ZOLIX ZLX-AS Series Transmission, Reflection, and Absorption Spectrophotometry System

Overview

The ZOLIX ZLX-AS Series Transmission, Reflection, and Absorption Spectrophotometry System is an engineered platform for quantitative spectral characterization of optical and functional materials across ultraviolet, visible, and near-infrared (UV-VIS-NIR) regions. Based on double-monochromator and multi-source optical architecture, the system implements both single-beam and dual-beam measurement principles—enabling high-fidelity transmittance (τ(λ)), reflectance (ρ(λ)), and absorbance (α(λ)) determinations in accordance with international photometric standards. Its core optical design integrates a 750 mm focal-length double monochromator with large-aperture (110 mm × 110 mm) holographic gratings, non-spherical collimating and focusing optics, and automated wavelength calibration via mercury lamp reference lines. The system supports absolute spectral responsivity traceability to NIM (National Institute of Metrology, China) primary standards and meets the metrological requirements for certified reference material (CRM) validation under ISO/IEC 17025-accredited laboratories.

Key Features

• Modular optical architecture supporting interchangeable detector modules: Si photodiode (200–1100 nm), InGaAs (900–2500 nm), and MCT/InSb (2–10 μm) for time-resolved IR applications
• Automated light source switching between deuterium (UV), tungsten-halogen (VIS-NIR), and calibrated Hg lamp (wavelength verification)
• Motorized sample stage with 5-axis precision positioning: XYZ translation (±150 mm range) and dual-axis rotation (θy: ±45°, θz: ±90°) for angular distribution measurements
• Integrated Glan-Thompson polarizers enabling polarization-resolved transmission/reflection analysis per ASTM E1331 and ISO 15099
• Variable beam diameter control via motorized iris diaphragm and shutter-assisted dark-signal subtraction for high-dynamic-range photometry
• Dual-monochromator configuration delivering stray light suppression to <5×10⁻⁹—critical for high-optical-density filter and low-transmittance film characterization
• Software-controlled spectral scanning modes: continuous wavelength sweep or fixed-wavelength acquisition with programmable dwell time and averaging

Sample Compatibility & Compliance

The ZLX-AS system accommodates diverse sample geometries and material classes—including flat optical substrates (glass, quartz, polymer films), curved optics (lenses up to Ø150 mm and 600 mm length), architectural glazing (100 mm × 100 mm × 10 mm standard), personal protective equipment (PPE) such as UV-blocking eyewear, and thin-film coated components. All mechanical fixtures comply with ISO 10110-7 (optical element mounting) and ASTM E1175 (spectrophotometer geometry specifications). Measurement protocols align with GB/T 2680 (building glass), EN 410 (glass optical properties), ANSI Z87.1 (eye protection), and ISO 9050 (solar heat gain coefficient derivation). For regulated environments, the software suite includes 21 CFR Part 11-compliant electronic signatures, full audit trail logging, and instrument qualification documentation templates (IQ/OQ/PQ).

Software & Data Management

OmniAS Control Suite is a Windows-based, modular application built on .NET Framework with real-time multithreaded data acquisition. It provides synchronized control of monochromator grating selection, source switching, motorized stages, filter wheels, and detector bias settings. Raw spectral data are stored in HDF5 format with embedded metadata (wavelength calibration coefficients, slit width, integration time, ambient temperature/humidity). Built-in analysis modules compute integrated transmittance (e.g., UV-A/B/C, VIS, NIR bands), solar-weighted transmittance (ASTM G173), colorimetric coordinates (CIE 1931), and angular scattering profiles. Export options include CSV, XML, and PDF reports compliant with GLP/GMP documentation requirements. Optional API access enables integration with LIMS and MES platforms via RESTful endpoints.

Applications

• Optical coating R&D: Quantitative evaluation of anti-reflective, high-reflective, and bandpass filter performance across 200–2500 nm
• Architectural glazing certification: Determination of solar transmittance (T_sol), luminous transmittance (T_v), and UV rejection rate per ISO 9050 and EN 410
• Ophthalmic PPE validation: Spectral transmittance mapping of safety lenses per ANSI Z87.1 and EN 166, including integral UVC/NIR hazard assessment
• Time-resolved infrared spectroscopy: Nanosecond-scale transient absorption kinetics using SiC blackbody source and fast MCT detection
• Diffraction efficiency mapping: Angular-resolved spectral measurement of grating structures using dual-rotating platform configuration
• Reference material calibration: High-accuracy transmittance validation of NIST-traceable neutral density filters and spectral standards

FAQ

What spectral ranges does the ZLX-AS support across different configurations?

The base UV-VIS-NIR configuration covers 200–2500 nm; optional IR extensions enable 1–16 μm coverage using InSb or MCT detectors.
Is the system compliant with FDA 21 CFR Part 11 for regulated pharmaceutical or medical device testing?

Yes—the OmniAS software includes role-based user authentication, electronic signatures, immutable audit trails, and change control logs required for Part 11 compliance.
Can the system measure angular-dependent reflectance for BRDF characterization?

Yes—via the dual-rotation platform with 0.00125° angular resolution and independent sample/detector positioning.
How is stray light minimized in high-accuracy transmittance measurements?

Through a tandem double-monochromator design, large-format holographic gratings, and optimized baffling—achieving stray light levels below 5×10⁻⁹ in UV-VIS standard mode.
Does the system support automated calibration against NIST-traceable standards?

Yes—integrated mercury lamp line referencing, pre-loaded calibration curves for common CRMs, and user-defined standard library import functionality are included.