Accretech Surface Roughness Tester
| Brand | Accretech |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported Instrument |
| Model | Accretech Surface Roughness Tester |
| Pricing | Available Upon Request |
Overview
The Accretech Surface Roughness Tester is a high-precision contact profilometer engineered for quantitative evaluation of surface topography in accordance with ISO 4287, ISO 4288, and ASME B46.1 standards. Utilizing a diamond-tipped stylus (typically 2 µm radius, 90° included angle) driven by a precision linear motor, the instrument measures vertical displacement as the stylus traverses the surface at controlled speeds (0.05–1.0 mm/s). Vertical resolution reaches sub-nanometer levels (≤0.1 nm), enabling reliable characterization of machined, ground, polished, or coated surfaces across aerospace, automotive, medical device, and semiconductor manufacturing environments. Its rigid granite base, air-isolated vibration damping platform, and thermally stable metrology frame ensure long-term measurement repeatability (Rr ≤ ±1.5% per ISO 25178-6) under ambient laboratory conditions (20 ± 1°C, 40–60% RH).
Key Features
- Stylus-based tactile profiling with automatic lift mechanism to prevent tip damage during sample loading and retraction
- Multi-parameter surface analysis including Ra, Rz, Rq, Rsk, Rku, Rsm, Rmr, and bearing ratio curve (Abbott-Firestone)
- Integrated filtering: Gaussian, 2CR-75%, and phase-corrected digital filters compliant with ISO 16610-21
- Vertical measuring range up to 1000 µm (standard), extendable to 2000 µm with optional transducer
- Horizontal traverse length: 12.5 mm (standard), 25 mm, or 50 mm via interchangeable drive units
- Motorized Z-axis with auto-focus and programmable touchdown force (0.5–4 mN) for delicate or soft materials
- Compliance with ISO/IEC 17025 traceability requirements through NIST-traceable calibration artifacts (step height, roughness standards)
Sample Compatibility & Compliance
The Accretech system accommodates flat, cylindrical, and curved specimens with diameters ranging from 10 mm to 300 mm (with optional rotary stage). It supports samples up to 300 mm × 300 mm × 150 mm (L×W×H) on its standard granite table. Materials include metals (steel, aluminum, titanium), ceramics, polymers, optical glasses, and thin-film-coated substrates. All measurements adhere to international regulatory frameworks: ISO 25178-2 (areal surface texture), ISO 13565 (material ratio curves), and ASTM E1092 (stylus calibration verification). The instrument meets electromagnetic compatibility (EMC) requirements per IEC 61326-1 and safety standards per IEC 61010-1, supporting GLP/GMP-compliant laboratories through audit-ready configuration control and user access management.
Software & Data Management
Accretech’s proprietary SURFPAK software (v8.x or later) provides full measurement automation, real-time waveform visualization, and statistical process control (SPC) integration. It supports export of raw profile data in ASCII, CSV, and .srf formats; generates PDF reports with embedded calibration certificates, operator ID, timestamp, and environmental metadata. The software complies with FDA 21 CFR Part 11 requirements—including electronic signatures, audit trail logging (user actions, parameter changes, report generation), and role-based permissions—enabling deployment in regulated quality assurance environments. Data integrity is reinforced via encrypted local storage and optional network backup to secure enterprise servers.
Applications
- Verification of surface finish specifications for critical engine components (e.g., cylinder bores, valve seats, turbine blades)
- Process validation and tool wear monitoring in CNC grinding, honing, and lapping operations
- Quality control of orthopedic implants (titanium femoral stems, cobalt-chrome joint surfaces) per ISO 14644 and ASTM F2129
- Characterization of wafer-level microstructures and MEMS device surfaces in semiconductor packaging
- Research-grade quantification of tribological behavior correlation between Rq, Rsk, and coefficient of friction
- Failure analysis of adhesive bond interfaces and coating delamination initiation sites
FAQ
What stylus tip radius options are available for different material types?
Standard stylus: 2 µm radius, 90° included angle (suitable for most metals and ceramics). Optional 5 µm radius for soft polymers or composites; 0.5 µm radius for ultra-smooth optical surfaces.
Can the system measure inside small-diameter bores or recessed features?
Yes—using the optional miniature probe kit (Accretech Model P-100M), measurements down to Ø3 mm internal diameter are supported with lateral resolution ≤0.5 µm.
Is calibration documentation provided with each instrument shipment?
Yes—each unit ships with a factory calibration certificate traceable to NMIJ (National Metrology Institute of Japan), including linearity, sensitivity, and step-height verification data.
Does the software support multi-language UI and automated report localization?
SURFPAK supports English, Japanese, Chinese, German, and French UI languages; report templates can be customized with localized terminology and regulatory headers per regional QA requirements.
How is thermal drift compensated during extended measurement sequences?
The system employs dual-sensor thermal monitoring (baseplate + transducer housing) and applies real-time offset correction using embedded temperature coefficients derived from NMIJ-accredited thermal stability testing.
