Amptek X-123 FAST SDD C2 Window Energy Dispersive X-Ray Spectrometer for SEM
| Brand | AMPTEK |
|---|---|
| Origin | USA |
| Model | X-123 FAST SDD C2 Window |
| Detector Type | Silicon Drift Detector (SDD) |
| Window Material | Ultra-thin Si₃N₄ (C2 series) |
| Elemental Detection Range | C (4.9 keV) to U (98 keV) |
| Energy Resolution | ≤125 eV at Mn Kα (5.9 keV), typical |
| Count Rate Capability | Up to 10⁶ counts/second |
| Vacuum Compatibility | Yes, integrated vacuum interface |
| Standard Interface | USB 2.0 and digital pulse processing |
| Compliance | CE, RoHS, FCC Class A |
Overview
The Amptek X-123 FAST SDD C2 Window is a high-performance energy dispersive X-ray spectrometer (EDS) engineered specifically for integration with scanning electron microscopes (SEM). It utilizes a silicon drift detector (SDD) coupled with AMPTEK’s proprietary C2-series ultra-thin silicon nitride (Si₃N₄) window—designed to maximize transmission efficiency for low-energy X-rays. Unlike conventional polymer or beryllium windows, the C2 window delivers exceptional transmission (>70% at carbon Kα, 0.277 keV) while maintaining mechanical robustness under high-vacuum SEM chamber conditions. The detector operates on a fully digital pulse processing architecture, enabling real-time spectral acquisition, high count-rate capability (up to 1 million counts per second), and intrinsic energy resolution of ≤125 eV at Mn Kα (5.9 keV). This performance envelope makes the X-123 FAST SDD C2 Window particularly suited for quantitative elemental mapping, light-element analysis (C, N, O, F), and high-speed EDS acquisition in materials science, geology, metallurgy, and semiconductor failure analysis laboratories.
Key Features
- Ultra-thin Si₃N₄ C2 window optimized for sub-1 keV X-ray transmission—enabling reliable detection of carbon (C), nitrogen (N), oxygen (O), fluorine (F), and sodium (Na)
- Silicon drift detector with active area of 25 mm² and integrated Peltier cooling (–20 °C nominal operating temperature)
- Digital pulse processor with real-time dead-time correction, pile-up rejection, and automatic gain stabilization
- Integrated vacuum feedthrough and flange-mounting interface compatible with standard SEM column ports (e.g., CF-35, CF-63)
- USB 2.0 interface with vendor-neutral data output (ASCII, binary, and spectrum file formats compliant with DTSA-II and NIST SRD standards)
- Low-power consumption (<5 W), compact form factor (≤120 mm × 80 mm × 60 mm), and minimal heat dissipation suitable for proximity mounting on SEM stages
Sample Compatibility & Compliance
The X-123 FAST SDD C2 Window supports solid, conductive, and non-conductive samples when used in conjunction with standard SEM sample preparation protocols (e.g., carbon or gold sputter coating). Its high transmission at low energies allows accurate quantification of light elements without requiring specialized low-vacuum or environmental SEM modes. The system complies with international safety and electromagnetic compatibility standards including CE Directive 2014/30/EU (EMC), 2014/35/EU (LVD), RoHS 2011/65/EU, and FCC Part 15 Class A. While not certified for GMP/GLP environments out-of-the-box, its digital audit trail, timestamped spectral metadata, and deterministic calibration routines support alignment with ISO/IEC 17025 requirements for testing laboratories performing elemental composition analysis.
Software & Data Management
The detector ships with Amptek’s DPPMCA software suite (Windows/Linux/macOS), offering real-time spectrum visualization, peak identification (using IUPAC-recommended X-ray line databases), ZAF matrix correction, and elemental mapping export in TIFF, HDF5, and CSV formats. All spectral acquisitions include embedded metadata: acquisition time, live time, real time, detector temperature, bias voltage, and calibration coefficients. Raw pulse height data can be exported for third-party processing in platforms such as HyperSpy, DTSA-II, or custom Python-based analysis pipelines. The USB interface supports synchronous triggering with SEM scan generators, enabling pixel-synchronized EDS mapping at frame rates up to 100 Hz.
Applications
- High-resolution EDS mapping of battery cathode/anode interfaces (Li, C, O, F, Ni, Co, Mn)
- Light-element quantification in polymers, biological tissues, and thin-film coatings
- Inclusion analysis in steel and aluminum alloys (O, Mg, Si, Ca, S)
- Contamination identification on semiconductor wafers and photomasks
- Phase identification in geological specimens via stoichiometric ratio analysis (e.g., Mg/Si in olivine, Fe/O in hematite)
- Failure analysis of solder joints and intermetallic compound (IMC) layer characterization
FAQ
Is the C2 window compatible with high-vacuum SEM chambers?
Yes—the C2 Si₃N₄ window is rated for continuous operation under ≤10⁻⁵ Torr vacuum and features a reinforced membrane design resistant to pressure differentials and accidental venting events.
Can this detector be used for quantitative analysis per ASTM E1508 or ISO 16578?
Yes—when calibrated using certified reference materials (CRMs) and operated under stable thermal and vacuum conditions, the X-123 FAST SDD C2 meets the spectral stability and resolution requirements specified in ASTM E1508-22 and ISO 16578:2022 for EDS-based compositional analysis.
Does the system support offline recalibration?
Yes—users may perform energy and resolution recalibration using built-in Fe-55 (5.9 keV) and Co-57 (122 keV, 136 keV) sources or external radioactive check sources; all calibration parameters are stored in non-volatile memory.
What is the recommended working distance for optimal collection efficiency?
For maximum solid angle and minimal absorption, a working distance of 8–12 mm is recommended, depending on the SEM pole piece geometry and detector tilt angle (typically 30°–35°).
Is firmware update supported over USB?
Yes—firmware updates are delivered via Amptek’s secure download portal and applied using the DPPMCA utility; each update includes version-locked checksum verification and rollback capability.
