FN-T50 Transmittance Measurement System
| Brand | Optec |
|---|---|
| Origin | Beijing, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | FN-T50 |
| Price Range | USD 70,000 – 112,000 |
Overview
The FN-T50 Transmittance Measurement System is a precision optical instrumentation platform engineered for quantitative spectral transmittance characterization of lenses, lens assemblies, optical filters, and multi-element optical systems. It operates on the principle of integrating sphere photometry combined with monochromator-grade spectral selection, enabling high-fidelity measurement of absolute and relative transmittance across the visible spectrum (400–750 nm). The system employs a calibrated tungsten-halogen light source with stable spectral output, coupled to an automated filter wheel for discrete wavelength selection—supporting both broadband and narrowband (single-wavelength) transmittance evaluation. Its horizontal optical layout minimizes gravitational misalignment risks during sample loading and ensures repeatable mechanical positioning for production-line or R&D laboratory deployment.
Key Features
- Integrated 150 mm diameter Ulbricht-type integrating sphere with >98% BaSO₄ coating reflectance, optimized for uniform spatial collection of transmitted radiant flux
- High-resolution silicon photodiode detector with 0.1 nm spectral sampling resolution and <0.5% linearity deviation over full dynamic range
- Motorized 6-position filter wheel with pre-aligned interference filters (FWHM ≤ 10 nm), enabling rapid transition between standardized CIE illuminants (e.g., D65, A) and custom spectral bands
- Automated sample stage with XYZ micrometer-adjustable translation (±0.01 mm resolution) and rotational alignment capability for off-axis optical components
- Embedded real-time calibration engine that performs reference baseline correction prior to each measurement cycle, compensating for source drift and detector aging
- Compliance-ready firmware architecture supporting audit trails, user access levels, and electronic signature protocols aligned with ISO/IEC 17025 and FDA 21 CFR Part 11 requirements
Sample Compatibility & Compliance
The FN-T50 accommodates plano-convex, bi-convex, meniscus, and aspheric lenses up to Ø120 mm in diameter and 50 mm maximum thickness. It supports mounted lens barrels, unmounted elements, and multi-lens modules (e.g., telecentric objectives, zoom assemblies) via adjustable kinematic mounts. Sample holders are compatible with standard optical breadboard mounting (M6 threaded holes). All optical path components—including the integrating sphere interior, detector housing, and collimating optics—are traceably calibrated against NIST-traceable standards (SRM 2036, SRM 2065). Measurement uncertainty is validated per ISO 9001:2015 Annex A.2 and conforms to ASTM E308-22 (Standard Practice for Computing the Colors of Objects by Using the CIE System) for spectral data reporting.
Software & Data Management
The system ships with TransCal v4.2 software—a Windows-based application developed under IEC 62304 Class B medical device software guidelines. It provides real-time spectral curve visualization, batch measurement scripting, and export of transmittance data in CSV, XML, and industry-standard SDF (Spectral Data Format) compliant with ISO 15339. Raw spectral datasets include metadata tags for instrument ID, operator, date/time stamp, environmental conditions (ambient temperature/humidity logged via integrated sensors), and calibration certificate reference numbers. Data integrity safeguards include SHA-256 hashing of measurement files, write-once archive mode, and optional integration with LIMS platforms via OPC UA or RESTful API endpoints.
Applications
- Quantitative verification of anti-reflective (AR) coating performance on camera lenses and smartphone optics
- Batch-to-batch consistency testing of molded plastic lenses (e.g., PMMA, COC) used in automotive ADAS modules
- Transmittance mapping of gradient-index (GRIN) optics and diffractive optical elements (DOEs)
- Validation of optical bandpass filter specifications in life science imaging systems (e.g., fluorescence microscope filter sets)
- Development and QA of VR/AR waveguide combiners where angular-dependent transmittance must be characterized at multiple incidence angles
- Support for ISO 10110-2 surface quality inspection workflows when paired with optional beam profiling accessories
FAQ
What is the measurement uncertainty for absolute transmittance at 550 nm?
The expanded uncertainty (k=2) for absolute transmittance at 550 nm is ±2.8%, derived from Type A (repeatability) and Type B (calibration, geometry, spectral mismatch) uncertainty components per GUM (JCGM 100:2008).
Can the FN-T50 measure transmittance of curved or tilted samples?
Yes—the motorized XYZ stage allows precise angular alignment (±5° tilt, ±2° decenter) and accommodates radius-of-curvature compensation through software-defined optical path length correction.
Is GLP-compliant documentation included with calibration certificates?
Yes—each factory calibration includes a NIST-traceable certificate with measurement uncertainty budget, environmental conditions, equipment IDs, and technician digital signature; all stored in encrypted PDF format with embedded digital signatures.
Does the system support automated pass/fail grading against user-defined transmittance tolerances?
Yes—TransCal v4.2 includes configurable tolerance envelopes (e.g., ±1.5% T at 450 nm, ≥92% T across 500–600 nm) with visual flagging and CSV summary reports for statistical process control (SPC) integration.
