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Renishaw XL-80 Laser Interferometer

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Brand Renishaw
Origin United Kingdom
Model XL-80
Measurement Principle Stabilized HeNe laser interferometry (wavelength 632.991 nm, traceable to SI meter)
System Accuracy ±0.5 ppm (0–40 °C, compensated)
Resolution 0.001 µm
Max Linear Velocity 4.0 m/s
Sampling Rate 50 kHz
Measurement Range 0–80 m
Laser Warm-up Time ~6 min
Environmental Compensation XC-80 sensor (updates compensation every 7 s)
Laser Source Stability ±0.05 ppm
Beam Height & Optical Compatibility Fully compatible with ML10 optics and mounts
Software Suite LaserXL™ (step-by-step metrology workflows), QuickViewXL™ (real-time display)
Warranty 3 years standard, extendable to 5 years

Overview

The Renishaw XL-80 Laser Interferometer is a high-precision, portable displacement measurement system engineered for metrological-grade linear, angular, straightness, flatness, and squareness verification in industrial and calibration environments. It operates on the fundamental principle of stabilized helium–neon (HeNe) laser interferometry, utilizing a vacuum-wavelength-stabilized source at 632.991 nm—directly traceable to the International System of Units (SI) definition of the meter. Unlike conventional optical encoders or capacitive sensors, the XL-80 delivers absolute length measurements with sub-nanometer resolution and real-time environmental compensation, enabling compliance with ISO 230-2 (machine tool testing), ISO 10360 (CMM verification), and ASME B89.1.12M standards. Its design prioritizes robustness under variable ambient conditions: across the full operational temperature range (0–40 °C), atmospheric pressure (60–110 kPa), and relative humidity (0–95% non-condensing), the system maintains a certified accuracy of ±0.5 parts per million (ppm) in linear mode—achievable only through continuous, automated correction via the integrated XC-80 environmental sensor.

Key Features

  • Stabilized HeNe laser source with ±0.05 ppm frequency stability, ensuring long-term measurement repeatability and international traceability.
  • Real-time environmental compensation: XC-80 sensor acquires temperature, pressure, and humidity data every 7 seconds, dynamically updating refractive index corrections in accordance with the Edlén equation (ISO 5023:2021).
  • High-speed acquisition capability: 50 kHz sampling rate at full 0.001 µm resolution supports dynamic machine tool characterization, including rapid acceleration/deceleration profiling and servo loop diagnostics.
  • Extended linear range up to 80 meters without signal degradation, enabled by integrated gain control and multi-signal interface (analog output + direct USB connection to PC—no external interface box required).
  • Ultra-compact, lightweight architecture: total system mass < 3.2 kg (laser head + XC-80 + cables + power supply), representing a 70% reduction versus the legacy ML10 platform.
  • Full backward compatibility: seamless integration with existing ML10 retroreflectors, beam splitters, and angular optics—preserving capital investment in optical components and operator training.
  • Reduced warm-up time of ~6 minutes enables rapid deployment in field service applications, minimizing downtime during on-site CMM or CNC calibration campaigns.

Sample Compatibility & Compliance

The XL-80 is designed for use with standard interferometric optics—including plane mirror retroreflectors, corner-cube retroreflectors, and angular optics (e.g., pentaprisms, beam diverters)—all conforming to ISO 10110 optical surface specifications. Its fixed 10 mm beam height matches ML10 mechanical interfaces, allowing direct mounting on granite tables, magnetic bases, or Renishaw’s compact tripod and pan-tilt assembly. The system meets electromagnetic compatibility requirements per EN 61326-1:2013 and is CE-marked for use in EU industrial environments. All measurement data generated using LaserXL™ software support audit trails and electronic signatures compliant with FDA 21 CFR Part 11 when configured in validated environments. Calibration certificates issued by Renishaw-accredited laboratories are traceable to UKAS (United Kingdom Accreditation Service) and NIST (National Institute of Standards and Technology) primary standards.

Software & Data Management

LaserXL™ is Renishaw’s dedicated metrology software for structured, standards-compliant measurement execution. It guides users through ISO 230-2 linear axis tests, step-diagonal checks, and volumetric error mapping with built-in pass/fail criteria, automatic report generation (PDF/CSV), and customizable templates aligned with internal QA protocols. QuickViewXL™ provides real-time visualization of raw interferometric fringe counts, velocity profiles, and environmental compensation deltas—essential for troubleshooting alignment drift or air turbulence effects. Both applications support timestamped data logging with metadata tagging (operator ID, location, ambient conditions), facilitating GLP/GMP documentation and retrospective analysis. Data export conforms to ASTM E2918-22 (digital record integrity) and includes checksum validation to prevent corruption during transfer or archival.

Applications

  • Geometric performance verification of CNC machine tools, coordinate measuring machines (CMMs), and ultra-precision motion stages.
  • Volumetric error mapping and compensation table generation for multi-axis systems (e.g., five-axis machining centers).
  • Dynamic characterization of servo response, positioning overshoot, and following error under varying load and speed conditions.
  • Calibration of linear scales, encoder readheads, and laser tracker baselines against primary length standards.
  • In-process verification in aerospace and semiconductor manufacturing where thermal drift and air turbulence must be quantified and corrected in real time.
  • Research applications requiring traceable nanometrology in national metrology institutes and advanced manufacturing testbeds.

FAQ

Is the XL-80 compatible with existing ML10 optical components?
Yes—the XL-80 shares identical beam height, mounting interfaces, and optical path geometry with the ML10, enabling full reuse of retroreflectors, beam splitters, and angular optics.
What environmental parameters does the XC-80 sensor measure?
The XC-80 simultaneously records air temperature, barometric pressure, and relative humidity at 7-second intervals, applying real-time refractive index compensation per the Ciddor and modified Edlén equations.
Does the system require an external interface box for PC connectivity?
No—XL-80 features native USB 2.0 communication, eliminating the need for legacy RS-232 or dedicated interface hardware.
Can the XL-80 perform angular or straightness measurements?
Yes—when used with Renishaw’s angular optics kits (e.g., RX10 rotary encoder interface) or straightness optics (e.g., HS10), the XL-80 supports full six-degree-of-freedom error mapping per ISO 230-1 and ISO 230-6.
What is the warranty coverage for the XL-80 system?
The XL-80 carries a standard 3-year comprehensive warranty covering parts, labor, and software updates; optional extension to 5 years is available at time of purchase.

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