Semiconductor Device Testing Instruments
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| Brand | ANALYSIS TECH |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Import Status | Imported |
| Model | 32-106 |
| Price | Upon Request |
| Channel Count | 32 |
| Threshold Resistance Range | 0.1–2000 Ω |
| Minimum Event Duration | 100 ns (standard settings: 0.1, 0.5, 1.0 µs) |
| Channel Test Current Options | 1, 5, 10, 20, 50, 100 mA |
| Max Channel Source Voltage | 2.5 V |
| Max Sensing Current | 100 mA |
| Threshold Tolerance | ±5% |
| Operating Temperature | ≤35 °C |
| Power Supply | 120 VAC, 60 Hz, 3 A |
| Enclosure Dimensions | 7.5" H × 18" W × 16.5" D |
| Weight | 26 lbs |
| Input Cable Standard | PVC-shielded ribbon cable (rated to 105 °C) |
| Optional Cable | High-temp shielded cable (rated to 180 °C) |
| Compatibility | HLV Amplifier for milliohm-range sensing |
| Brand | Attolight |
|---|---|
| Origin | Switzerland |
| Model | Allalin |
| Electron Source | Schottky thermal field emission gun |
| Beam Energy Range | 1–10 keV |
| Minimum Probe Size | 3 nm @ 10 kV |
| Working Distance | 3 mm |
| Field of View | up to 300 µm |
| Optical NA | 0.71 (f/0.5) |
| Spectral Range | 200–1700 nm |
| Spectral Acquisition Speed | >900 spectra/s (UV-Vis), >180 spectra/s (NIR) |
| EBIC Current Detection Limit | 100 fA |
| Temperature Range (Cryostat) | 10 K to 300 K |
| Positioning Precision | 1 nm step, 100 nm repeatability over full range |
| Vacuum System | Ion pump (electron column) + turbomolecular pump (sample chamber) |
| Data Export Format | HDF5, TIFF, CSV |
| Software Compliance | Audit-trail enabled, metadata-embedded, GLP/GMP-ready |
| Brand | Attolight |
|---|---|
| Origin | Switzerland |
| Model | Chronos |
| Electron Gun | Schottky Field Emission with Ultrafast Laser-Driven Pulsing |
| Spatial Resolution | <10 nm (3–10 keV) |
| Temporal Resolution | 2 ps (streak camera), 20 ps FWHM (TCSPC) |
| Spectral Range | UV–IR (200–1700 nm) |
| Detector Options | Streak Camera + TCSPC Modules |
| Automation | Fully Automated CW/Pulsed Mode Switching |
| Compliance | Designed for GLP/GMP-adjacent nanophotonics labs, compatible with ASTM E2845 and ISO/IEC 17025 traceability frameworks |
| Dimensions | 1437 × 1039 mm (footprint), 2236 × 2426 mm (recommended lab space) |
| Weight | ~1170 kg |
| Brand | Attolight |
|---|---|
| Origin | Switzerland |
| Model | Monch |
| Optical Collection NA | >0.4 |
| Mirror Working Distance | 300 µm |
| Mirror Reflectivity | up to 90% (200 nm – 1.7 µm) |
| Positioning Accuracy | 100 nm (absolute encoder) |
| XY/Z Travel | 30 mm (X), ±1.5 mm (Y/Z) |
| Max Imaging Speed | 900 Hz (128×128 in 18 s) |
| Compatible STEM Platforms | JEOL, Thermo Fisher Scientific (FEI), Hitachi, Nion, VG |
| Minimum Pole-Piece Gap | 4.5 mm |
| Fiber Interface | Asymmetric fiber bundle reconfigured for spectrometer slit alignment |
| Software | Windows 10+ (64-bit), Gatan DigitalMicrograph® integration, Python API (optional encrypted) |
| Brand | Attolight |
|---|---|
| Origin | Switzerland |
| Model | Santis 300 |
| Wafer Handling | Fully automated for 150 mm, 200 mm, and 300 mm wafers |
| Positioning Accuracy | <10 µm |
| Warpage Compensation | Real-time topography mapping and stage tilt correction |
| Acquisition Modes | Full-Field Brush (FWBrush), Averaged Pixel (AWPix), and Multi-Point Spot Scanning |
| CL Spectral Range | Typically 200–1100 nm (configurable with grating options) |
| Detector | Back-illuminated CCD or sCMOS with high quantum efficiency in UV-VIS-NIR |
| Integration with SEM | Synchronized electron beam scanning and photon collection via fiber-coupled monochromator or spectrometer |
| Brand | McScience |
|---|---|
| Origin | South Korea |
| Model | M131 |
| Operating Modes | DC & AC (up to 1 kHz sinusoidal) |
| Quadrants | Four-Quadrant Source/Measure Capability |
| Compliance Function | Voltage/Current Limiting with Real-Time Protection |
| Communication Interface | Ethernet (LAN) |
| Customization | Available per customer requirements |
| Category | Semiconductor Device Testing Instrument |
| Application Scope | Flat Panel Display (LCD, OLED), Micro/Mini LED, Lithium-ion Battery Characterization, General Electronic Component Evaluation |
| Brand | Moglabs |
|---|---|
| Origin | Australia |
| Model | MSA Series ECDL-Based MOPA Laser |
| Wavelength Range | 630–1064 nm |
| Output Power | Up to 4 W (wavelength-dependent) |
| Linewidth | <100 kHz |
| ASE Suppression | >45 dB |
| Small-Signal Gain | Up to 23 dB |
| Seed Input Requirement | 10–30 mW |
| Gain Bandwidth | 10–30 nm (wavelength-dependent) |
| Polarization Extinction Ratio | >20 dB |
| Beam Collimation | Integrated, Linearly Aligned Coupling Lenses |
| Amplifier Module Replaceability | User-Serviceable TA Diode Cartridge |
| Optional Configurations | Dual-Stage Isolator (5 mm aperture), Single-Mode Fiber Coupling, Frequency Stabilization Kit, Power Stabilization Module, Astigmatism-Corrected Output, Dual-Beam (Free-Space + Fiber) |
| Brand | EXPEC |
|---|---|
| Origin | Zhejiang, China |
| Manufacturer Type | Original Equipment Manufacturer (OEM) |
| Country of Origin | China |
| Model | SUPEC 2050 |
| Price | Contact for Quotation |
| Brand | YAMATO |
|---|---|
| Origin | Japan |
| Model | TE100 |
| Compliance | ISO 4825-1:2023-01 |
| Sample Size | 30 × 30 mm |
| Load Force | 10 kg |
| Temperature Resolution | ≥0.01 °C |
| Electrical Resistance Measurement Error | ±0.1 mΩ (70–130 Ω) |
| Sampling Rate | up to 100 samples/sec |
| Power Supply | AC 100 V, 50/60 Hz |
| Controller Dimensions | W380 × D470 × H180 mm |
| Measurement Unit Dimensions | W380 × D400 × H320 mm |
| TEG Chip Dimensions | W5 × D5 × H0.35 mm |
| TEG Heat Generation Density | 1 kW/cm² |
| Max Input Power | ~250 W |
| Thermal Ramp Rate | 1.4 × 10⁴ K/sec |
| External Circulator Model | NeoCool CFA302 |
| Circulation Type | External Closed-Loop System |
| Cooling Method | Air-Cooled |
| Temperature Control Range | −10 to +60 °C |
| Circulator Power Supply | AC 100 V, 13.8 A |
| Circulator Dimensions | W380 × D565 × H725 mm |