mm |
| Weight | ~200 kg |
| Brand | Freiberg Instruments |
|---|---|
| Origin | Germany |
| Model | MDPspot- |
| Minority Carrier Lifetime Range | 20 ns to several tens of ms |
| Penetration Depth | 500 µm |
| Sample Size | min. 50 × 50 mm², max. 12″ (300 mm) or 210 × 210 mm² |
| Resistivity Range | 0.2 – >10³ Ω·cm |
| Compatible Materials | Silicon, compound semiconductors, oxides, wide-bandgap materials, perovskites, epitaxial layers |
| Brand | SENTECH |
|---|---|
| Origin | Germany |
| Model | MDPinline |
| Application | In-line quantitative minority carrier lifetime mapping of silicon wafers |
| Measurement Principle | Microwave-detected photoconductance decay (µ-PCD) |
| Scan Speed | <1 second per wafer |
| Integration | Conveyor-compatible, no moving mechanical parts |
| Compliance | Designed for semiconductor manufacturing environments compliant with ISO 9001 and SEMI S2/S8 safety standards |
| Software Interface | Ethernet-enabled, supports SECS/GEM protocol for factory automation integration |
| Data Output | Full-wafer lifetime map (pixel-resolved), dual-line resistivity profile, CSV/HDF5 export |
| Calibration | Traceable to NIST-traceable reference wafers |
| Operating Environment | Class 1000 cleanroom compatible (ISO 4), 18–28 °C, <60% RH non-condensing |
| Power Supply | 100–240 V AC, 50/60 Hz, <500 W |
| Brand | SENTECH |
|---|---|
| Origin | Germany |
| Model | MDPspot |
| Type | Contactless, Microwave Photoconductance Decay (μ-PCD) Based Lifetime Tester |
| Sample Handling | Manual Z-axis adjustment (up to 156 mm height) |
| Measurement Mode | Single-point, non-contact, room-temperature operation |
| Material Compatibility | Crystalline and multicrystalline silicon wafers & bricks |
| Compliance | Designed for R&D and process monitoring in PV and semiconductor fabrication environments |
| Software | MDP Control Suite (Windows-based, real-time visualization, CSV export, GLP-compliant data logging) |
| Brand | Sinton Instruments |
|---|---|
| Origin | USA |
| Model | WCT-120MX + Suns-VocMX |
| Minority Carrier Lifetime Range | 0.1 µs – 15 ms |
| Penetration Depth | 3 mm |
| Maximum Sample Diameter | 230 mm |
| Resistivity Range | 0.15 – 300 Ω·cm |
| Compatible Material | Silicon wafers |