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ZOLIX SolarIV Series Photovoltaic I-V Characterization System

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Brand ZOLIX
Model SolarIV Series
Origin Beijing, China
Manufacturer ZOLIX (OEM/ODM Producer)
Type Domestic
Automation Level Semi-Automatic
Price Range USD 14,000 – 72,000 (based on configuration)
Compliance IEC 60904-9:2020 (Class A Solar Simulator), ASTM E927-22
Core Instrumentation Keithley 2400/2450 SourceMeter® (optional), QE-B1 Reference Cell (calibrated to NREL traceability), IV-Software v3.x

Overview

The ZOLIX SolarIV Series Photovoltaic I-V Characterization System is a semi-automated, standards-compliant instrumentation platform engineered for precise current–voltage (I-V) characterization of photovoltaic devices under controlled illumination and dark conditions. Built upon the fundamental principle of source-measure unit (SMU)-driven four-terminal sensing, the system applies programmable voltage sweeps while simultaneously measuring output current with high linearity and low noise—enabling accurate extraction of key photovoltaic parameters including short-circuit current (ISC), open-circuit voltage (VOC), maximum power point (PMAX), fill factor (FF), photoconversion efficiency (η), series resistance (RS), and shunt resistance (RSH). The system integrates Class A solar simulators compliant with IEC 60904-9:2020 and ASTM E927-22, ensuring spectral match (AM1.5G, 0.75–1.25), irradiance non-uniformity ≤2%, and temporal instability ≤2% over 30 seconds—critical for reproducible, metrologically traceable measurements in R&D, quality control, and certification laboratories.

Key Features

  • Full I-V curve acquisition in both illuminated and dark modes, with bidirectional sweep capability and automatic dark-current subtraction
  • Selectable Class A solar simulators: SolarIV-150A (40 × 40 mm² irradiation area) and SolarIV-300A (60 × 60 mm²), both delivering AM1.5G spectrum with spectral mismatch ≤±25%
  • Modular optical path design enabling vertical or inverted illumination orientation to accommodate diverse sample geometries (e.g., rigid cells, flexible modules, perovskite films on glass or PET)
  • Integrated NREL-traceable standard reference cell (QE-B1, monocrystalline Si) with factory calibration certificate for absolute irradiance normalization
  • High-precision SMU architecture: Standard Keithley 2400 SourceMeter® (10 fA resolution, 100 mV–200 V range); optional upgrade to 2450 (enhanced speed and digitizing capability)
  • Vacuum-assisted sample stage (standard on SolarIV-300A) for stable, shadow-minimized contact during probing—reducing measurement artifacts from mechanical drift or probe misalignment
  • Temperature-controlled stage interface (optional accessory) supporting IEC 61215-defined test conditions (25 ± 2 °C) via external chiller or Peltier module integration

Sample Compatibility & Compliance

The SolarIV Series accommodates a broad range of PV technologies—including crystalline silicon (c-Si), thin-film (CIGS, CdTe), organic photovoltaics (OPV), and emerging perovskite solar cells—via configurable probe stations and custom sample holders. All configurations maintain strict adherence to international photovoltaic testing standards: IEC 60904-1 (photovoltaic current–voltage characteristics), IEC 60904-9 (solar simulator classification), and IEC 61215-1 (terrestrial PV module qualification). The system supports GLP-compliant operation through audit-ready software logging (timestamped raw data, instrument settings, environmental metadata) and optional 21 CFR Part 11–enabled electronic signatures when paired with validated IV-Software v3.x deployment.

Software & Data Management

IV-Software v3.x provides a Windows-based graphical user interface with real-time curve visualization, multi-sweep averaging, and automated parameter extraction using iterative Levenberg–Marquardt fitting for RS and RSH. Raw data are stored in HDF5 format with embedded metadata (simulator settings, SMU configuration, ambient temperature/humidity), and exportable to CSV, TXT, or Excel without loss of precision. Reporting modules generate ISO/IEC 17025–aligned test reports—including uncertainty budgets derived from SMU accuracy specifications and reference cell calibration uncertainties—with customizable templates and batch-print functionality. Software updates and remote diagnostics are supported via secure HTTPS-based firmware delivery.

Applications

  • R&D labs evaluating novel absorber layers, interfacial engineering, and tandem cell architectures
  • Manufacturing QA/QC lines performing 100% inline I-V screening of finished cells and mini-modules
  • Independent testing laboratories conducting IEC 61215 and UL 1703 certification pre-tests
  • University teaching laboratories demonstrating fundamental semiconductor device physics and PV performance metrics
  • Calibration facilities verifying secondary reference cells against primary standards (e.g., NIST, PTB)

FAQ

Does the SolarIV system support pulsed light I-V measurement for minimizing heating effects?

Yes—when configured with the optional Keithley 2450 and synchronized shutter control, the system enables gated I-V sweeps with pulse widths down to 10 ms, suitable for heat-sensitive perovskite and organic devices.
Can the system be integrated into an existing glovebox environment?

Absolutely—the optical head and sample stage are modular; feedthrough-compatible cabling and compact footprint (W × D × H: 600 × 500 × 320 mm for SolarIV-150A) allow seamless integration into nitrogen-purged or inert-atmosphere enclosures.
Is NIST-traceable calibration documentation included with the QE-B1 reference cell?

Yes—each QE-B1 cell ships with a calibration certificate issued by ZOLIX’s ISO/IEC 17025-accredited calibration lab, referencing NREL’s SRM 2230 and including expanded uncertainty (k=2) at 1000 W/m² AM1.5G.
What level of technical support is provided post-purchase?

ZOLIX offers 24-month hardware warranty, lifetime software updates, and direct application engineering support—including remote troubleshooting, method validation assistance, and on-site training (available globally via authorized partners).

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