Oxford Instruments UltraBright Microfocus X-ray Source
| Brand | Oxford Instruments |
|---|---|
| Origin | USA |
| Manufacturer Type | General Distributor |
| Origin Category | Imported |
| Model | UltraBright |
| Price Range | USD 0 – 9,999 |
| Max Anode Current | 1.0 mA |
| Max Anode Voltage | 50 kV |
| Max Power | 50 W |
| Filament Nominal Voltage | 2.0 V @ 50 kV, 1 mA |
| Filament Max Current | 1.7 A |
| Stability (after 4 hrs) | ±0.2% |
| Nominal Focal Spot Size | 110 µm |
| Anode Materials | W, Mo, Rh (custom options available) |
| Beryllium Window Thickness | 125 µm (optional: 75 µm or 250 µm) |
| Approx. Weight | 1.816 kg (4 lbs) |
| Cooling Method | Compressed Air @ 150 CFM |
| Beam Divergence Angle | 25° |
Overview
The Oxford Instruments UltraBright Microfocus X-ray Source is a high-stability, compact, and field-proven X-ray generation module engineered for integration into advanced chemical analysis platforms—including X-ray fluorescence (XRF), X-ray diffraction (XRD), micro-CT, and X-ray imaging systems. Based on the robust 5000-series side-window X-ray tube architecture, the UltraBright leverages a sealed, lead-lined stainless-steel housing with integrated oil-based thermal management to ensure consistent output under prolonged operation. Its microfocus design enables spatial resolution down to 110 µm (nominal), supporting high-magnification, low-background imaging and quantitative elemental mapping where source size directly impacts geometric unsharpness and signal-to-noise ratio. The system operates at up to 50 kV and 1.0 mA (50 W max), delivering stable photon flux with ≤0.2% drift after four hours—critical for time-resolved measurements and automated QA/QC workflows in regulated environments.
Key Features
- Microfocus focal spot (110 µm nominal) optimized for high-resolution X-ray imaging and diffraction applications
- Hermetically sealed, lead-shielded stainless-steel housing with internal Oxford-specific cooling oil for uniform thermal dissipation
- Modular flange interface compatible with standard vacuum and atmospheric coupling configurations
- Interchangeable anode targets (tungsten, molybdenum, rhodium) enabling tunable characteristic line emission (e.g., W Lα, Mo Kα, Rh Kα) for matrix-matched excitation in XRF
- Optional beryllium window thicknesses (75 µm, 125 µm, 250 µm) to balance low-energy transmission efficiency against mechanical durability and vacuum integrity
- Compressed-air cooling (150 CFM) ensures passive heat rejection without liquid loops—ideal for cleanroom or mobile instrument integration
- Beam divergence of 25° facilitates efficient coupling with polycapillary optics or collimator assemblies
Sample Compatibility & Compliance
The UltraBright is designed for seamless integration into ISO/IEC 17025-accredited analytical systems and complies with IEC 61000-6-3 (EMC emissions) and IEC 61000-6-2 (immunity). Its mechanical and electrical interfaces meet common vacuum flange standards (CF, KF, ISO-K), supporting both high-vacuum (<10⁻⁵ mbar) and differential-pumping configurations. When deployed in XRF spectrometers, it supports ASTM E1621 (standard test method for elemental analysis by wavelength-dispersive XRF) and ISO 21043 (XRF instrumentation performance verification). The source’s stability and repeatability are validated per GLP and GMP-aligned protocols, including 21 CFR Part 11 audit-trail readiness when paired with compliant control software.
Software & Data Management
Oxford Instruments provides OEM-level SDKs and LabVIEW-compatible drivers for direct integration into custom acquisition platforms. The UltraBright supports RS-232 and Ethernet-based communication for remote voltage/current setpoint control, real-time status monitoring (tube temperature, filament current, HV interlock status), and fault logging. All operational parameters—including runtime, cumulative anode dose, and thermal history—are timestamped and exportable in CSV or XML format. When used within Oxford’s proprietary X-ray control suite (e.g., AZtecLive or X-sight), the source participates in automated calibration sequences, beam alignment routines, and compliance-reporting modules aligned with FDA 21 CFR Part 11 electronic record requirements.
Applications
- High-resolution micro-XRF mapping of heterogeneous catalysts, battery electrode cross-sections, and semiconductor thin films
- Lab-based micro-CT for non-destructive 3D structural analysis of geological cores, additive-manufactured parts, and biological specimens
- Energy-dispersive and wavelength-dispersive XRF quantification in environmental soil screening and RoHS-compliant materials testing
- In-line process monitoring in metallurgy and recycling—where rapid elemental sorting requires stable, low-drift excitation
- Phase identification and strain analysis via laboratory-scale XRD using monochromatic microbeam geometry
FAQ
What anode materials are standard, and how do they affect spectral output?
Standard anodes are tungsten (W), molybdenum (Mo), and rhodium (Rh). Each produces distinct characteristic X-ray lines: W L-lines (~8–10 keV), Mo Kα (17.4 keV), and Rh Kα (20.2 keV), enabling selection based on sample absorption edges and detector efficiency profiles.
Is the UltraBright suitable for vacuum-integrated systems?
Yes—the housing includes CF- or ISO-K-compatible flanges and is rated for continuous operation under high vacuum (≤10⁻⁵ mbar); optional differential pumping adapters are available for atmospheric sample chambers.
How is long-term stability maintained during extended acquisitions?
Stability is achieved through active thermal regulation (oil-immersed anode + forced-air cooling), precision filament current feedback control, and HV supply ripple <0.05%, resulting in ≤0.2% intensity drift over 4-hour periods.
Can the source be retrofitted into existing XRF or XRD platforms?
Yes—mechanical footprints, electrical pinouts, and cooling interface specifications are documented in Oxford’s OEM Integration Manual; technical support includes mechanical mounting drawings and power supply compatibility guidance.
