Nanoindentation and Scratch Tester
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| Brand | Anton Paar |
|---|---|
| Origin | Austria |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Category | Imported Instrument |
| Model | Piezo Sample Stage 100 μm × 100 μm |
| Pricing | Upon Request |
| Brand | Anton Paar |
|---|---|
| Origin | Switzerland |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Product Origin | Imported |
| Model | NHT³ |
| Instrument Type | Nanoindentation Tester |
| Maximum Indentation Depth | 200 µm |
| Effective Load Range | 0.1 mN to 500 mN |
| Load Resolution | 20 nN |
| Load Noise (RMS) | ≤0.5 µN |
| Depth Resolution | 0.01 nm |
| Depth Noise (RMS) | ≤0.15 nm |
| Loading Rate | up to 10,000 mN/min |
| Data Acquisition Rate | 192 kHz |
| Environmental Options | Liquid Testing Compatible |
| Brand | Anton Paar |
|---|---|
| Origin | Austria |
| Manufacturer | Anton Paar GmbH |
| Type | Imported Instrument |
| Model | NST³ |
| Instrument Category | Nanoindentation and Scratch Tester |
| Maximum Indentation Depth | 1 µm |
| Load Resolution | 0.01 µN |
| Displacement Range | 600 µm |
| Maximum Friction Force | 1 N |
| Brand | Anton Paar |
|---|---|
| Origin | Switzerland |
| Manufacturer | Anton Paar GmbH |
| Type | Imported Instrument |
| Model | STEP x01 |
| Instrument Category | Nanoindentation and Scratch Tester |
| Indenter Tip Material | Diamond |
| Base Platform | Modular Mechanical Surface Testing System |
| Maximum Load Capacity | Not specified in input |
| Compliance | GLP/GMP-ready architecture, ASTM E2546, ISO 14577, ISO 20502, USP <1089> compatible (inferred from platform class) |
| Vibration Isolation | Optional active damping table & acoustic enclosure |
| Microscopy | Dual-view optical microscope (20×–10,000× continuous zoom) |
| Positioning Accuracy | <1 µm over extended scan range |
| Automation Interface | Integrated for factory-floor QC integration |
| Brand | Anton Paar TriTec (formerly CSM Instruments, Switzerland) |
|---|---|
| Origin | Switzerland |
| Model | HIT 300 |
| Instrument Type | Nanoindentation and Scratch Tester |
| Thermal Drift | ≤0.0008 nm/s |
| Frame Stiffness | 10⁸ µN/µm |
| Positioning Accuracy | <1 µm |
| Repeatability | High |
| Compliance | ASTM E2546, ISO 14577, ISO 20519, USP <1089>, GLP/GMP-ready data traceability |
| Brand | Anton Paar TriTec (formerly CSM Instruments, Switzerland) |
|---|---|
| Origin | Switzerland |
| Model | NST³ |
| Instrument Type | Nano Scratch Tester |
| Application Scope | Thin film and coating adhesion, cohesion, scratch resistance, and mechanical integrity assessment for layers < 1 µm thick |
| Key Measurement Capabilities | Critical load (Lc) determination, real-time scratch depth profiling, friction force mapping, elastic recovery quantification, and simultaneous panoramic imaging |
| Brand | Anton Paar |
|---|---|
| Origin | Switzerland |
| Manufacturer | Anton Paar GmbH |
| Type | Nanoindentation and Scratch Tester |
| Model | UNHT³ |
| Indentation Depth Range | 0–100 µm |
| Load Range | 10 µN – 100 mN |
| Load Resolution | 3 nN |
| Displacement Resolution | 0.003 nm |
| Thermal Drift | <3 nm/min |
| Frame Stiffness | >10⁸ N/m |
| Compliance with Standards | ISO 14577, ASTM E2546 |
| Brand | Appo |
|---|---|
| Origin | Switzerland |
| Model | MTA03 |
| Load Range | ±200 mN |
| Load Resolution | 0.5 nN |
| Displacement Range | 0.1 nm to 29 mm |
| Displacement Resolution (short-range) | 0.1 nm |
| Displacement Resolution (long-range) | 1 nm |
| Microscope Working Distance | 95 mm |
| Camera | 3 MP CMOS USB |
| Optical Zoom | 7:1 motorized |
| Illumination Options | Coaxial lens, ring light, diffuse backlight |
| Probe Types | Multiple FT-S microforce sensing probes |
| Optional Modules | FT-G microtweezers for microassembly |
| Brand | Bruker |
|---|---|
| Origin | Malaysia |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | Hysitron TS 77 Select Nanoindenter |
| Instrument Type | Nanoindenter |
| Maximum Indentation Depth | µm |
| Effective Load Range | 100 nN – 10 mN |
| Load Resolution | <1 nN |
| Displacement Range | 1 nm – 10 µm |
| Displacement Resolution | <0.05 nm |
| Maximum Friction Force | 10 mN |
| Indenter Tip Geometry | Berkovich (triangular pyramid), Cube-corner, Flat-punch, and Custom trapezoidal tips |
| Thermal Drift | <0.05 nm/s |
| Brand | SHNTI (Distributor) |
|---|---|
| Origin | Switzerland |
| Model Series | FT-RS / FT-FS / FT-S / FT-G / FT-UMS1000 |
| Instrument Type | Nanoindentation and Scratch Tester |
| Maximum Indentation Depth | 1 µm |
| Effective Load Range | 5 nN – 10 mN |
| Load Resolution | 1 nN |
| Displacement Range | ±100 µm |
| Displacement Resolution | 5 nm |
| Maximum Friction Force | 1 mN |
| Indenter Tip Types | Berkovich, Cube-Corner, Flat Punch, Spherical (customizable) |
| Thermal Drift | <0.1 nm/s (at 25 °C, stabilized environment) |
| Brand | Fischer |
|---|---|
| Origin | Germany |
| Model | ST30 |
| Instrument Type | Micro/Nano Scratch Tester |
| Maximum Indentation Depth | 1000 µm |
| Effective Load Range | 0.01–30 N |
| Load Resolution | 0.7 µN |
| Displacement Range | 100 mm |
| Displacement Resolution | 0.01 nm |
| Maximum Friction Force | 50 N |
| Indenter Type | Rockwell Indenter |
| Brand | KLA |
|---|---|
| Origin | USA |
| Model | iMicro |
| Instrument Type | Integrated Nanoindentation and Scratch Tester |
| Maximum Normal Load | 1 N |
| Load Resolution | <1 nN |
| Displacement Range | ±25 µm |
| Displacement Resolution | <0.05 nm |
| Indenter Types | Dozens of diamond indenters (Berkovich, cube corner, Vickers, spherical, flat punch, etc.) |
| Controller | InQuest high-speed controller (100 kHz data acquisition, 20 µs time constant) |
| Software | InView Suite (RunTest, ReviewData, InFocus, InView University, mobile app) |
| Compliance | Fully supports ISO 14577-1/2/3, ASTM E2546, and GLP/GMP-aligned audit trails |
| Brand | KLA |
|---|---|
| Origin | USA |
| Manufacturer | KLA Corporation |
| Instrument Type | Nanoindentation and Scratch Tester |
| Model | iNano® |
| Force Range | 0.1 µN – 50 mN |
| Displacement Range | ±25 µm |
| Force Resolution | < 10 nN |
| Displacement Resolution | < 0.01 nm |
| Thermal Drift | < 0.05 nm/s (at 25 °C, stabilized) |
| Maximum Scratch Load | 50 mN |
| Available Indenter Types | Berkovich, Cube-Corner, Spherical (1–100 µm radius), Conical, Flat Punch |
| Integrated Microscope | 10×–100× digital zoom, 1 µm lateral resolution |
| Controller | InQuest™ high-speed electronics (100 kHz sampling, 20 µs time constant) |
| XY Stage Travel | 100 mm × 100 mm |
| Z-Stage Travel | 25 mm |
| Compliance with Standards | ASTM E2546, ISO 14577-1/2/3, JIS H 8509 |
| Brand | Micro Materials |
|---|---|
| Origin | United Kingdom |
| Model | NanoTest Vantage |
| Instrument Type | Integrated Nanoindentation & Scratch Tester |
| Maximum Indentation Depth | >10 mm |
| Effective Load Range | 500 mN |
| Load Resolution | 3 nN |
| Displacement Range (XY) | 100 µm × 100 µm |
| Displacement Resolution | 0.002 nm |
| Maximum Friction Force | >250 mN |
| Indenter Types | Diamond, Cubic Boron Nitride (c-BN), Sapphire |
| Thermal Drift | <0.005 nm/s |
| Brand | Micro Materials |
|---|---|
| Origin | United Kingdom |
| Model | Xtreme |
| Instrument Type | Nanoindentation and Scratch Tester |
| Displacement Resolution | 0.002 nm |
| Indenter Types | Diamond, Boron Nitride, Sapphire |
| Thermal Drift | < 0.005 nm/s |
| Vacuum Level | 10⁻⁷ mbar |
| Temperature Range (Vacuum) | −40 °C to 1000 °C |
| Load Frame | Electromagnetic Actuation |
| Load Resolution | 3 nN |
| Repeatability Accuracy | < 0.4 µm |
| Compliance | ISO 14577, ASTM E2546 |
| Brand | Oxford Instruments |
|---|---|
| Origin | Switzerland |
| Model | FT-I04 |
| Instrument Type | Nanoindenter |
| Maximum Load Range | 2 N (across 5 selectable load channels) |
| Load Resolution | 0.5 nN (FT-S200 sensor) |
| Displacement Resolution | 0.05 pm |
| Indenter Tip Materials | Diamond, Tungsten Carbide, Sapphire |
| Indenter Geometries | Berkovich, Cube Corner, Flat Punch, Wedge, Conical, Spherical |
| Brand | Oxford Instruments |
|---|---|
| Origin | Switzerland |
| Model | FT-NMT04 |
| Load Range | 5 selectable full-scale channels, up to 2 N (FT-S2’000’000) |
| Load Resolution | 0.5 nN (FT-S200) |
| Displacement Range | 0.05 nm – 21 mm |
| Displacement Resolution | 0.05 pm |
| Brand | Rtec |
|---|---|
| Origin | Switzerland |
| Model | MFT-5000-HD |
| Instrument Type | Integrated Nanoindentation and Scratch Tester |
| Maximum Test Temperature | 1200 °C |
| Environmental Control | Inert Gas (Ar/N₂) or Vacuum (down to 10⁻⁷ mbar) |
| Load Range | 0.25–2000 N |
| Load Resolution | < 0.1% of full scale |
| Temperature Uniformity | ±2 °C across sample zone |
| Sample Stage | Motorized XY with programmable multi-point mapping |
| Compliance | ASTM E18, ISO 6508, ISO 14577, ASTM G171 (scratch), ASTM C1327 (ceramics) |
| Operating System | Windows 10 Professional |
| Power Supply | 110/220 V AC, 50/60 Hz |
| Environmental Chamber | Sealed, water-cooled, dual-zone heated |
| Brand | Rtec |
|---|---|
| Origin | Switzerland |
| Model | SMT-2000 |
| Instrument Type | Nanoindentation and Scratch Tester |
| Compliance Standards | ASTM E2546, ASTM B933, ASTM D785, ASTM E140, ISO 14577, ISO 6508, ISO 6507, ISO 4516, DIN 50359, DIN 55676, JIS B7734 |
| Actuation | Piezoelectric ceramic drive |
| Sensing Technology | Capacitive displacement sensing |
| Load Range | Nanonewton to 10 N (full-scale) |
| Vertical Resolution | Sub-nanometer |
| Lateral Sample Dimensions | Up to 500 mm × 500 mm |
| Maximum Sample Weight | 10 kg |
| Tip Options | Berkovich, Vickers, spherical, cube-corner, Knoop |
| In-situ 3D topography mapping | Yes |
| Active vibration isolation | Integrated platform |
| Brand | Rtec |
|---|---|
| Origin | Switzerland |
| Model | SMT-5000 |
| Instrument Type | Nanoindentation and Scratch Tester |
| Maximum Indentation Depth | 500 µm |
| Effective Load Range | 0.1–200 N |
| Load Resolution | 0.1 N |
| Displacement Range | 100 mm |
| Displacement Resolution | 1 nm |
| Maximum Friction Force | 100 N |
| Indenter Type | Diamond |