Scanning Acoustic Microscope
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| Brand | Doppler |
|---|---|
| Model | Doppler-3 |
| Origin | Guangdong, China |
| Detection Principle | Phased Array Ultrasonic Testing (PAUT) with Immersion Technique |
| Scan Mode | B-scan |
| Probe Type | Concave Linear Phased Array Probe (Configurable: 2.5–15 MHz, 64–256 elements) |
| Positioning Accuracy | ±0.05 mm |
| Cycle Time | ≤3 min per 1 m rod (high-resolution mode) |
| Compliance | Designed for ASME Section V Art. 4, ASTM E2700, ISO 16810, and nuclear-grade QA/QC workflows |
| Software | Real-time C-scan visualization, automated defect sizing & classification, statistical reporting (defect count, depth, length, amplitude), audit-trail-enabled data export |
| Automation Level | Fully integrated robotic handling (loading/unloading, rotational clamping, XYZ probe positioning), optional portable PAUT unit for manual verification |
| Application Domain | Nuclear energy components (fuel cladding, control rod sleeves, structural alloy rods) |
| Brand | Doppler |
|---|---|
| Origin | Guangdong, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Model | SAM-1 |
| Price | USD 280,000 (FOB Guangdong) |
| Application Field | Aerospace & Semiconductor Sputtering Target Manufacturing |
| Scanning Mode | B-scan |
| Transducer Configuration | Single-element immersion transducer |
| Motion System | High-precision XYZ linear motor-driven scanning stage |
| Water Tank | Heavy-duty stainless steel immersion tank (modular sizing: Small / Medium / Large) |
| Imaging Modes | A-scan, B-scan, S-scan, C-scan, Top-C-scan, 3D volumetric reconstruction |
| Data Acquisition | Full RF waveform + positional metadata synchronized at sub-millisecond resolution |
| Compliance | Designed to support ISO 17025-compliant workflows |
| Brand | Doppler |
|---|---|
| Origin | Guangdong, China |
| Model | SAM-450C |
| Scan Mode | B-scan |
| Transducer | Single-element focused transducer |
| Scan Volume | 450 × 300 × 120 mm |
| Maximum Image Resolution | 10,000 × 10,000 pixels (subject to configuration) |
| Max Scan Speed | 1200 mm/s |
| Ultrasonic Frequency Range | 10–300 MHz |
| X/Y-axis Repeatability | ±0.5 µm |
| Ambient Temperature Range | 19–25 °C |
| Relative Humidity Limit | ≤65% RH |
| Imaging Modes Supported | A-scan, B-scan, C-scan, D-scan, X-scan |
| System Positioning Accuracy | ±0.03 mm |
| Effective Imaging Resolution | 0.2 × 0.2 mm |
| Minimum Detectable Defect Size | <25 µm (at 100 MHz) |
| Operating Frequency Range (Typical) | ≥20 MHz |
| Brand | Olympus |
|---|---|
| Origin | Shanghai, China |
| Manufacturer Type | Authorized Distributor |
| Country of Origin | China |
| Axis Configuration | 6-Axis (X, Y, Z, A, B, T) |
| Application Scope | Semiconductor Packaging, Microelectronics, Welding Integrity Assessment, Advanced Materials QA/QC |
| Compliance Framework | Designed for ISO/IEC 17025-aligned laboratory environments |
| Software Platform | Olympus SAMView™ v4.2 with Audit Trail & Data Export (CSV, TIFF, BMP, HDF5) |
| Brand | Struers |
|---|---|
| Origin | France |
| Model | PSM-5 / PSM-10 |
| Magnification | up to 400× (PSM-5), up to 600× (PSM-10) |
| Illumination | Integrated battery-powered LED |
| Construction | Lightweight aluminum housing |
| Accessories | Digital camera adapter, eyepiece micrometer, thin-film thickness gauge, magnetic cross-stage (PSM-10 only), high tripod base (PSM-10 only) |
| Carrying case | Rugged aluminum transport case with integrated tool storage |
| Compliance | Designed for field-deployable non-destructive evaluation in accordance with aerospace surface inspection best practices |