TZTEK VME222 Entry-Level Automated Vision Measuring Machine

Overview

The TZTEK VME222 is an entry-level, fully automated vision measuring machine engineered for precision geometric metrology in R&D labs, quality control environments, and small-to-medium manufacturing facilities. It operates on the principle of high-resolution digital image acquisition combined with sub-pixel edge detection algorithms and calibrated coordinate metrology. The system captures magnified optical images of parts placed on its granite base, then performs non-contact dimensional analysis—including length, width, angle, radius, position, and profile deviation—using traceable measurement algorithms aligned with ISO 10360 and VDI/VDE 2617 standards. Its modular architecture supports both routine first-article inspection and iterative design validation workflows, making it especially suitable for mechanical components, stamped parts, PCBs, plastic housings, and micro-machined features where cost-effective, repeatable 2D/3D geometric verification is required.

Key Features

• Granite structural base ensuring long-term thermal stability and mechanical rigidity—critical for maintaining measurement repeatability across temperature fluctuations.
• Electronically indexed manual zoom lens turret with automatic magnification recognition: software detects and registers current optical magnification (25×–160×), enabling accurate pixel-to-unit calibration without manual input.
• High-speed motion system: XY axes travel at up to 500 mm/s with closed-loop servo control; Z-axis achieves 100 mm/s with integrated auto-focus capability for rapid height profiling and surface topography assessment.
• Multi-spectral illumination suite: programmable 6-ring, 8-zone LED surface illuminator allows independent control of azimuth and elevation angles; supplemented by uniform LED backlight for silhouette edge detection and optional coaxial illumination for reflective or glossy surfaces.
• 0.5 µm resolution linear glass scales on all three axes—certified to meet ISO 230-2 positioning accuracy requirements—ensuring consistent traceability in dimensional reporting.
• Modular expansion interface supporting add-on sensors including chromatic confocal probes (for transparent or multi-layer materials), tactile touch-trigger probes (for GD&T compliance), and spectral reflectance modules (for material identification or coating thickness estimation).

Sample Compatibility & Compliance

The VME222 accommodates parts up to 200 mm × 200 mm × 200 mm in volume, with maximum weight capacity of 15 kg. Its open-stage design permits flexible fixturing—vacuum chucks, custom jigs, and kinematic mounts are compatible. The system complies with CE safety directives (2014/30/EU EMC and 2014/35/EU LVD) and meets RoHS 2 (2011/65/EU) material restrictions. Measurement data output conforms to ISO 14253-1 (GPS — Inspection by measurement of workpieces) and supports audit-ready reporting per ISO 9001:2015 clause 7.1.5. Optional GLP/GMP-compliant software packages include electronic signatures, audit trails, and 21 CFR Part 11–ready user access controls.

Software & Data Management

Equipped with TZTEK’s proprietary MetroVision 5.2 software platform, the VME222 delivers intuitive workflow-driven measurement programming—including teach-mode alignment, CAD-based feature matching, and batch report generation in PDF, Excel, or XML formats. All measurement routines are scriptable via Python API for integration into factory MES or PLM systems. Raw image archives, calibration logs, and operator metadata are stored with SHA-256 hashing for integrity verification. Version-controlled measurement programs support revision tracking and rollback—essential for regulated industries requiring documented change control.

Applications

• Dimensional verification of injection-molded plastic components against GD&T callouts (e.g., position, concentricity, profile of a surface).
• First-article inspection of machined metal parts including threaded fasteners, flanges, and housing bores.
• PCB solder paste inspection and component placement accuracy assessment (IPC-A-610 Class 2/3).
• R&D prototyping validation for MEMS devices, microfluidic chips, and miniature optics assemblies.
• Automotive interior trim part conformity checks (e.g., gap-and-flush analysis, hole pattern alignment).
• Educational use in metrology laboratories for teaching coordinate measurement principles and uncertainty budgeting.

FAQ

Does the VME222 support automated measurement program generation from CAD files?
Yes—MetroVision 5.2 imports STEP, IGES, and DXF formats and enables direct feature mapping between CAD geometry and measured edges.
Is calibration certification included with delivery?
A factory calibration certificate traceable to NIM (National Institute of Metrology, China) is provided; optional UKAS-accredited calibration is available upon request.
Can the system perform true 3D surface profiling?
While primarily optimized for 2.5D metrology, Z-axis auto-focus combined with sequential focus stacking enables height mapping of shallow relief features up to ±5 mm with ≤1 µm vertical repeatability.
What is the recommended maintenance interval for the optical path?
Annual cleaning and alignment verification of the telecentric lens path and illumination homogeneity is advised; no consumables require replacement within the first 36 months under standard operating conditions.