Jinhuatester CHY-01 Contact-Type Paper and Film Thickness Gauge

Overview

The Jinhuatester CHY-01 Contact-Type Paper and Film Thickness Gauge is a precision mechanical thickness measurement instrument engineered for high reproducibility in quality control laboratories and production environments serving the packaging, paper, flexible electronics, and thin-film manufacturing industries. It operates on the standardized contact principle defined in ISO 4593 (plastics film and sheet), ISO 534 (paper and board), and ASTM D6988 (polymeric film thickness), where a calibrated measuring head applies a fixed pressure through a precisely defined contact area onto a stationary specimen. This method eliminates operator-dependent variables—such as inconsistent hand pressure or angular misalignment—that compromise non-contact alternatives like optical interferometry or capacitance-based gauges when used on compressible or heterogeneous substrates. The CHY-01’s dual-pressure/dual-foot configuration enables traceable switching between low-load (17.5 ± 1 kPa, 50 mm²) measurement for compliant films and high-load (100 ± 1 kPa, 200 mm²) operation for rigid paperboard and metallic foils—ensuring compliance with material-specific test protocols without recalibration.

Key Features

• Automated motorized probe descent with programmable dwell time, eliminating manual loading variability and ensuring consistent force application across all measurements.
• High-resolution capacitive displacement sensor with 0.1 µm resolution and ±0.5 µm system accuracy, validated against NIST-traceable gauge blocks.
• Dual-mode anvil system: Interchangeable foot assemblies for film (50 mm²) and paper (200 mm²) conform to ISO 534 Annex A and ASTM D6988 Section 7.2 requirements.
• Integrated color LCD display showing real-time thickness value, statistical summary (n, mean, standard deviation, min/max), and trend graph of sequential readings.
• Onboard thermal printer (optional) outputs raw data points, statistical aggregates, timestamp, and operator ID—supporting GLP-compliant record retention.
• RS232 serial port enables bidirectional communication with LIMS or custom QA software; supports ASCII command protocol for automated test sequencing.
• Modular design accommodates optional automatic sample feeder for unattended multi-point measurement across standardized test zones (e.g., ISO 534 sampling grid).

Sample Compatibility & Compliance

The CHY-01 accommodates specimens up to 5 mm in nominal thickness—including coated and uncoated papers, corrugated board liners, aluminum and copper foils, lithium-ion battery separators, PET/PVC/PE films, silicon wafers (front-side only), nonwovens, and solid electrical insulators. Its mechanical contact architecture ensures reliable measurement of materials exhibiting surface roughness, opacity, or low dielectric contrast—conditions that limit optical or ultrasonic methods. All pressure and area configurations comply with mandatory testing clauses in ISO 534:2012 (Clause 6.2), TAPPI T411 om-17, and GB/T 451.3–2012. For regulated environments, the instrument supports audit-ready data logging with user-access level controls and timestamped metadata—aligning with FDA 21 CFR Part 11 expectations when paired with validated software.

Software & Data Management

The embedded firmware provides local data storage for up to 1,000 test records with full statistical post-processing. Raw data export via RS232 follows fixed-field ASCII format (e.g., “ID|DATE|TIME|VALUE_µm|MEAN_µm|STD_µm|MIN_µm|MAX_µm”), compatible with Excel, Minitab, and JMP. Optional PC-based software (sold separately) adds SPC charting (X̄–R, Cpk), batch reporting, PDF certificate generation, and electronic signature capture. Audit trails record all parameter changes, calibration events, and user logins—enabling full traceability under GMP/GLP frameworks.

Applications

• Quality assurance of paper grammage consistency during converting operations (e.g., offset, gravure, flexo printing substrates).
• Thickness profiling of battery separator membranes to detect caliper variation affecting ionic conductivity and dendrite resistance.
• In-process verification of foil lamination uniformity in pharmaceutical blister packaging.
• R&D evaluation of nanocoated paper surfaces where sub-micron thickness gradients impact barrier performance.
• Calibration validation of non-contact profilometers using certified reference standards measured on the CHY-01.

FAQ

Does the CHY-01 meet ISO/IEC 17025 calibration requirements?
Yes—when operated with documented procedures, certified reference standards (e.g., NIST SRM 1995), and periodic verification by an accredited lab, it satisfies clause 6.5 of ISO/IEC 17025 for measurement equipment used in accredited testing.
Can the instrument measure textured or embossed paper?
It measures average thickness at the point of contact; for structured surfaces, use the optional auto-feeder to acquire ≥10 points per sheet and report mean ± SD per ISO 534 sampling rules.
Is firmware upgrade supported remotely?
Firmware updates require physical USB-to-serial adapter connection and are performed via Jinhuatester’s proprietary utility—no cloud connectivity or OTA capability is implemented for security and regulatory stability.
What maintenance intervals are recommended?
Annual verification of load cell linearity and foot area geometry is advised; daily cleaning of the anvil surface with lint-free isopropyl alcohol prevents particulate-induced error.
How is measurement uncertainty estimated?
Combined standard uncertainty (k=2) is calculated per GUM (JCGM 100:2008) incorporating resolution (0.1 µm), accuracy (±0.5 µm), repeatability (≤0.3 µm at 95% confidence), and environmental drift (±0.2 µm/°C above 23°C).